List of Analytical Equipment and Devices products
- classification：Analytical Equipment and Devices
1366～1380 item / All 5042 items
Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.
- air conditioning
Important analysis items for performance evaluation and quality control of functional materials! Evaluation of pore size and pore distribution of non-woven sheets and membrane materials.
- Analytical Equipment and Devices
Measurement of specific surface area of powdered zeolite by the BET method.
Our company conducts specific surface area measurements of powdered zeolite using the BET method. In addition to powdered zeolite, it can also be used for specific surface area measurements of catalysts and activated carbon, and by utilizing other applications, it is possible to measure not only specific surface area but also pore distribution. Furthermore, particle size and pore distribution can be evaluated using methods and equipment other than those mentioned. For more details, please refer to our catalog.
Observing the conductive particles from the planar direction and the cross-sectional direction! A case study confirming the degree of deformation.
- Analytical Equipment and Devices
Observation of Conductive Particle Shape in COG Implementation
We will introduce the observation of the shape of conductive particles in COG implementation. ICs and liquid crystal panels are implemented using the COG method with ACF (anisotropic conductive film). A resin ball is used as the core, and a metal layer (such as nickel or gold) for conductivity is deposited on its surface. During connection, the particles deform appropriately to electrically connect the IC and the panel. To confirm the degree of particle deformation and connection status, cross-sectional observations were conducted, revealing that the particle deformation was at a "medium" level, indicating an appropriate degree of deformation. By examining the deformation of conductive particles from both the planar and cross-sectional directions, we can explore the correlation with display defects. Please feel free to contact us for any inquiries regarding panel-related defects.
Observations before and after reliability testing and cross-sectional observations! Here are examples of observations of various implemented components.
- Analytical Equipment and Devices
Confirmation of chiplet package structure by mechanical polishing.
Regarding the chip mounted on the main circuit board of the VR goggles manufactured by Company A, upon visual observation, it was inferred that it has a chiplet structure with multiple chips integrated. To examine the structure in more detail, we created a cross-section using X-ray CT observation and mechanical polishing, and we will introduce the structural confirmation results. *For more details, please download the PDF or feel free to contact us.*
We provide quick and accurate solutions based on technology and experience for quality initiatives that consider performance, reliability, disposal, and recycling from the product planning stage.
- Contract Analysis
- Contract Inspection
- Analytical Equipment and Devices
Evaluation of various implementation substrates
At Aites Co., Ltd., we provide a wide range of technical services for evaluation tests of printed circuit boards (mounted boards) equipped with electronic components. We conduct reliability tests, solder joint observations, whisker observations, and cross-sectional observations. We have IPC-A-610 certified IPC specialists on staff who can assist with observations in accordance with international standards, consultations, and various observation-related concerns. Additionally, we offer services such as X-ray observations, appearance inspections, and shape measurements, so please feel free to consult with us when needed.
We will identify and observe the defective areas of power devices such as diodes, MOS-FETs, and IGBTs.
- Contract Analysis
- Transistor
- Analytical Equipment and Devices
Announcement of the introduction of Talos F200E
Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has improved, and performance has been significantly enhanced, allowing for EDS analysis with four detectors. Additionally, it is equipped with features such as drift-corrected frame integration (DCFI), which accumulates multiple frames while correcting for drift.
If it is 5 micrometers or larger, foreign object IR data can be obtained.
- Contract Analysis
- Analytical Equipment and Devices
- Other contract services
Micro FT-IR imaging measurement
We would like to introduce the "Microscopic FT-IR Imaging Measurement" that we conduct. It allows for the visualization of the distribution of substances as a two-dimensional image within a specified plane. It becomes possible to evaluate changes in the distribution of substances that are difficult to assess with regular point measurements through visual images.
We will report rapid analysis results using various sampling techniques regarding foreign substances that significantly impact the yield of electronics products.
- Contract Analysis
- Analytical Equipment and Devices
- Other contract services
Chemical Analysis Concierge Service
We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analysis device can measure different targets, it is necessary to choose a method that fits the purpose based on the information available.
TOF-SIMS can analyze light elements and inorganic substances as well as large organic molecules.
- Analytical Equipment and Devices
- Contract Analysis
- Other contract services
Chemical Analysis Concierge Service
We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analysis device can measure different targets, it is necessary to choose a method that fits the purpose based on the information available.
Proposals tailored to the purpose of analysis and the target object! GC/MS analysis of derivatized samples.
- Analytical Equipment and Devices
Chemical Analysis Concierge Service
We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analysis device can measure different targets, it is necessary to choose a method that fits the purpose based on the information available.
Suitable for analysis of glass, metal, ceramics, silicon, compound semiconductors, shallow implants, and more!
- Analytical Equipment and Devices
Dynamic SIMS
"Dynamic SIMS" is a secondary ion mass spectrometry method that can detect trace amounts of all elements (from H to U) in samples with high sensitivity, ranging from ppm to ppb. It allows for qualitative analysis and depth profiling, and additionally enables high-precision quantitative analysis using standard samples (conducted at our partner company's facility). The minimum beam diameter is approximately 30 µm, and it can be further reduced depending on the material.
Observation of the sensor chip surface, creating a cross-section through mechanical polishing in the mounted state, and conducting structural observation of the device!
- Analysis Services
- Analytical Equipment and Devices
Confirmation of chiplet package structure by mechanical polishing.
Regarding the chip mounted on the main circuit board of the VR goggles manufactured by Company A, upon visual observation, it was inferred that it has a chiplet structure with multiple chips integrated. To examine the structure in more detail, we created a cross-section using X-ray CT observation and mechanical polishing, and we will introduce the structural confirmation results. *For more details, please download the PDF or feel free to contact us.*
Measure the change state with a 3D shape measuring device! Visually confirm the indented shape and amount due to pressure.
- Analysis Services
- Analytical Equipment and Devices
Observation of thermal deformation using a 3D shape measuring machine (VR-6200)
This is a measuring device that can non-contact measure surface shapes such as concavities, undulations, and surface roughness. We will introduce "heating deformation observation" using a 3D shape measuring machine. First, we acquire a 3D texture image at room temperature, and then we acquire a 3D texture image in the heated state. By overlaying the texture images before and after heating and checking the differential texture image and cross-sectional profile, it can be seen that the substrate in the heated state has higher ends and a lower center compared to the room temperature state.
We will solve your problems and issues with our expertise and abundant equipment!
- Analytical Equipment and Devices
- Other contract services
Chemical Analysis Concierge Service
We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analysis device can measure different targets, it is necessary to choose a method that fits the purpose based on the information available.
Measuring the area ratio of internal voids in solder! By combining mechanical polishing, a comprehensive evaluation is possible.
- Analytical Equipment and Devices
- Other contract services
High-brightness electron gun for detailed SEM images! Equipped with an in-lens SE detector sensitive to surface information.
- Analytical Equipment and Devices
- Other contract services