List of Contract Services products
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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
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A belt grinding machine that has been in use for about 50 years since 1973. In addition to trust and proven results, the lineup is also extensive.
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Belt grinding machine "Veda Machine" has high durability and a wide range of service parts.
The "Bader Machine" is our belt grinder that boasts excellent polishing performance for each individual unit. By selecting models and types according to the shape and size of the workpiece, and by equipping it with a polishing belt suitable for the task, it can flexibly accommodate a wide variety of items across various fields. Please make extensive use of it for high-efficiency polishing and grinding, reduction of work time, labor-saving, and standardization of tasks. 【Lineup】 ■ Portable type BP-K (air motor type) ■ Made-to-order machine PC-1 (wheel centerless), BC (standard dust cover) ■ Installed type BM (basic type), SBA-1, BH-2 ■ Wheel type SBD-4S, SBD-7, BWd *For more details, please download the PDF or contact us.
It is possible to evaluate the sample in its original state.
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FIB: Focused Ion Beam Processing
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SIMS: Secondary Ion Mass Spectrometry
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This is a processing method for cutting bulk samples using a diamond knife to produce ultra-thin sections for transmission electron microscopy with a thickness of less than 100 nm.
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Principles and Applications of Pyrolysis GC/MS
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EBSD: Electron Backscatter Diffraction
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X-ray photoelectron spectroscopy (XPS)
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IC: Ion Chromatography
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SRA: Spread Resistance Measurement Method
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SRA: Spread Resistance Measurement Method
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AES: Auger Electron Spectroscopy
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GC/MS: Gas Chromatography-Mass Spectrometry
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LC/MS/MS: Liquid Chromatography-Mass Spectrometry
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SIMS: Secondary Ion Mass Spectrometry
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GC/MS: Gas Chromatography-Mass Spectrometry
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- Memory
HPLC: High-Performance Liquid Chromatography
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AFM: Atomic Force Microscopy Method
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- Wafer
NMR analysis of trace components is possible.
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SSDP： Substrate Side Depth Profile
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You can identify high resistance and open areas in the wiring from the absorption current image.
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Using an ultra-short pulse laser with micron-level processing position accuracy, samples can be produced quickly and with low damage.
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We will introduce the target of analysis, the physical property information obtained, and examples of analysis that can be understood from molecular dynamics calculations.
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A method for separating components by analyzing volatile components and utilizing differences in gas adsorption or distribution coefficients with respect to the stationary phase.
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We will introduce the target of analysis, the physical property information obtained, and examples of analysis.
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Here is an example of the semi-quantification of the eight catechin components contained in green tea.
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It is possible to visualize the phase separation structure of polymers from thermal conductivity information.
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Reliability Test
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Measurement of the light solvent as is.
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![[IP Method] Ar Ion Polishing Proces...](https://image.mono.ipros.com/public/product/image/3af/387108032/IPROS8821214265644794739.jpg?w=280&h=280){kind=small}
The IP method is a type of polishing technique that uses ion beams for processing.
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![[SIM] Scanning Ion Microscopy Metho...](https://image.mono.ipros.com/public/product/image/d09/387108028/IPROS2308410282720757772.jpg?w=280&h=280){kind=small}
Observation of SIM images is possible with high resolution (accelerating voltage 30kV: 4nm).
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Cooling and hardening the soft sample to make it machinable.
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HAADF-STEM: High-Angle Annular Dark Field Scanning Transmission Electron Microscopy
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XPS: X-ray photoelectron spectroscopy, etc.
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TEM: Transmission Electron Microscopy
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EBSD: Electron Backscatter Diffraction
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Notice of publication of a written article in the May 2012 issue of Applied Physics.
In the May 2012 issue of the monthly magazine "Applied Physics," published by the Japan Society of Applied Physics, the MST General Foundation for Materials Science and Technology contributed an article on scanning electron microscopy (SEM). ● Magazine Overview - Publisher: Japan Society of Applied Physics - Published Issue: May 2012, Applied Physics - Project Name: Basic Course <Hop, Step, Jump> Series "Scanning Electron Microscopy" ● MST Contribution Overview - Author: Kyoko Yonemitsu, Leader of the Analysis and Evaluation Department, MST General Foundation for Materials Science and Technology - Content: Applications of scanning electron microscopy in research and development - Case studies and uses Please take a look.
This is a processing method for producing thin film samples for transmission electron microscopy with a thickness of less than 50 nm by performing mechanical polishing followed by finishing with a low...
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Processing under atmosphere control, cryo-processing, cooling, TEM: transmission electron microscopy and others.
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Processing under atmosphere control, cryo-processing, cooling, SEM: scanning electron microscopy and others.
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Cryo-processing cooling SEM: Scanning Electron Microscopy method
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UPS: Ultraviolet Photoelectron Spectroscopy
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SIMS: Secondary Ion Mass Spectrometry
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Photoluminescence method
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XPS: X-ray Photoelectron Spectroscopy
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XPS: X-ray Photoelectron Spectroscopy AES: Auger Electron Spectroscopy
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