List of Other semiconductor manufacturing equipment products
- classification：Other semiconductor manufacturing equipment
1501～1515 item / All 2013 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!
- Cooling system
April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024
Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.
It is a device that loads wafers one by one.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device used for handling to perform P/N determination and visual inspection of silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device for inverting and transferring silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Classified by resistivity and thickness categories.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device that detects the wafer edge using laser light and measures the diameter by comparing it with a calibration wafer (reference wafer).
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device that detects the edge of a wafer and measures its diameter through image processing.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device that measures the thickness of sapphire wafers and sorts them according to their thickness.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device that measures the thickness of silicon wafers and rearranges them according to their thickness.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and double-sided polishing process.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and the double-sided polishing process.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and the double-sided polishing process.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Thickness measurement of compound semiconductor wafers in sizes φ2”, φ4” or φ6”.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Thickness measurement of various types of wafers below φ4"
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment