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Analytical Equipment Product List and Ranking from 264 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

Analytical Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

  1. フォス･ジャパン Tokyo//Testing, Analysis and Measurement
  2. サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  3. ビーエルテック Tokyo//Testing, Analysis and Measurement
  4. 4 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  5. 5 日東精工アナリテック Kanagawa//Industrial Machinery
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Analytical Equipment Product ranking

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

  1. iCAP PRO Series ICP Emission Spectrometer サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  2. Sake FT-IR component analysis device "OenoFoss2" フォス･ジャパン
  3. 3-year warranty for non-destructive, high-speed analysis. A metal analyzer that completes everything up to report creation in one device. ナニワプロジェックス
  4. 4 Alcohol analysis device for sake Alcolyzer3001 SAKE
  5. 5 Total Organic Carbon Automatic Analyzer "TOC-200 Series" 東レエンジニアリングDソリューションズ

Analytical Equipment Product List

181～210 item / All 1210 items

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Would you like to check the deterioration of resin through FT-IR analysis?

Would you like to check the deterioration of resin through FT-IR analysis?

Detect and analyze the absorption wavelengths of organic molecular groups (functional groups)!

At Aites Co., Ltd., we conduct "FT-IR analysis" to confirm the degradation of resins. The degradation of resins can manifest as visible discoloration or invisible changes. Discoloration can be detected through visual changes, but invisible changes can lead to a decrease in strength and become the source of various issues. IR analysis allows us to understand the changes in molecular structure caused by these alterations. *For more details, please refer to the PDF document or feel free to contact us.*

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Changes due to differences in acceleration voltage during EDX analysis.

Changes due to differences in acceleration voltage during EDX analysis.

Confirm changes due to differences in acceleration voltage! Analyze under appropriate conditions based on accumulated know-how!

When conducting EDX analysis, many people may analyze at high acceleration voltages to increase the detection sensitivity of elements. However, depending on the purpose, it is not always the case that high acceleration voltage analysis is preferable. White LEDs generate white light by combining blue LEDs with yellow phosphors (powder), and in this study, we examined how changing the acceleration voltage affects the surface analysis of these phosphors. Please take a moment to read this. [Contents] - Test sample (LED phosphor) - Surface analysis images at different acceleration voltages - Considerations from electron beam scattering regions using Monte Carlo simulations *For more details, please refer to the PDF document or feel free to contact us.

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[Data] Analysis of SEG-LCD Panel Display Malfunction

[Data] Analysis of SEG-LCD Panel Display Malfunction

We introduce case studies of comparative analysis conducted through chemical analysis, such as GC-MS analysis and ICP-AES analysis!

In the event of a display failure on a liquid crystal panel, it is necessary to clarify the cause in order to prevent recurrence. This document presents a case study comparing panel A, which exhibited display unevenness due to temperature stress, and panel B, which showed no display issues, through chemical analysis. Aites can investigate the cause through chemical analysis of the liquid crystal interior when initial analyses, such as observations, do not reveal any issues. We can also propose analytical methods tailored to the sample and purpose beyond the techniques mentioned here. [Contents] ■ Reliability Testing (80°C/Dry Conditions/1000 Hours) ■ Liquid Crystal GC-MS Analysis ■ Metal Element ICP-AES Analysis in Liquid Crystal ■ Summary *For more details, please refer to the PDF document or feel free to contact us.

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[Data] EPMA Analysis Example 2

[Data] EPMA Analysis Example 2

Analysis by EPMA can detect PET and PETH spectral crystals, allowing for peak separation of 17Cl and 47Ag!

EPMA has superior detection resolution compared to EDX. Even in cases where the detection positions of elements are close in EDX, making peak separation difficult, it may be possible to achieve peak separation with EPMA. This document introduces the peak separation of 47Ag and 17Cl. It includes cross-sectional observations of chip resistors, X-ray spectra of 47Ag, and mapping comparisons. [Contents] ■ Peak separation of 47Ag and 17Cl ■ X-ray spectrum of 47Ag ■ Mapping comparison *For more details, please refer to the PDF document or feel free to contact us.

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[Document] Mass Spectrometry Guide

[Document] Mass Spectrometry Guide

Analyze using information obtained from various analytical methods such as functional groups and skeletal structures! Introducing the mass spectrometry guide.

This document introduces a guide to mass spectrometry. In the analysis of organic compounds, information is obtained and analyzed from various analytical methods based on the functional groups, skeletal structures, and masses of the compounds. There are various methods for analyzing the mass of compounds, each with its own strengths in terms of the type of analysis and targets. Additionally, these methods can be selectively used according to the application or combined with other analytical techniques to obtain the necessary information. [Contents] ■ Methods mainly used in mass spectrometry - GC-MS - LC-MS - MALDI-TOFMS - GPC *For more details, please refer to the PDF document or feel free to contact us.

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[Case of EBSD] Comparison of two brass materials

[Case of EBSD] Comparison of two brass materials

Visualizing the differences between two samples based on differences in crystal structure! Introducing a case study of EBSD analysis.

Here is a case study comparing two types of brass with similar elemental compositions. When spectral analysis was performed using SEM-EDX, it was found that brass mainly consists of Cu (copper) and Zn (zinc), and the elemental compositions of both samples appeared to be relatively similar. Additionally, an EBSD analysis was conducted, and the phase map revealed the presence of a β phase with a different crystal structure in part of Sample 1. [Case Overview] <Comparison of Two Brass Materials through Elemental Analysis> ■ Analysis Method: SEM-EDX Analysis ■ Results - Spectral analysis indicated that brass mainly consists of Cu (copper) and Zn (zinc), and the elemental compositions of both samples appeared to be relatively similar. - Surface analysis was conducted for elements Cu and Zn, and no bias in the in-plane distribution was observed. *For more details, please refer to the PDF document or feel free to contact us.

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[Information] GC-MS Analysis Device Guide

[Information] GC-MS Analysis Device Guide

Introducing the sample introduction device and the types of analytical samples and analysis content that each device specializes in!

GC-MS analysis is a method commonly used for the analysis of organic components and organic structure analysis. With auxiliary devices, it is capable of a wide range of analyses, from low molecular substances like solvents to high molecular substances like plastics. In this document, we will introduce the sample introduction devices owned by Aites, as well as the types of analysis samples and analysis content that each device specializes in. We invite you to read it. 【Contents】 ■ Overview ■ Conditions ■ Samples ■ Data Obtained ■ Analysis Examples *For more details, please refer to the PDF document or feel free to contact us.

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Foreign substance analysis and component analysis: Comparison of micro-Raman and FTIR.

Foreign substance analysis and component analysis: Comparison of micro-Raman and FTIR.

Spectroscopic analysis is suitable for component analysis and qualitative analysis of foreign substances.

We will introduce the comparison between Raman spectroscopy analysis by Aites Co., Ltd. and FTIR. Spectroscopic analysis is suitable for component analysis of foreign substances and qualitative analysis. Both Raman and FT-IR can obtain spectra based on the structure of the analysis target. However, since each has its strengths and weaknesses, it is necessary to choose between the two depending on the analysis target. 【Features】 ■ Measurement in the order of several micrometers, which is difficult to analyze with IR, is possible. ■ No sampling is required. *For more details, please refer to the PDF materials or feel free to contact us.

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Example of analysis of compounds at the SAC solder and Ni pad interface.

Example of analysis of compounds at the SAC solder and Ni pad interface.

It is also possible to display various maps of each phase! Analysis is based on the information of the crystal structure possessed by the sample.

We will introduce an example of the analysis of compounds formed at the interface between Sn-Ag-Cu solder and NiP pads. At the interface between NiP pads and Sn-Ag-Cu solder, compounds such as (Ni,Cu)3Sn4 and (Cu,Ni)6Sn5 grow, and surface analysis using EDX shows the distribution of Ni, Cu, and Sn within these compounds. The EBSD method is an analytical technique based on the crystallographic information of the sample. By combining it with elemental analysis using EDX, it is possible to estimate the composition, and in some cases, analysis can be performed using the crystallographic data of Ni3Sn4 and Cu6Sn5 as substitutes. [Summary] < Elemental Analysis by EDX > - Surface analysis shows the distribution of Ni, Cu, and Sn within the compounds. < Crystallographic Orientation Analysis by EBSD > - By combining this with elemental analysis using EDX, it is possible to estimate the composition. - In some cases, analysis can be performed using the crystallographic data of Ni3Sn4 and Cu6Sn5 as substitutes. *For more details, please download the PDF or feel free to contact us.

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Automatic Dispensing Device Workstation Type 'ADS-384-24'

Automatic Dispensing Device Workstation Type 'ADS-384-24'

Due to its connectivity with robot systems and other features, it can meet various needs, including dispensing, thanks to its scalability.

The "ADS-384-24" is a dispensing device that enables a stage layout adaptable to various tasks through its 24 stages. By exchanging the dispensing head, it allows for dispensing into 1536 wells and achieves minimum micro-dispensing of 0.1μL. Additionally, it supports a double-range head, allowing for the use of two types of tips to accommodate a wide range of dispensing volumes from small to large. 【Features】 ■ Double-range head compatible ■ 0.1μL dispensing ■ 24 stages ■ For 1536/384/96 well plates ■ Dispensing head can be changed according to application *For more details, please refer to the PDF document or feel free to contact us.

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Automatic Dispensing Device Tabletop Standard Type 'EDR-384SX'

Automatic Dispensing Device Tabletop Standard Type 'EDR-384SX'

A space-saving, multifunctional, and low-cost automatic dispensing device! It can perform high-speed dispensing operations continuously.

The "EDR-384SX" is a compact workstation with a simultaneous dispensing type for 96/384/1536 wells, featuring a high-precision dispensing unit from the already well-received "EDR series" and equipped with 12 stages. When combined with the 0.1 to 5μl disposable tip BST-5, it achieves high-precision and reproducible dispensing of as little as 0.1μl. Additionally, it can connect up to two large-capacity stackers, each capable of holding approximately 50 microplates, allowing for continuous high-speed dispensing operations. 【Features】 ■ Supports 0.1μL ■ Compatible with double-range heads ■ For 96/384/1536 well plates ■ Cylinder/head can be easily exchanged with a one-touch mechanism ■ Various stage options available *For more details, please refer to the PDF materials or feel free to contact us.

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[LC/MS] Liquid Chromatography Mass Spectrometry

[LC/MS] Liquid Chromatography Mass Spectrometry

It is an analytical method that detects ions with a detector and performs qualitative and quantitative analysis.

Liquid chromatography (LC) is classified as a type of chromatographic method that separates components of a liquid sample based on chromatographic principles. The detection of the separated components using a mass spectrometer is referred to as liquid chromatography-mass spectrometry (LC/MS). LC/MS is an analytical technique for the qualitative and quantitative analysis of organic compounds. - Effective for analyzing components with relatively large molecular weights or relatively high polarity. - By selecting the ionization method, it can accommodate thermally unstable substances and others. - There are various ionization methods available, allowing detection using the most suitable ionization method for the component (Electrospray Ionization (ESI), Atmospheric Pressure Chemical Ionization (APCI), Atmospheric Pressure Photoionization (APPI)). - High mass resolution can be achieved using mass spectrometers that utilize the Time-of-Flight method.

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Differential Thermal Balance - Mass Spectrometry Method

Differential Thermal Balance - Mass Spectrometry Method

Measurement of weight change, differential thermal analysis, heat quantity, and mass of volatile components resulting from heating the sample.

TG-DTA simultaneously evaluates weight changes due to heating (TG) and thermal behavior of endothermic and exothermic reactions (DTA). Additionally, TG-DTA-MS continuously assesses volatile components (MS) along with TG and DTA evaluations. - TG allows for the detection of weight changes on the order of percentage. - DTA provides insights into reactions such as pyrolysis, melting, sublimation, oxidation, combustion, and phase transitions. - MS enables the structural estimation of volatile components and decomposition products.

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Treatment under non-atmospheric exposure

Treatment under non-atmospheric exposure

It is possible to evaluate the sample in its original state.

■Features ? By handling samples under atmospheric non-exposure, it is possible to minimize alteration and changes even for highly reactive samples. ? Cutting, peeling, and surface preparation under atmospheric non-exposure can reduce secondary contamination and oxidation from the atmosphere. ? Methods that can be evaluated under atmospheric non-exposure: SIMS, TOF-SIMS, AES, XPS, SEM, TEM, STEM, Raman, XRD, FIB, etc.

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[Analysis Case] Evaluation of the state of the organic thin film solar cell electrode interface and the dispersion state of the organic film.

[Analysis Case] Evaluation of the state of the organic thin film solar cell electrode interface and the dispersion state of the organic film.

It is possible to conduct a comprehensive evaluation analysis that minimizes the influence of the atmosphere.

Organic devices are devices that use materials susceptible to the effects of oxygen and water. At MST, we conduct analyses with sample transport, processing methods, and measurement environments that minimize atmospheric influences, allowing for evaluations closer to true conditions. We assessed the interface state between the organic film and the electrode using XPS analysis. We can confirm the composition and bonding state of the titania present on the surface of the organic film. Through TOF-SIMS analysis, we examined the dispersion state of P3HT (p-type organic semiconductor) and PCBM (n-type organic semiconductor) within the organic film of bulk and heterostructure organic thin-film solar cells in the depth direction.

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[Analysis Case] Evaluation of Element Distribution in Oxide ReRAM Operating Area Using SIMS

[Analysis Case] Evaluation of Element Distribution in Oxide ReRAM Operating Area Using SIMS

High-sensitivity evaluation of local elemental distribution in oxide devices using oxygen isotopes.

In oxide ReRAM, it was suggested that oxygen diffusion associated with the application of an electric field is related to memory operation (resistance change). Since SIMS analysis allows for the measurement of isotopes, utilizing the isotope 18O ion implantation technique enables the tracking of oxygen diffusion. For devices where 18O was locally implanted, a bridge structure that serves as the operating region was formed by applying an electric field, and elemental mapping revealed that the intensity of 18O in the bridge area was weak, indicating localized reduction.

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[Analysis Case] Evaluation of the Distribution of High Fatty Acids in Hair

[Analysis Case] Evaluation of the Distribution of High Fatty Acids in Hair

Visualization of the distribution of high-grade fatty acids.

Using TOF-SIMS for ion imaging analysis of hair (beard) cross-sections, we investigated the distribution of long-chain fatty acids, which are also detected as sebum. As a result, it was found that the distribution varies depending on the type of fatty acid.

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[Analysis Case] Elemental Analysis of Active Materials in Lithium-Ion Secondary Batteries

[Analysis Case] Elemental Analysis of Active Materials in Lithium-Ion Secondary Batteries

Dismantling and sampling can be performed in a non-exposed atmospheric environment, allowing for measurements that minimize degradation and alteration.

In AES (Auger Electron Spectroscopy), it is possible to perform elemental mapping (surface analysis) at sub-micron levels, allowing for clear confirmation of the elemental distribution in ternary materials (Co, Mn, Ni). Additionally, the distribution of carbon derived from binders and conductive additives can be measured with high sensitivity. In this study, a series of processes for the positive electrode active material were conducted in an atmosphere-free environment (inert gas atmosphere) until the introduction of the equipment, minimizing alterations during measurement. As a result, it was suggested that larger particles are LiCoO2, while smaller particles are LiCoxMnyNizO2 and LiMn2O4, indicating a non-uniform distribution of particles. Measurement methods: AES・SEM Product field: Secondary batteries Analysis purpose: Composition evaluation, identification, composition distribution evaluation For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of Composition Distribution in the Active Layer of Organic Thin-Film Solar Cells

[Analysis Case] Evaluation of Composition Distribution in the Active Layer of Organic Thin-Film Solar Cells

Preprocessing and depth direction analysis are possible under controlled atmosphere conditions.

In bulk heterojunction solar cells using p-type and n-type material active layers, it is necessary to properly control the mixing state of the materials within the film. After performing annealing treatment post-deposition, we conducted TOF-SIMS depth profiling analysis on samples that showed an improvement in photoelectric conversion efficiency along with an increase in fill factor without any change in open-circuit voltage. As a result, it was found that PCBM was segregated at the interface with the PEDOT:PSS layer before annealing.

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[Analysis Case] Evaluation of Interdiffusion Between Layers of CIGS Solar Cells Using SIMS

[Analysis Case] Evaluation of Interdiffusion Between Layers of CIGS Solar Cells Using SIMS

It is possible to achieve high-precision measurements that are not affected by surface irregularities.

In solar cells, surface roughness is utilized to effectively absorb sunlight. When conducting SIMS analysis, the surface roughness leads to a decrease in depth resolution. Measurements from the surface appear to show that elements like Cd, Zn, and O are diffusing into the CIGS layer due to the effects of surface roughness and knock-on (Figure 3), but measurements taken from the substrate side (back side) reveal that there is no significant diffusion of Cd, Zn, and O into the CIGS layer (Figure 4). In addition to interdiffusion, it is also possible to evaluate changes in the composition of the main components (Cu, In, Ga, Se) and the concentration distribution of impurities (B, Na, Fe).

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[Analysis Case] Evaluation of the State of the Electrode/Organic Layer Interface in Organic EL Devices

[Analysis Case] Evaluation of the State of the Electrode/Organic Layer Interface in Organic EL Devices

The process will be carried out from pretreatment to XPS measurement under an inert gas atmosphere.

We physically peeled off the buffer layer/Alq3 interface and conducted XPS analysis on the peeled surface (buffer layer side). By peeling in an inert gas atmosphere, we were able to expose the interface without destroying the chemical structure, and by transporting it to the XPS device while maintaining the inert gas atmosphere, we minimized post-peeling alterations (such as oxidation and moisture absorption). The main component of the buffer layer is LiF, and it was suggested that some of it may have oxidized. By controlling the atmosphere, it is possible to evaluate the oxidation states of metal elements such as Al and Li due to differences in film formation methods, treatment methods, and organic layers.

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[Analysis Case] Evaluation of SiON Film by SIMS

[Analysis Case] Evaluation of SiON Film by SIMS

Evaluation of nitrogen in SiON with a film thickness of approximately 1 nm is possible.

It is possible to evaluate the distribution of nitrogen in SiON films in the depth direction, even down to low concentration areas where high-sensitivity SIMS analysis excels, and to assess the amount of nitrogen (unit: atoms/cm²) with high precision (Figure 1). Additionally, nitrogen can be converted to atomic% (Figure 2), and a fitting curve for nitrogen can be calculated, allowing for the determination of nitrogen's peak concentration, depth, and half-width through fitting (Figure 3).

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[Analysis Case] Evaluation of B Penetration Amount from SSDP-SIMS Gate to Substrate

[Analysis Case] Evaluation of B Penetration Amount from SSDP-SIMS Gate to Substrate

Measurement avoiding the effects of surface irregularities and high concentration layers using SSDP-SIMS.

By conducting SIMS analysis (SSDP-SIMS) from the substrate side, it is possible to obtain measurements that are not affected by the knock-on effects from the high-concentration layer on the surface due to surface roughness and sputtering. We evaluated the amount of boron penetration from the gate electrode (B-doped Poly-Si) into the substrate. Measurements from the substrate side showed no effects from knock-on, indicating that a more accurate evaluation of the penetration amount is possible. Thus, SSDP-SIMS is effective for assessing the barrier properties of barrier metals, the incorporation of metals into Low-k films, and the evaluation just beneath the rough silicide.

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Improvement of depth resolution by vertical incidence method.

Improvement of depth resolution by vertical incidence method.

SIMS: Secondary Ion Mass Spectrometry

■Measurement Method for Depth Direction Distribution (1) Limitations of Depth Direction Resolution in Oblique Incidence Method The dependence of depth direction resolution on primary ion energy in the oblique incidence method was investigated using δ-doped samples (Figure 1). It was found that in the oblique incidence method, there is a limit to the improvement of depth direction resolution due to the roughness of the crater bottom (Figure 2). (2) Improvement of Depth Direction Resolution by Vertical Incidence Method Figure 3 shows the relationship between the half-width of the B peak (δ-doped sample) and primary ion energy in both vertical and oblique incidence methods. In the region below 1 keV of primary ion energy, where there were limitations in improving resolution with the oblique incidence method, improvements in resolution have been achieved with the vertical incidence method.

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[RBS] Rutherford Backscattering Spectrometry

[RBS] Rutherford Backscattering Spectrometry

It is a method for measuring the energy and intensity of ions scattered backward by Rutherford scattering after irradiating a solid sample with an ion beam.

RBS is a method that irradiates solid samples with ion beams (H+, He++) and measures the energy and intensity of ions scattered backward through Rutherford scattering. By measuring the kinetic energy of the scattered He ions and examining the mass number of the colliding atoms, it is possible to evaluate the components and layer structure of the analyzed sample. Additionally, by directing He ions at a solid sample and measuring the H ions scattered forward, it is also possible to assess the hydrogen concentration in the sample. This measurement technique is known as Hydrogen Forward-Scattering Spectroscopy (HFS). It is also referred to as Elastic Recoil Detection Analysis (ERDA). - Analysis of elements from B to U is possible (H is also possible through HFS) - Quantitative analysis can be performed without using standard samples - Depth profile of composition distribution can be obtained - Density can be calculated from film thickness information obtained by other methods - Sensitivity and accuracy tend to increase with heavier elements - Non-destructive analysis

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[Analysis Case] Composite Analysis of White Powder

[Analysis Case] Composite Analysis of White Powder

Identification of powders by FT-IR analysis and XRF analysis.

When analyzing and identifying unknown samples such as foreign substances, it is effective to analyze the data comprehensively from multiple measurement methods. We will introduce a case where FT-IR analysis, which is a vibrational spectroscopy method, was combined with XRF analysis, an elemental analysis method in the atmosphere, to identify two types of white powders.

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[Analysis Case] Evaluation of "Water" in Si Oxide Films and ITO Films using SIMS

[Analysis Case] Evaluation of "Water" in Si Oxide Films and ITO Films using SIMS

Depth-direction analysis of hydrogen using 'heavy water (D2O) treatment'

We will introduce a case where the permeability of water (H2O) in a thin film with a thickness of less than 1 µm was evaluated by measuring the distribution of deuterium (D) in the film. When hydrogen (H) is originally present in the thin film, it is difficult to distinguish whether the hydrogen is due to the influence of water. Therefore, treatment with heavy water (D2O) was performed, and the distribution of the naturally occurring isotope deuterium was measured in the depth direction using SIMS. By examining the depth distribution of deuterium, it is possible to estimate how deep the water has penetrated.

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[Analysis Case] Evaluation of Dopant Concentration Distribution in a-Si Thin Film Solar Cells Using SIMS

[Analysis Case] Evaluation of Dopant Concentration Distribution in a-Si Thin Film Solar Cells Using SIMS

Select measurement conditions according to the target element.

We will introduce a case where the concentration distribution of dopants in a-Si (amorphous silicon) was quantitatively evaluated in flexible thin-film Si solar cells. The sample, sealed with resin, was disassembled, and SIMS analysis was conducted. In the analysis of B (Figure 3), measurements were performed with enhanced depth resolution because it exists in shallow areas on the surface side. In the analysis of P (Figure 4), a large amount of H exists in a-Si, causing mass interference; therefore, measurements were conducted under conditions that separated H from Si using high mass resolution methods to detect only P.

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[Analysis Case] Depth Direction Analysis of Degradation Components in GCIB_Ar Cluster Organic Materials

[Analysis Case] Depth Direction Analysis of Degradation Components in GCIB_Ar Cluster Organic Materials

Component evaluation of organic EL layer structures and degradation layers using GCIB under controlled atmosphere.

This paper presents a case study analyzing the degradation components of organic materials that deteriorate due to atmospheric exposure, using GCIB (Ar cluster). The experiment utilized the organic EL material, Rubrene. Measurements of the atmosphere-exposed samples using TOF-SIMS revealed the presence of a mass (m/z 564) estimated to be Rubrene peroxide, as well as low molecular weight benzene-related masses (m/z 77, 105). It was confirmed that these degradation-related components exist at depths of approximately 1μm or more from the surface. *GCIB: Gas Cluster Ion Beam

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