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Probe Product List and Ranking from 41 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Aug 20, 2025～Sep 16, 2025
This ranking is based on the number of page views on our site.

Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Aug 20, 2025～Sep 16, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング Kanagawa//Manufacturing and processing contract 本社
  2. 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 Tokyo//Testing, Analysis and Measurement （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社　＆　GEエナジー・ジャパン株式会社
  3. ヴァイサラ Tokyo//Testing, Analysis and Measurement
  4. 4 テクノプローブ Chiba//Testing, Analysis and Measurement
  5. 5 ブルーム-ノボテスト Aichi//Testing, Analysis and Measurement
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Probe Product ranking

Last Updated： Aggregation Period:Aug 20, 2025～Sep 16, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Flexible electric wire with terminal for connection (normal temperature specification) サンケイエンジニアリング 本社
  5. 5 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社

Probe Product List

526～540 item / All 658 items

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[Standard Type] AFM/SPM Probe

[Standard Type] AFM/SPM Probe

High cost-performance AFM/SPM probes

This is a probe for atomic force microscopy and scanning probe microscopy. It can be used for a wide range of applications. With a reflective coating (Au, Al), it enables high-sensitivity measurements, and you can choose from many models with different cantilever shapes, resonance frequencies, and force constants that are suitable for your samples. Conductive coatings (Au, Pt, TiN, W2C), magnetic coatings, and bare probes without back coatings are also available. - Golden Probe: An excellent probe with an Au reflective coating and a curvature radius of 6 nm (typical). - ETALON Probe: An inexpensive probe with controlled tolerances for resonance frequency and force constant. It has different types of cantilevers at both ends of the chip. - TOP VISUAL Probe: A protruding probe that allows observation of the tip position from directly above, enabling precise positioning on the sample surface.

  • Other microscopes
  • Analytical Equipment and Devices
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High Aspect Ratio Type: High Aspect Ratio Probes for AFM/SPM

High Aspect Ratio Type: High Aspect Ratio Probes for AFM/SPM

This is a probe with a long extra tip at the tip end. It is effective for measuring samples with deep grooves and vertical sidewalls.

This is a probe for atomic force microscopy and scanning probe microscopy. It features a long extra tip at the tip's end. It is effective for measuring samples with deep grooves that a standard tip cannot reach, as well as vertical sidewalls that are difficult to measure. - Whisker Probe: A probe with an extra tip that extends at an angle of 10° or 20° at the tip's end. The angle can be selected to be perpendicular to the sample. - PHA Probe: A probe with an elongated extra tip shaped like a drill.

  • Other microscopes
  • Analytical Equipment and Devices
  • probe

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[Information] About the microdialysis probe for experimental physicochemical instruments.

[Information] About the microdialysis probe for experimental physicochemical instruments.

It provides a detailed explanation of probe holders, treatment methods, and custom probes.

This document introduces the "Microdialysis Probe," an experimental physicochemical instrument. It includes details on the "A-I type probe system," which involves inserting the probe into animals that have undergone a pre-embedded guide cannula procedure and securing it with a screw-type cap nut, as well as the "CX-I type probe system," which is easy to insert and fix, and is compact and lightweight. It also provides detailed information about dialysis membranes and recovery rates. Please use this information for product selection and handling. [Contents (partial)] ■ Introduction ■ 1. A-I Type Probe System ■ 2. CX-I Type Probe System ■ 3. C-I (IB) Type Inert Specification Probe ■ 4. D-I Type Probe, etc. *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment

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Aluminum double-tube grain probe 'OSK 491UU GSS'

Aluminum double-tube grain probe 'OSK 491UU GSS'

Made of aluminum, so it won't rust! A delicate double combination structure consisting of an outer tube and an inner tube.

The "OSK 491UU GSS" is a double-tube grain probe designed for deeply inserting into granular materials such as grains and seeds to collect samples. Its lightweight and high portability reduce the workload during sample collection with multiple transport vehicles. Additionally, it features a precise double combination structure consisting of an outer tube and an inner tube, allowing the opening to be activated one by one by adjusting the rotation angle of the inner tube, enabling uniform filling throughout the entire length of the sampling probe. 【Features】 ■ Comes with a plastic tip ■ Suitable for temperatures from -50°C to 50°C ■ Can be replaced with a metal tip ■ Ideal for sampling during inspections and checks in storage warehouses, grain trucks, and railway freight transport. *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices

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[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

Stock products domestically to achieve short delivery times! We also respond to inquiries regarding probe selection.

This is a cantilever that can be used with commercially available scanning probe microscopes and atomic force microscopes. Products from "NanoWorld," the world's largest probe manufacturing group, are used for various applications such as routine measurements in manufacturing process management, solid surface observation, material analysis, research on polymer materials, and biomaterials. We supply high-quality cantilevers with sharp tips and low variability in characteristics, as well as cantilevers equipped with probes suitable for industrial applications with high durability. [Contents] - Probes for AC mode non-contact mode - Probes for contact mode force-distance measurements - Broad compatibility for various measurement modes such as electrical and magnetic measurements - Colloid probes suitable for soft measurement targets like polymers and biomaterials - Self-exciting, self-detecting type - AFM accessories such as metal disks for fixing mica and HOPG samples *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Other measurement, recording and measuring instruments

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Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

High aspect ratio SPM/AFM probes that can fit into narrow groove structures!

This product is suitable for quantitative measurements in the depth direction, which are difficult to measure with laser microscopes, such as line & space and trenches. Are you struggling with low surface shape reproducibility with your current probe? Cases where the groove shape is not accurately measured due to the opening angle of the probe tip can be improved by using a probe with a high tip aspect ratio. 【Features】 ■ Well-suited for quantitative measurements in the height direction, which are difficult to measure with laser microscopes ■ Improves cases where the groove shape is not accurately measured due to the opening angle of the probe tip *For more details, please refer to the related link page or feel free to contact us.

  • Other physicochemical equipment
  • 3D measuring device
  • Other microscopes

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AFM/SPM Probes and Cantilevers for Polymer Material Research and Development

AFM/SPM Probes and Cantilevers for Polymer Material Research and Development

Suitable for high polymer materials with a slightly lower spring constant than conventional non-contact tapping mode probes.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for polymer material research and development. For tapping mode measurements of polymers with relatively soft surfaces, soft tapping probes are ideal. Additionally, we offer colloid probes suitable for localized viscoelastic measurements, friction force measurements, and modulation response measurements, which have been in high demand in recent years. 【Features】 The NanoWorld Pointprobe NCL is designed for non-contact mode and tapping mode. It combines a low spring constant, high measurement stability, excellent sensitivity, and high-speed measurement capabilities. The tip shape is a polygon close to a pyramid. *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • Other microscopes
  • 3D measuring device

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AFM/SPM Probes and Cantilevers for Measuring Electrical Properties of Nanomaterials

AFM/SPM Probes and Cantilevers for Measuring Electrical Properties of Nanomaterials

Introducing a conductive film coat probe suitable for measuring the electrical properties of various materials.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for measuring the electrical properties of nanomaterials. For localized electrical property measurements, probes with metal film coatings are preferable. While platinum coating is the standard, you can also use platinum silicide or conductive diamond-coated types that enhance wear resistance during contact. 【Features】 ■ For measuring the electrical properties of nanomaterials ■ Probes with metal film coatings are suitable for localized electrical property measurements ■ Platinum silicide and conductive diamond-coated types are also available *For more details, please refer to the related link page or feel free to contact us.

  • Other physicochemical equipment
  • Other microscopes
  • 3D measuring device

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AFM/SPM Probes and Cantilevers for Biomaterial Measurement

AFM/SPM Probes and Cantilevers for Biomaterial Measurement

A liquid probe equipped with a low spring constant cantilever suitable for measuring soft samples in liquid.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for bio-sample and biomaterial measurement. In recent years, there has been a growing demand from customers for the measurement of surface shapes and viscoelasticity of cells and biomolecules, which requires special cantilevers with extremely soft spring constants. 【Features】 ■ Versatile SPM/AFM probes suitable for a wide range of applications ■ Designed for both contact mode and dynamic mode ■ Compatible with almost all commercially available SPM/AFM systems <PNP Series> ■ Cantilevers and probes made of silicon nitride ■ Support tips made of Pyrex glass ■ Individually separated chips for easy handling <uniqprobe Series> Probes with smaller dimensional specifications and material-specific warping and bending compared to Si probes and SiN probes. *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • 3D measuring device
  • Other microscopes

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High-speed AFM: AFM/SPM probes and cantilevers

High-speed AFM: AFM/SPM probes and cantilevers

USC series with a maximum resonance frequency of 5 MHz for high-speed AFM measurements in air and liquid.

The "USC Cantilever" is a probe with a high resonance frequency that enables unprecedented high-speed response in both air and liquid environments. This product, which balances a high resonance frequency with a low spring constant, is widely used in high-speed AFM measurements that allow for dynamic observation of bio-samples and real-time observation of material surfaces. 【Features】 ■ Designed for high-speed scanning ■ The cantilever and probe are fixed to a single crystal silicon support chip ■ Straight cantilever with no inherent stress ■ Ribbon-shaped cantilever with rounded corners at the free end ■ Cantilever made of quartz-like material *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes
  • 3D measuring device
  • Other physicochemical equipment

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Probe for Scanning Probe Microscopy (SPM)

Probe for Scanning Probe Microscopy (SPM)

A lineup of various probes, including high-resolution models and cost-effective models. We also offer surface stress sensors.

As a member of the global probe manufacturer NanoWorld Group, we offer a variety of probes for Scanning Probe Microscopes (SPM). We have a rich lineup including high-end models that excel in fields requiring high resolution, as well as mid-range probes for Atomic Force Microscopes (AFM). We stock products domestically and provide them at short lead times and reasonable prices. 【Product Lineup (Partial)】 ■ NanoSensors PPP Series, NanoSensors ATEC Series High-end models that excel when high-resolution data is required ■ OPUS160AC Series, BudgetSensors Tap Series, etc. High cost performance for standard routine measurements ■ USC Series, OPUS 55AC Series, etc. Supports high-speed scanning with resonance frequencies in the MHz range, achieving several images per second In addition, we can propose solutions tailored to measurement needs such as electrical property measurements, long-duration measurements, measurements of soft materials, and nano-scale viscoelasticity measurements. *For more details, please refer to the materials. Feel free to contact us as well.

  • probe
  • Other microscopes

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Field Emission Auger Microprobe

Field Emission Auger Microprobe

High-spec OJE electronic spectrometer

Japan Electronics Corporation JAMP-9510F Field Emission Auger Microprobe is a high-spec Auger electron spectroscopy device equipped with a stable high-current field emission electron gun, which is also used in EPMA, and enables high-throughput analysis of chemical bonding states in the nano to micro range. It achieves versatility that does not depend on the sample, providing compositional information from metallic samples to insulating samples, as well as chemical information. 〇 Features - High sensitivity and high resolution analyzer - Schottky field emission electron gun - User-centric sample stage - High durability - Waveform separation software *For more details, please download the PDF or feel free to contact us.

  • Other electronic measuring instruments

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High voltage (10kV) compatible coaxial probe holder

High voltage (10kV) compatible coaxial probe holder

High voltage measurement, 10kV compatible, coaxial probe holder.

The HVP-CX-10 comes with a 10kV UHV connector and coaxial cable, allowing for measurements of up to 10kV. The needle vice at the tip of the holder securely holds the needle with simple operation. The SP100 positioner with a T-type arm is ideal for the HVP series probe holders. Additionally, micro positioners with a T-type arm, such as "SP-150" and "S-926," can also be used.

  • probe

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PROXIMAL BALLPROBE Non-contact Wide Area Probe

PROXIMAL BALLPROBE Non-contact Wide Area Probe

Non-contact Raman probe that enables measurement of Raman spectra over a wide range.

The wide-area probe has an effective aperture diameter of 8mm, which is wider than that of a standard probe, allowing for the broad collection of Raman scattered light from samples. Additionally, the working distance (focal length) is 3cm, enabling non-contact measurements in the biopharmaceutical, pharmaceutical, and food sectors, thereby reducing the risk of cross-contamination and foreign matter intrusion during measurement.

  • Raman Spectrophotometer
  • Other photoanalytical instruments

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TH-Raman Probe for low wavenumber region measurement

TH-Raman Probe for low wavenumber region measurement

The Raman spectrum in the low-frequency region can be measured non-contactly and non-destructively.

The TH-RamanProbe system consists of a control unit made up of a laser light source and power supply, and a probe that irradiates the sample with laser light and receives Raman scattered light from the sample. A special notch filter that cuts the excitation laser is built into the probe section. The probe, equipped with a sapphire lens that has high throughput, is available in two types: short focus and long focus, depending on the measurement purpose.

  • Analytical Equipment and Devices

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