List of Coating thickness gauge products
- classification：Coating thickness gauge
91～105 item / All 404 items
Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.
- air conditioning
【* Demo units available, sample measurements possible】 High precision ±0.1 μm, capable of measuring a wide range from 12 μm to 80 mm thickness gauge (thickness meter).
- Coating thickness gauge
12" wafer full inspection accelerated, can also be used for full inspection of wafers.
- Coating thickness gauge
2026 OPIE Exhibition Information
We will be exhibiting at OPIE 26' held at Pacifico Yokohama from April 22 to 24. Our booth will be L-37 (Light and Imaging Sensor & Imaging EXPO). We plan to showcase the 3D line sensor CLS2, a single-point thickness sensor, a distance sensor, and Enovasense, which can measure the thickness of opaque objects.
Capable of measuring the total thickness of 12-inch wafers. High-speed measurement without the influence of vibrations, without a scanning stage. Suitable for online, offline, and wafer inspection app...
- Coating thickness gauge
- 3D measuring device
2026 OPIE Exhibition Information
We will be exhibiting at OPIE 26' held at Pacifico Yokohama from April 22 to 24. Our booth will be L-37 (Light and Imaging Sensor & Imaging EXPO). We plan to showcase the 3D line sensor CLS2, a single-point thickness sensor, a distance sensor, and Enovasense, which can measure the thickness of opaque objects.
Thickness measurement is possible from thick wafers to ultra-thin wafers (less than 1μm).
- Coating thickness gauge
Notice of Participation in SEMICON JAPAN 2025
Our company will exhibit at "SEMICON JAPAN 2025," which will be held at Tokyo Big Sight starting from December 17, 2025 (Booth Number: E4727). At this exhibition, we will introduce semiconductor industry-specific applications and non-contact measuring instruments that contribute to the reliability of semiconductor manufacturing processes and the improvement of semiconductor performance, which are continuously evolving. We warmly invite you to visit our booth and see our offerings. <Main Exhibited Products> - Visual blade inspection system for dicing processes - Non-contact high-precision thin film measurement device (interferometry technology) - Non-contact high-precision surface shape measurement device (chromatic confocal technology) - Contact/non-contact thickness measurement gauge for controlling wafer thickness during processing (interferometry technology)
Speedy pinpoint check of coatings. Automatic identification of ferrous and non-ferrous measurement substrates.
- Coating thickness gauge
A revolution in the measurement of coating film thickness! A film thickness measurement support tool that dramatically improves work efficiency.
- Coating thickness gauge
- Other network tools
Film thickness measurement goes from "point" to "surface." High-speed full-area film thickness measurement device.
- Coating thickness gauge