Appearance defect measurement device "ST-VA" compatible with various substrates.
Ideal for pre-processing and final products! Introducing a device that automatically measures surface defects in product appearance.
We would like to introduce the appearance measurement system 'ST-VA' handled by Seiren Electronics Co., Ltd. This device automatically measures defects on the product's surface and can measure multiple items simultaneously. It is suitable for use before processing or on final products. 【Features】 ■ Automatically measures defects on the product's surface ■ Can measure multiple items simultaneously ■ Suitable for use before processing or on final products *For more details, please refer to the PDF document or feel free to contact us.
- Company:セーレン電子
- Price:5 million yen-10 million yen