List of Semiconductor inspection/test equipment products

  • classification:Semiconductor inspection/test equipment

316~360 item / All 696 items

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

  • PRエリア.png
  • Other conveying machines

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Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.

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  • Other safety and hygiene products

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The layered metal mesh filter offers more options for mesh opening size and thickness (number of layers). Additionally, adding a radius to the corners makes it easier for materials to enter.

  • Chuck
  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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An ECU testing system that allows for free customization of test patterns.

  • Automotive catalyst evaluation test equipment
  • Semiconductor inspection/test equipment

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Mixed Signal IC Tester ECOIC-M1

  • Other semiconductors
  • Semiconductor inspection/test equipment
  • Testing Equipment and Devices

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Tabletop type ECU (Power Control Unit) tester

  • Tester
  • Semiconductor inspection/test equipment
  • Automotive catalyst evaluation test equipment

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Easy operation with a test setup application featuring automatic position detection! Meter panel automatic evaluation system.

  • Automotive catalyst evaluation test equipment
  • Semiconductor inspection/test equipment
  • Communications

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Low-cost semiconductor manufacturing equipment vibration monitor for logging displacement data of the vibration isolation table over an extended period.

  • Semiconductor inspection/test equipment
  • Vibration Testing
  • Testing Equipment and Devices

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We provide various automotive measurement solutions such as meter panels, airbags, and steering.

  • Testing Equipment and Devices
  • Image Processing Equipment
  • Semiconductor inspection/test equipment

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[Linear IC Tester ECOIC-L1] Capable of high-precision DC parameter measurement, waveform analysis, and timing measurement.

  • Other semiconductors
  • Semiconductor inspection/test equipment
  • Testing Equipment and Devices

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High-performance IC tester built with 1/10 the cost of commercial products.

  • Other electronic parts
  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment

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Introduction to the software features of Peritec's RFID tester (catalog available for download)

  • Tester
  • IC tag
  • Semiconductor inspection/test equipment

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Multi-standard compatible "RFID Comprehensive Testing Machine" using proprietary "LabVIEW" measurement technology.

  • Tester
  • IC tag reader/writer
  • Semiconductor inspection/test equipment

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Compatible with various auto probers! LED chip tester ECOIC-LED

  • Tester
  • LED Module
  • Semiconductor inspection/test equipment

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Unifying the semiconductor testing phase to improve work efficiency.

  • Integrated operation management
  • Semiconductor inspection/test equipment
  • Software (middle, driver, security, etc.)

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We can easily accommodate a tight budget. RF amplifier IC tester.

  • Mobile phones, PHS, data communication cards
  • Semiconductor inspection/test equipment
  • Testing Equipment and Devices

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By calibrating the coaxial cable connection, accurate measurements of the IC chip can be obtained.

  • probe
  • Semiconductor inspection/test equipment
  • IC tag

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Stainless processing/SUS304/cutting

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Oxidation/Diffusion Device

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Cleared the Ministry of Land, Infrastructure, Transport and Tourism's "Trial Guidelines for Remote Presence at Construction Sites" Professional version of the remote work support and recording system ...

  • Semiconductor inspection/test equipment

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A5056 processed products, individual items, machining processing [Leave cost reduction to Philir Co., Ltd.]

  • CVD Equipment
  • Ashing device
  • Semiconductor inspection/test equipment

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Aluminum precision machining / A5052 / Single item [Leave cost reduction to Philir Co., Ltd.]

  • Molding Equipment
  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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Aluminum cutting / A5052 / Lathe processing / Osaka [Leave cost reduction to Firiru Co., Ltd.]

  • CVD Equipment
  • Sputtering Equipment
  • Semiconductor inspection/test equipment

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UV condensing lighting that solves the issues of insufficient uniformity and brightness when inspecting UV adhesives with UV lighting such as rings or bars.

  • Lighting for image processing
  • Semiconductor inspection/test equipment
  • Other optical parts

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Leave the highly precise metal parts related to optics to us!

  • lens
  • Semiconductor inspection/test equipment
  • Spectroscopic Analysis Equipment

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Single-item aluminum processing, prototyping, A5052 [Leave cost reduction to Philir Co., Ltd.]

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Resist Device

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Consistent production system from grinding to assembly! We also accommodate small lots.

  • lens
  • Semiconductor inspection/test equipment
  • Optical microscope

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Please leave all threading processing for quartz glass to Takashima Manufacturing.

  • Semiconductor inspection/test equipment

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There is a technique to make a pin stand at a specified angle.

  • Semiconductor inspection/test equipment

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Press the start button to automatically measure all items continuously! Introduction to the laser diode inspection device.

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment

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LD is supplied in a tray storage state, and automatic pickup and measurement are performed continuously!

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment

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We will respond as your manufacturing partner with a one-stop (integrated production system) approach!

  • Contract manufacturing
  • Semiconductor inspection/test equipment
  • Wafer processing/polishing equipment

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Notice of Participation in Internepcon Japan 2021 Electronics Manufacturing and Assembly Exhibition

We will be exhibiting at "NEPCON Japan," where the latest manufacturing and implementation technologies that support the multifunctionality and high performance of electronic devices come together. "NEPCON Japan" has established itself as a venue for business negotiations with domestic and international manufacturers of electronic devices, semiconductors, electronic components, and automotive and electrical equipment. If you are facing various challenges such as complicated outsourcing management or improving equipment utilization rates, please stop by our booth. We will propose the optimal plan tailored to your situation. 【Booth Number: W1-54】 ● NEPCON Official Site: https://www.nepcon.jp/ja-jp.html ● NEPCON Company Site: https://jan2021.tems-system.com/exhiSearch/INW/jp/Details?id=%2FUqXsOFXpWM%3D&type=2&rel=undefinedl If you need an invitation ticket, please request the necessary number by writing to us through the "Contact" section. We look forward to your visit as we prepare new proposals.

Aluminum five-axis machining Osaka [Leave cost reduction to Philir Co., Ltd.]

  • CVD Equipment
  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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We provide design and manufacturing services for automatic assembly machines and labor-saving machinery in various fields, including automotive parts, electronic components, semiconductors, and constr...

  • Assembly robot
  • Semiconductor inspection/test equipment
  • Automatic sorting machine

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From the pursuit of steel materials, we measure with high-precision inspection equipment such as temperature control of heat treatment furnaces, hardness tests, microstructure inspections, and dimensi...

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment

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Osaka Cutting Mass Production Lathe Processing and Machining Processing [Leave cost reduction to Filir Co., Ltd.]

  • CVD Equipment
  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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Aluminum precision parts for semiconductor manufacturing equipment. [Leave cost reduction to Philir Co., Ltd.]

  • Semiconductor inspection/test equipment
  • Ion implantation equipment
  • CMP Equipment

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Aluminum precision parts, lathe processing, machining processing [Leave cost reduction to Filir Co., Ltd.]

  • CVD Equipment
  • Etching Equipment
  • Semiconductor inspection/test equipment

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Five-axis machining for semiconductor manufacturing equipment parts [Leave cost reduction to Philir Co., Ltd.]

  • CVD Equipment
  • Semiconductor inspection/test equipment
  • Etching Equipment

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Silicon block internal foreign matter inspection device

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices

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Thin-film solar cell panel measurement device

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices

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Crystal Defect Measurement Device (Light Scattering Tomography)

  • Semiconductor inspection/test equipment
  • Other electronic measuring instruments
  • Analytical Equipment and Devices

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Inline wafer measurement module

  • Semiconductor inspection/test equipment
  • Other electronic measuring instruments
  • Analytical Equipment and Devices

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Using the JPV method, non-contact measurement of junction leakage in PN junctions, evaluation of the depletion layer capacitance, and rapid measurement of the sheet resistance of PN junction samples!

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment

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The world's only spectroscopic ellipsometer technology for measuring pore rate and pore distribution using an EP (optical porosimeter).

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices

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The PN determination of silicon wafers/blocks can be performed instantly.

  • Semiconductor inspection/test equipment
  • Other electronic measuring instruments
  • Analytical Equipment and Devices

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Instantly measure the resistance of silicon ingots/blocks non-contact and non-destructively using eddy current technology.

  • Semiconductor inspection/test equipment
  • Other electronic measuring instruments
  • Analytical Equipment and Devices

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Mapping measurements using the u-PCD method are possible, and there are numerous achievements in the solar cell and semiconductor markets.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices

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