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analysis(se) - List of Manufacturers, Suppliers, Companies and Products

Last Updated: Aggregation Period:Sep 03, 2025~Sep 30, 2025
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analysis Product List

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[FIB] Focused Ion Beam Processing

FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas.

FIB refers to a focused ion beam with diameters ranging from several nanometers to several hundred nanometers, which can be used to etch specific areas (sputtering) or deposit materials such as carbon (C), tungsten (W), and platinum (Pt) onto specific regions by scanning the sample surface. Additionally, the shape of the processed sample can be recognized through SIM images, which detect secondary electrons generated by irradiating the sample with the ion beam. - Arbitrary shape processing through etching in micro-regions (several nanometers to several tens of micrometers) is possible (typical processing size: around 20 μm) - Sample preparation for SEM, SEM-STEM, and TEM imaging (cross-sections of specific areas can be produced) - Fine pattern deposition and thin film formation (C, W, Pt deposition) are possible in the range of several micrometers to several tens of micrometers - High-resolution SIM (Scanning Ion Microscope) imaging is possible (acceleration voltage 30 kV: 4 nm) - Observation of metal crystal grains (Al, Cu, etc.) is possible with SIM images.

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  • Contract Analysis
  • Contract measurement
  • Contract Inspection

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Estimation of deformation and fracture due to compressive stress in plastic.

The deformation and fracture of plastic washers, gaskets, etc., due to localized compressive stress can be estimated using a TMA and stress-strain measurement device.

●Sample: Estimation of deformation and fracture due to localized compressive stress on plastic washers, gaskets, etc. ●Method: Compression creep measurement and stress-strain measurement using TMA (Thermomechanical Analysis) and stress-strain measurement equipment. ●Results: The deformation of the sample due to compression was understood from the creep curve and stress-strain curve. Please take a moment to read the PDF materials. In addition to TMA, our company also specializes in various thermal analyses such as DSC and TG/DTA. ●DSC: Can be used for analysis of sample melting, glass transition, thermal history, crystallization, curing, Curie point, etc., as well as measuring specific heat. ●TG/DTA: Can be used for analysis of moisture content, ash content, decomposition, oxidation, and evaluation of heat resistance. ●TMA: Can be used for measuring sample expansion rate, glass transition, softening point, etc. We would be happy to discuss this case and thermal analysis with you at any time. https://www.seiko-sfc.co.jp/service/thermal.html Case introduction https://www.seiko-sfc.co.jp/case/index.html *Other materials are also available. Please request them through the inquiry button, and we will send them to you.

  • Contract Analysis
  • plastic
  • Other polymer materials

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Foreign Object Investigation Service

We will take clear photos and report back! Using analytical equipment, we will investigate and analyze the identity of the foreign substance.

Are you troubled by issues of appearance defects and functional defects caused by foreign substances? If we can identify the nature of the foreign substance, it will provide an important clue to uncovering the pathway of its contamination. Our company will investigate and analyze the nature of the foreign substance using analytical equipment. We will take clear photographs according to the size of the foreign substance and report our findings. We will conduct detailed observations of the size, color tone, and adhesion state of the appearance, and if it is an organic substance, we will analyze it using FT-IR; if it is an inorganic substance, we will use SEM/EDX. Please feel free to consult us when you need our services. 【Features】 ■ Clear photographs will be taken and reported according to the size of the foreign substance ■ Detailed observations of the size, color tone, and adhesion state of the appearance ■ Analysis using FT-IR for organic substances and SEM/EDX for inorganic substances *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Inspection
  • Contract Analysis

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Laser Ablation Device "LASER BLENDER"

Precise measurement of micro-areas on the sample surface! High-speed analysis using a galvanometer mirror.

The "LASER BLENDER" is a laser ablation device that achieves high-speed and high-precision LA-ICP analysis. It enables direct approaches to solid samples, allowing for "local," "imaging," and "depth" analysis. It not only simplifies the preprocessing for ICP analysis but also expands the range of analytical methods, including direct solid analysis, high-speed analysis, and local analysis. 【Features】 ■ Reduces thermal effects and refines generated particles for high precision using FHG f's laser ■ High-speed ablation with a galvanometer scanner ■ Enables high spatial resolution measurements with a minimum focal diameter of 1μmΦ ■ Equipped with a goniometer to correct sample tilt ■ Arbitrary setting of ablation shapes using a tablet device *For more details, please refer to the related links or feel free to contact us. Exhibition Participation JASIS 2023 Advanced Science and Analytical Systems & Solutions Exhibition Date: September 6-8, 2023, 10:00 AM - 5:00 PM Venue: Makuhari Messe International Exhibition Hall, 2-1 Nakase, Mihama-ku, Chiba City, Chiba Prefecture 261-0023 Booth: 4B-206

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  • Analytical Equipment and Devices

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Diotec Semiconductor AG Company Profile

Active in a highly competitive market for over 40 years! We provide customized solutions.

Our affiliated company, Diotec Semiconductor AG, specializes in semiconductor diodes and rectifiers. We provide customized solutions tailored to the configuration of semiconductor chips, packages, and leads. We have been active in this highly competitive market for over 40 years. Please feel free to contact us when needed. 【Products Offered】 ■ Semiconductor Diodes ■ Rectifiers * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.

  • Contract manufacturing

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Data DL available: DSC measurement of silicone rubber (low temperature measurement)

Generally, it is possible to observe transition phenomena such as melting, glass transition, crystallization, and thermosetting of materials even in difficult low-temperature regions.

Depending on the material, glass transition, cryocrystallization, and melting points may exist in the low-temperature range. Our company has the technology to measure these characteristics using DSC (Differential Scanning Calorimetry). We hope you can utilize this technology to understand material properties. In this case, we introduce an example of this technology: "DSC Measurement of Silicone Rubber (Low-Temperature Measurement)." Please refer to the PDF document for details. In addition to DSC, our company also specializes in various thermal analyses such as TG-DTA and TMA. https://www.seiko-sfc.co.jp/service/thermal.html ●DSC (Differential Scanning Calorimetry): Can be used for analysis of sample melting, glass transition, thermal history, crystallization, curing, Curie point, etc., as well as measuring specific heat. ●TG-DTA (Thermogravimetric and Differential Thermal Analysis): Can be used for analysis of sample moisture content, ash content, decomposition, oxidation, and thermal resistance evaluation. ●TMA (Thermomechanical Analysis): Can be used for measuring sample expansion rate, glass transition, softening point, etc. Please take a look at many other examples below: https://www.seiko-sfc.co.jp/case/index.html

  • Rubber
  • Contract Analysis
  • Analysis Services

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Data DL available: DMA Long-term deformation prediction (deformation of rubber)

The results of DMA measurements can predict the long-term deformation (creep measurement) of materials. This can be utilized in evaluations that typically take a long time.

At our company, by applying the WLF rule (the time-temperature superposition principle) to the results of DMA measurements, we can estimate properties such as elasticity in frequency regions that have not actually been measured (creating master curves). Would you like to utilize this technology to understand material properties? In this case, we introduce an example of this technology: "Prediction of long-term deformation of rubber (creep test)". Please refer to the PDF document for details. In addition to DSC, our company also specializes in various thermal analyses such as TG-DTA and TMA. https://www.seiko-sfc.co.jp/service/thermal.html ●DSC (Differential Scanning Calorimetry): Used for analyzing melting, glass transition, thermal history, crystallization, curing, Curie point, etc., and for measuring specific heat. ●TG-DTA (Thermogravimetric and Differential Thermal Analysis): Used for analyzing moisture content, ash content, decomposition, oxidation, and evaluating heat resistance. ●TMA (Thermomechanical Analysis): Used for measuring expansion rate, glass transition, softening point, etc. Please see below for other examples as well. https://www.seiko-sfc.co.jp/case/index.html

  • Rubber
  • Contract Analysis
  • Contract Analysis

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Differential Scanning Calorimeter 'Setline DSC/DSC+'

Various measurements can be efficiently conducted! Easily and affordably replaceable sensors.

The "Setline DSC/DSC+" is a differential scanning calorimeter manufactured by Setaram Instrumentation. It employs a simple structured plate-type DSC sensor. Due to its rod-type sensor structure, which can be replaced by the user, it significantly reduces repair time and costs in case of sensor failure. 【Features】 ■ Utilizes a simple structured plate-type DSC sensor ■ Significantly reduces repair time and costs in case of sensor failure ■ Rapid heating and cooling rates ■ Efficiently conducts various measurements *For more details, please refer to the PDF document or feel free to contact us.

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  • Other measurement, recording and measuring instruments

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[SIM] Scanning Ion Microscopy Method

Observation of SIM images is possible with high resolution (accelerating voltage 30kV: 4nm).

- SIM imaging observation is possible with high resolution (accelerating voltage 30kV: 4nm). - Compared to SEM images, SIM images provide information about the extreme surface layer. - Observation of metal crystal grains is possible (e.g., Al, Cu). - The resolution is inferior to SEM images (SIM: 4nm, SEM: 0.5nm). ■Features of MST-owned equipment - Compatible with JEIDA standard wafers with a maximum sample size of 300mm in diameter. - Continuous cross-sectional SIM imaging acquisition is possible in combination with FIB (Focused Ion Beam) processing (Slice & View).

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  • Contract Analysis
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Air Monitor Fresh - Air Quality Measurement Device with German Design

Visualizing the invisible air environment. Sophisticated German design.

Invisible air environment. Visualizing the values of CO2 (carbon dioxide), PM2.5, VOCs (volatile organic compounds), temperature, humidity, and other factors in living environments such as homes, offices, tutoring centers, and accommodations, and adjusting them for a comfortable environment is a very important aspect of daily life. The Laserliner air monitor series is designed to visualize the values of air quality, enabling appropriate measures such as ventilation, the use of air purifiers, and adjustments to heating and cooling.

  • Thermo-hygrometer

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Air environment measuring device with German design - Air Check Clima

Visualizing the invisible air environment. Sophisticated German design.

Invisible air environment. Visualizing the values of CO2 (carbon dioxide), PM2.5, VOCs (volatile organic compounds), temperature, humidity, and other factors in living environments such as homes, offices, schools, and accommodations, and adjusting them for a comfortable environment is a very important aspect of daily life. The Laserliner air monitor series is designed to visualize the values of air quality, aiming to facilitate appropriate measures such as ventilation, the use of air purifiers, and adjustments to heating and cooling.

  • Thermo-hygrometer

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GPC (Gel Permeation Chromatography) analysis

Measurement of the relative molecular weight and molecular weight distribution of polymers and oligomers.

This method utilizes the pores of a filler used as a stationary phase to separate sample molecules in order of increasing molecular size, and is also known as size exclusion chromatography (SEC). Larger molecules penetrate the pores of the gel less and move through the column and elute faster than smaller molecules. In this way, by separating and eluting based on molecular size, and using the differences in refractive index (RI) between the solvent and the sample solution or the absorption of functional groups (UV) to detect concentration, a distribution of molecules can be obtained.

  • Contract Analysis

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[Handbook Presentation] Analysis and Evaluation

In "Evaluation and Analysis of Li-ion Batteries," a series of evaluations including prototyping, testing, battery disassembly, and non-atmospheric exposure analysis is possible.

Our company supports trouble resolution with advanced technology and cutting-edge equipment cultivated in the electronics field. This document includes "areas of support" such as "MSEC's analysis and evaluation support areas," "analysis case studies" like "comprehensive analysis of Li-ion batteries," and "introduction of analytical equipment." Please feel free to download and take a look. 【Contents (partial)】 <Areas of Support> ■ MSEC's analysis and evaluation support areas ■ Comprehensive analysis system for power devices and modules <Analysis Case Studies> ■ Front-end analysis ■ Power device package defect analysis *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices

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[Analysis Case] Evaluation of Si Anode in Lithium-Ion Secondary Batteries

It is possible to evaluate the structure of the Si anode after charging through sample cooling.

Si is one of the candidates for high-capacity negative electrode active materials, but it is said to suffer from severe cycle degradation due to very large volume changes during charge and discharge. In this study, to confirm the state of the Si negative electrode after charging, we disassembled it under a controlled atmosphere environment and performed cooling FIB processing, followed by observing the cross-sectional shape using SEM. When observing the cross-section at room temperature, significant damage such as film contraction, roughness of the observation surface, and pore formation was observed. In contrast, by conducting the observation while cooling, we were able to suppress the alteration of the Si negative electrode and evaluate the original shape of the sample.

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  • Contract Analysis
  • Contract measurement

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