![Low resistance measurement mode (0.1mΩ～) [Under development]](https://image.mono.ipros.com/public/product/image/7cf/2001025840/IPROS14564244884576935579.jpeg?w=280&h=280)
Low resistance measurement mode (0.1mΩ～) [Under development]
Introducing the Takaya Flying Probe Tester. We are challenging the measurement of low resistance (0.1mΩ and below).
At Takaya, in order to respond to further requests from our customers, we are advancing the development of a unique mode for the flying probe tester that adjusts the application parameters to measure lower resistance (0.1 mΩ and below). *Resolution: 0.001 mΩ Compared to handheld low-resistance meters, the flying probe tester has longer measurement lines (approximately 5 meters) from the measurement probes to the main unit, which necessitates machine design that takes external noise into account; however, we have expertise in this area. Additionally, when measuring with handheld probes, the force, angle, and position when contacting the measurement target are not consistent, which can lead to variations in measurement results and potential marks or damage to the object being measured. Our probe system is well-regarded for its damage-free contact and high-precision contact. If you have concerns such as wanting to eliminate the uncertainty of manual measurements or finding the measurement process too cumbersome, please feel free to reach out to us. We would be happy to accept test trials.
- 企業：TAKAYA Corporation
- 価格：Other
![[Exhibition Information] Introduction of Exhibited Products at the 38th Nepcon Japan](https://image.mono.ipros.com/public/product/image/487/2001041999/IPROS61502736572407395.png?w=280&h=280)
