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Diffraction Equipment Product List and Ranking from 10 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Diffraction Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  3. スペクトリス株式会社 マルバーン・パナリティカル事業部 Hyogo//Testing, Analysis and Measurement
  4. null/null
  5. 5 シエンタ オミクロン Tokyo//Testing, Analysis and Measurement
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Diffraction Equipment Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. ARL EQUINOX 100 X-ray diffractometer (XRD) サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  2. Multipurpose X-ray diffraction device Empyrean スペクトリス株式会社 マルバーン・パナリティカル事業部
  3. X-ray diffraction method 一般財団法人材料科学技術振興財団　MST
  4. Fully Automatic Multi-Purpose X-ray Diffraction System: XRDynamic 500
  5. 4 Low-Energy Electron Diffraction Device 'LEED' シエンタ オミクロン

Diffraction Equipment Product List

16～30 item / All 32 items

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[EBSD] Electron Backscatter Diffraction Method

[EBSD] Electron Backscatter Diffraction Method

It is possible to easily obtain crystal information over a wide area.

This is a method for orientation analysis of crystalline samples using EBSD. It allows for easier and broader acquisition of crystal information compared to electron diffraction methods. EBSP: Electron Backscatter Pattern, also referred to as SEM-OIM or OIM. - Measurement of the surface orientation of single crystal grains is possible. - Orientation measurement of the measurement area is possible. - Observation of crystal grain size is possible. - Observation of twin grain boundaries (corresponding grain boundaries) is possible. - Extraction of specific crystal orientations is possible. - Measurement of the rotation angle of adjacent crystal grains is possible. - Evaluation of grains larger than 10 nm is possible using transmission methods.

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  • Contract Analysis
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[Analysis Case] Distortion Analysis in the Field of Element Separation

[Analysis Case] Distortion Analysis in the Field of Element Separation

NBD: Strain analysis of micro-regions using Nano Beam Diffraction.

The NBD method allows us to gain insights into lattice strain from the changes in the diffraction angle of the electron beam (positions of electron diffraction spots) within the sample. Measurements can be conducted in any arbitrary crystal axis incident direction, tailored to the device pattern. Results measured on the Si substrate in the element separation region (around LOCOS) confirmed that the strain varies depending on the heat treatment temperature and crystal orientation.

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[ED] Electron Diffraction Method

[ED] Electron Diffraction Method

ED is a method for investigating crystal structures from diffraction patterns obtained by irradiating a sample with an electron beam.

ED is a method for investigating crystal structures from diffraction patterns obtained by irradiating a sample with an electron beam. - Crystallographic information about the material can be obtained. In the case of a transmission electron microscope, a single crystal shows regularly arranged diffraction spots, a polycrystal shows concentric circular rings, and an amorphous material shows broad circular electron diffraction patterns. - It is possible to examine the crystal structure of small regions observed with a transmission electron microscope. - By combining the crystal structure with elemental analysis results from the EDX method, it is also possible to identify materials that possess crystallinity.

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[Analysis Case] Local Crystal Structure Analysis of IGZO Film

[Analysis Case] Local Crystal Structure Analysis of IGZO Film

Continuous evaluation of crystallinity and orientation using electron diffraction.

IGZO films are materials that are being researched and developed as TFT materials for displays. The presence or absence of crystalline structure in the thin film may affect the TFT characteristics and reliability, necessitating local crystalline evaluation within the device. We will introduce a case where the crystalline structure in IGZO films was continuously evaluated using electron diffraction measurements from TEM.

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[Analysis Case] Measurement of Residual Stress in Metal Materials Before and After Load Application Using XRD

[Analysis Case] Measurement of Residual Stress in Metal Materials Before and After Load Application Using XRD

It is possible to quantitatively measure tensile and compressive stress non-destructively.

Residual stress measurement is one of the important methods to investigate whether a component can withstand various stress conditions. In XRD (X-ray diffraction), it is possible to determine residual stress by measuring the lattice spacing. This document introduces a case where a sample of aluminum plates with V-shaped processing on both sides was created for tensile testing, and a comparison of residual stress before and after applying tensile load using a tensile testing device, as well as the distribution of residual stress in the sample after application, was confirmed. The residual stress values were determined using the sin²ψ method. For more details, please download the document or contact us.

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[Analysis Case] Degradation Assessment of Cathode Active Material in Secondary Batteries

[Analysis Case] Degradation Assessment of Cathode Active Material in Secondary Batteries

Evaluate the degradation state of active materials from the crystal structure.

The positive electrode active material of lithium-ion secondary batteries, LiCoO2, undergoes changes in crystal interlayer spacing and other characteristics due to lithium intercalation during charge and discharge. It is also known that overcharging and long-term cycling tests can significantly alter the composition and crystal structure, leading to a decline in charge and discharge characteristics. In this presentation, we will introduce cases where these changes were evaluated using XRD and Raman spectroscopy. Furthermore, by conducting in situ (operando) XRD measurements, it is also possible to evaluate the crystal structure at various states of charge (SOC). Measurement methods: XRD, Raman, SEM Product field: Secondary batteries Analysis purposes: Composition evaluation and identification, composition distribution evaluation, shape evaluation, structural evaluation, product investigation For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of Hierarchical Structure of Polymer Materials Using X-ray Diffraction and Scattering Techniques

[Analysis Case] Evaluation of Hierarchical Structure of Polymer Materials Using X-ray Diffraction and Scattering Techniques

Structural analysis of lamellae and similar structures is possible! Similar evaluations can be performed using WAXS (Wide-Angle X-ray Scattering).

Our organization conducts evaluations of the hierarchical structure of polymer materials using X-ray diffraction and scattering techniques. It is known that the differences in higher-order structures created by amphiphilic substances affect the moisturizing and permeability properties of skin tissue, making it important to understand these structures in order to evaluate the functionality of the materials. We will introduce examples of evaluating the hierarchical structure of polymers using XRD (X-ray diffraction) for structures on the order of a few nanometers and SAXS (small-angle X-ray scattering) for structures on the order of several tens of nanometers. 【Measurement and Processing Methods】 ■ [XRD] X-ray Diffraction ■ [SAXS] Small-Angle X-ray Scattering *For more details, please download the PDF or feel free to contact us.

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Observation of the metal structure of wire (spring material) using DL/EBSD.

Observation of the metal structure of wire (spring material) using DL/EBSD.

Observing metal microstructures with EBSD allows for smooth consideration of material selection and changes.

Electron Backscatter Diffraction Pattern (EBSD) allows for the following when combined with a Scanning Electron Microscope (SEM): - Separation of phases with different crystal systems - Distribution ratio and crystal orientation analysis for each separated phase In this case, we introduce "metal microstructure observation of wire (spring material) using EBSD." We investigated the changes in metal microstructure during the processing of spring material (drawing with a diameter of Φ1.00mm and 0.07mm) and confirmed that the metal microstructure changes after drawing. This measurement technique is very useful for selecting metal materials and comparing during material changes. We encourage you to give it a try. Additionally, our company conducts various cross-sectional analyses using TEM and surface analysis using XPS, allowing for multifaceted analytical assessments. Both sales and technical staff are available to assist directly, so please feel free to consult with us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/

  • Other metal materials
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  • Other microscopes

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[Data Download Available/EBSD] Evaluation of Aluminum Sputter Films Using EBSD

[Data Download Available/EBSD] Evaluation of Aluminum Sputter Films Using EBSD

The electron backscatter diffraction method (EBSD) is useful for evaluating the performance of aluminum sputter films and selecting substrate materials.

Electron Backscatter Diffraction Pattern (EBSD) can be combined with Scanning Electron Microscopy (SEM) to enable the following: ● Measurement of the shape and orientation of micro-regions of crystal grains ● Confirmation of the orientation of crystals relative to a reference orientation ● Measurement of internal strain in materials from information on crystal orientation differences In this case, we introduce "Evaluation of Aluminum Sputter Films Using EBSD." This measurement technique is useful for evaluating the performance of aluminum sputter films and for substrate selection. It can also be applied to ceramic materials if there is orientation evaluation and crystallinity. We encourage you to give it a try. In addition to EBSD and SEM, our company also conducts various cross-sectional analyses using TEM and surface analysis using XPS, allowing for multifaceted analytical evaluations. Both sales and technical staff are available to assist directly, so we would appreciate it if you could feel free to consult with us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/

  • Other metal materials
  • Sputtering Equipment
  • Ceramics

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Data DL available: EBSD Measurement of Samarium Cobalt Magnet

Data DL available: EBSD Measurement of Samarium Cobalt Magnet

The orientation distribution of the magnet can be understood through SEM and EBSD, allowing for the assessment of product performance and changes over time.

Electron Backscatter Diffraction Pattern (EBSD) allows for the understanding of the crystal orientation distribution of materials when combined with a Scanning Electron Microscope (SEM). This case introduces "EBSD measurement of samarium cobalt magnets." Many customers are utilizing this technology for performance evaluation and improvement of various magnets. Please take a look at the PDF materials. In addition to EBSD and SEM, our company also conducts various cross-sectional analyses using TEM and surface analysis using XPS, providing multifaceted analytical services. Both sales and technical staff are available for direct assistance, so we would be grateful if you could feel free to consult with us. Seiko Future Creation Official Website: https://www.seiko-sfc.co.jp/

  • Other metal materials
  • magnet
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Low-Energy Electron Diffraction Device 'LEED'

Low-Energy Electron Diffraction Device 'LEED'

An electron gun with a diameter of 10mm obtains a LEED pattern image while minimizing the shadow area.

"LEED" is a device manufactured by OCI that can perform low-speed electron diffraction measurements. The electron gun of this product has a diameter of 10mm, providing a wide field of view on the screen, and minimizes the shadow area caused by the electron gun, allowing for the acquisition of LEED pattern images. Additionally, by using a cylindrical structure for the lens part, the outgassing within the electron gun is efficiently discharged through the side slits. Various options such as Auger electron spectroscopy measurement functionality, MCP attachment, linear drive mechanism, shutter, and image acquisition device can be selected according to measurement purposes. [Features] - Electron gun with a diameter of 10mm and a wide field of view on the screen - Use of μ-metal in a cylindrical shape to prevent magnetic field interference - Digital controlled power supply can provide the necessary voltage and current for the LEED device through digital control - Compatible flange types include ICF203, ICF152, and ICF114 *For more details, please refer to the PDF materials or feel free to contact us.

  • Analytical Equipment and Devices

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X-ray diffraction test

X-ray diffraction test

Ideal for quantitative analysis of environmental dust! X-ray diffraction equipment capable of measurements at high temperatures!

The "X-ray diffraction apparatus" is a device used to investigate the crystal structure, or the name of the material, by measuring the angles and intensities of the diffracted X-rays. From the diffraction positions and integrated intensities during qualitative analysis, quantitative analysis for each material can also be performed using the Rietveld refinement method. Additionally, measurements can be conducted at high temperatures (typically from room temperature to 1300 °C). 【Test Items】 ■ Identification of crystal structure and quantitative analysis ■ Measurement of lattice size and lattice strain ■ Quantitative analysis of environmental dust *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices

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RHEED unit "PHD-30K-034"

RHEED unit "PHD-30K-034"

A compact control power supply compatible with 30kV! Differential exhaust design usable up to 1Pa.

The "PHD-30K-034" is a reflection high-speed electron diffraction system that irradiates a substrate with an accelerated and converged electron beam under ultra-high vacuum for surface characterization. The compact-sized electron gun, mounted on an ICF34 flange, is easy to install and maintain due to its small size. In addition to standard diffraction image observation, it can achieve measurements under high-pressure conditions or sample surface scanning functionality through optional additions. 【Features】 ■ Compact control power supply compatible with 30kV ■ Differential pumping design usable down to 1Pa ■ Monitorable at around 100Pa with a two-stage differential pumping (optional) ■ Electron beam scanning with a scan coil (optional) allows for multiple diffractions under the same conditions *For more details, please refer to the PDF materials or feel free to contact us.

  • Other analyses
  • Spectroscopic Analysis Equipment

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