<PDF Data Download Available> [XPS] Contamination Analysis of Polyimide Surfaces Using XPS
X-ray photoelectron spectroscopy (XPS) is ideal for analyzing surface contamination, discoloration, and other evaluations because it provides elemental information from the outermost surface of the sample (a few nm).
A defect occurred where the surface of the polyimide film became hydrophobic, but due to the depth of information obtained from SEM/EDX analysis, the specific elements present on the very surface could not be detected. Therefore, we conducted surface analysis using X-ray photoelectron spectroscopy (XPS), which is a surface-sensitive method. In this case, we will introduce "Surface Contamination Analysis of Polyimide by XPS." Please take a moment to read the PDF materials. Additionally, our company conducts various surface analyses including GD-OES and Auger, in addition to this WPS. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.
- Company:セイコーフューチャークリエーション
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