Analytical Equipment Product List and Ranking from 264 Manufacturers, Suppliers and Companies

[Analysis Case] Evaluation of the Condition of Foreign Matter with Surface Oxidation Film

Evaluation of aluminum hydroxide Al(OH)3 and aluminum oxide Al2O3 is possible.

If you want to qualitatively evaluate metallic foreign substances, analyzing only the very surface may result in information about the oxide film present on the surface of the foreign substance, and you may not obtain information about the foreign substance itself. By performing depth analysis using TOF-SIMS, it is possible to evaluate the composition and state of the foreign substance located deeper than the oxide film. This document presents case studies evaluating the state of three locations that are believed to contain aluminum-based foreign substances.

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[Analysis Case] Evaluation of Transdermal Absorption of Indomethacin in Rat Skin

Visualization of the distribution of active ingredients in biological tissues using TOF-SIMS.

TOF-SIMS identifies components based on the mass of molecular ions, eliminating the need for labels such as fluorescent substances, allowing for imaging evaluations without their influence. Additionally, by performing cross-sectional imaging, it is possible to assess distribution in the depth direction. In this study, a gel formulation of indomethacin was applied to rat skin for 2 hours, and the distribution of the permeated active ingredient was visualized. As a result, indomethacin was found to be highly concentrated at approximately 5μm on the stratum corneum surface, and the depth profile analysis showed that it was gradually permeating.

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[Analysis Case] Evaluation of Residual Contaminants in Blood Components

Visualization of wipe residues using TOF-SIMS

When describing cleaning methods in brochures for medical devices, it is necessary to confirm the validity of those cleaning methods. In this case, as a verification experiment for the wiping method of medical devices, we applied bovine serum albumin (BSA), a blood model drug, to sheets of acetyl cellulose (TAC), SUS-made scalpels, and glass, and evaluated the residual components before and after wiping using TOF-SIMS. As a result, it was found that ethanol is more suitable than water for wiping BSA, and that the wiping effectiveness varies depending on the substrate. Measurement method: TOF-SIMS Product field: Medical devices and pharmaceuticals Analysis purpose: Composition evaluation, identification, composition distribution evaluation, failure analysis, defect analysis For more details, please download the materials or contact us.

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[Analysis Case] Visualization of the Component Distribution on the Surface of Hair Cuticles

Comparison of the distribution of organic molecules using TOF-SIMS imaging analysis.

TOF-SIMS is an effective method for analyzing the distribution and penetration of target components in samples, as it can simultaneously perform elemental analysis and molecular information analysis of organic and inorganic substances, as well as image analysis. This document presents the results of image analysis of the "cross-section and surface" of hair and the "surface" of hair using siloxane-based hair care agents. It was confirmed that there are differences in the distribution of components between the cuticles of the tip and the root of the hair. Measurement method: TOF-SIMS Product field: Pharmaceuticals and cosmetics Analysis purpose: Composition evaluation, identification, composition distribution evaluation For more details, please download the document or contact us.

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[Analysis Case] TOF-SIMS Analysis of Solder Separation Cross Section

It is possible to evaluate the distribution of inorganic and organic substances in microdomains.

To investigate the causes of solder delamination, it is effective to conduct component analysis of the solder and the substrate interface. TOF-SIMS is a suitable method for evaluating delaminated areas because it can simultaneously analyze elemental composition and molecular information of organic and inorganic substances, as well as perform imaging analysis. This document presents a case study analyzing the cross-section of a delaminated solder area, confirming the distribution of substrate components, resin components, and organic components other than resin.

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[Analysis Case] TDS Analysis of Glass Samples

It is possible to analyze desorbed gases by temperature increase even with transparent samples that allow infrared rays to pass through.

The temperature-programmed desorption gas analysis method (TDS) is a mass spectrometry technique that directly heats a sample by irradiating it with infrared light and monitors the gases generated at each temperature. When analyzing samples that cannot absorb infrared light, such as glass substrates, it is possible to conduct the analysis by changing the sample stage from transparent to black. The black stage absorbs infrared light, raising its temperature, which in turn increases the temperature of the sample through thermal conduction, generating gases.

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[Analysis Case] Estimation of Detachment Components by TDS

We will compare the outgassing patterns of multiple masses.

The analysis results of TDS may show multiple components detected for a single mass-to-charge ratio (m/z). Even in such cases, it is possible to estimate the components desorbed by heating by measuring multiple masses and comparing the desorption patterns. Using the TDS analysis results of W films on Si substrates as an example, I will explain the estimation methods for water and ammonia (m/z=17), as well as organic substances and argon (m/z=40).

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[Analysis Case] Thermal Desorption Gas Analysis of Organic Films (TDS)

It is possible to evaluate the outgassing components of organic matter in a vacuum environment.

TDS is a method that heats samples in a vacuum environment and monitors the gases that are released. When measuring organic substances, it can be difficult to obtain accurate measurements due to contamination of the equipment from large amounts of gas release. However, by adjusting the sample amount and analysis conditions in advance to control the amount of gas released, analysis becomes possible. Below are the results of TDS analysis conducted on organic films. We were able to capture the phenomenon where surface-adsorbed water is released at low temperatures, and the intensity of gas release increases with rising temperature.

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[Analysis Case] Evaluation of Cu Surface Discoloration Using AES and SEM-EDX

It is possible to perform elemental analysis with a shallow detection depth while conducting SEM observation.

SEM-EDX analysis and AES analysis are suitable for simple investigations of discoloration and foreign substances on metal surfaces. However, when the discoloration or foreign substances are thin or small, AES analysis, which provides information from very shallow areas of the surface (about 4-5 nm), is effective. The AES equipment owned by MST can acquire SEM images, allowing AES analysis to be conducted while confirming the areas of interest using SEM images. In this case study, we will present data comparing the evaluation of discoloration on the Cu surface using AES analysis and SEM-EDX analysis. Additionally, we will also present the results of AES depth direction analysis.

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Examples of TDS analysis by representative materials and purposes

TDS: Thermal Desorption Gas Analysis Method

TDS is a method that heats samples in high vacuum (1E-7 Pa) and detects the gases that are released. By heating the sample at a constant rate in high vacuum, it is possible to confirm the temperature dependence of even trace amounts of desorption (at the monolayer level). Additionally, for some components, it is also possible to calculate the number of molecules of the desorbed gas. We will introduce examples of TDS applied to representative materials.

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[Analysis Case] Evaluation of Ion Implantation Damage in GaN by XAFS

It is possible to confirm the recovery of crystallinity due to irradiation defects and annealing.

Gallium nitride (GaN) is used as a material for LEDs and power devices due to its high thermal conductivity and high breakdown voltage characteristics. In its manufacturing process, the production of high-quality GaN crystals without crystal defects is required, making the assessment of damage from ion implantation and the degree of recovery an important evaluation criterion. This document presents a case study evaluating the damage caused by ion implantation into GaN substrates using XAFS. It is possible to detect disturbances in the crystal structure near the GaN surface, as well as N2 and interstitial N within the film, with high precision.

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[Analysis Case] Evaluation of Pharmaceutical Crystal Polymorphism

It is possible to evaluate the structure of crystalline polymorphs.

The majority of pharmaceuticals are crystalline and are known to have multiple crystal forms. Even for the same substance, the physical and chemical properties, such as solubility, can differ depending on the crystal form, which can also affect the efficacy and safety of the drug. Therefore, the identification of crystal forms is extremely important. In this case, XRD analysis was conducted to evaluate the crystal forms of the active pharmaceutical ingredient in question, both for the pure active pharmaceutical powder and for the commercial products.

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[Analysis Case] Evaluation of Gold Thin Film Adhesion on Wafer by XRF

Comparison of the amount of thin film components adhered between samples.

In fluorescent X-ray analysis (XRF), a simple evaluation of elemental distribution is possible. In this case study, we used a deposition device to create films of arbitrary amounts of Au on 4-inch Si wafers A and B as samples, and compared the distribution and total amount of Au. The results of the surface analysis confirmed the distribution state of Au (Figures 1-4). Additionally, by comparing the adhesion amounts based on the Au intensity from the XRF spectra obtained from each pixel, we confirmed that wafer B had more Au than wafer A (Figure 5).

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[Analysis Case] In-plane film thickness evaluation of Au thin film on wafer using XRF.

Visualization of film thickness distribution through multi-point mapping measurement.

In fluorescent X-ray analysis (XRF), it is possible to easily evaluate element distribution and film thickness. In this case study, we will introduce an example of evaluating the thickness distribution of an Au film on a 4-inch Si wafer through multi-point mapping measurements. By performing multi-point mapping, we can calculate the Au film thickness using the FP (Fundamental Parameter) method from the XRF spectra at each point, allowing for the evaluation of thickness distribution based on the measurement coordinates.

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[Analysis Case] Evaluation of De-gassing of Resist Film by TDS

Evaluation of gas release components from organic films and temperature dependence assessment are possible with TDS.

TDS is a method that heats samples in high vacuum (1E-7 Pa) and investigates the gases released from the samples using a mass spectrometer. Since it is a vacuum system, it is not suitable for the large release of organic substances, but it can be evaluated by adjusting the sample amount. Below is an example of TDS analysis conducted on a resist film. Desorption gases originating from the resist film, such as organic substances, water, H2S, and SO2, were detected. It was also found that the desorption temperatures varied depending on the components.

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[Analysis Case] Corrosive Gas Analysis by TDS

You can check for gases that have a negative impact on the product.

Corrosive gases such as etching gases have a significant impact on the degradation of semiconductors, electronic components, and devices. Below, we present an example of capturing corrosive gases using TDS (Temperature-Programmed Desorption Gas Analysis). It was confirmed that HCl, a corrosive gas, desorbs with the increase in temperature of the sample. Since TDS can capture desorption in the m/z range of 2 to 199 while heating, it is effective for investigating the types and amounts of corrosive gases as well as their temperature dependence of desorption.

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Announcement of the Start of Non-Destructive Testing Services from April 2018

We have assembled equipment that is strong in the analysis of organic materials such as resin and carbon composites.

On April 2, 2018, MST will introduce the latest processing and analysis equipment and begin offering non-destructive analysis services. We will provide analysis services across a wide range of fields, including product development and quality control for electronic devices, pharmaceuticals, and food. Non-destructive analysis is a technology that visualizes the internal state of a product without destroying it. Until now, MST has primarily offered contract services based on destructive analysis methods such as electron microscopy and mass spectrometry. However, there has been an increasing customer demand for observing electronic devices without destruction in recent years. Additionally, there has been a growing need in other fields as well, such as confirming the shapes of pharmaceutical and medical device components, observing the distribution of constituent materials within food, and checking for the presence of cavities. With the introduction of the latest processing and analysis equipment, MST is now able to conduct non-destructive analysis. We will provide analysis services on a contract basis.

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[Analysis Case] Evaluation of Blood Lithium Concentration

It can be analyzed over a wide range from low concentrations to toxic levels.

Lithium carbonate, widely used in the treatment of mania and bipolar disorder, must be administered while maintaining an appropriate blood concentration to prevent lithium toxicity. Therefore, regular measurement of blood concentration (therapeutic drug monitoring: TDM) is required. Analysis using ICP-MS (inductively coupled plasma mass spectrometry) allows for the quantification of lithium concentrations in the blood across a wide range, from subtherapeutic levels to toxic levels.

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Regarding interface and depth direction resolution

SIMS: Secondary Ion Mass Spectrometry

The SIMS analysis profile of the interface between different materials changes with a certain width in the depth direction. This is due to the characteristics of SIMS analysis, which are influenced by ion beam mixing and the roughness of the sputtered surface. The detected impurities represent averaged information up to the mixed depth, detecting ions from regions with a width in the depth direction. Therefore, the interface position is generally defined as the location where the ion intensity of the main constituent elements reaches 50%.

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[Analysis Case] Depth Direction Analysis of XPS on the Micron (μm) Order

Depth direction analysis will be conducted to a depth of several micrometers.

XPS is a surface-sensitive technique widely used for evaluating sample surfaces, but when combined with ion etching, it allows for depth analysis. In addition to the compositional distribution in the depth direction, XPS also enables the assessment of bonding states, making it suitable for investigating the causes of discoloration on the surfaces of device components. This document presents a case study evaluated by XPS regarding the discoloration of the blades of a turbo molecular pump.

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[Analysis Case] Analysis of Hydrogen Desorption from Stainless Steel by TDS

It is possible to evaluate the amount of hydrogen released from metals using TDS (Thermogravimetric Desorption Gas Analysis).

Many metallic materials, such as steel, are known to deteriorate (hydrogen embrittlement) due to diffusible hydrogen that diffuses within the crystal lattice at room temperature. This time, we present an example of evaluating the amount of hydrogen desorption from stainless steel plates (SUS316L) with added hydrogen using TDS. A desorption peak, thought to be diffusible hydrogen, was observed in the low-temperature range around 150°C.

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Analysis case: Metal content analysis in a solution

High-sensitivity analysis of various solutions, such as pure water and wafer cleaning liquids, is possible.

ICP-MS can sensitively analyze the metal content in solutions, such as the metal amounts in the cleaning solution used in the wafer cleaning process and the metal amounts in the pure water flowing through the pipes installed in the equipment and buildings. It can accommodate various types of solutions, including pure water, acids, and alkalis, and can analyze metal element concentrations ranging from ppt levels to major component levels. This document presents case studies investigating the metal content in commercially available solutions.

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[Analysis Case] Simultaneous Heating Analysis of Copper Plates and Solder by TDS

It is possible to evaluate degassing in an environment close to the actual process by bringing the materials into contact with each other.

Soldering of metals is one of the essential processes in the field of electronics. It is known that the outgassing that occurs when metal and solder are heated in contact can lead to voids. Below, we introduce a case where TDS analysis (Thermal Desorption Spectroscopy) was performed with solder placed on a copper plate. TDS can evaluate the outgassing associated with the heating of materials. By bringing the copper plate and solder into contact and heating them simultaneously within the TDS apparatus, we were able to capture outgassing in an environment close to the actual process.

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[Analysis Case] Quantitative Analysis of Low Molecular Weight Siloxanes

We will quantify the siloxanes in the exhaust gas at the ng level.

The siloxane that is emitted as outgassing from silicone products is a component that is volatile and tends to adhere to substrates. It is known that when siloxane adheres, it can cause adverse effects such as fogging of optical system lenses, delamination or poor adhesion of films, and contact failures in relay circuits, making it important to investigate the amount of siloxane outgassing. This document presents a case study on the amount of cyclic dimethylsiloxane generated when heating silicone tubes at 200°C.

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The Kumamoto Sales Office opened on April 15, 2022 (Friday) MST!

We will base our operations at the Kumamoto Sales Office and aim to further improve our services for customers in the Kyushu region.

The first Kumamoto sales office in the Kyushu region has opened. Based in the Kumamoto sales office, we aim to further enhance our services for customers in the Kyushu area. Meetings can be held by visiting your company, and consultations on analysis can also be conducted at the sales office. We will achieve satisfactory quality and delivery times through close collaboration with our Tokyo headquarters (laboratory). Please look forward to it. Opening date: April 15, 2022 (Friday) Address: 161-1 Muro, Otsu Town, Kikuchi District, Kumamoto Prefecture, Station M 102 *Please send samples to the headquarters located in Setagaya, Tokyo. Headquarters address: 1-18-6 Kitami, Setagaya, Tokyo Phone number: 090-7017-3882 (Contact: Takeda)

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[Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS

Separation of components in the Cu spectrum, quantification, and calculation of film thickness.

From the analysis of the Cu2p3/2 spectrum and Cu Auger spectrum, it is possible to evaluate the bonding state, quantitative assessment, and film thickness of the Cu surface. Major application examples include the evaluation of CMP processing and cleaning of Cu wiring, as well as the investigation of rust and discoloration of Cu electrodes. We will summarize the surface states of Cu treated with various processes and the thickness of the oxide film. (Measurements can be conducted immediately after treatment in a clean room environment.)

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[Analysis Case] Qualitative Evaluation of Fiber Optic Core and Cladding

Qualitative and distribution evaluation of optical fiber materials is possible using TOF-SIMS.

Optical fibers have a structure that consists of a core with a high refractive index surrounded by a cladding layer with a low refractive index. Due to the difference in refractive indices, light is totally internally reflected at the boundary and transmitted. Therefore, it is important to analyze the selection of materials, the presence of impurities, adhesion, coating conditions, and contaminants. Optical fibers can be broadly classified into two types: plastic and quartz. This document presents a case study in which the materials of the core and cladding were identified by analyzing the cross-section of plastic optical fibers using TOF-SIMS. Measurement method: TOF-SIMS Product field: Optical fibers, electronic components Analysis purpose: Qualitative evaluation, organic matter evaluation, composition distribution evaluation "For more details, please download the document or contact us."

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[Analysis Case] Depth Profile Concentration Analysis of Mg in Deep Ultraviolet LEDs

Quantification of impurities in AlGaN with various Al compositions is possible.

To determine impurity concentrations using SIMS analysis, it is necessary to use a standard sample with the same composition as the analysis sample. By preparing various Al compositions of AlGaN standard samples for AlGaN used in ultraviolet LEDs and power devices, MST can achieve more accurate quantification of impurities. We will introduce a case where, after disassembling a commercially available deep ultraviolet LED, SIMS analysis was conducted to determine the concentration of the dopant Mg and the distribution of the main component Al composition. Measurement method: SIMS Product fields: Lighting, power devices, optical devices Analysis purposes: Trace concentration evaluation, impurity evaluation, distribution evaluation, product investigation For more details, please download the materials or contact us.

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[Analysis Case] Molecular Structure Analysis of Liquid Crystal Materials

It is possible to estimate the structure of liquid crystal molecules in liquid crystal displays using GC/TOFMS.

The response speed, driving voltage, and reliability characteristics of liquid crystal panels are attributed to the molecular structure of the liquid crystals. Therefore, analyzing the details of the molecular structure is essential for controlling the display characteristics of liquid crystal panels. Here, we introduce a case where the liquid components in commercially available panels were extracted and structurally estimated using GC/TOFMS. Approximately 10 components, including liquid crystal materials that exhibit negative dielectric anisotropy, were estimated from precise mass information. Measurement method: GC/MS Product fields: Displays, televisions, projectors Analysis objectives: Market research, molecular structure evaluation, degradation investigation For more details, please download the materials or contact us.

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[Analysis Case] Investigation of Adhering Components Before and After Cleaning of Mechanical Parts

It is possible to evaluate cleaning effectiveness and identify contaminants.

When overhauling mechanical parts such as pumps and engines, there are cases where parts are cleaned and reused. If the cleaning does not sufficiently remove dirt, there is a risk of malfunctions occurring in the assembled machinery. To investigate the presence of dirt or to analyze the components that are attached, thermal desorption gas chromatography/mass spectrometry (TD-GC/MS) is effective. By heating the sample at a high temperature (up to 350°C), the attached organic substances can be volatilized and measured using GC/MS. This method is useful for identifying the attached components, comparing the amount of attachment before and after cleaning, and assessing the degree of cleaning based on different cleaning methods. Measurement method: GC/MS Product field: Manufacturing equipment and parts Analysis purpose: Composition evaluation and identification For more details, please download the materials or contact us.

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Analytical Equipment Product List and Ranking from 264 Manufacturers, Suppliers and Companies | IPROS GMS

Analytical Equipment Manufacturer, Suppliers and Company Rankings

Analytical Equipment Product ranking