List of 3D measuring device products
- classification：3D measuring device
61～90 item / All 879 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
Enabling nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Enables nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Enabling nanoscale "actual measurements" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Optical methods enable the measurement of nanoscale fine structures.
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale measurements with optical methods. For evaluating reflection characteristics.
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Measured nanoscale shape accuracy using optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Optical "vertical focus" enables nanoscale "actual measurement."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Optical "vertical focus" enables nanoscale "actual measurement."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
A compact industrial DLP projector that enables high-precision 3D inspection.
- 3D measuring device
- Lighting for image processing
- Light source/lighting
Notice of Participation in Nepcon Japan 2026 | January 21 (Wed) - 23 (Fri) Tokyo Big Sight
We will be exhibiting at "Nepcon Japan 2026," which will be held at Tokyo Big Sight from January 21 (Wednesday) to 23 (Friday), 2026. We will focus on showcasing the following products, so please be sure to visit our booth. - 105MP/245MP ultra-high-resolution sensor CoaXPress area scan cameras - 10MP/14MP/21MP ultra-high-speed CoaXPress area scan cameras - 8k TDI 1MHz CoaX over Fiber 100G line scan cameras - 2k & 4k CoaXPress line scan cameras - DLP projectors, 3D-Camera series ◇◆Nepcon Japan 2026 □ Dates: January 21 (Wednesday) to 23 (Friday), 2026, 10:00 AM to 5:00 PM □ Venue: Tokyo Big Sight, East Exhibition Hall, E10-37 For details and visitor registration, please visit ➤ https://www.nepconjapan.jp/tokyo/ja-jp.html#/ Please take this opportunity to see our industrial cameras, designed and developed in Japan, which combine performance, quality, cost, and delivery time at a high level, focusing on CoaXPress cameras!
Industrial DLP projectors that achieve high-precision 3D inspection.
- Lighting for image processing
- 3D measuring device
- Light source/lighting
Notice of Participation in Nepcon Japan 2026 | January 21 (Wed) - 23 (Fri) Tokyo Big Sight
We will be exhibiting at "Nepcon Japan 2026," which will be held at Tokyo Big Sight from January 21 (Wednesday) to 23 (Friday), 2026. We will focus on showcasing the following products, so please be sure to visit our booth. - 105MP/245MP ultra-high-resolution sensor CoaXPress area scan cameras - 10MP/14MP/21MP ultra-high-speed CoaXPress area scan cameras - 8k TDI 1MHz CoaX over Fiber 100G line scan cameras - 2k & 4k CoaXPress line scan cameras - DLP projectors, 3D-Camera series ◇◆Nepcon Japan 2026 □ Dates: January 21 (Wednesday) to 23 (Friday), 2026, 10:00 AM to 5:00 PM □ Venue: Tokyo Big Sight, East Exhibition Hall, E10-37 For details and visitor registration, please visit ➤ https://www.nepconjapan.jp/tokyo/ja-jp.html#/ Please take this opportunity to see our industrial cameras, designed and developed in Japan, which combine performance, quality, cost, and delivery time at a high level, focusing on CoaXPress cameras!
Industrial DLP projectors available for selection from a wide lineup.
- Lighting for image processing
- 3D measuring device
- Light source/lighting
Notice of Participation in Nepcon Japan 2026 | January 21 (Wed) - 23 (Fri) Tokyo Big Sight
We will be exhibiting at "Nepcon Japan 2026," which will be held at Tokyo Big Sight from January 21 (Wednesday) to 23 (Friday), 2026. We will focus on showcasing the following products, so please be sure to visit our booth. - 105MP/245MP ultra-high-resolution sensor CoaXPress area scan cameras - 10MP/14MP/21MP ultra-high-speed CoaXPress area scan cameras - 8k TDI 1MHz CoaX over Fiber 100G line scan cameras - 2k & 4k CoaXPress line scan cameras - DLP projectors, 3D-Camera series ◇◆Nepcon Japan 2026 □ Dates: January 21 (Wednesday) to 23 (Friday), 2026, 10:00 AM to 5:00 PM □ Venue: Tokyo Big Sight, East Exhibition Hall, E10-37 For details and visitor registration, please visit ➤ https://www.nepconjapan.jp/tokyo/ja-jp.html#/ Please take this opportunity to see our industrial cameras, designed and developed in Japan, which combine performance, quality, cost, and delivery time at a high level, focusing on CoaXPress cameras!
3D modeling and drafting of products without drawings (e.g., manufacturing drawings for discontinued parts)
- 3D measuring device
- 3D CAD
For visualizing 5G electromagnetic waves! Capable of 6-axis 3D measurement! Completely covers EMC noise measurement in various industrial fields.
- 3D measuring device
- Noise Inspection
Handheld devices allow for easy acquisition of detailed and multifaceted measurement data!
- 3D measuring device
A spatial electromagnetic field visualization system that measures EMC noise in three dimensions and makes electromagnetic waves and sound "visible"! [For the automotive and home appliance industries]
- 3D measuring device
Visualizing 5G millimeter wave radiation! Introducing a 3D electromagnetic field visualization system!
- 3D measuring device
We will exhibit at the Techno Frontier EMC and Noise Control Technology Exhibition.
Techno Frontier EMC and Noise Control Technology Exhibition July 20 (Wednesday) - 22 (Friday), 2022 Venue: Tokyo Big Sight East Exhibition Hall Booth: 2E-20 https://www.jma.or.jp/tf/tf/emc.html Exhibited Products: ■ WM7000 Series EMC Noise Scanner ■ FP291/FP431 Millimeter Wave Magnetic Field Probes (29.5GHz/43GHz) ■ WM9500 Series 3D Electromagnetic Field Visualization System ■ WM950ZERO Camera-less 3D Electromagnetic Field Visualization System (Electromagnetic wave visualization inside a hand-in shield box)
![[EMC] WM9500 Series 3D Electromagne...](https://image.mono.ipros.com/public/product/image/6e0/2000158639/IPROS38373264589482544142.jpeg?w=280&h=280){kind=small}
Three-dimensional measurement of "radio waves, EMC noise, ultrasound, static magnetic fields," etc., using handheld sensors and probes.
- 3D measuring device
We will exhibit at the Techno Frontier EMC and Noise Control Technology Exhibition.
Techno Frontier EMC and Noise Control Technology Exhibition July 20 (Wednesday) - 22 (Friday), 2022 Venue: Tokyo Big Sight East Exhibition Hall Booth: 2E-20 https://www.jma.or.jp/tf/tf/emc.html Exhibited Products: ■ WM7000 Series EMC Noise Scanner ■ FP291/FP431 Millimeter Wave Magnetic Field Probes (29.5GHz/43GHz) ■ WM9500 Series 3D Electromagnetic Field Visualization System ■ WM950ZERO Camera-less 3D Electromagnetic Field Visualization System (Electromagnetic wave visualization inside a hand-in shield box)
A spatial electromagnetic field visualization system that can measure EMC noise in three dimensions and make electromagnetic waves and sound "visible"! [For the automotive and home appliance industrie...
- 3D measuring device
"Electromagnetic fields, sound, ultrasound" - the invisible becomes visible!
- 3D measuring device
"Electromagnetic fields, sound, ultrasound" - the invisible becomes visible!
- 3D measuring device
Measuring the effects of electromagnetic waves on the human body! Visualizing the electromagnetic waves of the subject on a computer! Quick measurements!
- 3D measuring device
We will exhibit at the Techno Frontier EMC and Noise Control Technology Exhibition.
Techno Frontier EMC and Noise Control Technology Exhibition July 20 (Wednesday) - 22 (Friday), 2022 Venue: Tokyo Big Sight East Exhibition Hall Booth: 2E-20 https://www.jma.or.jp/tf/tf/emc.html Exhibited Products: ■ WM7000 Series EMC Noise Scanner ■ FP291/FP431 Millimeter Wave Magnetic Field Probes (29.5GHz/43GHz) ■ WM9500 Series 3D Electromagnetic Field Visualization System ■ WM950ZERO Camera-less 3D Electromagnetic Field Visualization System (Electromagnetic wave visualization inside a hand-in shield box)
Large workpieces can also be measured with high precision without contact!
- 3D measuring device
Solving the absence of drawings! Physical measurement and drafting service.
- 3D measuring device
- Mechanical Design
- Machinery and equipment installation/dismantling/relocation
Non-contact line sensor CLS. High precision, high speed, and wide range 3D shape measurement. High tolerance for angles suitable for edges and slopes. Numerous achievements in wafer edge measurement.
- 3D measuring device
Nepcon Japan 2026
We will be exhibiting at Nepcon Japan 2026, which will be held at Tokyo Big Sight from January 21 (Wed) to January 23 (Fri), 2026. If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Chromatic aberration confocal optical line sensor CLS2 3. Non-contact thickness measurement sensor for opaque materials Enovasnese
Capable of measuring the total thickness of 12-inch wafers. High-speed measurement without the influence of vibrations, without a scanning stage. Suitable for online, offline, and wafer inspection app...
- Coating thickness gauge
- 3D measuring device
Semicon Japan 2024
We will be exhibiting at Semicon Japan 2024, which will be held at Tokyo Big Sight from December 11 (Wednesday) to December 12 (Friday). If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Area scanner for measuring the thickness and shape of 12" wafers - Flying Spot Scanner (FSS) 3. Chromatic aberration confocal optical line sensor CLS2.0 4. Chromatic aberration confocal line camera CVC 5. Chromatic aberration confocal optical single-point sensor CHRocodile Mini 6. Non-contact thickness measurement sensor for opaque materials Enovasnese 7. Sensor for detecting internal defects non-contactly - Field sensor