List of Contract Analysis products
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For those who have isolators. Achieving high chemical resistance and workability. Low cost and short delivery times are also possible for glove box and isolator gloves.
- Work gloves
Notice of participation in 'INTERPHEX Week Tokyo' from May 20 (Wednesday) to May 22 (Friday), 2026.
Ito Corporation will be exhibiting at "INTERPHEX Week Tokyo" held at Makuhari Messe. This exhibition is the largest in Japan, showcasing a wide range of products and services related to the research and manufacturing of pharmaceuticals, cosmetics, and regenerative medicine from 25 countries and regions around the world. Pharmaceutical and cosmetic manufacturers, as well as regenerative medicine companies, will be attending from all over the globe. We will be showcasing "Gloves for Glove Boxes/Isolators" manufactured by Tron Power. We look forward to your visit.
![[MFM] Magnetic Force Microscopy Met...](https://image.mono.ipros.com/public/product/image/8b9/2000475543/IPROS6176896315983391970.jpg?w=280&h=280){kind=small}
MFM is a measurement technique that uses a probe coated with a magnetic film to measure the leakage magnetic field occurring near the sample surface and obtain magnetic information.
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![[SXES] Soft X-ray Emission Spectros...](https://image.mono.ipros.com/public/product/image/7dc/2000459897/IPROS8348572353503213333.jpg?w=280&h=280){kind=small}
SXES is a method that evaluates the chemical bonding state using soft X-rays emitted from materials.
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![[XPS] X-ray Photoelectron Spectrosc...](https://image.mono.ipros.com/public/product/image/9af/387108003/IPROS1881601582061665056.jpg?w=280&h=280){kind=small}
Effective for evaluating the types, quantities, and chemical bonding states of elements on the sample surface (at a depth of about several nanometers).
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This is a method for inorganic element analysis using inductively coupled plasma (ICP) as the excitation source.
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The mass array method allows for the simultaneous analysis of multiple genetic polymorphisms.
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It is possible to capture multiple CT images by connecting them vertically.
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By using an integrating sphere, it is possible to measure samples with surface roughness or thickness.
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It is possible to evaluate the sample in its original state.
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FIB: Focused Ion Beam Processing
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SIMS: Secondary Ion Mass Spectrometry
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This is a processing method for cutting bulk samples using a diamond knife to produce ultra-thin sections for transmission electron microscopy with a thickness of less than 100 nm.
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EBSD: Electron Backscatter Diffraction
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X-ray photoelectron spectroscopy (XPS)
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