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Last Updated: Aggregation Period:Mar 11, 2026~Apr 07, 2026
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Tips Product List

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Test chip with solder bumps

Test chip with solder bumps

Test chip equipped with solder bumps □Product name ... JTEG Phase1E50/JTEG Phase1E28/JTEG Phase1E15 ■Main applications Material development, equipment development, substrate development, package development Process startup/development, promotional data acquisition, etc.

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  • Tips

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Test chip with solder bumps

Test chip with solder bumps

Test chip equipped with solder bumps (narrow pitch area type) □Product name ... JTEG Phase2E200/JTEG Phase2E175/JTEG Phase2E150 ■Main applications Material development, equipment development, substrate development, package development Process startup/development, promotional data acquisition, etc.

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Test chip for thermal resistance and stress measurement.

Test chip for thermal resistance and stress measurement.

Thermal resistance and stress measurement test chip □Product name... JTEG Phase5/JTEG Phase5GB2 ■Main applications Material development, equipment development, package development Process startup/development, promotional data acquisition, etc.

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Test chip [Large general-purpose]

Test chip [Large general-purpose]

General-purpose test chip with a larger chip size than JTEG Phase 0 ■ Wafer size ... 8-inch wafer ■ Base chip size ... 3.5mm × 3.5mm ■ Pad pitch ... 120μm ■ Number of pads ... 96 bumps (the inner pads do not have aluminum pads opened) ■ Compatible bump process ... gold stud bump ■ Compatible substrate ... none ■ Options ... bump mounting / dicing processing / back grinding processing ■ Main applications Material development, equipment development, package development Process startup/development, promotional data acquisition, etc.

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Test chip [for ultra fine pitch WB/FC mounting evaluation]

Test chip for ultra-fine pitch WB/FC mounting evaluation.

Ultra Fine Pitch WB・FC Implementation Evaluation Test Chip ■Wafer Size ... 8-inch wafer ■Base Chip Size ... 6.0mm × 2.3mm ■Pad Pitch ... 300μm ■Number of Pads ... 16 bumps ■Compatible Bump Process ... None ■Compatible Substrate ... None ■Options ... Dicing processing / Back grinding processing ■Main Applications Material development, promotional data acquisition, etc.

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Test chip [for ultra fine pitch WB/FC mounting evaluation]

Test chip for ultra-fine pitch WB/FC mounting evaluation.

Ultra Fine Pitch WB・FC Implementation Evaluation Test Chip □Product Name... JTEG Phase11_80/JTEG Phase11_70/JTEG Phase11_60/JTEG Phase11_50/JTEG Phase11_40 ■Main Applications Package development, process startup/development, promotional data acquisition, etc.

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Test chip for LCD driver implementation evaluation.

Test chip for evaluating LCD driver implementation.

Liquid Crystal Driver Implementation Evaluation Test Chip □ Product Names ... JTEG Phase6_50/JTEG Phase6_35 JTEG Phase6_30/JTEG Phase6_25 JTEG Phase6_15S/JTEG Phase6_20 JTEG Phase6_40/JTEG Phase6_25E JTEG Phase6_60 ■ Main Applications Material development, equipment development, substrate development, process startup/development, promotional data acquisition, etc.

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Test chip 【Ultra-small chip size 0.55mm】

Test chip 【Ultra-small chip size 0.55mm】

Ultra-small chip size 0.55mm□ test chip ■ Wafer size ... 6-inch wafer ■ Base chip size ... 0.55mm × 0.55mm□ ■ Pad pitch ... 110μm ■ Number of pads ... 8 pads ■ Compatible bump processes ... Gold-plated bump / Gold stud bump ■ Options ... Bump mounting / Dicing processing / Back grinding processing / Surface polyimide film formation (excluding gold-plated bump products) ■ Main applications Material development, equipment development, package development Process startup/development, promotional data acquisition, etc.

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Test chip for evaluating Cu bonding with Cu bumps.

Test chip for evaluating Cu bonding with Cu bumps.

Cu bump mounted Cu bonding evaluation test chip ■Wafer size ... 8-inch wafer ■Base chip size ... 5.09mm × 5.09mm ■Pad pitch ... 150μm (staggered pads) ■Number of pads ... 841 bumps ■Compatible bump process ... Cu bump ■Compatible substrate ... None ■Options ... Bump mounting / Dicing processing / Back grinding processing ■Main applications Package development, process startup/development, promotional data acquisition, etc.

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Test chip with next-generation solder bumps

Test chip with next-generation solder bumps.

Next-generation test chip with Low-K film used in the interlayer dielectric layer for solder bumps ■Wafer size: 8-inch wafer ■Base chip size: 5.02mm × 5.02mm ■Pad pitch: 200μm (staggered pads) ■Number of pads: 484 bumps ■Compatible bump processes: Eutectic solder / Lead-free solder ■Compatible substrate: JKIT Type 5 ■Options: Bump mounting / Dicing processing / Back grinding processing / Surface polyimide film formation ■Main applications: Package development, process ramp-up / Development, promotional data acquisition, etc.

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Glass chip for observing underfill entrapment voids.

Glass chip for observing underfill entrapment voids.

Underfill Encapsulation Void Observation Glass Chip ■Wafer Size: 5-inch Wafer ■Base Chip Size: 5.02mm × 5.02mm ■Pad Pitch: 200μm ■Number of Pads: 484 Bumps ■Compatible Bump Processes: Eutectic Solder / Lead-Free Solder ■Compatible Substrates: JKIT Type1 (SIDE A) / JKIT Type5 ■Base Material: Natural Quartz Glass ■Options: Bump Mounting / Dicing Processing ■Main Applications: Material Development, Process Startup/Verification, Promotional Data Acquisition, etc.

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Test chip for ultra-fine pitch wire bonding evaluation.

Test chip for ultra-fine pitch wire bonding evaluation.

Super Fine Pitch Wire Bonding Evaluation Test Chip ■Wafer Size: 8-inch wafer ■Base Chip Size: 3.0mm × 3.0mm ■Pad Pitch: 30, 35, 40, 45, 50, 55, 60μm from the chip inner peripheral pads ■Number of Pads: 120, 136, 144, 152, 152, 160, 160 pads from the chip inner peripheral pads ■Compatible Bump Process: None ■Compatible Substrate: None ■Options: Dicing processing / Back grinding processing ■Main Applications Material development, equipment development, package development Process startup/development, promotional data acquisition, etc.

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Test Chip 【Multi-Type】

Test Chip 【Multi-Type】

Fine pitch wire bonding, gold-plated bumps, gold stud bumps, and multi-purpose test chip ■ Wafer size: 6-inch wafer ■ Base chip size: 2.11mm × 2.11mm ■ Pad pitch: 45, 50, 60μm from the chip inner peripheral pads ■ Number of pads: 92, 92, 100 pads from the chip inner peripheral pads ■ Compatible bump processes: Gold-plated bumps (select one type from pads with 45, 50, 60μm pitch) / Gold stud bumps ■ Compatible substrates: None ■ Options: Dicing processing / Back grinding processing ■ Main applications Material development, equipment development, substrate development Process startup/development, promotional data acquisition, etc.

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Test chip [Multi-type]

Test Chip 【Multi-Type】

Test chip used for wire bonding, gold-plated bumps, gold stud bumps, and multi-purpose applications. ■Wafer size: 6-inch wafer ■Base chip size: 2.13×2.1mm ■Pad pitch: 130μm ■Number of pads: 108 bumps (48 bumps on the inner circumference, 60 bumps on the outer circumference) ■Compatible bump processes: Gold-plated bumps / Gold stud bumps ■Compatible substrate: JKIT Type2 (SIDE A) ■Options: Bump mounting / Dicing processing / Back grinding processing / Surface polyimide film formation (excluding gold-plated bump products) / Can be changed to gallium arsenide wafer (only for gold-plated bump products) ■Main applications: Material development, equipment development, substrate development, package development, process startup/development, promotional data acquisition, etc.

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Ultra Wideband Radio Impulse UWB

Low power consumption and low cost! It has excellent low interference with devices and non-invasive properties for the human body.

"Impulse Radio (IR, Impulse Radio) UWB" can be applied not only for high-speed communication but also for high-precision distance measurement and positioning sensors, as well as short-range radar, due to its characteristics. Additionally, it is attracting attention as a technology for medical devices because of its low interference with other devices and non-invasive nature towards the human body. At Japan G.I.T. Co., Ltd., we are working on the development of proprietary LSI to realize this product with low power consumption and low cost. 【Features】 ■ High-precision position detection ■ High-speed data communication ■ Low interference with electronic devices ■ Non-invasive to the human body ■ Low power consumption ■ Low cost *For more details, please refer to the PDF materials or feel free to contact us.

  • Communications
  • Tips

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Silicon PIN photodiode chip

We have started offering the PD Chip series at a low price. We have 15 different chip sizes available.

It is high quality and competitively priced.

  • Other semiconductors
  • diode
  • Tips

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TEG chip

TEG chip

We can offer standard and custom options to fit your budget. We also accommodate various bump processing. We will respond to your specifications for wiring materials, insulation materials, etc. Additionally, we can create from just one piece, so please feel free to consult with us.

  • Bonding Equipment
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Semiconductor dummy chip

We will manufacture according to the client's specifications.

The wafer size is a maximum of 4 inches, with a thickness of 200 to 500 μm. The electrode materials include Al, Al-Si-Cu, and Al-Cu, among others. The formation of SiN and photolithography is possible, and the formation of Au bumps and dicing can be done for supplied wafers up to a maximum of 8 inches. Dicing and tray packing will also be performed.

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VIC292 Consumer Device Security Chip, MATTER Compatible

VIC292 securely connects low-power devices such as sensors to the network using TLS.

Securely connect edge devices to servers using the TLS protocol. The cryptographic keys and digital certificates used in PKI are stored securely within the chip. It handles interactions with the certification authority on behalf of the host microcontroller. From the host microcontroller, it only requires an I2C call, eliminating the need for developing cryptographic processing firmware. It is compatible with the smart home network MATTER. The digital certificates for MATTER can be pre-loaded into the VIC292 chip and provided.

  • Dedicated IC
  • Encryption and authentication
  • Tips

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Reinin Manual Pipette

Unmatched pipetting performance and ergonomic design.

Metra Toledo/Reinin offers a variety of manual pipettes and accessories, including single-channel, multi-channel, and adjustable spacers, utilizing cutting-edge technology to enhance comfort, performance, and control. Reinin's Pipet-Lite XLS+ manual pipette integrates advanced engineering technology and innovation, providing excellent comfort along with highly reproducible results. The new "low-friction" elastomer seal technology and polymer tip ejector enable smooth and reliable pipetting. A comfortable handle, lightweight spring, and patented LTS LiteTouch system allow for light and smooth operation, significantly reducing the risk of repetitive strain injuries (RSI). In addition to the standard type, Reinin offers its unique LTS type that can be operated with less force for both tips and shafts. Furthermore, all XLS+ pipettes from Reinin are equipped with RFID tags for enhanced safety, state-of-the-art inventory management, and calibration tracking. With Reinin's manual pipettes, you can achieve world-class results.

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Report: ValleyView Atom Z3740 SoC

Detailed structural analysis report of the Intel Atom 23740 processor.

The "Intel(R) 22nm ValleyView Atom(TM) Z3740 SoC" is a detailed structural analysis report of the Intel Atom 23740 processor. The 24740 is designed for Windows and Android tablets and is a power-efficient quad-core SoC. This SoC operates at a clock speed of 1.33GHz and is based on the Intel Bay Trail-Silvermont architecture. 【Features】 ■ The 23740 is manufactured using a 9-layer metal, dual-gate dielectric, 22nm SoC process. ■ Device: HKMG FinFET transistors with a minimum pitch of 90nm. ■ Silicon diffusion layer section: Used for NMOS transistors, while SiGe is used for PMOS transistors. For more details, please contact us or download the catalog.

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TEG chip

Creation of TEG chips for implementation evaluation using techniques such as film formation, photo-etching, and plating.

At Toyowa Sangyo Co., Ltd., we create TEG chips for implementation evaluation using technologies such as film formation, photo-etching, and plating. We offer options for standard and custom products tailored to our customers' budgets and specifications. We can also accommodate small quantities. Please feel free to consult with us. Additionally, we provide back grinding processing for wafers and can handle processing for evaluation implementation boards. For more details, please contact us or refer to our catalog.

  • Other electronic parts
  • Contract manufacturing
  • Tips

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