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Analytical Equipment - メーカー・企業266社の製品一覧とランキング

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Analytical Equipmentのメーカー・企業ランキング

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  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. ライフィクスアナリティカル Osaka//Pharmaceuticals and Biotechnology
  3. null/null
  4. 4 ビーエルテック Tokyo//Testing, Analysis and Measurement
  5. 5 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
企業ランキングへ

Analytical Equipmentの製品ランキング

更新日： 集計期間:Oct 15, 2025～Nov 11, 2025
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  1. Nanoparticle analysis device "TaylorSizer" ライフィクスアナリティカル
  2. iCAP PRO Series ICP Emission Spectrometer サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  3. Sake FT-IR component analysis device "OenoFoss2"
  4. 4 Alcohol analysis device for sake Alcolyzer3001 SAKE
  5. 5 Laser Ablation ICP-MS System サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.

Analytical Equipmentの製品一覧

136～150 件を表示 ／ 全 1216 件

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Graphene crystal thin film and surface analysis equipment

Graphene crystal thin film and surface analysis equipment

It is composed of MBE film formation mechanisms, surface thermal analysis mechanisms, and RHRRD crystal structure analysis systems!

The product is an in-situ system that combines the growth mechanism of graphene crystal thin films using "MBE method" and "surface thermal decomposition method" with RHEED/LEED surface analysis mechanisms. Using a 6H-SiC micro-tilted ([1-100] 4° off) substrate with a (0001) surface (Si face), the formation of graphene was confirmed through diffraction patterns during the growth of graphene. Additionally, the formation of graphene was also confirmed through micro-Raman measurements. 【Components】 ■ MBE deposition mechanism equipped with a "high-temperature K cell for graphene thin film growth" ■ Surface thermal analysis mechanism using a "heating holder for thermal decomposition of SiC substrate" ■ RHRRD crystal structure analysis system ■ LEED surface observation system *For more details, please refer to the PDF materials or feel free to contact us.

  • Analytical Equipment and Devices

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Automatic Gas Analyzer for Oil

Automatic Gas Analyzer for Oil

Automatic Gas Analyzer for Oil

This is an automatic gas analysis device for oil that analyzes dissolved gases in insulating oil used in equipment such as transformers to perform abnormal diagnosis.

  • Vacuum Equipment
  • Transformers

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Tabletop Nuclear Magnetic Resonance (NMR) Analysis Device 'MQC+'

Tabletop Nuclear Magnetic Resonance (NMR) Analysis Device 'MQC+'

Ideal for research and development as well as quality control! Capable of measuring various samples such as oil, water, and fluorine.

The "MQC+" is a compact tabletop nuclear magnetic resonance (NMR) analysis device. We offer three models: "MQC+23," which is used for small sample and high-sensitivity measurement applications, as well as "MQC+5" and "MQC+F." Analysis results can be obtained in a few seconds, or at most a few minutes, enabling easy, rapid, and accurate quality assurance and research and development. 【Features】 ■ Operable with simple training ■ Non-destructive analysis ■ Cost-effective ■ Minimal sample pretreatment ■ No hazardous solvents or chemicals required ■ Rapid analysis *For more details, please refer to the PDF materials or feel free to contact us.

  • Analytical Equipment and Devices

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Quantification of Si(1-x)Gex samples with compositional gradient.

Quantification of Si(1-x)Gex samples with compositional gradient.

Analyze three or more samples with known concentration to solve the problem of two points.

SIMS (Secondary Ion Mass Spectrometry) is used to accurately quantify the concentration distribution of Ge in Si(1-x)Gex films with a compositional gradient used in devices, in the depth direction. When analyzing Si(1-x)Gex films with SIMS, there are two issues that must be resolved. The first issue is that the secondary ion intensity of Ge relative to Si changes significantly with variations in the compositional ratio, so it is necessary to determine the relative sensitivity factor for each compositional ratio. The second issue is that the sputtering rate at each analysis point changes due to variations in the compositional ratio of Si and Ge, so it is necessary to establish the relationship between the compositional ratio and the sputtering rate. To solve these two issues, samples with known concentrations were analyzed at more than three points, and the RSF and sputtering rates were determined. *For more details, please refer to the PDF document or feel free to contact us.*

  • others

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Analysis device "ESCA"

Analysis device "ESCA"

Our ESCA can narrow the X-ray probe diameter down to 5 μm!

"ESCA" is an X-ray photoelectron spectroscopy device capable of narrowing the X-ray probe diameter down to 5μm. By scanning and irradiating X-rays, it generates secondary electron images (SXI: Scanning X-ray Image) that allow for the identification of measurement locations, enabling the analysis of local composition and chemical bonding states. Surface analysis is also possible. [Features] ■ Capable of narrowing the X-ray probe diameter to 5μm ■ Enables analysis of local composition *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices

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Case Studies on Depth Resolution Measurement in Compound Semiconductor Superlattice Samples

Case Studies on Depth Resolution Measurement in Compound Semiconductor Superlattice Samples

Results of depth resolution measurements using compound semiconductor superlattice samples are published!

This case study collection presents the results of depth resolution measurements conducted by Ion Tech Center Co., Ltd., which provides services such as ion implantation, film formation and analysis, and research and commercialization management. Using Q-pole SIMS (ULVAC: ADEPT-1010), we employed a compound semiconductor sample of Al0.28Ga0.72As/GaAs that was deposited by molecular beam epitaxy (MBE) in 50nm increments to obtain the results of depth resolution. [Overview of Contents] ■ Results of Depth Resolution Measurements *For more details, please refer to the catalog or feel free to contact us.*

  • others
  • Contract measurement
  • Other contract services

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Seawater Nutrient Measurement Device Quattro

Seawater Nutrient Measurement Device Quattro

Low concentrations of nitrate, ammonia, phosphate, and silica in seawater can be measured. (Continuous flow analysis method is used.)

It is used by marine research institutions in government offices and universities. It can measure up to five items—nitrate, nitrite, phosphate, ammonia, and silica—simultaneously at a rate of 120 samples per hour. It is capable of measuring ultra-low concentrations of nutrients. 【Features】 - High precision and high sensitivity analysis based on a bubble segmentation continuous flow method - The main console can accommodate four colorimeters - By adding extra colorimeters, simultaneous analysis of up to five items is possible - Standard equipped with an auto-sampler that holds 120 samples - Capable of measuring ultra-low concentrations of nutrients *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices

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Automatic Colorimetric Analyzer AQ400

Automatic Colorimetric Analyzer AQ400

The process of adding reagents, weighing, and colorimetry is performed fully automatically using a discrete method.

It can perform the addition, mixing, dilution, and color development of various reagents, as well as colorimetric quantification, all automatically. The processes of reagent addition, mixing, and dilution can be customized for use. Multiple items can be measured simultaneously.

  • Analytical Equipment and Devices

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