Analytical Equipment Product List and Ranking from 259 Manufacturers, Suppliers and Companies

[GDMS] Glow Discharge Mass Spectrometry

Dissociate and fragment specific mass ions, and detect them with a mass spectrometer.

GDMS is a method for analyzing the composition of solid samples, allowing simultaneous analysis from major components to trace elements, and performing semi-quantitative analysis of impurities present in the sample. The concentration conversion uses the relative sensitivity factor (RSF) associated with the device. The analytical values are derived from the ion intensities of the major component elements and the target elements, calculated using the RSF, resulting in semi-quantitative values. - Bulk analysis is possible from trace elements (ppb level) to major component levels. - Depth profile analysis on the order of micrometers and thin film analysis are possible. - By using conductive materials and auxiliary electrodes, analysis of semiconductor materials and insulating materials is also possible. - High mass resolution allows for the removal of interfering ions. - Measurement is possible for almost all elements below Li, excluding hydrogen and noble gases. - Isotope ratio measurement is possible.

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[RBS] Rutherford Backscattering Spectrometry

It is a method for measuring the energy and intensity of ions scattered backward by Rutherford scattering after irradiating a solid sample with an ion beam.

RBS is a method that irradiates solid samples with ion beams (H+, He++) and measures the energy and intensity of ions scattered backward through Rutherford scattering. By measuring the kinetic energy of the scattered He ions and examining the mass number of the colliding atoms, it is possible to evaluate the components and layer structure of the analyzed sample. Additionally, by directing He ions at a solid sample and measuring the H ions scattered forward, it is also possible to assess the hydrogen concentration in the sample. This measurement technique is known as Hydrogen Forward-Scattering Spectroscopy (HFS). It is also referred to as Elastic Recoil Detection Analysis (ERDA). - Analysis of elements from B to U is possible (H is also possible through HFS) - Quantitative analysis can be performed without using standard samples - Depth profile of composition distribution can be obtained - Density can be calculated from film thickness information obtained by other methods - Sensitivity and accuracy tend to increase with heavier elements - Non-destructive analysis

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[Analysis Case] Analysis of Organic Foreign Substances on Printed Circuit Boards

Reduce the impact of foreign matter surrounding information through appropriate sampling and microscopic measurement.

We will introduce a case study of foreign substance evaluation using micro FT-IR analysis combined with sampling. Foreign substances on electrodes with almost no substrate influence were identified as flux, but no information from the foreign substances on the printed circuit board could be obtained (Figure 1). By performing sampling on inorganic crystals, information about the foreign substances was obtained, and they were identified as flux (Figure 2).

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[Analysis Case] Observation of the Cross-Section of Tooth Enamel Prisms

Applying FIB processing technology, the entire interface of enamel/dental adhesive is observed.

In dental caries treatment, adhesives are used to integrate the filling material used to fill the "cavity" with the tooth structure. The adhesive must have a strong bonding strength with the tooth and the ability to withstand acids and heat that may occur in the oral cavity over a long period after treatment. Observing the adhesive interface is an effective means for evaluation and consideration. By using a manufacturing method that employs FIB processing technology, we were able to achieve effective results that could not be obtained with conventional ultra-thin sections made with diamond knives, and we would like to introduce this.

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[Analysis Case] Investigation of Watermark Causes

Identification of contamination sources on the outermost surface using TOF-SIMS.

TOF-SIMS detects secondary ions originating from molecules and visualizes their distribution. By estimating the components derived from the ion species detected from abnormal areas, it is possible to investigate which process the anomaly occurred in. When abnormal areas (such as discoloration or adhesion) are found on wafers or products, conducting TOF-SIMS measurements can help distinguish whether the issue is due to watermarks from cleaning and drying, alterations in the base material, or contaminants from a different process, making it effective for identifying the causes of defects.

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[Analysis Case] Composite Analysis of White Powder

Identification of powders by FT-IR analysis and XRF analysis.

When analyzing and identifying unknown samples such as foreign substances, it is effective to analyze the data comprehensively from multiple measurement methods. We will introduce a case where FT-IR analysis, which is a vibrational spectroscopy method, was combined with XRF analysis, an elemental analysis method in the atmosphere, to identify two types of white powders.

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[Analysis Case] Evaluation of "Water" in Si Oxide Films and ITO Films using SIMS

Depth-direction analysis of hydrogen using 'heavy water (D2O) treatment'

We will introduce a case where the permeability of water (H2O) in a thin film with a thickness of less than 1 µm was evaluated by measuring the distribution of deuterium (D) in the film. When hydrogen (H) is originally present in the thin film, it is difficult to distinguish whether the hydrogen is due to the influence of water. Therefore, treatment with heavy water (D2O) was performed, and the distribution of the naturally occurring isotope deuterium was measured in the depth direction using SIMS. By examining the depth distribution of deuterium, it is possible to estimate how deep the water has penetrated.

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[Analysis Case] Evaluation of Impurity Concentration in AlGaN UV Sensors Using SIMS

A lineup of AlGaN standard samples with various Al compositions.

In SIMS analysis, it is essential to use standard samples with a composition close to that of the measurement sample in order to obtain more reliable concentration quantification values. By offering a wide range of AlGaN standard samples with varying Al content, we have been able to more accurately determine the impurity concentration in AlGaN, which is used in UV LEDs and UV sensors. We will present a case study where SIMS analysis of a UV sensor was conducted to quantify the concentration of the dopant, Si.

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[Analysis Case] Evaluation of Dopant Concentration Distribution in a-Si Thin Film Solar Cells Using SIMS

Select measurement conditions according to the target element.

We will introduce a case where the concentration distribution of dopants in a-Si (amorphous silicon) was quantitatively evaluated in flexible thin-film Si solar cells. The sample, sealed with resin, was disassembled, and SIMS analysis was conducted. In the analysis of B (Figure 3), measurements were performed with enhanced depth resolution because it exists in shallow areas on the surface side. In the analysis of P (Figure 4), a large amount of H exists in a-Si, causing mass interference; therefore, measurements were conducted under conditions that separated H from Si using high mass resolution methods to detect only P.

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[Analysis Case] Depth Direction Analysis of Degradation Components in GCIB_Ar Cluster Organic Materials

Component evaluation of organic EL layer structures and degradation layers using GCIB under controlled atmosphere.

This paper presents a case study analyzing the degradation components of organic materials that deteriorate due to atmospheric exposure, using GCIB (Ar cluster). The experiment utilized the organic EL material, Rubrene. Measurements of the atmosphere-exposed samples using TOF-SIMS revealed the presence of a mass (m/z 564) estimated to be Rubrene peroxide, as well as low molecular weight benzene-related masses (m/z 77, 105). It was confirmed that these degradation-related components exist at depths of approximately 1μm or more from the surface. *GCIB: Gas Cluster Ion Beam

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Analysis case: Composition distribution analysis of CIGS thin films

It is possible to evaluate the composition quantification, in-plane distribution, and depth distribution of thin films.

In the development aimed at enhancing the performance of CIGS thin-film solar cells, the optimization of the film formation process conditions for the light-absorbing layer is necessary, and controlling the compositional distribution of the CIGS composition has become important. This document presents cases where the composition of the deposited CIGS thin film was quantitatively analyzed with high precision using ICP-MS, evaluated for depth concentration distribution using SIMS, and assessed for in-plane concentration distribution on the substrate using XRF. Measurement methods: SIMS, ICP-MS, XRF, etching Product field: Solar cells Analysis objectives: Composition evaluation, identification, compositional distribution assessment, film thickness evaluation, product investigation For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of Surface Metal Contamination in Plastic Containers

Evaluation of the composition and distribution of impurities in polymer materials using XRF.

XRF is an analytical method used to evaluate the composition and distribution of constituent elements. A notable feature is that it does not require any special pretreatment for measurements, and it can be performed non-destructively over a wide range from 1.2 mm to several centimeters. As an example of elemental analysis using XRF, we will introduce a case where measurements were conducted focusing on the metal components contained in polymer materials of chemical storage containers, investigating metal contamination that adhered to the container surface during the storage period.

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[Analysis Case] Layered Structure Analysis of Heat-Resistant PET Bottles for Food Use

It is possible to identify the components of each layer of PET bottles using TOF-SIMS.

PET bottles allow a small amount of air (oxygen) to permeate, making the beverages inside susceptible to the effects of oxygen intrusion from the outside, which leads to a deterioration in quality. To address this, various innovations have been made in PET bottles. For example, by inserting an oxygen-absorbing layer between the PET layers, as shown in Figure 1, the deterioration of beverages is prevented, preserving their taste. This document presents the results of analyses conducted using TOF-SIMS to confirm what the oxygen-absorbing layer is composed of.

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[Analysis Case] Composition Analysis of Sheet-Like Active Material for Lithium-Ion Secondary Batteries

Quantitative analysis of the main components of sheet-like active substances is possible.

Lithium-ion secondary batteries have excellent characteristics among secondary batteries, but there are various challenges in their development, such as increasing output, capacity, and lifespan. This time, we will introduce a case where the composition of sheet-like active materials for the positive electrode was evaluated with high precision using ICP-MS analysis.

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[Analysis Case] Evaluation of SUS Passive Film Depth Direction State and Oxide Film Thickness

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

Stainless steel (SUS) is excellent in corrosion resistance and is used in various industrial products and components. Although it is a material resistant to corrosion, changes in the composition of the surface passive film due to aging or processing can lead to issues. In this instance, we introduce a case study analyzing the state of the metal oxide film on the surface of stainless steel using TOF-SIMS. TOF-SIMS allows for the high-sensitivity acquisition of molecular information in the oxide state, enabling the distribution of oxides ranging from a few nanometers to several tens of nanometers on the surface to be obtained, and spatial distribution can be evaluated through image analysis. Measurement method: TOF-SIMS Product field: Manufacturing equipment and components Analysis purpose: Evaluation of chemical bonding state, composition distribution, and thickness of corrosion layers For more details, please download the materials or contact us.

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[Analysis Case] SIMS Measurement of Specially Shaped Samples

Analysis is possible even for special shapes through innovative fixing methods.

Typically, SIMS measurements are conducted using chips with a flat surface of a few millimeters in size, but analysis can also be performed on small chips or samples with special shapes, typically less than 1 mm in size, by applying a fixed pre-treatment. Some samples that require investigation of trace components may have shapes that are not suitable for analysis under normal conditions, such as tiny chips or wire-like samples (Figure 1). In such cases, analysis is performed after fixation (Figure 2). Additionally, analysis may be possible for cross-sections, side surfaces, or samples with special shapes by applying pre-treatment.

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[Analysis Case] Depth Profile Concentration Analysis of Impurities in GaN-based LEDs Using SIMS

Measurements will be taken under analysis conditions suited to the purpose.

We will introduce a case where the depth concentration distribution of dopant elements such as Mg and Si in GaN-based LED structures was evaluated using multiple analysis modes. By selecting the optimal analysis mode according to the purpose in SIMS analysis, more precise evaluations can be achieved, so please feel free to consult with us.

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[Analysis Case] Composition Analysis of Compound Semiconductors by SIMS

Capable of evaluating the composition of the main elemental components of compound semiconductors in the depth direction.

Generally, in SIMS, the quantification of major elements with concentrations exceeding a certain percentage is considered to be low. However, by using the M Cs+ (M: target element) detection mode with Cs+ as the primary ion, it is possible to determine the compositional distribution of major elements in the depth direction. An example of depth compositional evaluation for Al and Ga in AlGaAs is presented.

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[Analysis Case] Analysis of the Multilayer Structure of Polymer Films

Clear visualization of the layer structure of multilayer films using low-damage sputtering with GCIB.

The functionality of films is known to be determined by factors such as material, thickness, and layer structure. In this study, we evaluated the layer structure of polyethylene-based multilayer films commonly used as food wrap. By confirming that the film is primarily composed of polyethylene using FT-IR, and employing GCIB (Ar cluster) for sputtering, we were able to clearly visualize the structure where polyethylene and nylon 6 are layered within a thickness of 10μm through depth profiling with TOF-SIMS.

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[Analysis Case] Composite Evaluation of Zn-based Buffer Layer Using X-rays

Evaluation of composition, bonding state, structure, and density is possible.

In the pursuit of improving the efficiency of CIGS thin-film solar cells, various buffer layer materials have been investigated for controlling the band structure and crystallinity from the light absorption layer to the transparent electrode. This presents a case study of various evaluations conducted using X-rays on Zn-based buffer layers deposited on a flattened substrate. Comparisons can be made between different levels based on deposition conditions and various processes after deposition.

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[Analysis Case] Evaluation of the Functional Ingredient Glucosylceramide

Qualitative analysis by LC/MS and quantitative analysis examples by HPLC.

Glucosylceramide (plant ceramide), one of the glycosphingolipids, has been reported to have moisturizing effects and improvements for atopic dermatitis, making it a component of interest in the beauty field. Although the main structural components of glucosylceramide vary among plants, qualitative analysis can be performed using LC/MS. Additionally, since glucosylceramide has multiple molecular species even from the same plant source, quantitative analysis can be conducted with high precision using an evaporative light scattering detector (ELSD).

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[Analysis Case] Quantitative Analysis of Functional Components in Tea

Evaluation of the concentration of tea catechins and caffeine, and product comparison.

In MST, qualitative and quantitative analysis of tea catechins can be performed using LC/MS/MS. This document observed the changes in EGCG concentration based on the temperature and time of brewing tea (Figure 1). It was found that the higher the temperature, the greater the extraction efficiency of EGCG, with a significant amount extracted up to 5 minutes. Additionally, a comparison of the catechin content in six commercially available tea products confirmed that green tea contains more catechins than black tea or oolong tea (Figure 2). Benifuki green tea contains a high amount of methylated catechin (ECCG3"Me), which has strong anti-allergic effects against conditions such as hay fever.

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Simultaneous analysis of odor components.

Identification of odor components using gas chromatography-mass spectrometry.

Odors are commonly expressed in various ways, such as "fragrance" that gives pleasure and "stench" that causes discomfort. Odors rarely exist as a single type of odor component; instead, they are typically a mixture of various odor components. To visualize these complex odors, instrumental analysis using gas chromatography-mass spectrometry (GC/MS) is effective. This document introduces the flow of odor component analysis and presents a case study of simultaneous analysis of unpleasant odors.

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[Analysis Case] Evaluation of the Chemical State of IGZO Film

Evaluation of bonding state and electronic state using XPS and UPS.

IGZO films are materials that are being researched and developed as TFT materials for displays. Since they are composed of multiple metal elements, it is important to understand how the composition, bonding state, and electronic state change depending on the process. We will introduce examples of evaluating the composition, bonding state, and electronic state of IGZO film surfaces using XPS and UPS.

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Interference peak removal process in quantitative analysis

X-ray photoelectron spectroscopy (XPS)

In XPS analysis, in addition to the photoelectron peaks used for evaluation, photoelectron peaks from other orbitals and Auger peaks from X-ray excitation are also detected. Depending on the combination of elements, these sub-peaks can overlap with the target peak and interfere with the evaluation. *Typically, a strong photoelectron peak emitted from an inner shell level close to the outer shell is used. In the quantitative calculations of XPS analysis, the removal of such interfering peaks is primarily performed using the following two methods: 1. Removal using sensitivity coefficient ratios 2. Removal using waveform separation

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[Analysis Case] Evaluation of the Fracture Surface of Laminated Samples by AES Analysis

Visualizing a 50nm thin film with a cross-sectional sample.

AES analysis is a method for obtaining compositional information from the surface to a depth of several nanometers. By performing AES measurements on the cross-section of a sample to obtain elemental distribution images, it is possible to clearly evaluate the layered structure. In addition to evaluating layered structures and conducting elemental analysis of the inner walls of trenches and holes, combining mechanical processing and ion beam processing allows for the assessment of thin alloy layers and phenomena such as diffusion and segregation of elements. In this case, we will present data evaluated using AES analysis for a thin film deposited on a silicon substrate.

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[Analysis Case] Quantitative Analysis of Free Amino Acids in Alcoholic Beverages

Quantitative analysis of 17 free amino acids is possible using the OPA post-column method.

This document presents a case study of the quantitative analysis of free amino acids contained in alcoholic beverages using the OPA post-column method. It was found that sake, a brewed alcoholic beverage, contains a rich and well-balanced variety of free amino acids, including alanine and arginine. Furthermore, when comparing three sake products, differences were observed in both the content and balance of free amino acids. Although draft beer is also a brewed beverage like sake, it showed a lower content of free amino acids compared to sake. On the other hand, distilled spirits such as whiskey and awamori contained almost none.

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[Analysis Case] LC/MS/MS Analysis of Vitamin C

Simultaneous analysis of D, L-ascorbic acid and dehydroascorbic acid.

The vitamin C contained in food refers to the total amount of reduced L-ascorbic acid and oxidized dehydroascorbic acid. Its applications include not only nutritional enhancement but also use as an antioxidant. When measuring vitamin C using HPLC, it is common to convert the oxidized form after noting that dehydroascorbic acid has no UV absorption, and then derivatize it for measurement. By quantifying dehydroascorbic acid using LC/MS/MS, it becomes possible to simplify the pretreatment and analyze with high sensitivity.

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[Analysis Case] Evaluation of Distribution State and Component Analysis of Fluorine-based Films

Evaluation of distribution uniformity and identification/estimation of organic matter through surface analysis of microdomains.

The state of the water-repellent surface in water-repellent treatment differs based on whether fluorine-based compounds are distributed in an island-like manner or uniformly. Therefore, we conducted observations of the distribution of fluorine-based compounds using TOF-SIMS. As a result, it was found that they are distributed unevenly. Additionally, by performing qualitative analysis in a 1μm square area, it was determined that the fluorine-based film is Krytox. Measurement method: TOF-SIMS Product field: Electronic components and daily necessities Analysis purpose: Composition evaluation, identification, composition distribution evaluation For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of the Degradation Layer of Polycarbonate

It is possible to evaluate the film thickness of the degraded layer using the GCIB (Ar cluster).

Polycarbonate (PC) is a type of thermoplastic that has excellent transparency, impact resistance, and heat resistance, and is widely used as a material for solar panels, eyeglass lenses, CDs, automotive parts, and medical devices. In this study, TOF-SIMS analysis was conducted using GCIB (Ar cluster) with a sputter ion beam to evaluate the degradation layer on the surface of PC. *Note: GCIB stands for Gas Cluster Ion Beam.*

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