Analytical Equipment Product List and Ranking from 259 Manufacturers, Suppliers and Companies

[Analysis Case] Investigation of Alkyl Chain Length Distribution of LAS

Analysis of LAS in powder detergents, liquid detergents, and household wastewater is possible.

Linear alkylbenzene sulfonic acid and its salts (LAS) are considered substances of concern due to their potential impact on living organisms. Therefore, they have been added to the environmental standards related to the conservation of aquatic organisms within the environmental standards concerning the preservation of living environments affected by water pollution, and a standard value has been established (March 27, 2013). Since approximately 90% of the usage of LAS is for household detergents, measurements were conducted on existing household detergents and household wastewater, and a comparison of the distribution of LAS alkyl chain lengths (C10 to C14) was performed.

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[Analysis Case] Evaluation of Copper (Cu) Oxide Film Thickness: Differences Due to Storage Environment

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

Copper (Cu), used as wiring material, forms an oxide film in the air. Here, we present a case study evaluating the differences in film thickness due to variations in storage environments. Copper (Cu) wrapped in aluminum foil and copper (Cu) stored in a plastic bag were each kept for 40 days, and the oxide film thickness was measured using TOF-SIMS. Additionally, a continuous investigation over approximately 20 days confirmed reproducibility. TOF-SIMS allows for depth profiling analysis of inorganic materials such as oxides and metals. Measurement method: TOF-SIMS Product fields: Displays, LSI, Memory, Electronic components Analysis purpose: Evaluation of chemical bonding states For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of Damage Layer on Polymer Surface Due to Ion Irradiation

By using GCIB (Ar cluster), it is possible to evaluate the composition and thickness of the damaged layer.

By irradiating the surface of polymer materials with ions, changes in surface properties occur. Utilizing these changes, research is being conducted in a wide range of fields, including the development of functional materials. Evaluating the changes that occur in the surface state after ion irradiation is important for efficient research and development. In TOF-SIMS analysis, using a GCIB (Gas Cluster Ion Beam) for the sputtering ion beam makes it possible to evaluate the composition and thickness of the damage layer caused by ion irradiation on the surface of polymer materials.

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[Analysis Case] Evaluation of the Surface Silanol Groups

Quantitative evaluation of silanol groups is possible with TOF-SIMS.

The presence of silanol groups (Si-OH) on the surfaces of glass and wafers affects properties such as hydrophobicity and hydrophilicity. Therefore, it is likely to influence subsequent surface treatments, necessitating control. We will introduce a case where the quantification of silanol groups was performed using TOF-SIMS. To conduct the evaluation, calibration curves were created using several types of samples with different concentrations. In the measurement examples, the silanol groups on the surfaces of samples with different materials and conditions were compared. Measurement method: TOF-SIMS Product fields: LSI, memory, electronic components Analysis purpose: Composition evaluation and identification For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of the sp2/(sp2+sp3) Ratio of DLC Films

Evaluation of the sp2/(sp2+sp3) ratio using C1s waveform analysis.

Due to its characteristics such as high hardness and high wear resistance, DLC (diamond-like carbon) films are utilized in a wide range of fields. These films are materials that lie between graphite and diamond, and the separation of sp2 (graphite structure) and sp3 (diamond structure) within the film to obtain the sp2/(sp2+sp3) ratio is one of the important factors that determine the properties of the film. Here, we will introduce an example of evaluating this sp2/(sp2+sp3) ratio by analyzing the C1s spectrum using XPS.

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[Analysis Case] Removal of Organic Contaminants by Etching

We will remove surface contamination and conduct an evaluation using XPS.

XPS is a surface-sensitive technique, so carbon derived from organic contaminants due to the atmosphere is detected at a significant level. Reducing the influence of this carbon from organic contaminants is important for evaluating the original composition of the film. Typically, Ar ion sputtering is used to remove organic contaminants, but damage caused by sputtering may prevent the evaluation of the film's original composition and bonding states. We present an example where the influence of carbon from organic contaminants was reduced by removing the surface oxide layer using wet etching instead of Ar ion sputtering.

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Comparison of depth profiling analysis using XPS and AES.

XPS: X-ray Photoelectron Spectroscopy AES: Auger Electron Spectroscopy

XPS and AES are surface-sensitive analytical techniques widely used for evaluating sample surfaces, but by combining them with ion etching, depth profiling analysis becomes possible. When conducting depth profiling analysis, it is important to appropriately differentiate between XPS and AES according to the area to be measured and the material of the sample in order to perform analysis that aligns with the objectives. The characteristics of depth profiling analysis using XPS and AES will be compared using the analysis of SUS passive films as an example.

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[Analysis Case] Analysis of the Binding State of Li in Lithium-Ion Secondary Batteries

By analyzing the waveform of other elements, it is possible to calculate the existence ratio of Li based on its bonding states.

In lithium-ion secondary batteries, the SEI layer (solid electrolyte interface) is a significant factor affecting the battery's lifespan, and it is important to understand the chemical species of Li contained within it. Li itself has a small chemical shift, making direct evaluation difficult; however, by performing waveform analysis to separate the states of the bonding partner elements (C, O, F, P), it is possible to calculate the presence ratio of Li in different bonding states. An evaluation of the state of Li before and after cycle testing revealed that after the test, the presence ratios of Li2CO3 and Li-POxFy increased compared to before the test.

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Analysis of components in conductive paint.

Evaluation of the shape, composition, and dispersion state of additives in the paint due to sample cooling.

Conductive paints are used to impart conductivity to insulating materials. Additives are included in the paint to give conductivity to the originally insulating paint itself. This document evaluates two types of conductive paints with different conductivities, focusing on the shape and composition of the additives in the paint, as well as the dispersion state of the additives.

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[Analysis Case] Chemical Decomposition - Analysis of Polyurethane by GC/MS Method

Detailed structural analysis of condensation polymers is possible.

When conducting structural analysis of condensation-type polymers such as polyurethane, information may not be sufficiently obtained using only thermal decomposition GC/MS. In such cases, performing chemical decomposition using methanol can provide more detailed structural information. This case presents the results of decomposing polyurethane-based lightweight aggregate with methanol and conducting GC/MS measurements. Diphenylmethane diisocyanate, dimethyl phthalate, trimethylolpropane, and propylene glycol compounds were detected, leading to the conclusion that this product is composed of polyester urethane made from these materials.

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[Analysis Case] Surface Contamination Assessment of Si Wafers Stored Using TOF-SIMS

Evaluation of contamination and oxidation of Si wafers after removing the oxide film with hydrofluoric acid treatment.

Knowledge about the effects of contamination and oxidation during sample transport is important in surface analysis where the detection depth is on the nanometer order. Therefore, we examined the impact of contamination and oxidation due to differences in storage methods on Si wafers. In storage with wrapping paper and aluminum foil, there is a tendency for the peaks of organic materials caused by secondary contamination to be weaker. When samples are wrapped and stored in the matte side of aluminum foil during storage and transport, it can suppress contamination and oxidation compared to other storage methods.

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[Analysis Case] Component Analysis of Aluminum Foil Surface

Evaluate the difference between glossy surfaces and matte surfaces.

Aluminum foil is produced by rolling two sheets together, where the outer side in contact with the rollers has a glossy surface, while the inner side, where the aluminum sheets touch each other, has a matte surface. We compared the components present on the extreme surfaces of each side. Common organic secondary pollutants such as PDMS (polydimethylsiloxane), BHT (antioxidant), DOP (plasticizer), amines (m/z 182, 242), amides (m/z 256, 284), and carboxylic acids (m/z 255, 283) were not observed. There was a slight tendency for Fe and organic materials (such as hydrocarbons) to be stronger on the glossy side, while substances like SO4 showed a slightly stronger tendency on the matte side.

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[Analysis Case] Component Analysis of Organic EL Emission Layer

Possible to dismantle and preprocess while maintaining the atmosphere, up to the introduction of equipment.

It is known that organic EL materials undergo changes when exposed to air. We present results obtained from TOF-SIMS regarding the surface state of luminescent materials left in a nitrogen atmosphere and in the atmosphere. In samples produced in a nitrogen atmosphere, parent ions are primarily detected, but when left in air, fragments with oxygen attached to the parent ions are detected. For materials that are prone to degradation, it is necessary to analyze them without exposing them to the atmosphere.

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[Analysis Case] Evaluation of Organic EL Device Degradation

Suppressing changes due to processing through cutting under atmosphere control.

A comparison was made between commercially available digital audio players equipped with organic EL, one that had undergone electrical power and experienced brightness degradation and one that had not. As a result, no differences were observed in the TOF-SIMS spectra between the samples.

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[Analysis Case] Thermal Desorption Gas Analysis of SiN Film by TDS

It is possible to evaluate the surface-adsorbed gas on the thin film and the desorbed gas from within the film.

The TDS analysis results regarding the SiN film on the Si substrate are presented. In the low-temperature range up to around 100°C, there is little desorption, indicating that there were few adsorbed components on the surface of the sample. On the other hand, as the temperature of the sample increases, it can be observed that m/z 2 (H2), m/z 18 (H2O), and m/z 27 (C2H3: organic fragment components) are being desorbed. TDS analysis conducted under high vacuum (1E-7 Pa) is effective for evaluating the adsorbed gas components on the film surface and trace gas components within the film.

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Differences in detected components by ionization methods ESI and APCI.

LC/MS: Liquid Chromatography-Mass Spectrometry

The ionization method for LC/MS is commonly ESI (Electrospray Ionization). In ESI, if low-polarity components cannot be ionized, APCI (Atmospheric Pressure Chemical Ionization) is available as a highly sensitive detection method. It is important to choose the optimal ionization method according to the target components in order to obtain data that aligns with the objectives.

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About MSDM

TOF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry

In depth profiling analysis using TOF-SIMS, if the positional information on the plane (x, y) is ignored, mass spectra exist at each depth (z), resulting in three-dimensional data of depth, mass, and spectral intensity. The visualization of this three-dimensional data as a single image is called MSDM (Mass Spectra Depth Mapping) representation.

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[Analysis Case] Degradation Analysis of Organic EL Devices Using MSDM

By visualizing the mass spectrum, more accurate analysis is possible.

Organic EL (OLED) is used in various applications such as high-definition display panels and lighting, and the demand for layer structure analysis and degradation analysis is increasing. However, since it is formed by combining various organic materials, elemental analysis alone can only capture a portion of the phenomena. This document presents a case study where depth direction analysis data of OLED was obtained using TOF-SIMS, and insights into the degradation of the sample were gained through MSDM (Mass Spectra Depth Mapping).

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Pre-treatment methods for trace element analysis on the wafer surface.

ICP-MS: Inductively Coupled Plasma Mass Spectrometry

In the process of confirming metal contamination adhered to the wafer surface after the formation of the SiO2 film, a method has traditionally been used where the SiO2 film is dissolved in acid as a pre-treatment for analysis, followed by the analysis of the solution. This method results in analysis that combines metal contamination on the very surface with that within the SiO2 film, making it unsuitable for analyzing only the metal contamination on the very surface. In MST, it is possible to evaluate the metal contamination elements on the wafer's very surface by dissolving only the metal elements adhered to the very surface without dissolving the SiO2 film during the pre-treatment.

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[Analysis Case] Ultra-high Sensitivity Measurement of Impurities in SiC Using SIMS

Evaluates bulk concentrations at the ppb to ppt level.

In the development of ultra-high voltage, low-loss SiC power devices that can be used in substations, controlling low carrier concentration is necessary, and SIMS analysis is effective for evaluating extremely low concentrations of impurities. In SIMS analysis, it is possible to evaluate extremely low concentrations by limiting the impurities to one element without simultaneously acquiring multiple elements. This document presents analysis examples that evaluate the extremely low concentration range of impurities in SiC with ultra-high sensitivity, which has been difficult to assess conventionally.

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[Analysis Case] Evaluation of the Condition of Foreign Matter with Surface Oxidation Film

Evaluation of aluminum hydroxide Al(OH)3 and aluminum oxide Al2O3 is possible.

If you want to qualitatively evaluate metallic foreign substances, analyzing only the very surface may result in information about the oxide film present on the surface of the foreign substance, and you may not obtain information about the foreign substance itself. By performing depth analysis using TOF-SIMS, it is possible to evaluate the composition and state of the foreign substance located deeper than the oxide film. This document presents case studies evaluating the state of three locations that are believed to contain aluminum-based foreign substances.

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[Analysis Case] Evaluation of Composition Distribution of Tablet-Type Headache Medicine

Visualization of components in the cross-section of tablets after harsh testing and in new products.

To evaluate the components contained in commercially available tablet-type headache medications and their distribution, mass imaging analysis of the tablet cross-section was performed using TOF-SIMS. It was found that Al and Mg, derived from antacids, and the active ingredient acetylsalicylic acid were separated into two distinct regions. Additionally, as a harsh test, the tablets were placed in an environment of 50°C and 75% humidity for four weeks to assess changes in the components. This is effective for visualizing formulation research and stability evaluation. Measurement method: TOF-SIMS Product field: Biotechnology and Pharmaceuticals Analysis purpose: Composition evaluation, identification, and composition distribution evaluation For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of Transdermal Absorption of Indomethacin in Rat Skin

Visualization of the distribution of active ingredients in biological tissues using TOF-SIMS.

TOF-SIMS identifies components based on the mass of molecular ions, eliminating the need for labels such as fluorescent substances, allowing for imaging evaluations without their influence. Additionally, by performing cross-sectional imaging, it is possible to assess distribution in the depth direction. In this study, a gel formulation of indomethacin was applied to rat skin for 2 hours, and the distribution of the permeated active ingredient was visualized. As a result, indomethacin was found to be highly concentrated at approximately 5μm on the stratum corneum surface, and the depth profile analysis showed that it was gradually permeating.

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[Analysis Case] Analysis of Resveratrol Concentration in Blood and Urine Components

You can calculate the absorption amount of functional ingredients.

Resveratrol is a type of polyphenol found in red wine and the skins of peanuts, and it is believed to have antioxidant and anti-inflammatory effects. It is known that resveratrol is absorbed in the stomach after ingestion and is rapidly metabolized. During the metabolic process, it becomes glucuronide and sulfate conjugates, but by converting those metabolites back to resveratrol for quantification, the amount of resveratrol absorbed can be calculated.

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[Analysis Case] Evaluation of Residual Contaminants in Blood Components

Visualization of wipe residues using TOF-SIMS

When describing cleaning methods in brochures for medical devices, it is necessary to confirm the validity of those cleaning methods. In this case, as a verification experiment for the wiping method of medical devices, we applied bovine serum albumin (BSA), a blood model drug, to sheets of acetyl cellulose (TAC), SUS-made scalpels, and glass, and evaluated the residual components before and after wiping using TOF-SIMS. As a result, it was found that ethanol is more suitable than water for wiping BSA, and that the wiping effectiveness varies depending on the substrate. Measurement method: TOF-SIMS Product field: Medical devices and pharmaceuticals Analysis purpose: Composition evaluation, identification, composition distribution evaluation, failure analysis, defect analysis For more details, please download the materials or contact us.

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[Analysis Case] Visualization of the Component Distribution on the Surface of Hair Cuticles

Comparison of the distribution of organic molecules using TOF-SIMS imaging analysis.

TOF-SIMS is an effective method for analyzing the distribution and penetration of target components in samples, as it can simultaneously perform elemental analysis and molecular information analysis of organic and inorganic substances, as well as image analysis. This document presents the results of image analysis of the "cross-section and surface" of hair and the "surface" of hair using siloxane-based hair care agents. It was confirmed that there are differences in the distribution of components between the cuticles of the tip and the root of the hair. Measurement method: TOF-SIMS Product field: Pharmaceuticals and cosmetics Analysis purpose: Composition evaluation, identification, composition distribution evaluation For more details, please download the document or contact us.

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[Analysis Case] TOF-SIMS Analysis of Solder Separation Cross Section

It is possible to evaluate the distribution of inorganic and organic substances in microdomains.

To investigate the causes of solder delamination, it is effective to conduct component analysis of the solder and the substrate interface. TOF-SIMS is a suitable method for evaluating delaminated areas because it can simultaneously analyze elemental composition and molecular information of organic and inorganic substances, as well as perform imaging analysis. This document presents a case study analyzing the cross-section of a delaminated solder area, confirming the distribution of substrate components, resin components, and organic components other than resin.

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[Analysis Case] TDS Analysis of Glass Samples

It is possible to analyze desorbed gases by temperature increase even with transparent samples that allow infrared rays to pass through.

The temperature-programmed desorption gas analysis method (TDS) is a mass spectrometry technique that directly heats a sample by irradiating it with infrared light and monitors the gases generated at each temperature. When analyzing samples that cannot absorb infrared light, such as glass substrates, it is possible to conduct the analysis by changing the sample stage from transparent to black. The black stage absorbs infrared light, raising its temperature, which in turn increases the temperature of the sample through thermal conduction, generating gases.

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[Analysis Case] Estimation of Detachment Components by TDS

We will compare the outgassing patterns of multiple masses.

The analysis results of TDS may show multiple components detected for a single mass-to-charge ratio (m/z). Even in such cases, it is possible to estimate the components desorbed by heating by measuring multiple masses and comparing the desorption patterns. Using the TDS analysis results of W films on Si substrates as an example, I will explain the estimation methods for water and ammonia (m/z=17), as well as organic substances and argon (m/z=40).

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[Analysis Case] Thermal Desorption Gas Analysis of Organic Films (TDS)

It is possible to evaluate the outgassing components of organic matter in a vacuum environment.

TDS is a method that heats samples in a vacuum environment and monitors the gases that are released. When measuring organic substances, it can be difficult to obtain accurate measurements due to contamination of the equipment from large amounts of gas release. However, by adjusting the sample amount and analysis conditions in advance to control the amount of gas released, analysis becomes possible. Below are the results of TDS analysis conducted on organic films. We were able to capture the phenomenon where surface-adsorbed water is released at low temperatures, and the intensity of gas release increases with rising temperature.

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