Analytical Equipment Product List and Ranking from 260 Manufacturers, Suppliers and Companies

[Analysis Case] Evaluation of the Component 18-MEA on Hair Surface

It is possible to evaluate 18-MEA, a component of the hair surface, using TOF-SIMS.

The surface of the hair cuticle is covered with a lipid called 18-MEA (18-methyl eicosanoic acid). 18-MEA is said to be the source of hair shine and smoothness, and when it decreases due to UV rays or hair coloring, the cuticle becomes more susceptible to damage. In this case, we will present the results of evaluating the differences in 18-MEA on the surfaces of healthy hair (hair near the root that has not been treated with hair color) and damaged hair (hair that has been treated with hair color) using TOF-SIMS.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement
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[Analysis Case] Analysis of α-Alumina (α-Al2O3) by TDS

Thermal desorption gas analysis of ceramics

Thermally stable α-alumina is used in a wide range of applications, including heat-resistant materials, semiconductor packages, and components of semiconductor manufacturing equipment. Among these, dense α-alumina is also used as a material for vacuum devices. However, the gases generated when such materials are heated can adversely affect products and equipment, making it important to understand the outgassing from these materials. In this report, we present a case study comparing the outgassing amounts of porous and dense α-alumina using TDS analysis (temperature-programmed desorption gas analysis).

Company：一般財団法人材料科学技術振興財団　MST
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Contract Analysis
Contract measurement
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[Analysis Case] Component Evaluation of Positive and Negative Electrode Binders in Secondary Batteries

Identification of organic substances using TOF-SIMS and GS/MS.

The binder for lithium-ion secondary batteries not only serves as an adhesive between active materials but also needs to be insoluble in the electrolyte. Therefore, the selection of suitable materials for both the positive and negative electrodes is crucial. This document presents cases where the components of the binders used in each electrode sheet were identified by measuring the positive electrode binder using TOF-SIMS and the negative electrode binder using GC/MS, and then comparing the results with a materials library database.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement
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[Analysis Case] XPS Analysis of Metal Pipe Inner Wall Using Combined Cutting Processing

We provide one-stop solutions from sample cutting processing to investigating the causes of discoloration and corrosion.

The inner walls of metal pipes, such as SUS, used in various fields can discolor and corrode due to reactions with incoming gases and liquids, leading to a decline in equipment functionality. Understanding the locations prone to discoloration and corrosion, as well as their causes, is an important issue in equipment maintenance. At MST, we provide a comprehensive evaluation from sample cutting to analysis. This document presents a case study of XPS analysis conducted on the inner walls of SUS pipes used in vacuum equipment, highlighting both normal and discolored areas.

Company：一般財団法人材料科学技術振興財団　MST
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Contract Analysis
Contract measurement
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[Analysis Case] Comprehensive Evaluation of Positive Electrode Active Materials in Secondary Batteries

Proposing an evaluation that combines structure, composition, and electricity to solve development issues.

This article introduces a case study evaluating the surface morphology, cross-sectional structure, components, composition, crystal structure, and resistance value distribution of Li(NiCoMn)O2 (NCM), which is used as a positive electrode in lithium-ion secondary batteries. Based on a comprehensive evaluation of structure, composition, and electrical properties, MST proposes assessments suitable for solving development challenges aimed at improving characteristics and enhancing reliability.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement
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[Analysis Case] Depth Direction Analysis of Components in SiON Ultra-Thin Films

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

The SiON film used as the gate oxide film for Si transistors is formed by introducing nitrogen into the Si oxide film to suppress leakage current. To ensure a good interface characteristic with the substrate while maintaining the dielectric constant, it is necessary to strictly control the distribution of nitrogen in the SiON film. We will present a case study evaluating the distribution of silicon oxide and nitride in a 1nm thick SiON film using TOF-SIMS. TOF-SIMS has high depth resolution on the surface and can obtain molecular information with good sensitivity, allowing for a clear understanding of the compositional distribution in the ultra-thin SiON film.

Company：一般財団法人材料科学技術振興財団　MST
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Contract measurement
Transistor
Memory
Analytical Equipment

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Accelerating research and development, [new] surface analysis service launched!

Not only the surface, but also up to a depth of 30nm - Quantitative evaluation of the chemical state at the surface and inside the material at the same location and non-destructively!

We have launched a new service using XPS/HAXPES starting in June! For increasingly complex materials and fine structure samples, we can evaluate the composition and chemical bonding states from the surface to the interior of the material (up to ~30nm) at the same location and in a non-destructive manner. - Depending on the elements of interest and the analysis area and depth, we can select the appropriate X-ray source (Al Kα/Mg Kα/Ga Kα/Cr Kα) to achieve evaluation under suitable measurement conditions. - Non-exposure measurements to the atmosphere, Ar monomer/GCIB sputter etching, and heating pretreatment can be combined. - It is possible to evaluate the electronic states of semiconductor samples using UPS/LEIPS (ionization potential/electron affinity/band gap).

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Secondary Cells/Batteries
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[Analysis Case] Evaluation of Metal Impurities in the Metal Film and Interface of the Device

Impurities in films and interfaces such as plating can be evaluated using TOF-SIMS.

Impurities from components of the film formation device, target materials, and plating solutions can contaminate the device and have adverse effects, making the qualitative assessment of impurities on surfaces, within films, and at interfaces important. TOF-SIMS can sensitively evaluate unknown elements present on surfaces, within films, and at interfaces in a single measurement due to the following three characteristics: 1. For metallic elements, ions from m/z 1 to 800 can be detected simultaneously in one measurement. 2. Detection sensitivity of a few ppm can be achieved (varies depending on materials and ions). 3. The use of a sputter gun allows for the evaluation of depth distribution.

Company：一般財団法人材料科学技術振興財団　MST
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Wafer
Contract measurement
Other semiconductors
Analytical Equipment

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[Analysis Case] Qualitative Analysis of Fluorinated Gases

Qualitative analysis of specific freons (CFC/HCFC) and alternative freons (HFC) is possible.

Freon gases are utilized in various applications such as refrigerants, foaming agents, semiconductors, and cleaning agents for precision parts due to their chemically stable nature and minimal impact on human health. On the other hand, they are substances that contribute to ozone layer depletion and global warming, which is why they are regulated by law. In this case, Freon gases were analyzed using GC/MS, and the separation analysis of CF4, which has low polarity and is difficult to separate among PFCs, was conducted. By using GC/MS, it is possible to qualitatively analyze specific Freons such as CFCs, HCFCs, and alternative Freons like HFCs and PFCs.

Company：一般財団法人材料科学技術振興財団　MST
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Contract measurement
Environmental Analysis
Analytical Equipment

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[Analysis Case] Metal Contamination Analysis of Si Wafer Surface (B0233)

It is possible to obtain a large amount of metal element information at once through qualitative and semi-quantitative analysis!

We offer metal contamination analysis of Si wafers (B0233). The purpose of metal contamination analysis of Si wafer surfaces using ICP-MS includes not only the contamination assessment of the Si wafer itself but also the evaluation of contamination within semiconductor devices and the assessment of the working environment due to Si wafer exposure. Therefore, the analysis of Si wafer surfaces is conducted for various purposes. ICP-MS analysis allows for the highly sensitive measurement of metal contamination on Si wafer surfaces, and it is also possible to specify the evaluation area according to the purpose. [Measurement Method] ■ [ICP-MS] Inductively Coupled Plasma Mass Spectrometry *For more details, please download the PDF or feel free to contact us.

Company：一般財団法人材料科学技術振興財団　MST
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Contract Analysis
Analytical Equipment

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[Analysis Case] Precursor Adsorption Simulation in ALD Film Formation

Information on the activation energy and reaction heat during precursor adsorption on the substrate can be obtained!

Our organization is conducting simulations of precursor adsorption in ALD film deposition using first-principles calculations. ALD (Atomic Layer Deposition) is a film deposition technology that utilizes continuous chemical reactions in the gas phase. It is widely used in the semiconductor field, where fine processing is required, due to its ability to precisely control film thickness, operate at low temperatures, and provide good step coverage. In general, to understand the differences in film deposition rates between different substrates in the slow deposition process of ALD, it is necessary to elucidate the precursor adsorption mechanisms on the substrate. [Measurement Methods and Processing Techniques] ■ Computational Science, AI, Data Analysis *For more details, please download the PDF or feel free to contact us.

Company：一般財団法人材料科学技術振興財団　MST
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Contract Analysis
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[Analysis Case] Oil Analysis (GC/MS Edition)

When oil contamination is suspected, it is possible to distinguish between types of oil and estimate the source!

Our organization is capable of identifying the composition of petroleum products, evaluating molecular weight distribution, and distinguishing types of oils. Petroleum products such as oils and greases are mixtures of hydrocarbons with various compositions, and GC/MS methods are effective for their qualitative analysis. Here, we present a case study where commercially available oils with different molecular weight distributions were measured using soft ionization methods. Compared to hard ionization methods (EI), soft ionization methods (FI and FD) allow for the detection of molecular ions, making them effective for evaluating the composition of oil components. In particular, the FD method can also be applied to evaluate oils containing high molecular weight components that are difficult to volatilize. [Measurement Method / Processing Method] ■ [GC/MS] Gas Chromatography Mass Spectrometry *For more details, please download the PDF or feel free to contact us.

Company：一般財団法人材料科学技術振興財団　MST
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Contract Analysis
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[Analysis Case] Depth Direction State Evaluation of Tin (Sn) Surface

Evaluation of modified layers and altered layers through surface treatment is possible!

TOF-SIMS has good depth resolution and can obtain fragment ions corresponding to bonding states, allowing for the evaluation of layer structures near the surface, within a few nanometers. This document presents a case study analyzing the layer structure of a tin plate surface based on the information obtained from the measurement of standard samples of tin oxide and hydrated tin oxide. By applying this technology, it is possible to evaluate modified layers and altered layers due to surface treatment.

Company：一般財団法人材料科学技術振興財団　MST
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Contract measurement
Contract Inspection
Analytical Equipment

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[Analysis Case] Investigation of Foreign Object Occurrence: Analysis of the Tube

It is possible to estimate the cause of wafer contamination!

TOF-SIMS is a very effective method for investigating the causes of contamination due to foreign substances, deposits, dirt, discoloration, and other factors related to the process. By comparing the mass spectral information obtained from contamination such as foreign substances with the mass spectral information of candidate contamination source components, it is possible to infer the sources of that contamination. In this document, we prepared four types of resin tubes used in the wafer manufacturing process and foreign substances on Si wafers, and by comparing their mass spectral information, we evaluated which components used in the process the contamination from the foreign substances was attributed to.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract measurement
Contract Inspection
Time-of-flight mass spectrometer
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[Analysis Case] Contamination Analysis in Vacuum Equipment

It is possible to evaluate the causes of contamination in vacuum devices, such as oil backs and grease!

Vacuum devices that utilize the characteristic of low gas molecular density in a space are used in various applications such as thin film formation and surface analysis in the manufacturing process of electronic components. Since the chamber of a vacuum device is a closed space, the presence of trace amounts of molecules can easily cause contamination within the device. To suppress contamination, it is necessary to conduct investigations to identify contamination sources such as pumps, devices, and samples. This document presents a case study investigating contamination within a vacuum device using TOF-SIMS.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract measurement
Surface treatment contract service
Time-of-flight mass spectrometer
Analytical Equipment

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Supercritical fluid chromatography-mass spectrometry method

Supercritical fluid chromatography is a method that uses supercritical CO2 as the mobile phase to separate components contained in a sample and detect them with a mass detector.

■What is Supercritical Fluid? A supercritical fluid is a state that exists under conditions of temperature and pressure above the critical point, possessing properties that are intermediate between those of a liquid and a gas (see Figure 1). Supercritical CO2 can be used as a mobile phase in chromatography due to its ease of handling at conditions (7.4 MPa, 31°C). ■Extraction Using Supercritical CO2 In the SFC/MS setup, SFE (Supercritical Fluid Extraction) is connected in the preceding stage, and extraction of components contained in the sample is performed using supercritical CO2. Since the extraction, separation, and detection can be carried out automatically, it is effective for the analysis of components that are sensitive to light, water, and oxygen.

Company：一般財団法人材料科学技術振興財団　MST
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Utilization of ALPHA and OPUS/QuickCompare

[Free Technical Data Giveaway] Smart Quality Control of Raw Materials.

In the manufacturing field of products, quality control can be considered one of the important issues. Its purpose is to prevent troubles in the manufacturing process in advance and to consistently guarantee a certain level of quality for the final product. In response to such needs, infrared spectroscopy can be said to be one of the suitable analytical methods in terms of speed, operability, and reliability. This document introduces the identification analysis of raw materials using our compact FT-IR "ALPHA" and the QuickCompare function included in the accompanying "OPUS/QuickCompare" software. [Contents] ■ Introduction ■ Infrared Spectrum and Quality Control ■ Quality Control with ALPHA ■ Identification Analysis Using the QuickCompare Function ■ Conclusion *For more details, please refer to the PDF document or feel free to contact us.

Company：ブルカージャパンオプティクス事業部
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Analytical Equipment and Devices
Analytical Equipment

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FT-IR imaging microscope "LUMOS II"

It is possible to conduct a chemical evaluation of non-uniform samples easily and accurately.

"LUMOS II" makes it possible to conduct micro-infrared spectroscopy and imaging analysis more easily, quickly, and comfortably. It demonstrates high performance in all measurement modes: transmission, reflection, and ATR (attenuated total reflectance). One of its features is the ease of access provided by the long working distance objective lens, along with an automated sample stage where all operations are electric. 【Features】 ■ Outstanding imaging performance with advanced FPA ■ High-quality spectral and image data ■ High-speed imaging and mapping capabilities: covering large areas in a short time ■ FTIR imaging compatible with transmission, reflection, and ATR measurement modes ■ Achieves high-sensitivity measurements without liquid nitrogen *For more details, please refer to the PDF document or feel free to contact us.

Company：ブルカージャパンオプティクス事業部
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Optical microscope
Analytical Equipment

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FT-IR imaging microscope "LUMOS II"

Are you having trouble with micro-particle analysis? 'LUMOS II' will solve it!

Are you having trouble with micro-sample analysis? - Can't prepare liquid nitrogen, it's a hassle The 'LUMOS II' features an electronic cooling MCT detector that does not require liquid nitrogen. - I want a micro-IR that is easy to use even for beginners The 'LUMOS II' offers fully automated operation, making it accessible for beginners. Additionally... - Is there a micro-IR with better image quality? - I would like to try high-speed imaging functions, etc. The 'LUMOS II' makes micro-infrared spectroscopy and imaging analysis easier, faster, and more comfortable. With a long working distance objective lens for easy access, it also features an automated sample stage where all operations are motorized. **Features** - Achieves high-sensitivity measurements without liquid nitrogen - Outstanding imaging performance with advanced FPA - High-quality spectral and image data - High-speed imaging and mapping functions: covers large areas in a short time - FTIR imaging that supports transmission, reflection, and ATR measurement modes

Company：ブルカージャパンオプティクス事業部
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Optical microscope
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【NEW!!】FT-IR Imaging Microscope 'LUMOS II'

【Equipped with high-speed imaging and high-speed mapping capabilities】FTIR imaging is now faster, more comfortable, and more accurate than ever!

"LUMOS II" is a high-speed imaging compatible FPA detector. With a guide function that can be used by anyone, from beginners to advanced users, regardless of their analytical skill level, it allows all users to utilize it quickly, comfortably, and accurately. Additionally, imaging can be performed in all measurement modes, enabling easy and accurate chemical evaluation of heterogeneous samples such as tablets, polymer materials, and the dispersion state of contaminants. 【Features】 ■ High-speed imaging and high-speed mapping function: covers wide areas in a short time ■ Excellent imaging performance with advanced FPA ■ High-quality spectral and image data ■ FTIR imaging compatible with transmission, reflection, and ATR measurement modes ■ Achieves high-sensitivity measurements without liquid nitrogen *For more details, please refer to the PDF materials or feel free to contact us.

Company：ブルカージャパンオプティクス事業部
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Optical microscope
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High-performance process gas analysis FT-IR MATRIX-MG5

Low-capacity, high-speed replacement gas cell! Measurement is possible without calibration and without background measurement.

The "MATRIX-MG5" is a product with a wide measurement concentration range equipped with a RockSolid interferometer. Calibration is not required, and it features a compact and robust housing. Measurements can be taken without background measurement. Additionally, the software "OPUS GA" of this product is equipped with a user interface optimized for process monitoring, allowing for instant grasp of process gas measurement results on a trend chart screen, and analysis of the correlation between measurement results and absorption spectra on the spectrum screen. 【Features】 ■ Equipped with RockSolid interferometer ■ No calibration required ■ Measurements possible without background measurement ■ Easy operation and maintenance ■ Wide measurement concentration range ■ Compact and robust housing ■ Low volume, high-speed replacement gas cell *For more details, please refer to the PDF document or feel free to contact us.

Company：ブルカージャパンオプティクス事業部
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Analytical Equipment and Devices
Analytical Equipment

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Effective for exhaust gas measurement! High-performance gas analyzer FT-IR "MATRIX-MG"

Verified through the "EURO6" measurement tests for phased automobile emissions regulations in the EU.

Are you familiar with the phased automotive exhaust gas regulation "EURO6" implemented by the EU (European Union)? Bruker's high-performance FT-IR gas analysis device "MATRIX-MG" has been validated in actual measurement tests for EURO6. We introduce the pinnacle of FT-IR gas analysis equipment, featuring a compact design that can be loaded onto a vehicle's cargo bed and unparalleled high resolution. ■ Features of MATRIX-MG - Achieves qualitative and quantitative gas analysis quickly, continuously, and automatically - Exceptional sensitivity, capable of detecting from a few ppb to 100% - Wide detectable range - No calibration required for target gases - Easy operation and maintenance - Automatic correction for the influence of gases and interfering components in the atmosphere - Gas cell with temperature control function capable of heating up to 191°C - Continuous monitoring of temperature and pressure within the gas cell, providing feedback for quantitative analysis - Measurement results can be output to industrial communication interfaces

Company：ブルカージャパンオプティクス事業部
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Analytical Equipment and Devices
Analytical Equipment

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Compact FT-IR Spectroscopic Analyzer "ALPHA II"

Stable results and high reliability! The compact design, equivalent to one A4 sheet of paper, allows for effective use of lab space.

"ALPHA II" is a chemical analysis device that rapidly performs qualitative and quantitative analysis of various samples. With a robust and sophisticated design, it features touch-operated software. New users can be trained in just a few minutes, and centralized data management is also possible. Additionally, it maximizes analytical work efficiency with simple operability without wasting valuable space in the laboratory. 【Features】 ■ Sampling modules that accommodate various applications ■ Long-lasting components (up to 10-year warranty) ■ Pre-set analytical workflows ■ Integrated panel PC option ■ High humidity environment compatibility option ■ Effective use of lab space *For more details, please refer to the PDF materials or feel free to contact us.

Company：ブルカージャパンオプティクス事業部
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Analytical Equipment and Devices
Analytical Equipment

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Technical Documentation: System Validation BRAVO

Minimize compliance costs! We provide comprehensive system eligibility assessments.

This document introduces the system validation of "BRAVO." It includes information on "Performance Qualification," "Data Integrity," and "Ready-to-Use System Qualification." The optical system of BRAVO is designed to achieve the highest standards of accuracy and can meet the stringent performance evaluation criteria set for benchtop devices (Ph.Eur.) and quantitative analysis (USP). [Contents] ■ Concept ■ Validated Solutions ■ 21 CFR Part 11 and Beyond ■ Performance Qualification – USP <858> & <1858>, Ph.Eur. 2.2.48, JP 2.26 ■ Data Integrity ■ Ready-to-Use System Qualification *For more details, please refer to the PDF document or feel free to contact us.

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Spectroscopic Analysis Equipment
Analytical Equipment

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Technical Data: Analysis of Biological Tissues Using Infrared Laser/QCL Imaging

The best tool for life sciences and medical fields, especially for tissue analysis.

By utilizing the high energy density of infrared lasers, it is possible to obtain high-quality spectral data in a very short time. This speed advantage is significant, allowing for the acquisition of spectral images at an unprecedented pace compared to traditional methods. This application note explains the benefits of infrared laser imaging and its applications. In this document, we clearly explain: 　▶　Infrared Laser Imaging: A New Analytical Tool 　▶　How to Apply Infrared Laser Imaging 　▶　FT-IR vs. Infrared Laser Imaging: Biological Tissue Samples 　▶　Innovations in Laser Imaging: Spatial Coherence Reduction Mechanisms

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Analytical Equipment and Devices
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Technical Data: Quantitative FT-IR Gas Analysis Without Calibration Curve Creation

FT-IR with excellent qualitative capabilities! It can accurately and in real-time quantify the concentration of each component.

FT-IR is a powerful tool that can qualitatively and quantitatively analyze the components of unknown gas by analyzing the infrared spectrum unique to the compound. The high selectivity and sensitivity of FT-IR ensure the reliable detection of trace amounts of infrared-active compounds even in mixed gases containing multiple components across a wide concentration range. This document includes topics such as "Gas Quantitative Analysis using FT-IR" and "Verification of OPUS GA Analysis Accuracy." We invite you to read it. [Contents] ■ Gas Quantitative Analysis using FT-IR ■ High-precision quantitative analysis without a calibration curve ■ Verification of OPUS GA Analysis Accuracy ■ Advantages of gas analysis without a calibration curve *For more details, please refer to the PDF document or feel free to contact us.

Company：ブルカージャパンオプティクス事業部
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Analytical Equipment and Devices
Analytical Equipment

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『FT-IR 基礎と応用セミナー』開催のご案内

2024/7/12(金)13：00～16：30、ブルカージャパン横浜本社ラボ(B号ビル6階)にて開催！

ブルカージャパン株式会社は、ブルカージャパン横浜本社ラボにて、『FT-IR 基礎と応用セミナー』を開催いたします。 FT-IRは、分子構造の解析や定性・定量分析の有力な手段として、品質管理から研究開発まで、様々な分野で広く使われている分析機器です。一方、その基本原理を良く知らないまま使われている現状もあります。本セミナーは、FT-IRの基礎を学んでいただける、初級・中級レベルの講習会です。現在FT-IRをお使いの方は、さらなる有効活用を考える機会として、また今後FT-IRの導入をお考えの方は、自社の目的に合致した機種・仕様を考える機会として、本セミナーを是非ご活用ください。【開催概要】 ■日時：2024/7/12(金) 13：00～16：30 ■会場：ブルカージャパン横浜本社ラボ(B号ビル6階) ■参加費：無料(申込み先着順) ■定員：30名 ※詳しくは関連リンクをご覧いただくか、お気軽にお問い合わせ下さい。

Company：ブルカージャパンオプティクス事業部
Price：Other

Analytical Equipment and Devices
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Technical Data: Feed Raw Material FT-NIR Analysis

Contributing to the optimization of raw materials, feed formulation, manufacturing processes, and the quality of the final product!

Our company provides a comprehensive FT-NIR solution for quality control and formulation adjustment. Samples can be analyzed non-destructively in just a few seconds, reducing costs by decreasing time and reagent usage. Liquid samples such as oils and molasses can also be analyzed using the same device when placed in disposable vials. Additionally, Bruker offers FT-NIR calibration packages to accommodate the analysis of various raw materials in the feed industry. 【Standard Analysis Items】 ■ Moisture ■ Crude Fat ■ Crude Fiber ■ Crude Protein ■ Crude Ash *For more details, please refer to the PDF materials or feel free to contact us.

Company：ブルカージャパンオプティクス事業部
Price：Other

Spectroscopic Analysis Equipment
Analytical Equipment

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Technical Data: Monitoring of Frying Oil Using FT-NIR

A valuable tool for food quality assurance and health authorities to verify the degree of fat deterioration!

Using FT-NIR spectroscopy, various quality parameters associated with the degradation of frying oil can be evaluated quickly and at low cost. Bruker has collaborated with multiple food regulatory agencies to collect over 300 samples of fats used in fried potatoes, potato chips, fish, chicken, and donuts. Statistical evaluations have shown that the measured FT-NIR spectra have a high correlation with existing official methods. Since FT-NIR can simultaneously determine important indicators related to oxidation and polymerization, it has become a valuable tool for food quality assurance and health authorities to assess the degree of fat degradation. **Monitoring Indicators** - Acid Value (AV) - Anisidine Value (AnV) - Polar Compounds (TPC) - Polymerized Triacylglycerols (DPTG) *For more details, please refer to the PDF document or feel free to contact us.*

Company：ブルカージャパンオプティクス事業部
Price：Other

Spectroscopic Analysis Equipment
Analytical Equipment

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