List of 新横浜 products

91~135 item / All 151 items

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We will provide total coordination for high-impact display presentations.

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Realizing a sustainable society! Providing high-quality, high-value-added services.

  • Other printing machines and peripheral equipment

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It is possible to project images onto the walls, three-dimensional objects, and graphics within the shop, allowing for various presentations.

  • others

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Ultra-high sensitivity DLTS system / Bulk defect and interface level measurement device

  • Other inspection equipment and devices

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High-precision measurement of the thickness and refractive index of multilayer films without contact. Easy operation of the main unit and analysis tasks. *Demonstration available and technical materia...

  • Optical Measuring Instruments
  • Spectroscopic Analysis Equipment
  • probe

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[WEB Seminar Announcement!] Explanation of the Procedure for Creating Analysis Models for Spectroscopic Ellipsometers [Nihon Semilab]

We will be holding a webinar. Details are as follows. If you are interested, please join us! --- **Theme: Explanation of the Procedure for Creating Analysis Models for Spectroscopic Ellipsometers - Beginner Level** ■ Date and Time May 13 (Thursday) 16:00 - ■ Content Using a sample with a general structure as an example, we will explain the procedure for creating analysis models. As a beginner level, we plan to explain analyses using the effective medium approximation model, Cauchy model, and Tauc-Lorentz model. *If you wish to participate, please contact us through the Japan Semilab Co., Ltd. website (https://www.semilab-j.jp/seminar/).*

A solution "kikiFREE" that enables remote development and evaluation using embedded devices *allows device sharing across multiple locations.

  • Other services

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A solution "kikiFREE" that enables remote development and evaluation using embedded devices *Streamlining the development of edge devices!

  • Other services

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The cushioning ability and cost reduction unique to paper! Contributing as an option that helps address environmental issues!

  • Cushioning material
  • Paper and pulp
  • Packaging materials

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This is an interface that allows for the addition of fast charging functionality. It can also be used as an EV-side simulator for charger evaluation.

  • Other power sources

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Polarization, ellipsometer, Brewster angle, etc.! Clearly introduced with diagrams and graphs. Demonstrations available.

  • Analytical Equipment and Devices
  • Spectroscopic Analysis Equipment
  • Coating thickness gauge

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[Public Announcement] Technical Document "Measurement Principles of Spectroscopic Ellipsometry"

We have newly registered the technical document "Measurement Principles of Spectroscopic Ellipsometry" on the Ipros page. It includes topics such as "polarization," which refers to light with a regular vibration direction of electric and magnetic fields, the principles of ellipsometry, and optical interference. More detailed information is provided in relation to the associated products.

We are pursuing sustainability to inherit a desirable environment for the next generation.

  • others

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Temperature display records for each part can be made for each condition! Due to its compact, waterproof, and dustproof design, it can be installed in various locations.

  • Communications

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Trench Depth Measurement Device

  • Other inspection equipment and devices

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We take pride in our ability to respond to short delivery times, which we believe is outstanding compared to our competitors in the industry.

  • Printed Circuit Board
  • Circuit board design and manufacturing

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Conducted bottleneck analysis and reduced startup time with acceleration processes such as processing parallelization!

  • Embedded OS

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Fully automatic spreading resistance measurement device

  • Other inspection equipment and devices

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As your brain partner, we propose technologies tailored to your needs!

  • Other industrial robots
  • Other Auto Parts

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For wind power generation equipment! Our adhesive helps reduce blade repair time and downtime for power generation!

  • glue

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Elimination of variability by the measurer; comfortable and accurate measurement of ultra-thin films below 1μm.

  • Coating thickness gauge

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Battery control system configured with up to 13 BSUs!

  • Other process controls
  • Control Panel

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Experienced engineers support the introduction of your embedded OS products!

  • Embedded OS

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A trigger for factory IoT! Introducing a temperature visualization system designed for work efficiency.

  • Communications

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Measurement device for the development of high-efficiency solar cells

  • Testing Equipment and Devices
  • Other inspection equipment and devices

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This is information about the container box for building confirmation application support.

  • Packaging materials

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Experienced engineers will support your development of RTOS, Linux, and Android products!

  • Embedded OS

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Developing software in various fields! Providing systems that meet your needs.

  • Embedded system design service

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The world's only spectroscopic ellipsometer technology for measuring pore rate and pore distribution using an EP (optical porosimeter).

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices

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Thin film thickness and Young's modulus measurement device

  • Other inspection equipment and devices

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Surface charge analysis device

  • Other inspection equipment and devices

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We will undertake the hardware, software, and mechanical design and development as a comprehensive service.

  • Embedded system design service

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Speedy response based on source code! Start EOL measures with minimal preparation.

  • Software (middle, driver, security, etc.)

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Improve concentration and increase learning efficiency! Reflect advice in your study plan to enhance the quality of learning.

  • Image analysis software

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Introducing a layer vision that can appeal to product lineup, features, and more.

  • others

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Instantly measure the resistance of silicon ingots/blocks non-contact and non-destructively using eddy current technology.

  • Semiconductor inspection/test equipment
  • Other electronic measuring instruments
  • Analytical Equipment and Devices

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Breathe new life into images captured with digital cameras and scanners!

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The PN determination of silicon wafers/blocks can be performed instantly.

  • Semiconductor inspection/test equipment
  • Other electronic measuring instruments
  • Analytical Equipment and Devices

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Mapping measurements using the u-PCD method are possible, and there are numerous achievements in the solar cell and semiconductor markets.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices

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Crystal defect analysis device (non-contact, non-destructive)

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices

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Silicon block internal foreign matter inspection device

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices

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