Analytical Equipment Product List and Ranking from 264 Manufacturers, Suppliers and Companies

[Analysis Case] Composition and Impurity Analysis of CIGS Powder

Quantitative analysis of main components and trace components is possible.

In the development aimed at achieving flexibility and cost reduction for CIGS thin-film solar cells, low-temperature formation processes for the light-absorbing layer and non-vacuum processes are required, making the optimization of the film formation method for CIGS composition and the control of metal contamination levels crucial. This time, we will introduce a case where the composition and impurity concentration of the raw CIGS powder were evaluated with high precision using ICP-MS.

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[Analysis Case] Evaluation of Surface Metal Contamination in Plastic Containers

Evaluation of the composition and distribution of impurities in polymer materials using XRF.

XRF is an analytical method used to evaluate the composition and distribution of constituent elements. A notable feature is that it does not require any special pretreatment for measurements, and it can be performed non-destructively over a wide range from 1.2 mm to several centimeters. As an example of elemental analysis using XRF, we will introduce a case where measurements were conducted focusing on the metal components contained in polymer materials of chemical storage containers, investigating metal contamination that adhered to the container surface during the storage period.

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[Analysis Case] Composition Analysis of Sheet-Like Active Material for Lithium-Ion Secondary Batteries

Quantitative analysis of the main components of sheet-like active substances is possible.

Lithium-ion secondary batteries have excellent characteristics among secondary batteries, but there are various challenges in their development, such as increasing output, capacity, and lifespan. This time, we will introduce a case where the composition of sheet-like active materials for the positive electrode was evaluated with high precision using ICP-MS analysis.

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Analysis case: Evaluation of the in-plane distribution of additives in solder alloys.

Capable of highly sensitive evaluation of the distribution of additives at the ppm level.

High impact resistance is required for the joints of lead-free solder used in electronic devices such as mobile terminals. To address this issue, solder alloys with trace amounts of elements like Ni have been developed. This document presents a case study comparing the in-plane distribution of a five-component lead-free solder with trace amounts of Ni and Ge added to a Sn-Ag-Cu system, and a three-component solder without additives, using imaging from D-SIMS, which excels in high-sensitivity analysis.

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[Analysis Case] Composition Analysis of Compound Semiconductors by SIMS

Capable of evaluating the composition of the main elemental components of compound semiconductors in the depth direction.

Generally, in SIMS, the quantification of major elements with concentrations exceeding a certain percentage is considered to be low. However, by using the M Cs+ (M: target element) detection mode with Cs+ as the primary ion, it is possible to determine the compositional distribution of major elements in the depth direction. An example of depth compositional evaluation for Al and Ga in AlGaAs is presented.

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Simultaneous analysis of odor components.

Identification of odor components using gas chromatography-mass spectrometry.

Odors are commonly expressed in various ways, such as "fragrance" that gives pleasure and "stench" that causes discomfort. Odors rarely exist as a single type of odor component; instead, they are typically a mixture of various odor components. To visualize these complex odors, instrumental analysis using gas chromatography-mass spectrometry (GC/MS) is effective. This document introduces the flow of odor component analysis and presents a case study of simultaneous analysis of unpleasant odors.

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[Analysis Case] Evaluation of the Chemical State of IGZO Film

Evaluation of bonding state and electronic state using XPS and UPS.

IGZO films are materials that are being researched and developed as TFT materials for displays. Since they are composed of multiple metal elements, it is important to understand how the composition, bonding state, and electronic state change depending on the process. We will introduce examples of evaluating the composition, bonding state, and electronic state of IGZO film surfaces using XPS and UPS.

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Interference peak removal process in quantitative analysis

X-ray photoelectron spectroscopy (XPS)

In XPS analysis, in addition to the photoelectron peaks used for evaluation, photoelectron peaks from other orbitals and Auger peaks from X-ray excitation are also detected. Depending on the combination of elements, these sub-peaks can overlap with the target peak and interfere with the evaluation. *Typically, a strong photoelectron peak emitted from an inner shell level close to the outer shell is used. In the quantitative calculations of XPS analysis, the removal of such interfering peaks is primarily performed using the following two methods: 1. Removal using sensitivity coefficient ratios 2. Removal using waveform separation

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[Analysis Case] Evaluation of the Fracture Surface of Laminated Samples by AES Analysis

Visualizing a 50nm thin film with a cross-sectional sample.

AES analysis is a method for obtaining compositional information from the surface to a depth of several nanometers. By performing AES measurements on the cross-section of a sample to obtain elemental distribution images, it is possible to clearly evaluate the layered structure. In addition to evaluating layered structures and conducting elemental analysis of the inner walls of trenches and holes, combining mechanical processing and ion beam processing allows for the assessment of thin alloy layers and phenomena such as diffusion and segregation of elements. In this case, we will present data evaluated using AES analysis for a thin film deposited on a silicon substrate.

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[Analysis Case] Quantitative Analysis of Free Amino Acids in Alcoholic Beverages

Quantitative analysis of 17 free amino acids is possible using the OPA post-column method.

This document presents a case study of the quantitative analysis of free amino acids contained in alcoholic beverages using the OPA post-column method. It was found that sake, a brewed alcoholic beverage, contains a rich and well-balanced variety of free amino acids, including alanine and arginine. Furthermore, when comparing three sake products, differences were observed in both the content and balance of free amino acids. Although draft beer is also a brewed beverage like sake, it showed a lower content of free amino acids compared to sake. On the other hand, distilled spirits such as whiskey and awamori contained almost none.

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[Analysis Case] LC/MS/MS Analysis of Vitamin C

Simultaneous analysis of D, L-ascorbic acid and dehydroascorbic acid.

The vitamin C contained in food refers to the total amount of reduced L-ascorbic acid and oxidized dehydroascorbic acid. Its applications include not only nutritional enhancement but also use as an antioxidant. When measuring vitamin C using HPLC, it is common to convert the oxidized form after noting that dehydroascorbic acid has no UV absorption, and then derivatize it for measurement. By quantifying dehydroascorbic acid using LC/MS/MS, it becomes possible to simplify the pretreatment and analyze with high sensitivity.

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[Analysis Case] Quantification of Hydroxyl Groups by Chemical Modification XPS

Evaluation of Hydroxyl Groups in Polymer Films

In controlling properties such as adhesion and wettability of polymer films, it is very important to quantitatively evaluate the polar functional groups (alcohol groups) present on the surface. XPS is optimal for quantitative evaluation; however, it is difficult to separate and quantify the adjacent oxidation state (C-O-C) and hydroxyl state (C-OH). In MST, after selectively reacting only the alcohol groups using a chemical modification method on polyvinyl alcohol (PVA), it is possible to quantify them using XPS. We present a case where the alcohol groups in PVA were chemically modified and evaluated using trifluoroacetic anhydride (TFAA). Measurement method: XPS, chemical modification Product fields: Electronic components, daily necessities Analysis purpose: Composition evaluation, identification, chemical bonding state evaluation For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of Distribution State and Component Analysis of Fluorine-based Films

Evaluation of distribution uniformity and identification/estimation of organic matter through surface analysis of microdomains.

The state of the water-repellent surface in water-repellent treatment differs based on whether fluorine-based compounds are distributed in an island-like manner or uniformly. Therefore, we conducted observations of the distribution of fluorine-based compounds using TOF-SIMS. As a result, it was found that they are distributed unevenly. Additionally, by performing qualitative analysis in a 1μm square area, it was determined that the fluorine-based film is Krytox. Measurement method: TOF-SIMS Product field: Electronic components and daily necessities Analysis purpose: Composition evaluation, identification, composition distribution evaluation For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of Copper (Cu) Oxide Film Thickness: Differences Due to Storage Environment

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

Copper (Cu), used as wiring material, forms an oxide film in the air. Here, we present a case study evaluating the differences in film thickness due to variations in storage environments. Copper (Cu) wrapped in aluminum foil and copper (Cu) stored in a plastic bag were each kept for 40 days, and the oxide film thickness was measured using TOF-SIMS. Additionally, a continuous investigation over approximately 20 days confirmed reproducibility. TOF-SIMS allows for depth profiling analysis of inorganic materials such as oxides and metals. Measurement method: TOF-SIMS Product fields: Displays, LSI, Memory, Electronic components Analysis purpose: Evaluation of chemical bonding states For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of Damage Layer on Polymer Surface Due to Ion Irradiation

By using GCIB (Ar cluster), it is possible to evaluate the composition and thickness of the damaged layer.

By irradiating the surface of polymer materials with ions, changes in surface properties occur. Utilizing these changes, research is being conducted in a wide range of fields, including the development of functional materials. Evaluating the changes that occur in the surface state after ion irradiation is important for efficient research and development. In TOF-SIMS analysis, using a GCIB (Gas Cluster Ion Beam) for the sputtering ion beam makes it possible to evaluate the composition and thickness of the damage layer caused by ion irradiation on the surface of polymer materials.

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[Analysis Case] Evaluation of the Surface Silanol Groups

Quantitative evaluation of silanol groups is possible with TOF-SIMS.

The presence of silanol groups (Si-OH) on the surfaces of glass and wafers affects properties such as hydrophobicity and hydrophilicity. Therefore, it is likely to influence subsequent surface treatments, necessitating control. We will introduce a case where the quantification of silanol groups was performed using TOF-SIMS. To conduct the evaluation, calibration curves were created using several types of samples with different concentrations. In the measurement examples, the silanol groups on the surfaces of samples with different materials and conditions were compared. Measurement method: TOF-SIMS Product fields: LSI, memory, electronic components Analysis purpose: Composition evaluation and identification For more details, please download the materials or contact us.

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[Analysis Case] Depth Direction Analysis of Thin Carbon Films

Depth-direction analysis of diamond-like carbon (DLC) and graphene is possible.

TOF-SIMS allows for the acquisition of mass spectra in the depth direction, enabling the analysis of components in very thin layers through qualitative assessment of each layer. In this case, we analyzed a hard disk in the depth direction. As a result, it was found that the diamond-like carbon (DLC) layer formed on the surface has a two-layer structure, with a nitrogen-containing C layer on the surface side and a layer consisting solely of C on the deeper side. This method can also be applied to the depth analysis of graphene films. Measurement method: TOF-SIMS Product fields: Electronic components, manufacturing equipment, parts Analysis objectives: Composition evaluation, identification, composition distribution evaluation For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of the sp2/(sp2+sp3) Ratio of DLC Films

Evaluation of the sp2/(sp2+sp3) ratio using C1s waveform analysis.

Due to its characteristics such as high hardness and high wear resistance, DLC (diamond-like carbon) films are utilized in a wide range of fields. These films are materials that lie between graphite and diamond, and the separation of sp2 (graphite structure) and sp3 (diamond structure) within the film to obtain the sp2/(sp2+sp3) ratio is one of the important factors that determine the properties of the film. Here, we will introduce an example of evaluating this sp2/(sp2+sp3) ratio by analyzing the C1s spectrum using XPS.

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[Analysis Case] Evaluation of Work Function After Thin Film Surface Treatment

UPS analysis after surface plasma treatment of ITO.

In semiconductor devices, their performance is greatly influenced by the combination of work functions of various materials that make up the device. Therefore, attempts have been made to control the work function through surface treatments and modifications, and it is important to verify their effects. This document presents an example of evaluating the change in work function of ITO (Sn-doped In2O3), used as an electrode material in organic ELs and solar cells, before and after surface plasma treatment using UPS analysis.

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Comparison of depth profiling analysis using XPS and AES.

XPS: X-ray Photoelectron Spectroscopy AES: Auger Electron Spectroscopy

XPS and AES are surface-sensitive analytical techniques widely used for evaluating sample surfaces, but by combining them with ion etching, depth profiling analysis becomes possible. When conducting depth profiling analysis, it is important to appropriately differentiate between XPS and AES according to the area to be measured and the material of the sample in order to perform analysis that aligns with the objectives. The characteristics of depth profiling analysis using XPS and AES will be compared using the analysis of SUS passive films as an example.

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[Analysis Case] Composition Evaluation and Morphological Observation of Fuel Cell Catalyst PtRu

Multifaceted evaluation using XPS, SEM, and TEM.

The electrodes of fuel cells have a structure in which catalyst particles are supported on a carbon carrier. Evaluating the state of the carrier and catalyst particles is essential for understanding degradation mechanisms and considering design guidelines. XPS analysis is effective for assessing the state of catalyst poisoning (oxidation). Additionally, SEM and TEM observations are effective for evaluating catalyst agglomeration and particle growth. By combining multiple analytical methods, we propose a multifaceted evaluation.

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[Analysis Case] Surface Contamination Assessment of Si Wafers Stored Using TOF-SIMS

Evaluation of contamination and oxidation of Si wafers after removing the oxide film with hydrofluoric acid treatment.

Knowledge about the effects of contamination and oxidation during sample transport is important in surface analysis where the detection depth is on the nanometer order. Therefore, we examined the impact of contamination and oxidation due to differences in storage methods on Si wafers. In storage with wrapping paper and aluminum foil, there is a tendency for the peaks of organic materials caused by secondary contamination to be weaker. When samples are wrapped and stored in the matte side of aluminum foil during storage and transport, it can suppress contamination and oxidation compared to other storage methods.

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[Analysis Case] Component Analysis of Organic EL Emission Layer

Possible to dismantle and preprocess while maintaining the atmosphere, up to the introduction of equipment.

It is known that organic EL materials undergo changes when exposed to air. We present results obtained from TOF-SIMS regarding the surface state of luminescent materials left in a nitrogen atmosphere and in the atmosphere. In samples produced in a nitrogen atmosphere, parent ions are primarily detected, but when left in air, fragments with oxygen attached to the parent ions are detected. For materials that are prone to degradation, it is necessary to analyze them without exposing them to the atmosphere.

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[Analysis Case] Thermal Desorption Gas Analysis of SiN Film by TDS

It is possible to evaluate the surface-adsorbed gas on the thin film and the desorbed gas from within the film.

The TDS analysis results regarding the SiN film on the Si substrate are presented. In the low-temperature range up to around 100°C, there is little desorption, indicating that there were few adsorbed components on the surface of the sample. On the other hand, as the temperature of the sample increases, it can be observed that m/z 2 (H2), m/z 18 (H2O), and m/z 27 (C2H3: organic fragment components) are being desorbed. TDS analysis conducted under high vacuum (1E-7 Pa) is effective for evaluating the adsorbed gas components on the film surface and trace gas components within the film.

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Differences in detected components by ionization methods ESI and APCI.

LC/MS: Liquid Chromatography-Mass Spectrometry

The ionization method for LC/MS is commonly ESI (Electrospray Ionization). In ESI, if low-polarity components cannot be ionized, APCI (Atmospheric Pressure Chemical Ionization) is available as a highly sensitive detection method. It is important to choose the optimal ionization method according to the target components in order to obtain data that aligns with the objectives.

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About MSDM

TOF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry

In depth profiling analysis using TOF-SIMS, if the positional information on the plane (x, y) is ignored, mass spectra exist at each depth (z), resulting in three-dimensional data of depth, mass, and spectral intensity. The visualization of this three-dimensional data as a single image is called MSDM (Mass Spectra Depth Mapping) representation.

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[Analysis Case] Degradation Analysis of Organic EL Devices Using MSDM

By visualizing the mass spectrum, more accurate analysis is possible.

Organic EL (OLED) is used in various applications such as high-definition display panels and lighting, and the demand for layer structure analysis and degradation analysis is increasing. However, since it is formed by combining various organic materials, elemental analysis alone can only capture a portion of the phenomena. This document presents a case study where depth direction analysis data of OLED was obtained using TOF-SIMS, and insights into the degradation of the sample were gained through MSDM (Mass Spectra Depth Mapping).

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[Analysis Case] Analysis of Paper Coated with Dyes and Pigments

Visualization of molecular information derived from dyes and pigments is possible using TOF-SIMS.

Color printers use ink to print on the surface of paper. The ink contains dyes and pigments, which have characteristic molecular information based on their colors. By visualizing this molecular information, it becomes possible to obtain information about the distribution of ink components on the paper surface and how deeply the ink components penetrate into the paper cross-section. Below, I will summarize the "imaging results of the paper surface" visualized by TOF-SIMS. TOF-SIMS can perform image analysis of molecular information ranging from 10 μm to 3 cm square.

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Pre-treatment methods for trace element analysis on the wafer surface.

ICP-MS: Inductively Coupled Plasma Mass Spectrometry

In the process of confirming metal contamination adhered to the wafer surface after the formation of the SiO2 film, a method has traditionally been used where the SiO2 film is dissolved in acid as a pre-treatment for analysis, followed by the analysis of the solution. This method results in analysis that combines metal contamination on the very surface with that within the SiO2 film, making it unsuitable for analyzing only the metal contamination on the very surface. In MST, it is possible to evaluate the metal contamination elements on the wafer's very surface by dissolving only the metal elements adhered to the very surface without dissolving the SiO2 film during the pre-treatment.

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[Analysis Case] Ultra-high Sensitivity Measurement of Impurities in SiC Using SIMS

Evaluates bulk concentrations at the ppb to ppt level.

In the development of ultra-high voltage, low-loss SiC power devices that can be used in substations, controlling low carrier concentration is necessary, and SIMS analysis is effective for evaluating extremely low concentrations of impurities. In SIMS analysis, it is possible to evaluate extremely low concentrations by limiting the impurities to one element without simultaneously acquiring multiple elements. This document presents analysis examples that evaluate the extremely low concentration range of impurities in SiC with ultra-high sensitivity, which has been difficult to assess conventionally.

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