List of Contract measurement products

  • classification:Contract measurement

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

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  • Other conveying machines

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Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.

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  • Other safety and hygiene products

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It is possible to analyze the structure of complex organic compounds with overlapping peaks.

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  • Contract Analysis
  • Contract measurement

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Measurement of weight change, differential thermal analysis, heat quantity, and mass of volatile components resulting from heating the sample.

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  • Contract Analysis
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[MST Homepage] Analysis Case "Investigation of Curing Temperature and Glass Transition Temperature of Epoxy Resin" has been published.

We have published analysis cases on the MST homepage. ◆Title Investigation of Curing Temperature and Glass Transition Temperature of Epoxy Resin ~Thermal Property Evaluation by DSC (Differential Scanning Calorimetry) Measurement~ ◆Measurement Method / Processing Method DSC ◆Product Field Electronic Components / Daily Necessities ◆Analysis Purpose Product Investigation / Thermal Property Evaluation ◆Overview Using DSC (Differential Scanning Calorimetry), we investigated the curing temperature and the glass transition temperature (Tg), which is an indicator of heat resistance, for a two-component epoxy resin. The DSC measurement of the uncured resin confirmed that a rapid exothermic reaction began around 103°C (Figure 1). This was due to the polymerization (curing) of the resin caused by the temperature increase. Furthermore, after air cooling the cured resin to room temperature, a second DSC measurement showed a shift of the baseline towards the endothermic side due to the glass transition of the resin, with Tg being approximately 116°C (Figure 2). ★★For detailed data, please see the linked page★★

Confident in inspection technology / If you are looking for a subcontractor for eccentricity measurement or sourcing processed parts with quality assurance, leave it to us!

  • Contract measurement

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Confident in inspection technology / If you are looking for a subcontractor for component analysis and inspection, or if you are seeking procurement of processed parts with quality assurance, leave it...

  • Contract measurement

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We evaluate the durability of electronic components and devices when repeatedly exposed to high and low temperatures.

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  • Contract measurement

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We evaluate the bonding strength of products and parts.

  • Contract measurement

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We evaluate the effects of vibrations and durability on electronic components, electronic devices, and other products during use or transportation.

  • Contract measurement

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We evaluate the impact of shocks and durability that electronic components, electronic devices, and other products experience during use or when dropped.

  • Contract measurement

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We evaluate and determine the sealing performance of sealed states in hollow structure components and the like.

  • Contract measurement

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Testing can be conducted using the solder pot balance method, solder ball balance method, and solder paste method.

  • Contract measurement

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We will evaluate the impact of thermal stress on electronic components in the implementation process.

  • Contract measurement

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Temperature cycle testing is possible with sample temperature control and air temperature control.

  • Contract measurement

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By detecting the sound generated when tiny foreign objects inside the hollow structure collide with the wall, it is possible to prevent troubles such as shorts before they occur.

  • Contract measurement

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We evaluate the effects and destruction tolerance when semiconductors and electronic components are subjected to stress from static electricity.

  • Contract measurement

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This is a method for analyzing the orientation distribution of crystalline samples using electron diffraction in a transmission electron microscope (TEM).

  • Contract measurement
  • Contract Analysis

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Elemental analysis, state evaluation, particle size analysis, and acquisition of three-dimensional structural images at the nanoscale.

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  • Contract Analysis
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Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation

The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology

This is a method for structural analysis of the sample surface. Due to its sensitivity to the surface compared to other analytical devices, it is suitable for identifying organic contaminants on the v...

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  • Contract Analysis
  • Contract measurement
  • Contract Inspection

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Announcement of the new TOF-SIMS service starting from October 2016.

In October 2016, MST will introduce the latest high-resolution TOF-SIMS and begin analysis services. We will provide analysis services across a wide range of fields, including pharmaceuticals, biotechnology, medical devices, and product development and quality control related to electronics. Building on our proven TOF-SIMS analysis technology, we will further support our customers' research and development with high-quality data. For more details, please visit the URL below. http://www.mst.or.jp/corporate/tabid/1211/Default.aspx Introduction of analysis examples: • Introduction of new TOF-SIMS services [for pharmaceuticals, biotechnology, and medical devices] http://www.mst.or.jp/special/tabid/1194/Default.aspx • Introduction of new TOF-SIMS services [for the electronics field] http://www.mst.or.jp/special/tabid/1210/Default.aspx

XRR:X-ray Reflectivity

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  • Contract Analysis
  • Contract measurement
  • Contract Inspection

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FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas...

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  • Contract Analysis
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Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation

The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology

XRD is a method for obtaining information about the crystal structure of a sample from its diffraction pattern.

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  • Contract Analysis
  • Contract measurement
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Obtain information about the molecular structure and crystal structure of the sample.

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  • Contract Analysis
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[MST Homepage] Analysis Case "Evaluation of Bone Condition Before and After HF Treatment" has been published.

We have published analysis cases on the MST homepage. ◆Title Evaluation of Bone Condition Before and After HF Treatment ~Evaluation of Condition Before and After Chemical Treatment Using Raman Analysis~ ◆Measurement Method / Processing Method Raman / Chemical Treatment ◆Product Field Pharmaceuticals / Biotechnology ◆Analysis Purpose Evaluation of Chemical Bonding State ◆Overview HF (hydrofluoric acid) is widely used in processes such as wet etching of SiO2 and plays a very important role in semiconductor manufacturing. However, it is also a very dangerous chemical that can penetrate the skin and damage bones, requiring careful handling. The erosion of bones caused by HF occurs due to the reaction between Ca, which exists in bones as apatite, and HF, resulting in the formation of CaF2. This case introduces an evaluation of the changes in this reaction using Raman analysis. ★★For detailed data, please see the link★★

It is possible to easily obtain crystal information over a wide area.

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  • Contract Analysis
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A method to obtain information about the electric field structure inside the sample (junction structure of semiconductors).

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  • Contract Analysis
  • Contract measurement
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By measuring the energy lost due to interactions with atoms as electrons pass through thin film samples, the constituent elements and electronic structure of the material can be analyzed.

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  • Contract Analysis
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Ion chromatography is a method for detecting ionic components in liquid samples.

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  • Contract Analysis
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Dissociate and fragment specific mass ions, and detect them with a mass spectrometer.

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  • Contract Analysis
  • Contract measurement
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EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis area, allowing for elemental analysis and compositional...

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  • Contract Analysis
  • Contract measurement
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ED is a method for investigating crystal structures from diffraction patterns obtained by irradiating a sample with an electron beam.

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  • Contract Analysis
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UV-Vis is a method that measures the intensity of light transmitted through a sample by irradiating the sample with light divided by wavelength, allowing for the determination of the sample's absorban...

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  • Contract Analysis
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Absolute PL quantum yield measurement is a method for determining the photoluminescence efficiency of materials.

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  • Contract Analysis
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By measuring the fluorescence lifetime of a substance, we can grasp the luminescent transient phenomena more dynamically.

  • Contract measurement

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Genetic analysis is a method that reads the nucleotide sequences of DNA to investigate gene mutations and functions.

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  • Contract Analysis
  • Contract measurement

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This is a method that allows simultaneous shape observation and elemental imaging of small areas using a FIB and a TOF mass spectrometer mounted on an SEM device.

  • Contract measurement

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By analyzing the characteristic X-rays generated when a finely focused electron beam is irradiated onto the surface of a solid sample in a vacuum, insights can be gained regarding the identification o...

  • Contract measurement

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It is a method for observing the light emitted when electrons, excited by the irradiation of light on a substance, return to the ground state.

  • Contract measurement

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HAXPES is an analytical method that uses hard X-rays as the excitation light for XPS (X-ray photoelectron spectroscopy).

  • Contract measurement

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Infrared spectroscopy is a method for obtaining information about molecular structure by measuring infrared absorption due to molecular vibrations.

  • Contract measurement
  • Contract Analysis

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Infrared spectroscopy is a method for obtaining information about molecular structure by measuring the infrared absorption due to molecular vibrations.

  • Contract measurement
  • Contract Analysis

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TG-DTA simultaneously evaluates weight changes caused by heating (TG) and thermal behavior of endothermic and exothermic reactions (DTA).

  • Contract Analysis
  • Contract measurement

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High magnification observation (up to about 300,000 times) is possible.

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  • Contract Analysis
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Notice of publication of a written article in the May 2012 issue of Applied Physics.

In the May 2012 issue of the monthly magazine "Applied Physics," published by the Japan Society of Applied Physics, the MST General Foundation for Materials Science and Technology contributed an article on scanning electron microscopy (SEM). ● Magazine Overview - Publisher: Japan Society of Applied Physics - Published Issue: May 2012, Applied Physics - Project Name: Basic Course <Hop, Step, Jump> Series "Scanning Electron Microscopy" ● MST Contribution Overview - Author: Kyoko Yonemitsu, Leader of the Analysis and Evaluation Department, MST General Foundation for Materials Science and Technology - Content: Applications of scanning electron microscopy in research and development - Case studies and uses Please take a look.

It is an analytical method that detects ions with a detector and performs qualitative and quantitative analysis.

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  • Contract Analysis
  • Contract measurement
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This is a method for qualitative and quantitative analysis of components contained in a sample by detecting secondary ions and measuring the detection amount at each mass.

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  • Contract Analysis
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