List of Semiconductor inspection/test equipment products
- classification:Semiconductor inspection/test equipment
91~135 item / All 673 items
Achieving ultra-thin, high rigidity, and high precision.
- Semiconductor inspection/test equipment
Adopting a low-dust structure, ideal for clean environments! Achieving high speed, high rigidity, and long-term maintenance-free operation!
- Semiconductor inspection/test equipment
It is used in a wide range of industries such as machinery, semiconductor and LCD manufacturing equipment, industrial robots, medical and welfare, transportation equipment, construction, and aerospace...
- Other machine elements
- Milling machine
- Semiconductor inspection/test equipment
USB connection I2C, SPI controller
- Semiconductor inspection/test equipment
Can be used for various applications! Such as patterning of organic devices and cutting of metal wiring for ICs, etc.
- Semiconductor inspection/test equipment
It is a UV irradiation device that can utilize DUV light up to 248nm and allows for wavelength selection and switching.
- Semiconductor inspection/test equipment
Overall alignment accuracy ±2.5μm! Inspection equipment for large individual pieces/quarter panels.
- Semiconductor inspection/test equipment
LUL can provide proposals tailored to your specifications! We accommodate a variety of automation requirements.
- Semiconductor inspection/test equipment
Double table/shuttle type! Inspection equipment for FC-CSP/large individual chip substrates.
- Semiconductor inspection/test equipment
Contributing to automation and labor-saving with new ideas! Actively used in various manufacturing sites through special methods!
- Mounter
- Assembly Machine
- Semiconductor inspection/test equipment
Cam and gear software
- Other machine tools
- gear
- Semiconductor inspection/test equipment
It is also possible to impart water-repellent properties to the tapered surface on the outer circumference to improve ESI efficiency!
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a constant inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
Would you like to achieve efficiency in repair and maintenance inspection operations and improve customer satisfaction with the core business package "ServAir" for after-sales service?
- Semiconductor inspection/test equipment

ServAir Cloud V4.3 has released the "BI Option."
We are pleased to announce the release of the after-sales service core business package, ServAir Cloud V4.3. In V4.3, we will offer a new BI (Business Intelligence) option. You will be able to analyze various data from ServAir and create graphs using the BI tool QuickSight provided by AWS Japan (Amazon Web Services Japan LLC). ServAir's data will be available in a format that can be easily utilized on QuickSight, allowing you to perform data analysis, forecasting, create various graphs, and manage KPIs on your own. This enables you to manage, analyze, and share data tailored to your business goals. V4.3 is scheduled to go on sale on December 15, 2023, and to start shipping on January 26, 2024. Please feel free to contact us for an introduction to the product, including the new features of V4.3.
We create tapered capillaries with a constant inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment

We will exhibit at the 2024 Japan Proteomics Society Annual Meeting and the 20th Joint Meeting of the Japanese Clinical Proteogenomics Society.
Our company will be exhibiting at the Joint Conference of the 2024 Annual Meeting of the Japanese Proteomics Society and the 20th Annual Meeting of the Japanese Clinical Proteogenomics Society, which will be held at Link Station Hall Aomori from June 26 to 28, 2024. At our booth, we will showcase a complete set of interfaces that enable high-sensitivity measurements using capillary electrophoresis-mass spectrometry (CE-MS). We invite anyone using CE-MS, as well as those who own an MS and are interested in utilizing capillary electrophoresis, to visit our booth.
CDSEM, boasting an overwhelming market share, along with the Hitachi S8000 and S9000 series. We have a constant inventory of equipment and a complete demonstration system in place.
- Semiconductor inspection/test equipment
Fusing the "design capabilities" of machinery, electronics, and software! We respond to needs in a one-stop manner.
- Semiconductor inspection/test equipment
Zirconia (ZrO2) has high bending strength and compressive strength at room temperature, and its fracture toughness is extremely high.
- Fine Ceramics
- Mounter
- Semiconductor inspection/test equipment
OYM-401 is a manual prober compatible with optical microscopes. It is equipped with multiple positioners, allowing for easy probing.
- Semiconductor inspection/test equipment
It is a device that automatically supplies semiconductor wafers to the inspection machine. It employs a vibration isolation mechanism to prevent vibrations during inspection.
- Semiconductor inspection/test equipment
266nm CW (continuous wave) laser 10mW - 550mW @ 266nm Compact head Air-cooled, low noise
- Semiconductor inspection/test equipment
Anisotropic conductive sheet
- Semiconductor inspection/test equipment
- Other semiconductors
- others
W-CSP inspection probe card
- Semiconductor inspection/test equipment
- Other semiconductors
- Printed Circuit Board
Consolidating decades of technology developed with contact probes for semiconductor testing!
- Semiconductor inspection/test equipment
- Other semiconductors
- Printed Circuit Board
We will introduce product information by genre for various precision tools and fixtures used in semiconductor manufacturing, as well as individual product specifications.
- Semiconductor inspection/test equipment
- Other semiconductors
- Printed Circuit Board
STEM-EDS observation can confirm the shape and layer structure of the insulating film between semiconductor Poly-Si (polysilicon) and can be applied to investigate the causes of semiconductor defects.
- Semiconductor inspection/test equipment
- Contract Analysis
- Other semiconductors
We provide a one-stop service from semiconductor test development to the launch of semiconductor testing and semiconductor testing outsourcing.
- Semiconductor inspection/test equipment
We have a proven track record in static electricity measures and charge prevention, from atmospheric environments to vacuum environments.
- Other semiconductors
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Inline cleaning of particles on the stage - wafer-type stage cleaner
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
- Other cleaning tools