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Tester Product List and Ranking from 317 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

Tester Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. フクダ Tokyo//Testing, Analysis and Measurement
  2. TAKAYA Corporation Okayama//Industrial Electrical Equipment
  3. ナック Tokyo//Industrial Electrical Equipment
  4. 4 コスモ計器 Tokyo//Testing, Analysis and Measurement
  5. 5 ケーエヌエフ・ジャパン KNF JAPAN Tokyo//Machine elements and parts
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Tester Product ranking

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. "Comprehensive Product Guide" "Technical Manual" ／ Fukuda Leak Test フクダ
  2. General-purpose differential pressure air leak tester | FLA-0201 series フクダ
  3. Masterless Differential Pressure Air Leak Tester | FLA-0200 series フクダ
  4. 4 Nodson DAGE Bond Tester (Joint Strength Testing Machine) オーヨー
  5. 5 Basic Knowledge of In-Circuit Testing: What is an In-Circuit Tester? TAKAYA Corporation

Tester Product List

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Fastest in-circuit testing! Case studies of flying probe testers.

Fastest in-circuit testing! Case studies of flying probe testers.

The Takaya APT series is a board inspection device capable of industry-leading ultra-fast in-circuit testing. Here are some case studies.

■Inspection of mass-produced products By connecting to loaders/unloaders, automated and unmanned inspections are possible even for large lots. ■Inspection of small quantities of various types of substrates There is no need for dedicated jig manufacturing costs. While it is difficult to identify defective areas in function tests, they can be identified through in-circuit tests. ■Inspection of prototype substrates We can respond immediately to design changes. Function tests are also possible, such as applying voltage to the substrate to confirm circuit operation (ON/OFF) and measuring direct current. ■Implementation confirmation inspection during model switching We can reliably and quickly confirm the mounting program of the first lot and check for incorrect component sets on the mounter during model switching. ■Defect analysis inspection This can be used for inspecting substrates that failed functional tests or for defect analysis of substrates that failed in the market. It significantly reduces repair time and decreases the number of discarded substrates. Additionally, there are various other applications where Takaya testers have been utilized successfully. For more details, please contact your sales representative.

  • Circuit Board Inspection Equipment

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Collaboration with boundary scan testing using a flying probe tester.

Collaboration with boundary scan testing using a flying probe tester.

We will create new value through the mutual complementarity of ICT and BST.

In-circuit testing with a flying probe tester excels at inspecting the electrical characteristics of implemented electronic components in analog circuits. However, components that cannot be probed make electrical testing difficult, and functional testing of digital circuits is challenging. On the other hand, boundary scan testing allows for quick interconnection testing between LSI pins and on-board programming for FPGAs, but it can only test digital circuits around ICs that comply with the boundary scan standard, and it also requires specialized fixtures for connections. At Takaya Corporation, we possess technology that uses flying probes instead of fixtures to connect 4 to 5 scan-compatible pins and measuring instruments required for boundary scan testing. This allows for boundary scan testing even when the counterpart of a boundary scan-compliant IC is a non-boundary scan-compliant IC or passive components (such as connectors) by enabling the flying probe to function as a virtual boundary scan cell. With a single flying probe tester, it is possible to conduct comprehensive testing of both digital and analog circuits, thereby significantly enhancing testing efficiency compared to before.

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  • Circuit Board Inspection Equipment

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Implementation Technology Journal Electronics Implementation Technology Special Feature Article Published

Implementation Technology Journal Electronics Implementation Technology Special Feature Article Published

We have received permission to publish the feature article that was included in the only domestic magazine specializing in implementation technology, "Electronics Implementation Technology." You can view it here.

Special Feature Content ■ Latest Trends in BGA Implementation Board Inspection Hybrid Inspection of Flying Probe Testers and JTAG Testing Andor System Support Co., Ltd. / Masayuki Taniguchi Takaya Co., Ltd. / Kohei Yanagida Overview BGA (Ball Grid Array) components are now used in all types of electronic devices, from consumer products to industrial equipment, and more recently, automotive devices. However, a reliable method for inspecting boards with BGA components (hereafter referred to as BGA implementation boards) has not been established. This is because every inspection method has its advantages and disadvantages, making it impossible to conduct a complete test using only one inspection method. Therefore, inspecting BGA implementation boards has become a challenge for many companies. In this article, we will introduce the latest technological trends in hybrid inspection that combines flying probe testers and JTAG (Joint Test Action Group) boundary scan as one solution to this issue. 1. Introduction 2. Inspection and Challenges of BGA Implementation Boards 3. Possibilities of Electrical Testing 4. In-Circuit Testing 5. JTAG Boundary Scan Testing 6. Hybrid Testing 7. Conclusion

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  • Circuit Board Inspection Equipment

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Introduction to the special feature article of the European electronics industry magazine "EPP"

Introduction to the special feature article of the European electronics industry magazine "EPP"

The European electronics industry magazine "EPP" has published a feature article on Takaya's flying probe tester.

In the October 2023 issue of the European electronics industry magazine "EPP," an article introducing Takaya's flying probe testers has been published. Takaya Corporation and its European distributor, Cystec Europe, have maintained a long-standing partnership with Siemens in Germany. At Siemens' global flagship factory "SIEMENS Karlsruhe," 12 Takaya flying probe testers are currently in operation, ensuring the reliability of assembled circuit boards. The APT-1600FD-A achieves fully unmanned inspection 24 hours a day, 5 days a week through simultaneous inspection of both sides, automatic setup of inspection programs using new software, and automatic transport of circuit boards using an Autonomous Mobile Robot (AMR). Additionally, it supports the latest interface standards such as OPC UA, enabling integration with MES systems, as well as establishing an environment for monitoring operational rates and automatically switching inspection programs based on defect statistics. Please check the related links and download page for more information.

  • Circuit Board Inspection Equipment

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Introduction of Exhibited Products at the Okayama Technology Exhibition OTEX2023

Introduction of Exhibited Products at the Okayama Technology Exhibition OTEX2023

Thank you for visiting the Okayama Technology Exhibition (OTEX) 2023. You can view the catalog of the exhibited products.

Thank you to everyone who visited our booth at the "Okayama Technology Exhibition (OTEX) 2023" held at Convex Okayama from November 7 (Tuesday) to 8 (Wednesday), 2023. In response to requests such as "I want to take a closer look at the exhibits again" and "I want to see the related catalogs and panels up close," we are now making available the product catalogs and display panels introduced at the Takaya booth. Please take a look.

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  • Circuit Board Inspection Equipment

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Low resistance measurement mode (0.1mΩ～) [Under development]

Low resistance measurement mode (0.1mΩ～) [Under development]

Introducing the Takaya Flying Probe Tester. We are challenging the measurement of low resistance (0.1mΩ and below).

At Takaya, in order to respond to further requests from our customers, we are advancing the development of a unique mode for the flying probe tester that adjusts the application parameters to measure lower resistance (0.1 mΩ and below). *Resolution: 0.001 mΩ Compared to handheld low-resistance meters, the flying probe tester has longer measurement lines (approximately 5 meters) from the measurement probes to the main unit, which necessitates machine design that takes external noise into account; however, we have expertise in this area. Additionally, when measuring with handheld probes, the force, angle, and position when contacting the measurement target are not consistent, which can lead to variations in measurement results and potential marks or damage to the object being measured. Our probe system is well-regarded for its damage-free contact and high-precision contact. If you have concerns such as wanting to eliminate the uncertainty of manual measurements or finding the measurement process too cumbersome, please feel free to reach out to us. We would be happy to accept test trials.

  • Circuit Board Inspection Equipment

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[Exhibition Information] Introduction of Exhibited Products at the 38th Nepcon Japan

[Exhibition Information] Introduction of Exhibited Products at the 38th Nepcon Japan

Thank you for visiting the 38th Internepcon Japan Electronics Manufacturing and Assembly Exhibition.

You can view information about the products exhibited on that day here. 〇 Industrial Equipment Division - Flying Probe Tester APT-1600FD-A (Assembly Board Inspection Device) Unmanned continuous inspection linked with front and rear devices OPC-UA (OPC Unified Architecture) Linked with MES (Manufacturing Execution System) Real-time information collection and management of operational status 〇 RF Division / Solutions Division - RFID Outgoing Management System - RFID UHF Band Continuous Monitoring System - Work performance collection using RFID / Semiconductor IC Tag Reading - RFID × IoT Data Device "RFID Performance Collection System" - Easy replacement from barcode HID reader and key input tool

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  • Circuit Board Inspection Equipment

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38th Electronics Packaging Society Spring Conference Presentation Materials Released

38th Electronics Packaging Society Spring Conference Presentation Materials Released

The presentation materials for the 38th Electronics Packaging Society Spring Conference are now available.

The 38th Electronics Packaging Society Spring Conference was held from March 13 (Wednesday) to 15 (Friday), 2024, at the Noda Campus of Tokyo University of Science. At this conference, Mr. Yanagida, the Technical Department Manager of Takaya Corporation's Industrial Equipment Division, gave a presentation on "The Latest Trends in Hybrid Testing Systems Combining JTAG Testing and Flying Probe Testers." The presentation materials from that session have been made available, so please take a look at the related catalog pages below. -------- Content -------- To ensure reliable assembly guarantees for printed circuit boards, electrical testing is essential. However, a single testing method alone does not provide sufficient test coverage. To address this issue, we introduce a hybrid testing system that integrates flying probe testers with JTAG boundary scan testing. By complementing each testing method, we can maximize the test coverage for high-density printed circuit boards, enabling more accurate fault diagnosis.

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  • Circuit Board Inspection Equipment

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Dual Side Flying Probe Tester APT-2600FD

Dual Side Flying Probe Tester APT-2600FD

A new innovation in substrate manufacturing. Achieving improvements in production efficiency and inspection accuracy!

The APT-2600FD is a next-generation dual-side flying probe tester that can perform combination testing with up to 6 probes using both upper and lower flying probes simultaneously. It improves test coverage while reducing the risk of product damage due to board flipping operations, significantly shortening inspection time. Equipped with a high-performance measurement system and a variety of features, it contributes to quality improvement from prototyping to mass production. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your boards. A complete testing process is possible, including the creation of inspection programs, testing using actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.*

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  • Other measurement, recording and measuring instruments

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Flying Probe Tester APT-2400F / 2600FD

Flying Probe Tester APT-2400F / 2600FD

2025 Electronics Packaging Society Technical Award Winner!" "55th Mechanical Industry Design Award IDEA Winner!

Takaya Corporation has announced a new model of its flying probe tester, the "APT-2400F/APT-2600FD series," which reliably detects various defects in printed circuit boards through ultra-high-speed inspection. Equipped with cutting-edge inspection technology that can check the placement and connections of fine components with high precision, it ensures that even minor defects and risks are not overlooked, strongly supporting the improvement of product quality. Additionally, thanks to the company's unique control mechanisms and sensing technology, reliable inspections can be achieved even in fluctuating environments, contributing to quality management by reducing recall risks. Furthermore, it features a user-friendly interface that anyone can intuitively operate, helping to alleviate burdens in workplaces where labor shortages are becoming serious, while still ensuring high inspection accuracy and contributing to increased productivity. *For more details, please download the PDF document or feel free to contact us.*

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[Case Study] The Importance of Electrical Testing in EMS Companies

[Case Study] The Importance of Electrical Testing in EMS Companies

Takahashi's flying probe tester solves the challenges faced by EMS companies.

【Implementation Results for EMS Companies】 - By conducting electrical inspections from the prototype stage of the circuit board, we achieve quality assurance before mass production. - Early optimization of circuit board design and component selection contributes to the reduction of defects in later processes. 【Challenges Faced by Customers】 Cost of Recreating Jigs: With jig-based testers, it is necessary to recreate dedicated jigs every time there is a prototype or design change. Each design change requires modifications to the jigs, significantly increasing costs and time. Insufficient Response to Design Changes: Conventional inspection methods make it difficult to respond flexibly to design changes. There were instances where long lead times made rapid verification during the prototype stage challenging.

  • Circuit Board Inspection Equipment

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[Case Study] Inspection of Large PCBs for Medical Devices

[Case Study] Inspection of Large PCBs for Medical Devices

Please utilize Takaya's flying probe tester for the inspection of large substrates for medical devices (in conjunction with boundary scan).

By combining visual inspection, non-contact scanning, and physical probing, we meet the stringent reliability standards in the medical device field, achieving both quality improvement and cost reduction. 【Implementation Achievements】 - Achieved full inspection in inline testing, ensuring product quality. - Enhanced defect detection capabilities for large substrates and complex design boards through collaboration with boundary scan technology. 【Challenges Faced by Customers】 Limitations of APT alone: Flying probe testers excel in electrical characteristic testing, but physical access for probing is difficult for components with hidden pin connections, such as BGA and QFP. In high-density substrates, there are areas that cannot be fully covered by probing alone. Constraints of AOI: Cannot detect defects (such as solder bridges or connection failures) located beneath BGA or large components. Internal connections and micro shorts in multilayer substrates cannot be detected. In large substrates, areas beyond the field of view occur, making it difficult to efficiently inspect the entire area. Challenges with large substrates and complex designs: In large substrates, inspection time tends to increase for both AOI and APT, leading to decreased productivity. Full inspection of high-density mounted substrates requires an efficient inspection system that combines physical probing and non-contact inspection.

  • Circuit Board Inspection Equipment

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[Case Study] PCB Inspection for Lighting (LED Lighting)

[Case Study] PCB Inspection for Lighting (LED Lighting)

Please utilize Takaya's flying probe tester for substrate inspection for lighting (LED lighting).

By utilizing color sensors for automated inspection, we overcome the limitations of visual inspection and achieve quality stabilization and efficiency. Automation reduces the burden on operators and establishes consistent inspection standards, balancing improved product reliability with cost reduction. 【Implementation Achievements】 - Transition from visual inspection to automated inspection. - Achieved quality stabilization through precise automated inspection using color sensors. 【Challenges Faced by Customers】 Operator Burden: Visual inspection relies on the skills and experience of operators, leading to issues such as fatigue and decreased concentration during long hours of work. As the burden on operators increases, the risk of decreased inspection accuracy rises. Variability in Judgment Criteria: Visual inspection involves subjective judgments by individuals, resulting in variability in quality standards. Inconsistent judgments can lead to the outflow of defective products and excessive inspection. Difficulty in Confirming LED Characteristics: Determining fine characteristics such as the color and brightness of LEDs is challenging through visual inspection. Inspections based on accurate numerical standards are required.

  • Circuit Board Inspection Equipment

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We received the Encouragement Award at the 21st JPCA Award.

We received the Encouragement Award at the 21st JPCA Award.

It is possible to inspect high-functionality substrates using ultra-precision substrates and new materials, establishing a new standard for printed circuit board assembly inspection, with expectations for contributions to the industry.

Takaya Corporation has been highly recognized for its technical uniqueness and future potential in the development of a flying-type in-circuit tester equipped with new technology, receiving the Encouragement Award at the "21st JPCA Award" organized by the Japan Electronics Circuit Industry Association. The JPCA Award is a system that honors outstanding products and technologies that contribute to the development of electronic circuit technology and related industries, and it is conducted for exhibitors at the exhibition "JPCA Show 2025 (Total Solution Exhibition for Electronic Devices 2025)" organized by the association. In this award, a rigorous examination is conducted by a selection committee composed of experts from academia, the electronic circuit industry, and specialized magazine editors, based on perspectives such as 'originality (uniqueness and originality)', 'potential for development and future in the industry', 'reliability', and 'relevance to current trends'. In 2025, five outstanding technologies and products were selected as the "21st JPCA Award". Our company has received this award for two consecutive years, following last year. We would like to express our heartfelt gratitude to the selection committee members and all those who have supported and cooperated with us.

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  • Circuit Board Inspection Equipment

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We have been featured on the official website of i-PRO Co., Ltd.

We have been featured on the official website of i-PRO Co., Ltd.

Visualizing the internal state of the equipment. Streamlining maintenance support with high-definition network cameras.

We are pleased to announce that Takaya Corporation's case study has been featured on the official website of i-PRO Co., Ltd. At our company, we have been addressing the challenge of developing a flying probe tester that allows for remote monitoring of the internal conditions of the device, thereby facilitating a swift initial response in the event of a problem. To solve this issue, we have equipped our latest models, the APT-2400F and APT-2600FD, with i-PRO Co., Ltd.'s network cameras as standard. By incorporating the cameras, we can monitor the internal state of the device in real-time, which has led to faster troubleshooting and enhanced quality control in the inspection process. In this case study, we provide detailed insights from the perspective of the development team regarding: - The background leading to the standard inclusion of cameras - The reasons for product selection - Operational innovations - The effects of the integration Please check the related link below for more information.

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  • Circuit Board Inspection Equipment

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