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microscope Product List and Ranking from 177 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

  1. スリーアールソリューション Fukuoka//Trading company/Wholesale
  2. null/null
  3. サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  4. 4 アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  5. 5 アイテス Shiga//Electronic Components and Semiconductors
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microscope Product ranking

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

  1. Portable Microscope "Magic Loupe R" / 15x Magnification, Photo and Save Capability スリーアールソリューション
  2. White interference microscope equipped with laser 'VK-X4000 series'
  3. White interference microscope equipped with laser microscope 'VK-X3000'
  4. 4 All-in-one fluorescence microscope 'BZ-X1000 Series'
  5. 5 All-in-one fluorescence microscope 'BZ-X800'

microscope Product List

151～165 item / All 662 items

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[Analysis Case] TEM Analysis under Atmosphere Control and Cooling (B0156)

[Analysis Case] TEM Analysis under Atmosphere Control and Cooling (B0156)

Observation with a high-resolution SEM equipped with FIB without atmospheric exposure (controlled atmosphere)!

Our organization has established a system that suppresses atmospheric exposure through atmosphere control, and further cools the samples for processing, observation, and analysis. We can produce TEM thin samples while maintaining the original structure of the specimen, allowing for observation and analysis. Even with unstable materials, we can perform thinning processing while cooling, and by maintaining a vacuum during the transfer between processing and observation devices, we enable cross-sectional TEM/SEM observation that minimizes atmospheric exposure and thermal alteration. 【Measurement and Processing Methods】 ■ [(S)TEM] Scanning Transmission Electron Microscopy ■ Processing under atmosphere control ■ Cryo-processing *For more details, please download the PDF or feel free to contact us.

  • Contract Analysis

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[Analysis Case] Dynamic Viscoelastic Evaluation of PDMS using AFM

[Analysis Case] Dynamic Viscoelastic Evaluation of PDMS using AFM

Introduction to the evaluation of in-plane distribution of viscoelasticity and frequency dependence!

Our organization offers dynamic viscoelastic evaluation of PDMS using AFM. Dynamic Mechanical Analysis (DMA) is an effective method for investigating viscoelastic behavior, which is an important factor in the research and development of polymer materials. Additionally, by combining it with the AFM mechanism, it becomes possible to measure in-plane distribution and evaluate localized areas. This document presents a case study using AFM-DMA to map the viscoelastic modulus of PDMS (polydimethylsiloxane) and conduct frequency-dependent spectroscopy evaluation. [Measurement Method / Processing Method] ■ [AFM] Atomic Force Microscopy *For more details, please download the PDF or feel free to contact us.

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  • Contract Analysis

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[Analysis Case] (S)TEM Observation by Negative Staining

[Analysis Case] (S)TEM Observation by Negative Staining

Examples of morphological observation of liposomes, CNF, microparticles, proteins, etc.!

Our organization offers (S)TEM observation using negative staining. Organic functional materials, such as fine particles and fibrous substances, are primarily composed of light elements like C (carbon), H (hydrogen), O (oxygen), and N (nitrogen), which do not provide sufficient contrast for morphological observation in (S)TEM. Therefore, by applying staining to these materials, we can enhance the contrast and enable observation. In this instance, we will introduce a case where negative staining was performed using phosphotungstic acid (H3[P(W3O10)4]·nH2O, abbreviated as PTA). 【Measurement Method / Processing Method】 ■ [(S)TEM] Scanning Transmission Electron Microscopy ■ Others *For more details, please download the PDF or feel free to contact us.

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  • Contract Analysis

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Hamamatsu Photonics PHEMOS-X

Hamamatsu Photonics PHEMOS-X

Equipped with a multi-wavelength laser, it can handle everything from visible light to near-infrared light with a single device.

PHEMOS-X is a high-resolution emission microscope that captures light emission and heat generation caused by semiconductor device failures to identify the failure location. 1. Capable of mounting up to two ultra-high sensitivity cameras. 2. Can accommodate up to seven light sources for OBIRCH, DALS, EOP, and laser markers. 3. Equipped with an optical stage compatible with various samples.

  • Optical microscope

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Confocal Microscopy Laser Raman "SENTERRA II"

Confocal Microscopy Laser Raman "SENTERRA II"

[Technical Data Presentation] Achieving high sensitivity performance and high frequency accuracy! A compact and robust distributed micro-Raman system.

The "SENTERRA II" is a high-performance system unique to Bruker, capable of handling everything from routine analyses such as quality control to cutting-edge research fields. In typical Raman microscopes, the spectrometer is mostly a separate system from the microscope, requiring a significant amount of time to maintain performance. This product is a compact and robust integrated system that combines the excitation laser, spectrometer, and microscope, achieving high performance and stability through its efficient optical design. Additionally, it supports operators smoothly and accurately to obtain results quickly. It guides users step by step through the procedures of data measurement, from visual observation of samples to confirming spectral quality and setting measurement areas. [Features] - Highly automated various functions and efficient operability - Compact & robust design - Efficiency and flexibility *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices

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Technical Data: Analysis of Large Samples Using FTIR Microscopy

Technical Data: Analysis of Large Samples Using FTIR Microscopy

Introduction of application examples for the analysis of long needle tips made of metal and the analysis of large automotive parts.

The fully automatic FTIR microscope "LUMOS II" allows for direct analysis of large samples without the need for tedious sample pretreatment. The size and range of the sample stage, as well as the working distance, are very important factors in microscopic analysis. By using accessories such as vice holders according to the sample shape, it is also possible to easily analyze challenging samples, such as needle tips. 【Contents】 ■ Introduction ■ Equipment ■ Application Example: Analysis of the tip of a long metal needle ■ Application Example: Analysis of large automotive parts ■ Conclusion *For more details, please refer to the PDF document or feel free to contact us.

  • Optical microscope

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FT-IR and QCL Microscope "HYPERION II Series"

FT-IR and QCL Microscope "HYPERION II Series"

A research and development FT-IR microscope with flexible expandability. It is possible to incorporate imaging functions using QCL infrared lasers into a single device.

HYPERION II is a technological innovation in infrared microscopy. It has achieved diffraction-limited infrared imaging and set a standard in micro ATR. Furthermore, it is the world's first system that integrates both FT-IR microscopy and infrared laser imaging microscopy (ILIM) functionalities in a single device for all measurement modes: transmission, reflection, and ATR. *For more details, please refer to the PDF document or feel free to contact us.*

  • Spectroscopic Analysis Equipment

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[Technical Data] High-Throughput Screening of Surface Contamination

[Technical Data] High-Throughput Screening of Surface Contamination

A dramatic improvement in operational efficiency is expected, as well as new applications!

The infrared microscope "HYPERION II" supports infrared laser imaging using QCL in addition to conventional micro FT-IR measurements. This document includes topics such as "QA/QC of precision machinery using FT-IR," "rapid detection of Regions of Interest (ROI)," and "detection of ROI using infrared laser imaging." The combination of QCL and FT-IR enables the swift detection of ROIs and more accurate qualitative analysis based on that information. [Contents] ■ QA/QC of precision machinery using FT-IR ■ Rapid detection of Regions of Interest (ROI) ■ Benefits of the combination of FT-IR and QCL ■ Detection of ROI using infrared laser imaging ■ Improved reliability of analysis using FT-IR ■ FT-IR and laser imaging: a powerful combination *For more details, please refer to the PDF document or feel free to contact us.

  • Laser microscope

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Forensic Analysis of Automotive Paint Samples Using QCL and FT-IR

Forensic Analysis of Automotive Paint Samples Using QCL and FT-IR

It is possible to analyze even tiny fragments of paint! In fact, it contributes to identifying accident vehicles.

The infrared microscope is one of the analytical tools capable of identifying the composition of microscopic objects and has become indispensable in forensic evidence analysis. The analysis method introduced in this document, using Bruker's "HYPERION II-ILIM System," combines IR laser imaging and micro FT-IR measurement, significantly reducing analysis time while further improving the quality of analysis. Please feel free to download and take a look. 【Contents】 ■ Differences in light sources used for IR laser imaging and FT-IR ■ Analysis method combining IR laser imaging and FT-IR ■ Application example: Automotive paint chips ■ Game changer: Achieving IR laser imaging and FT-IR measurement in a single device ■ Measurement results: Improved efficiency and reliability *For more details, please refer to the PDF document or feel free to contact us.

  • Spectroscopic Analysis Equipment

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Case Study Collection 1 on Cross-Section Observation and Structural Analysis using TEM/SEM/EBSD

Case Study Collection 1 on Cross-Section Observation and Structural Analysis using TEM/SEM/EBSD

We will introduce many examples of cross-sectional observation and structural analysis using TEM, FE-SEM, EBSD, etc., for metal microstructure observation and phase analysis!

This case study collection introduces examples related to "cross-sectional observation and structural analysis." It includes numerous analytical cases covering the objectives, methods, and results of "metallic structure observation of wire (spring material)," "phase analysis of duplex stainless steel," and "evaluation of semiconductor insulating films using STEM-EDS." Additionally, it presents observations, phase analyses, insulating film analyses, and measurements, among other topics. We encourage you to read it. [Contents] ■ Metallic structure observation of wire (spring material) ■ Phase analysis of duplex stainless steel ■ Evaluation of semiconductor insulating films using STEM-EDS ■ EBSD measurement of samarium cobalt magnets ■ Analysis of connector terminal contact defects using STEM ■ Cross-sectional observation of biological samples (Morpho butterfly scales) *For more details, please refer to the PDF document or feel free to contact us.

  • Other analyses
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EPIScope

EPIScope

We have commercialized the "EPIScope," a tabletop microscope type of EPIS sensor, so that customers can easily use it.

1. It can identify the "defective location" of Open/Short, which is difficult to determine with electrical testing. 2. It can detect "dents" that are difficult to identify with optical images. 3. It can detect defects not only in surface patterns but also in internal layer patterns. 4. It allows for dynamic observation as well as static images. 5. Since it detects electrical differences, it is less affected by dirt (insulators).

  • Circuit Board Inspection Equipment

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