Analytical Equipment Product List and Ranking from 259 Manufacturers, Suppliers and Companies

[Data] Analysis of SEG-LCD Panel Display Malfunction

We introduce case studies of comparative analysis conducted through chemical analysis, such as GC-MS analysis and ICP-AES analysis!

In the event of a display failure on a liquid crystal panel, it is necessary to clarify the cause in order to prevent recurrence. This document presents a case study comparing panel A, which exhibited display unevenness due to temperature stress, and panel B, which showed no display issues, through chemical analysis. Aites can investigate the cause through chemical analysis of the liquid crystal interior when initial analyses, such as observations, do not reveal any issues. We can also propose analytical methods tailored to the sample and purpose beyond the techniques mentioned here. [Contents] ■ Reliability Testing (80°C/Dry Conditions/1000 Hours) ■ Liquid Crystal GC-MS Analysis ■ Metal Element ICP-AES Analysis in Liquid Crystal ■ Summary *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
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[Data] EPMA Analysis Example 2

Analysis by EPMA can detect PET and PETH spectral crystals, allowing for peak separation of 17Cl and 47Ag!

EPMA has superior detection resolution compared to EDX. Even in cases where the detection positions of elements are close in EDX, making peak separation difficult, it may be possible to achieve peak separation with EPMA. This document introduces the peak separation of 47Ag and 17Cl. It includes cross-sectional observations of chip resistors, X-ray spectra of 47Ag, and mapping comparisons. [Contents] ■ Peak separation of 47Ag and 17Cl ■ X-ray spectrum of 47Ag ■ Mapping comparison *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
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Analysis of pigments and polymers using MALDI-TOFMS.

Detect the mass number as an absolute value! You can obtain information about the composition of the compound.

We conduct "pigment and polymer analysis using MALDI-TOFMS." With "MALDI-TOFMS," it is possible to obtain molecular weight information for insoluble substances such as pigments, molecular weight information for synthetic polymers, and information on terminal groups. Please feel free to contact us for mass confirmation of synthetic compounds or for structural analysis in combination with other analytical methods. 【Features】 ■ Adoption of Matrix-Assisted Laser Desorption Ionization Mass Spectrometry (MALDI) ■ Ability to obtain information regarding the composition of compounds ■ Suitable for analyzing polymers that are small compared to GPC and large compared to LCMS ■ Mass numbers are detected as absolute values *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
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[Document] Mass Spectrometry Guide

Analyze using information obtained from various analytical methods such as functional groups and skeletal structures! Introducing the mass spectrometry guide.

This document introduces a guide to mass spectrometry. In the analysis of organic compounds, information is obtained and analyzed from various analytical methods based on the functional groups, skeletal structures, and masses of the compounds. There are various methods for analyzing the mass of compounds, each with its own strengths in terms of the type of analysis and targets. Additionally, these methods can be selectively used according to the application or combined with other analytical techniques to obtain the necessary information. [Contents] ■ Methods mainly used in mass spectrometry - GC-MS - LC-MS - MALDI-TOFMS - GPC *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
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Analytical Equipment and Devices
Food Testing/Analysis/Measuring Equipment
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[Case of EBSD] Comparison of two brass materials

Visualizing the differences between two samples based on differences in crystal structure! Introducing a case study of EBSD analysis.

Here is a case study comparing two types of brass with similar elemental compositions. When spectral analysis was performed using SEM-EDX, it was found that brass mainly consists of Cu (copper) and Zn (zinc), and the elemental compositions of both samples appeared to be relatively similar. Additionally, an EBSD analysis was conducted, and the phase map revealed the presence of a β phase with a different crystal structure in part of Sample 1. [Case Overview] <Comparison of Two Brass Materials through Elemental Analysis> ■ Analysis Method: SEM-EDX Analysis ■ Results - Spectral analysis indicated that brass mainly consists of Cu (copper) and Zn (zinc), and the elemental compositions of both samples appeared to be relatively similar. - Surface analysis was conducted for elements Cu and Zn, and no bias in the in-plane distribution was observed. *For more details, please refer to the PDF document or feel free to contact us.

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[Information] GC-MS Analysis Device Guide

Introducing the sample introduction device and the types of analytical samples and analysis content that each device specializes in!

GC-MS analysis is a method commonly used for the analysis of organic components and organic structure analysis. With auxiliary devices, it is capable of a wide range of analyses, from low molecular substances like solvents to high molecular substances like plastics. In this document, we will introduce the sample introduction devices owned by Aites, as well as the types of analysis samples and analysis content that each device specializes in. We invite you to read it. 【Contents】 ■ Overview ■ Conditions ■ Samples ■ Data Obtained ■ Analysis Examples *For more details, please refer to the PDF document or feel free to contact us.

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Analytical Equipment and Devices
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Foreign substance analysis and component analysis: Comparison of micro-Raman and FTIR.

Spectroscopic analysis is suitable for component analysis and qualitative analysis of foreign substances.

We will introduce the comparison between Raman spectroscopy analysis by Aites Co., Ltd. and FTIR. Spectroscopic analysis is suitable for component analysis of foreign substances and qualitative analysis. Both Raman and FT-IR can obtain spectra based on the structure of the analysis target. However, since each has its strengths and weaknesses, it is necessary to choose between the two depending on the analysis target. 【Features】 ■ Measurement in the order of several micrometers, which is difficult to analyze with IR, is possible. ■ No sampling is required. *For more details, please refer to the PDF materials or feel free to contact us.

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Testing Equipment and Devices
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Example of analysis of compounds at the SAC solder and Ni pad interface.

It is also possible to display various maps of each phase! Analysis is based on the information of the crystal structure possessed by the sample.

We will introduce an example of the analysis of compounds formed at the interface between Sn-Ag-Cu solder and NiP pads. At the interface between NiP pads and Sn-Ag-Cu solder, compounds such as (Ni,Cu)3Sn4 and (Cu,Ni)6Sn5 grow, and surface analysis using EDX shows the distribution of Ni, Cu, and Sn within these compounds. The EBSD method is an analytical technique based on the crystallographic information of the sample. By combining it with elemental analysis using EDX, it is possible to estimate the composition, and in some cases, analysis can be performed using the crystallographic data of Ni3Sn4 and Cu6Sn5 as substitutes. [Summary] < Elemental Analysis by EDX > - Surface analysis shows the distribution of Ni, Cu, and Sn within the compounds. < Crystallographic Orientation Analysis by EBSD > - By combining this with elemental analysis using EDX, it is possible to estimate the composition. - In some cases, analysis can be performed using the crystallographic data of Ni3Sn4 and Cu6Sn5 as substitutes. *For more details, please download the PDF or feel free to contact us.

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Examples of cross-sectional observation of wire bonding with various compositions.

We propose processing, pretreatment, and observation methods based on accumulated know-how! We will introduce examples of observation and elemental analysis of various wire cross-sections.

We would like to introduce examples of cross-sectional observation and elemental analysis of wire bonding with various compositions conducted by our company. Wire bonding is a technology that connects electrodes on semiconductor chips to package terminals using metal wires, with materials such as gold (Au), aluminum (Al), and copper (Cu) being used for the wires. The samples presented were prepared by mechanical polishing to create cross-sections, but there are appropriate processing methods depending on the observation purpose, sample composition, and structure. Utilizing our accumulated know-how, we will consider and propose processing, pre-treatment, observation methods, and combinations. 【Characteristics of Each Wire】 ■ Gold (Au) Wire: Has high conductivity, is chemically stable, and is less prone to oxidation, making it highly reliable. ■ Aluminum (Al) Wire: Suitable for applications that require high current. ■ Copper (Cu) Wire: Has lower electrical resistance and higher thermal conductivity than gold. ■ Palladium (Pd) Coated Copper (Cu) Wire: Improves oxidation resistance and bonding properties. *For more details, please download the PDF or feel free to contact us.

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Other metal materials
aluminum
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Automatic Dispensing Device Workstation Type 'ADS-384-24'

Due to its connectivity with robot systems and other features, it can meet various needs, including dispensing, thanks to its scalability.

The "ADS-384-24" is a dispensing device that enables a stage layout adaptable to various tasks through its 24 stages. By exchanging the dispensing head, it allows for dispensing into 1536 wells and achieves minimum micro-dispensing of 0.1μL. Additionally, it supports a double-range head, allowing for the use of two types of tips to accommodate a wide range of dispensing volumes from small to large. 【Features】 ■ Double-range head compatible ■ 0.1μL dispensing ■ 24 stages ■ For 1536/384/96 well plates ■ Dispensing head can be changed according to application *For more details, please refer to the PDF document or feel free to contact us.

Company：バイオテック
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Dispenser
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Automatic Dispensing Device Tabletop Standard Type 'EDR-384SX'

A space-saving, multifunctional, and low-cost automatic dispensing device! It can perform high-speed dispensing operations continuously.

The "EDR-384SX" is a compact workstation with a simultaneous dispensing type for 96/384/1536 wells, featuring a high-precision dispensing unit from the already well-received "EDR series" and equipped with 12 stages. When combined with the 0.1 to 5μl disposable tip BST-5, it achieves high-precision and reproducible dispensing of as little as 0.1μl. Additionally, it can connect up to two large-capacity stackers, each capable of holding approximately 50 microplates, allowing for continuous high-speed dispensing operations. 【Features】 ■ Supports 0.1μL ■ Compatible with double-range heads ■ For 96/384/1536 well plates ■ Cylinder/head can be easily exchanged with a one-touch mechanism ■ Various stage options available *For more details, please refer to the PDF materials or feel free to contact us.

Company：バイオテック
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Other physicochemical equipment
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Differential Thermal Balance - Mass Spectrometry Method

Measurement of weight change, differential thermal analysis, heat quantity, and mass of volatile components resulting from heating the sample.

TG-DTA simultaneously evaluates weight changes due to heating (TG) and thermal behavior of endothermic and exothermic reactions (DTA). Additionally, TG-DTA-MS continuously assesses volatile components (MS) along with TG and DTA evaluations. - TG allows for the detection of weight changes on the order of percentage. - DTA provides insights into reactions such as pyrolysis, melting, sublimation, oxidation, combustion, and phase transitions. - MS enables the structural estimation of volatile components and decomposition products.

Company：一般財団法人材料科学技術振興財団　MST
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Treatment under non-atmospheric exposure

It is possible to evaluate the sample in its original state.

■Features ? By handling samples under atmospheric non-exposure, it is possible to minimize alteration and changes even for highly reactive samples. ? Cutting, peeling, and surface preparation under atmospheric non-exposure can reduce secondary contamination and oxidation from the atmosphere. ? Methods that can be evaluated under atmospheric non-exposure: SIMS, TOF-SIMS, AES, XPS, SEM, TEM, STEM, Raman, XRD, FIB, etc.

Company：一般財団法人材料科学技術振興財団　MST
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[Analysis Case] Evaluation of the state of the organic thin film solar cell electrode interface and the dispersion state of the organic film.

It is possible to conduct a comprehensive evaluation analysis that minimizes the influence of the atmosphere.

Organic devices are devices that use materials susceptible to the effects of oxygen and water. At MST, we conduct analyses with sample transport, processing methods, and measurement environments that minimize atmospheric influences, allowing for evaluations closer to true conditions. We assessed the interface state between the organic film and the electrode using XPS analysis. We can confirm the composition and bonding state of the titania present on the surface of the organic film. Through TOF-SIMS analysis, we examined the dispersion state of P3HT (p-type organic semiconductor) and PCBM (n-type organic semiconductor) within the organic film of bulk and heterostructure organic thin-film solar cells in the depth direction.

Company：一般財団法人材料科学技術振興財団　MST
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[Analysis Case] Degradation Assessment After Charge and Discharge Cycle Testing of LIB

From the production of battery cells to charge and discharge cycle testing, disassembly, and investigation of degradation components.

When investigating the degradation mechanisms of secondary batteries, it is important to analyze the deposits on the electrode surface. At MST, we conduct TOF-SIMS measurements under controlled atmospheric conditions, allowing us to evaluate the chemical state of the electrode's outermost surface without alteration due to exposure to the atmosphere. Additionally, by consistently performing measurements from charge-discharge cycle tests to the electrode surface, we can examine the correlation between the state of charge-discharge and the condition of the deposits on the electrode surface.

Company：一般財団法人材料科学技術振興財団　MST
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[Analysis Case] Evaluation of Degradation of Lithium-Ion Secondary Battery Anodes

Consistent evaluation from battery cell manufacturing, degradation testing, disassembly, to investigation of state changes due to degradation.

A degradation test was conducted on a battery cell made with LiCoO2 as the positive electrode, graphite as the negative electrode, and LiPF6/EC:DEC as the electrolyte, which was left in a constant temperature chamber at 60°C in a charged state of 4.2V for about one week. After that, the cell was disassembled and cleaned in an Ar atmosphere, and TOF-SIMS analysis of the negative electrode graphite was performed. Before the test, fragments derived from the binder and electrolyte salt were confirmed, and after the test, fragments such as Li3PO4 and PF3O, which are believed to have been generated due to the degradation of the electrolyte salt, as well as fragments from Li2CO3, were observed. Additionally, the detection of Co suggests the possibility of leaching of the positive electrode active material.

Company：一般財団法人材料科学技術振興財団　MST
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[Analysis Case] Evaluation of Depth Distribution of Alkali Metals in SiO2 Using SIMS

High-precision distribution evaluation of alkali metals through sample cooling.

When measuring the distribution of alkali metals in SiO2 under general analytical conditions, it is known that changes occur in the depth profile concentration distribution due to influences such as the electric field caused by the measurement. In MST, by cooling the sample during SIMS measurements, we suppress changes in the concentration distribution of alkali metals and evaluate the concentration distribution with higher accuracy.

Company：一般財団法人材料科学技術振興財団　MST
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[Analysis Case] Evaluation of Flux Cleaning Residue

We capture the minute and ultra-thin residue as an image.

In recent years, with the introduction of lead-free solder, the flux components have also been improved (with higher activity and heat resistance, etc.), leading to increased corrosiveness and a growing importance of residue issues. Therefore, the removal of flux is required. An analysis of foreign substances in the electrode parts of printed circuit boards using TOF-SIMS revealed the presence of flux components.

Company：一般財団法人材料科学技術振興財団　MST
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[Analysis Case] Evaluation of Element Distribution in Oxide ReRAM Operating Area Using SIMS

High-sensitivity evaluation of local elemental distribution in oxide devices using oxygen isotopes.

In oxide ReRAM, it was suggested that oxygen diffusion associated with the application of an electric field is related to memory operation (resistance change). Since SIMS analysis allows for the measurement of isotopes, utilizing the isotope 18O ion implantation technique enables the tracking of oxygen diffusion. For devices where 18O was locally implanted, a bridge structure that serves as the operating region was formed by applying an electric field, and elemental mapping revealed that the intensity of 18O in the bridge area was weak, indicating localized reduction.

Company：一般財団法人材料科学技術振興財団　MST
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[Analysis Case] Elemental Analysis of Active Materials in Lithium-Ion Secondary Batteries

Dismantling and sampling can be performed in a non-exposed atmospheric environment, allowing for measurements that minimize degradation and alteration.

In AES (Auger Electron Spectroscopy), it is possible to perform elemental mapping (surface analysis) at sub-micron levels, allowing for clear confirmation of the elemental distribution in ternary materials (Co, Mn, Ni). Additionally, the distribution of carbon derived from binders and conductive additives can be measured with high sensitivity. In this study, a series of processes for the positive electrode active material were conducted in an atmosphere-free environment (inert gas atmosphere) until the introduction of the equipment, minimizing alterations during measurement. As a result, it was suggested that larger particles are LiCoO2, while smaller particles are LiCoxMnyNizO2 and LiMn2O4, indicating a non-uniform distribution of particles. Measurement methods: AES・SEM Product field: Secondary batteries Analysis purpose: Composition evaluation, identification, composition distribution evaluation For more details, please download the materials or contact us.

Company：一般財団法人材料科学技術振興財団　MST
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[Analysis Case] Evaluation of Composition Distribution in the Active Layer of Organic Thin-Film Solar Cells

Preprocessing and depth direction analysis are possible under controlled atmosphere conditions.

In bulk heterojunction solar cells using p-type and n-type material active layers, it is necessary to properly control the mixing state of the materials within the film. After performing annealing treatment post-deposition, we conducted TOF-SIMS depth profiling analysis on samples that showed an improvement in photoelectric conversion efficiency along with an increase in fill factor without any change in open-circuit voltage. As a result, it was found that PCBM was segregated at the interface with the PEDOT:PSS layer before annealing.

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[Analysis Case] Comprehensive Evaluation of Organic EL Displays

We evaluate by combining various methods such as structural understanding, material assessment, and identification of deterioration causes.

Organic EL is expected to be a self-emitting, flexible next-generation display and lighting panel, but further improvements in reliability are desired. By combining various methods, comprehensive evaluations such as structural analysis, condition analysis, and identification of degradation causes can be achieved.

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[Analysis Case] Evaluation of Interdiffusion Between Layers of CIGS Solar Cells Using SIMS

It is possible to achieve high-precision measurements that are not affected by surface irregularities.

In solar cells, surface roughness is utilized to effectively absorb sunlight. When conducting SIMS analysis, the surface roughness leads to a decrease in depth resolution. Measurements from the surface appear to show that elements like Cd, Zn, and O are diffusing into the CIGS layer due to the effects of surface roughness and knock-on (Figure 3), but measurements taken from the substrate side (back side) reveal that there is no significant diffusion of Cd, Zn, and O into the CIGS layer (Figure 4). In addition to interdiffusion, it is also possible to evaluate changes in the composition of the main components (Cu, In, Ga, Se) and the concentration distribution of impurities (B, Na, Fe).

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[Analysis Case] Evaluation of the State of the Electrode/Organic Layer Interface in Organic EL Devices

The process will be carried out from pretreatment to XPS measurement under an inert gas atmosphere.

We physically peeled off the buffer layer/Alq3 interface and conducted XPS analysis on the peeled surface (buffer layer side). By peeling in an inert gas atmosphere, we were able to expose the interface without destroying the chemical structure, and by transporting it to the XPS device while maintaining the inert gas atmosphere, we minimized post-peeling alterations (such as oxidation and moisture absorption). The main component of the buffer layer is LiF, and it was suggested that some of it may have oxidized. By controlling the atmosphere, it is possible to evaluate the oxidation states of metal elements such as Al and Li due to differences in film formation methods, treatment methods, and organic layers.

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[Analysis Case] Wide-Area Cross-Section Observation of Bumps

Wide-area observation of micro-specific locations is possible through cross-section preparation using ion polishing.

The Ion Polish (IP) method allows for the production of cross-sections with minimal processing damage (such as delamination at interfaces, step differences due to hardness variations, and scratches from polishing) that were problematic in mechanical polishing methods. The positional accuracy of processing is also improved, enabling the creation of wide-area cross-sections that include small features. Due to the minimal damage to the crystals, clean crystal patterns can be obtained. Additionally, since there is no influence from mechanical stress, detailed evaluation of the cross-sectional structure of specific areas can be conducted through AES analysis, SEM observation, and EDX analysis while faithfully preserving the internal structure.

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[Analysis Case] Evaluation of SiON Film by SIMS

Evaluation of nitrogen in SiON with a film thickness of approximately 1 nm is possible.

It is possible to evaluate the distribution of nitrogen in SiON films in the depth direction, even down to low concentration areas where high-sensitivity SIMS analysis excels, and to assess the amount of nitrogen (unit: atoms/cm²) with high precision (Figure 1). Additionally, nitrogen can be converted to atomic% (Figure 2), and a fitting curve for nitrogen can be calculated, allowing for the determination of nitrogen's peak concentration, depth, and half-width through fitting (Figure 3).

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[Analysis Case] Evaluation of B Penetration Amount from SSDP-SIMS Gate to Substrate

Measurement avoiding the effects of surface irregularities and high concentration layers using SSDP-SIMS.

By conducting SIMS analysis (SSDP-SIMS) from the substrate side, it is possible to obtain measurements that are not affected by the knock-on effects from the high-concentration layer on the surface due to surface roughness and sputtering. We evaluated the amount of boron penetration from the gate electrode (B-doped Poly-Si) into the substrate. Measurements from the substrate side showed no effects from knock-on, indicating that a more accurate evaluation of the penetration amount is possible. Thus, SSDP-SIMS is effective for assessing the barrier properties of barrier metals, the incorporation of metals into Low-k films, and the evaluation just beneath the rough silicide.

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Improvement of depth resolution by vertical incidence method.

SIMS: Secondary Ion Mass Spectrometry

■Measurement Method for Depth Direction Distribution (1) Limitations of Depth Direction Resolution in Oblique Incidence Method The dependence of depth direction resolution on primary ion energy in the oblique incidence method was investigated using δ-doped samples (Figure 1). It was found that in the oblique incidence method, there is a limit to the improvement of depth direction resolution due to the roughness of the crater bottom (Figure 2). (2) Improvement of Depth Direction Resolution by Vertical Incidence Method Figure 3 shows the relationship between the half-width of the B peak (δ-doped sample) and primary ion energy in both vertical and oblique incidence methods. In the region below 1 keV of primary ion energy, where there were limitations in improving resolution with the oblique incidence method, improvements in resolution have been achieved with the vertical incidence method.

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[Analysis Case] Depth Direction Analysis of Organic EL Material TOF-SIMS RGB Elements

Evaluation of organic EL layer structures and degradation layers using GCIB (Ar cluster) under atmospheric control.

Organic EL displays are materials that hold the potential for high resolution and low power consumption, and market expansion is expected. In recent years, there has been a trend towards miniaturizing pixel arrangements to achieve higher image quality. When measuring small pixels, conventional oblique cutting TOF-SIMS measurements made it difficult to evaluate in the depth direction. However, by introducing GCIB (Ar cluster), it has become possible to evaluate organic EL materials in the depth direction with good reproducibility, even for small pixels, and to assess material degradation and diffusion as well. *GCIB: Gas Cluster Ion Beam

Company：一般財団法人材料科学技術振興財団　MST
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[Analysis Case] IGZO

Case studies of XRD and XRR analysis of oxide semiconductors.

The transparent oxide semiconductor IGZO thin film is being researched and developed as a TFT material for displays. IGZO is a material whose properties change significantly based on the composition of the film, the presence of oxygen vacancies, and crystallinity, making it important to consider the correlation with film quality. We will introduce a case where the crystallinity, film thickness, and film density of three types of IGZO thin films with different heating temperatures were measured and compared using XRD and XRR. It was confirmed non-destructively that crystallization progresses at high temperatures, resulting in higher film density.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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