Analysis Product List and Ranking from 376 Manufacturers, Suppliers and Companies

Failure analysis of power devices

We will identify and observe the defective areas of power devices such as diodes, MOS-FETs, and IGBTs.

We perform optimal preprocessing for power devices such as diodes, MOS FETs, and IGBTs of all sizes and shapes, and identify and observe defective areas through backside IR-OBIRCH analysis and backside emission analysis. ■ Preprocessing for analysis - Backside polishing - We accommodate various sample forms. Si chip size: 200um to 15mm square ■ Defective area identification - Backside IR-OBIRCH analysis and backside emission analysis - IR-OBIRCH analysis: Supports up to 100mA/10V and 100uA/25V Emission analysis: Supports up to 2kV * We address a wide range of defect characteristics such as low-resistance shorts, micro leaks, and high voltage breakdown failures. ■ Pinpoint cross-sectional observation of leak areas - SEM/TEM - We select SEM or TEM observation based on the predicted defects and can conduct physical observation and elemental analysis of leak defect areas with precision.

Company：アイテス
Price：Other

Contract Analysis
Transistor
Analytical Equipment and Devices
Analysis

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Analysis of semiconductor diffusion layers using sMIM

Detect changes in concentration as changes in C! The dC/dV signal can also be obtained, which is effective for analyzing the diffusion layer.

At Aites Co., Ltd., we conduct analysis of semiconductor diffusion layers using sMIM. The Scanning Microwave Impedance Microscopy (sMIM) features a signal that has a linear correlation with dopant concentration. sMIM scans the sample by irradiating microwaves from the tip of a metal probe attached to an SPM and measures the reflected waves to obtain sMIM-C images that have a linear correlation with the concentration of the diffusion layer. The C component of Zs obtained from reflectivity consists of oxide film capacitance and depletion layer capacitance, and by utilizing the fact that the depletion layer width changes depending on impurity concentration, we detect changes in concentration as changes in C. [Application Examples] ■ sMIM-C: Visualization of diffusion layers and semi-quantitative evaluation of dopant concentration for various semiconductor devices such as Si, SiC, GaN, InP, GaAs, etc. ■ dC/dV: Evaluation of diffusion layer shape, determination of p/n polarity, visualization of depletion layers. *For more details, please refer to the PDF materials or feel free to contact us.

Company：アイテス
Price：Other

Contract Analysis
Other contract services
Analysis

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Crystal analysis of Cu using the EBSD method.

Observe the changes before and after compression on the copper plate! You can compare the half-life of the crystal grain size before and after compression.

The EBSD (Electron Backscatter Diffraction) method obtains orientation information of individual crystals from the electron diffraction patterns generated by electron beam irradiation and maps this information. Furthermore, it is a technique for investigating not only crystal orientation (texture) but also material microstructural states such as grain distribution and stress-strain as quantitative and statistical data. In the observation of changes before and after compression of a copper plate, IQ maps, GROD maps, and IPF maps (in the Axis 3 direction) can be used to compare the halving of crystal grain size before and after compression. 【Features】 ■ Obtains and maps orientation information of individual crystals ■ Investigates material microstructural states such as crystal orientation, grain distribution, and stress-strain *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

Analytical Equipment and Devices
Analysis Services
Analysis

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Backside light emission analysis of SiC devices

Pre-processing of SiC devices → Identification of leakage points → Physical analysis/component analysis handled seamlessly!

Our company conducts "Backside Emission Analysis of SiC Devices." SiC is a power device with less energy loss compared to conventional Si semiconductors and is attracting attention. However, due to its different physical properties from Si semiconductors, new methods are required for failure analysis. In a case study of backside emission analysis of SiC MOSFETs, an overseas SiC MOSFET was subjected to ESD, creating a G-(D,S) leakage, and numerous emissions indicating the leakage points were detected through emission analysis. When the emission points were observed using TEM, destruction of the SiO2 film and damage to the SiC crystal were noted. *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

Analysis Services
Contract Analysis
Analysis

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EBSD analysis of flexible printed circuits (FPC)

We will introduce EBSD analysis that reveals areas where distortion has accumulated in the wiring of the bending section!

We will introduce the EBSD analysis of flexible printed circuits (FPC). For flexible circuits used in products with movable parts and bending mechanisms, we conducted an EBSD analysis to check for differences in the Cu wiring between the bending section and the fixed section. As a result, while no significant abnormalities or differences were observed in the optical images of the wiring in the bending and fixed sections, the EBSD analysis revealed areas where strain is accumulated in the wiring of the bending section and areas where low-angle grain boundaries are concentrated. [Analysis Content] ■Appearance of the flexible circuit and optical images of Cu wiring - Appearance of the flexible circuit - Wiring in the bending section - Wiring in the fixed section ■Comparison of Cu wiring in the bending section and fixed section using EBSD - Wiring in the bending section - Wiring in the fixed section *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

Analysis Services
Contract Analysis
Analysis

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LED failure analysis

Applying advanced sample preparation techniques and failure analysis equipment for semiconductors! Investigating the causes of non-lighting and brightness degradation.

In our "LED Failure Analysis," we conduct failure analysis of LEDs using advanced sample preparation techniques and semiconductor failure analysis equipment to investigate the causes of non-lighting and brightness degradation. In the "LED Defect Mode Discrimination," we performed lighting tests after lens polishing and observed the resin of the LED, polishing it to stages a, b, and c, conducting lighting observations for (a) and (b), and optical observations of the chip through the resin for (c). Additionally, we also have categories such as "Electrical Normal" and "Open, High Resistance." 【Initial Diagnostic Items for LED Packages】 ■ Electrical Characteristics Measurement ■ Visual Inspection ■ Lens Polishing / Internal Optical Observation of the Package ■ Lighting Test (Brightness Distribution Observation) *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

Contract Analysis
Analysis Services
Analysis

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Analysis of Li-ion battery separators

I confirmed the blocking function of polymer melting at high temperatures!

Regarding the separator used in commercially available Li-ion batteries, after conducting material analysis using FT-IR, we confirmed its function of blocking polymer melting at high temperatures. The document presents the material analysis of Li-ion battery separators and observations of the state changes of the separators under high-temperature conditions using graphs and photographs. [Analysis Overview] ■ Material analysis of Li-ion battery separators ■ Observation of state changes of separators under high-temperature conditions - The state changes of the separator were observed over time at a constant temperature of 135°C using FIB/SEM. *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

Other contract services
Contract Analysis
Analysis

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Structural analysis of prismatic Li-ion batteries.

Observation using optical microscopy and ultra-low acceleration FE-SEM! Detailed structural analysis and elemental analysis are possible.

By mechanically polishing commercially available rectangular Li-ion batteries and observing them with optical microscopy and ultra-low acceleration FE-SEM, detailed structural analysis and elemental analysis can be performed. The materials introduce the overall structure of the Li-ion battery and detailed structural observations of the Li-ion battery using SEM and ultra-low acceleration FE-SEM through photographs. [Analysis Overview] ■ Overall structure of the Li-ion battery and SEM observation ■ Detailed structural observation of the Li-ion battery using ultra-low acceleration FE-SEM *For more details, please refer to the PDF materials or feel free to contact us.

Company：アイテス
Price：Other

Analysis Services
Other contract services
Analysis

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Structural analysis of Nylon 6.10

We will elucidate the characteristics at the molecular level using our FT-IR and thermal decomposition GC-MS!

At AITES, we are conducting a structural analysis of Nylon 6.10. Nylon possesses flexibility and a texture similar to silk, while also having high strength and durability that natural fibers do not have, described as "stronger than steel and finer than a spider's silk." We will elucidate these characteristics at the molecular level using our FT-IR and pyrolysis GC-MS. 【Nylon 6.10 Interfacial Polymerization Reaction Mechanism】 1. Electron withdrawal by chlorine leads to a deficiency of electrons in adjacent carbon. 2. The non-bonding electrons of the amine attack the carbon as a nucleophile. 3. The oxygen atom is activated to form an unstable intermediate. 4. Hydrogen chloride is eliminated, forming an amide bond. 5. Interfacial polymerization progresses, resulting in polymerization. *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

Contract Analysis
Analysis

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Analysis of defects in overseas manufactured displays.

Numerous achievements in defect analysis! Detailed analysis is possible, from confirming phenomena to hypothesizing the mechanisms of defect occurrence.

Our company conducts "defect analysis of overseas manufactured displays." We can perform detailed analysis from confirming the phenomenon, hypothesizing the defect occurrence mechanism, to narrowing down the production processes that caused the issue. We carry out lighting observations, panel disassembly, and optical microscope observations tailored to the defect symptoms. If it is necessary to narrow down the defective areas and conduct detailed analysis, we will propose appropriate methods. 【Examples of detailed analysis (partial)】 ■ Cross-sectional observation of wiring ■ Foreign object analysis ■ Liquid crystal component analysis ■ Electrical characteristic measurement *Additional costs will be incurred. *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

LCD display
Analysis

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REFZ

Report creation tool for Zabbix server

REFZ is a tool that integrates with the Zabbix server to generate reports of club images. With simple operations, it can output reports in RTF (Rich Text Format). It is also possible to gather information on "events" and "traps" from the Zabbix server in a consolidated manner. This information can be filtered by the target period and devices, allowing you to output only the desired information.

Company：アイビーソリューション
Price：Other

LAN construction and wiring work
Other network tools
Analysis

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Contract analysis services focused on electronic devices.

We offer contracted analysis services for electronic devices, home appliances, and residential environments at lower prices than before.

Have you ever faced issues with unexpected heat generation or vibrations from components when you actually manufactured something you designed? How should you dissipate heat? What about vibration countermeasures? There are thermal, vibrational, and stress factors that cannot be understood from the drawings and can only be realized through actual production. However, repeatedly creating prototypes takes both time and cost... In such cases, computer-based analysis simulations are effective. SiM24 provides high-quality analysis simulations quickly and at a low cost, contributing to time and cost reduction in research, development, and manufacturing processes.

Company：SiM24
Price：Other

Stress Analysis
Thermo-fluid analysis
Contract Analysis
Analysis

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Thermal analysis service (thermal simulation)

Based on years of experience and achievements, we provide services focused on thermal analysis and thermal countermeasure proposals from the perspective of thermal design. We can offer services backed by semiconductor device development and system equipment development. We provide a wide range of services from contracted analysis to the sale of measurement systems. (Thermal simulation) [For more details, please download the catalog or feel free to contact us] ↓ ↓ ↓ ↓ ↓ ↓ ↓

Company：Wave Technology
Price：Other

Temperature and humidity measuring instruments
simulator
Contract Analysis
Analysis

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Technical Service Proposal for Power Products: Case Studies in Electrical Analysis

Quality UP! Efficiency UP! Trust UP! Proposals centered around technology and reduction of total costs.

By utilizing the electromagnetic field analysis simulator Q3D Extractor (Q3D), the quality of power line layout design can be enhanced. Design verification combined with waveform measurements for validation is also possible. Improve quality with substrate design that considers low inductance for high current paths! Increase efficiency with feedback from switching waveform evaluation to substrate design! Trust is enhanced through improved consistency via actual measurements and simulation model fitting! For more details, please download the catalog or contact us.

Company：Wave Technology
Price：Other

Other analyses
Analysis

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[Analysis Case] Evaluation of Crystal Structure by Micro XRD Analysis

XRD measurements in micro areas are possible.

We will introduce a case where XRD measurements were conducted by narrowing the X-ray beam to Φ400μm, allowing us to obtain crystal information targeting a specific area rather than the entire surface. In the XRD measurement results of the printed circuit board sample, Cu and BaSO4 were detected at all measurement points (1) to (3), and a peak from Au was detected at the measurement point (1), which is the electrode. This aligns well with the results from XRF measurements. Thus, it is possible to identify crystal structures by targeting regions of several hundred micrometers with different compositions and crystallinities. Measurement methods: XRD, XRF Product fields: LSI, memory, electronic components Analysis purposes: Composition evaluation, identification, structural evaluation For more details, please download the materials or contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Analysis

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Extreme point measurement

XRD: X-ray diffraction method

Pole figure measurement is a method that focuses on specific crystal planes and evaluates the distribution of crystal orientations by directing X-rays from various directions onto the sample. The detector is fixed at the diffraction angle (2θ) of the crystal plane of interest, and the two parameters, α (the tilt angle of the sample) and β (the in-plane rotation angle of the sample), are varied to measure crystal planes tilted in all directions. This indicates that the crystal orientations are concentrated in the directions where high diffraction intensity is observed. Additionally, the measurement results are represented in a pole figure as shown in the diagram at the bottom right.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Analysis

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Analysis of product characteristics of apple juice using LC/MS multivariate analysis.

We evaluate product characteristics and degradation components through inter-sample comparison using multivariate analysis.

As part of quality management, when you want to investigate components characteristic of the origin and variety, as well as components that cause defects between lots, comparisons between multiple samples are necessary. By statistically processing the data obtained from LC/MS measurements using multivariate analysis, it is possible to identify components that are characteristic of the samples among many components. In this case, we will introduce an example of investigating characteristic components among three apple juice products of different apple varieties using principal component analysis (PCA), which is one type of multivariate analysis.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract measurement
Analysis

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Rietveld analysis refers to

Detailed information such as atomic arrangements within the crystal can be obtained from the analysis of measurement data like XRD.

Rietveld analysis is a method for analyzing measurement data from XRD (X-ray diffraction) and neutron diffraction. In addition to identifying lattice constants and space groups using existing methods, it is possible to obtain more detailed crystallographic information, such as atomic arrangements within the unit cell, if there is a crystal structure model (candidate) for the sample.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Analysis

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Multiple SNP analyses using mass spectrometry.

The mass array method allows for the simultaneous analysis of multiple SNPs (single nucleotide polymorphisms).

This method is a gene analysis technique that utilizes mass spectrometry with MALDI-TOF-MS, allowing for the analysis of multiple SNP sites in a single measurement. Up to 40 SNPs can be measured simultaneously across 190 samples. The overall analysis follows the flow outlined below. Primers designed to amplify the target SNP regions without overlapping mass peaks, along with primers designed to extend only one base at each SNP site, are used to create mass differences in the DNA fragments, from which the bases are determined based on the detected mass peaks.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement
Analysis

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Analysis of low molecular weight compound-protein interactions using NMR and molecular dynamics calculations.

You can evaluate the interactions between small molecules and proteins using NMR and MD calculations.

Among physiological active compounds, there are many that act by targeting proteins. Therefore, obtaining structural insights into the interactions between small molecules and proteins is very important for drug development. This document presents a case study analyzing the interactions between L-tryptophan and bovine serum albumin (BSA) in solution using NMR and molecular dynamics calculations.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement
Analysis

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Overview and Characteristics of SNP Analysis

Differences between real-time PCR method and mass array method.

SNP (Single Nucleotide Polymorphism) refers to the parts of the DNA sequence that differ by a single nucleotide among individuals. It is believed that SNPs can lead to different characteristics such as physical traits and are also related to drug response. Therefore, SNP analysis is expected to be applied in personalized medicine. This document introduces the characteristics of real-time PCR and mass array methods among SNP analysis techniques. It is effective to choose the method according to the specific SNP locations, number of SNPs, and their frequencies that need to be investigated.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement
Contract Inspection
Analysis

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Structural analysis of oligosaccharides using 3D NMR.

It is possible to analyze the structure of complex organic compounds with overlapping peaks.

In the structural analysis of organic compounds using NMR, two-dimensional NMR is generally used in addition to one-dimensional NMR (1H-NMR and 13C-NMR) to confirm the correlations between peaks in one-dimensional NMR, allowing for the assignment of peaks and determination of the compound's structure. However, in compounds such as sugars that contain many similar structures, peaks can overlap even in two-dimensional NMR, making analysis difficult. In such cases, three-dimensional NMR is effective. This document presents examples of applying three-dimensional NMR using oligosaccharides as model compounds.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement
Analysis

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Analysis of genetic polymorphisms related to drug metabolism

The mass array method allows for the simultaneous analysis of multiple genetic polymorphisms.

There are individual differences in drug metabolism activity, and these differences are believed to be due to genetic polymorphisms. In the field of pharmacogenomics (PGx), there is an expectation for the application of personalized medicine that takes into account the effects of drugs, side effects, and drug interactions by investigating genetic polymorphisms. This document introduces the analysis of genetic polymorphisms related to drug metabolism using a designed analysis tool based on mass array methods. Genetic polymorphisms will be determined from the analysis results of SNPs (Single Nucleotide Polymorphisms) and CNVs (Copy Number Variations) for 20 drug metabolism-related genes.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract measurement
Contract Analysis
Analysis

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Structural analysis using Xe-plasma FIB.

Precision processing/structural evaluation is possible over a wide area of several hundred micrometers.

It achieves high positional accuracy and wide-area cross-section production, making it usable as a new large-capacity analysis application. Even small structures within a large area can be targeted for processing, enabling wide-area structural analysis.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Analysis

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[Analysis Case] Qualitative and Structural Analysis of Resin (Synthetic Polymer)

Insights into molecular structure can be obtained through combined analysis using FT-IR and thermal decomposition GC/MS.

Resins (synthetic polymers) are polymers of monomers and have characteristic functional groups depending on their type. Due to their structure, they exhibit properties such as heat resistance, toughness, and electrical insulation, making them widely used in packaging materials, adhesives, paints, and more. Structural analysis is important for understanding the properties of resins, and common analytical methods include FT-IR and thermogravimetric GC/MS. FT-IR allows for the evaluation of functional groups, while thermogravimetric GC/MS enables the assessment of monomers and partial structures, so by combining these two methods, structural analysis of a wide variety of resins becomes possible.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement
Analysis

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AI model development and image/data analysis services

Completely custom-made! We extract valuable information tailored to your needs from the important data you have collected.

- AI Model Development Based on collected data that includes the target object and publicly available open data, we will develop an AI model suitable for the conditions. By utilizing this AI model, it is expected that daily operations can be replaced by AI, promoting automation and efficiency in business processes and stabilizing accuracy. - Image/Data Analysis We analyze and evaluate images and other data. The evaluation content will be discussed with the client, and proposals will be made in line with the challenges. If the target is a product or material, analysis data can be obtained using MST.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract measurement
Contract Analysis
Image Processing Software
Analysis

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Analysis of organic monolayers using the IRRAS method with a vacuum-type infrared spectroscopy system.

[Free Gift] We have published an analysis regarding SAM-modified substrates.

Research on self-assembled monolayers (SAMs) formed by the chemical adsorption of organic molecules is gaining attention. Our product can achieve a vacuum in the spectroscopic chamber within 2 to 3 minutes after sample installation, allowing for measurements to begin in a short time. This document includes an analysis of SAM-modified substrates using the IRRAS method with a vacuum-type FT-IR, which can eliminate the influence of the atmosphere. [Contents] ■ Introduction ■ Samples ■ Equipment ■ Results ■ References *For more details, please refer to the PDF document or feel free to contact us.

Company：ブルカージャパンオプティクス事業部
Price：Other

Analytical Equipment and Devices
Analysis

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Analysis of the secondary structure of proteins in light water.

[Free Gift] Introducing a case study on the temperature dependence of protein secondary structure.

The components that make up living organisms all play important roles in life, and among them, proteins have a wide range of functions. Therefore, studying their fundamental properties is essential for understanding the mechanisms of life activities. Our "CONFOCHECK" enables qualitative and quantitative analysis of proteins in aqueous solutions, as well as dynamic analysis of changes in secondary structure. This document presents case studies on the temperature dependence of protein secondary structure using "CONFOCHECK." [Contents] ■ Introduction ■ Samples and Analysis System ■ Results ■ Conclusion ■ References *For more details, please refer to the PDF document or feel free to contact us.

Company：ブルカージャパンオプティクス事業部
Price：Other

Analytical Equipment and Devices
Analysis

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Analysis Product List and Ranking from 376 Manufacturers, Suppliers and Companies | IPROS GMS

Analysis Manufacturer, Suppliers and Company Rankings

Analysis Product ranking