List of Measurement and Analysis products

  • classification:Measurement and Analysis

9586~9630 item / All 55280 items

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

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  • Other conveying machines

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Ideal for micro-machining! Achieves deburring of holes and double-sided machining in one pass, which was difficult with conventional tools!

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  • Other machine tools

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We will be exhibiting at Mecatronics Tech Japan 2021 from October 20 (Wednesday) to October 23 (Saturday)!

Our company will exhibit at "Mechatrotech Japan 2021," which will be held at Portmesse Nagoya from Wednesday, October 20 to Saturday, October 23, 2021. We will introduce our tools, including the 'Bar Off Tool' capable of chamfering and deburring from a diameter of 0.8 mm, and the 'FEM' tool breakage detection device that reliably detects breakage. We look forward to your visit. (Booth number: 2B12)

Ultrasonic microscope observation of transistors! It is possible to check the peeling conditions at various locations even with the same focus.

  • Contract Analysis
  • Analysis Services
  • Contract Analysis

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Ultrasonic microscope observation of semiconductor packages

This is an introduction to the ultrasonic microscope observation of semiconductor packages conducted by our company. Due to storage conditions and mounting conditions, delamination may occur between the metal parts (die pad) and the package resin in semiconductor packages. Delamination inside the package is a defect that significantly affects product quality, but it cannot be detected through visual inspection. By using an ultrasonic microscope, we can clearly capture the internal structure of the package, contributing to reliability evaluation.

If it is something that ultrasonic waves can penetrate, you can check internal information that cannot be confirmed from the appearance!

  • Contract Analysis
  • Analysis Services
  • Contract Analysis

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Observation of adhesive conditions through a metal plate using an ultrasonic microscope.

Here is an introduction to a case where the adhesive condition was observed through a metal plate using an ultrasonic microscope. The ultrasonic microscope can reveal internal information that cannot be confirmed from the appearance, as long as the ultrasonic waves can pass through the material. After reliability testing, we observed the condition of the adhesive remaining on the metal plate from the metal side in a sample where the chip had come off. Please refer to the PDF document for details and results of the observations.

[Web demo in progress] Measurement procedure is a simple 4-step process that allows for PIV (velocity distribution measurement).

  • Other embedded systems (software and hardware)
  • Fluid analysis contract
  • Spectroscopic Analysis Equipment

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Biodegradable testing equipment that contributes to food quality preservation.

  • Testing Equipment and Devices

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Measuring the biodegradability of packaging materials such as bioplastics.

  • Testing Equipment and Devices

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We measure the biodegradability of wood and promote its sustainable use.

  • Testing Equipment and Devices

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[Product introduction video now available] We evaluate the biodegradability of fishing gear and contribute to reducing environmental impact.

  • Testing Equipment and Devices

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Measure the biodegradability of cosmetic ingredients and consider the environment.

  • Testing Equipment and Devices

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Measuring the biodegradability of a wide range of materials, including bioplastics.

  • Testing Equipment and Devices

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We measure the biodegradability of soil amendments to support sustainable agriculture.

  • Testing Equipment and Devices

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Measuring the biodegradability of a wide range of materials, including bioplastics.

  • Testing Equipment and Devices

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Measuring the biodegradability of coatings to support sustainable product development.

  • Testing Equipment and Devices

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Testing equipment for measuring the biodegradability of bioplastics and other materials.

  • Testing Equipment and Devices

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Improve the layering accuracy of 3D printers! Easy measurement with digital display.

  • Distance measuring device

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Digitize the alignment of printed materials! Improve work efficiency and accuracy.

  • Distance measuring device

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Digitalizing thread feed measurement! Contributing to improved productivity and stable quality.

  • Distance measuring device

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Supports precise operation of medical devices. Achieves accurate position measurement without contact.

  • Distance measuring device

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Contributing to the efficiency of packaging engineering! Achieving accurate sealing with digital displays.

  • Distance measuring device

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Contributing to the improvement of precision in food filling engineering! Non-contact, hygienic, and digital display.

  • Distance measuring device

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Digitalizing thread feeding measurement! Contributing to improved productivity and stable quality.

  • Distance measuring device

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Digitize the alignment of printed materials! Improve work efficiency and accuracy.

  • Distance measuring device

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Improving the layer accuracy of 3D printers! Achieving precise position measurement without contact.

  • Distance measuring device

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Digitizing measurement tasks! Improving efficiency with a linear encoder with a display.

  • Distance measuring device

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You can achieve diverse inspection requirements for various tasks by combining different functions!

  • Other image-related equipment
  • Visual Inspection Equipment

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Simultaneous inspection of front and back possible! A wafer and chip appearance inspection machine that can perform both macro and micro inspections with one unit. Suitable for LED and semiconductor c...

  • Visual Inspection Equipment

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Notice of Participation in SEMICON Japan 2018 (December 12-14, 2018)

Hubbrain Inc. will be exhibiting at SEMICON Japan 2018, which will be held at Tokyo Big Sight from December 12 (Wednesday) to 14 (Friday). This exhibition is an international trade show for the electronics manufacturing supply chain, covering all processes from the front-end to the back-end of semiconductor manufacturing, as well as SMART applications such as automotive and IoT devices. We will be showcasing compact inspection machines that enable diverse inspections with simple settings, as well as inspection equipment that utilizes a 2-megapixel color camera. <Exhibited Products> ■ Free-Angle Appearance Inspection Machine ■ Upper-Type Simple Inspection Machine ■ Wafer and Chip Appearance Inspection Equipment, etc. <Booth Number> ■ East 2 #2332 We sincerely look forward to your visit.

Achieving a high-speed, high-resolution 3D inspection system!

  • Image Processing Equipment
  • 3D measuring device
  • Visual Inspection Equipment

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We will detect black dots and stains on a continuously flowing plain sheet using image inspection!

  • Visual Inspection Equipment
  • Other image-related equipment

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Introduction of case studies! Specializing in simulations of low-pressure plasma or low-temperature plasma.

  • Other analyses
  • Magnetic field analysis/electromagnetic wave analysis
  • Contract Analysis

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Pellet and powder foreign matter inspection device *Compatible with clean rooms and can be installed in factories, capable of detecting 9µm!

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment

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It is possible to inspect appearance defects occurring in the wafer process and dicing process quickly and with high precision.

  • Semiconductor inspection/test equipment
  • Visual Inspection Equipment

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Green Sheet Appearance Inspection Machine - Parallel Processing Type

  • Image Processing Board
  • Visual Inspection Equipment

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Ideal for large volume work counting! High-speed, high-precision counting machine with space-saving design.

  • Counting Machine
  • counter

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Detect foreign substances and discoloration in pellets and powders with our independently developed inspection mechanism!

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment

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For inspecting electronic components like SMDs! It is possible to inspect individually for products that cannot use a parts feeder!

  • Image Processing Equipment
  • Visual Inspection Equipment

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Newly developed! Capable of detecting fine scratches and surface defects on six sides (front and back + four sides) as well as measuring dimensions!

  • Image Processing Equipment
  • Visual Inspection Equipment

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Detecting foreign substances and discoloration in pellets and powders with our independently developed inspection mechanism!

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment

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Thanks to our unique technology, we can cancel out polycrystalline patterns and detect fine defects!

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment

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A group of engineers full of personality! We are always striving for a higher level of engineering expertise.

  • Visual Inspection Equipment
  • Other image-related equipment

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Tabletop robot specifications! A low-cost, high-functionality tabletop appearance inspection machine.

  • Other inspection equipment and devices
  • Visual Inspection Equipment

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SEMICON_Japan_289px.png

Notice of Participation in SEMICON Japan 2018 (December 12-14, 2018)

Hubbrain Inc. will be exhibiting at SEMICON Japan 2018, which will be held at Tokyo Big Sight from December 12 (Wednesday) to 14 (Friday). This exhibition is an international trade show for the electronics manufacturing supply chain, covering all processes from the front-end to the back-end of semiconductor manufacturing, as well as SMART applications such as automotive and IoT devices. We will be showcasing compact inspection machines that enable diverse inspections with simple settings, as well as inspection equipment that utilizes a 2-megapixel color camera. <Exhibited Products> ■ Free-Angle Appearance Inspection Machine ■ Upper-Type Simple Inspection Machine ■ Wafer and Chip Appearance Inspection Equipment, etc. <Booth Number> ■ East 2 #2332 We sincerely look forward to your visit.

Equipped with a 2-axis rotating robot! An appearance inspection device close to visual inspection is realized at a low price!

  • Visual Inspection Equipment
  • Other inspection equipment and devices

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SEMICON_Japan_289px.png

Notice of Participation in SEMICON Japan 2018 (December 12-14, 2018)

Hubbrain Inc. will be exhibiting at SEMICON Japan 2018, which will be held at Tokyo Big Sight from December 12 (Wednesday) to 14 (Friday). This exhibition is an international trade show for the electronics manufacturing supply chain, covering all processes from the front-end to the back-end of semiconductor manufacturing, as well as SMART applications such as automotive and IoT devices. We will be showcasing compact inspection machines that enable diverse inspections with simple settings, as well as inspection equipment that utilizes a 2-megapixel color camera. <Exhibited Products> ■ Free-Angle Appearance Inspection Machine ■ Upper-Type Simple Inspection Machine ■ Wafer and Chip Appearance Inspection Equipment, etc. <Booth Number> ■ East 2 #2332 We sincerely look forward to your visit.

Compatible with cover glass! Image inspection equipment with numerous achievements in the smartphone and FPD industry.

  • Visual Inspection Equipment
  • Defect Inspection Equipment

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Rose supply available!

  • Other inspection equipment and devices

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High-speed parts transfer machine

This device is a high-speed transfer machine that receives small electronic components and high-function modules from a supply unit, aligns and stores them in trays, and then retrieves them. It achieves high-quality component transfer and high productivity through a high-speed, high-precision transfer unit with 16 nozzles arranged in a rotary configuration.

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