Nikon interference-corrected infinity-corrected objective lens
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The interference objective lens is used in differential interference microscopy, which enables non-contact optical three-dimensional measurement. It can examine the structural features of the surface of the specimen with extremely high precision, below the wavelength of light. A beam splitter is incorporated into the optical system, where part of the illuminating light passes through this element and directly illuminates the specimen, while the remaining illuminating light is reflected by this element and relayed to a reference mirror also incorporated into the optical system. The light reflected back from the specimen overlaps with the light reflected back from the reference mirror, forming an interference fringe pattern. The Epi Plan TI lens for the Michelson interference system has a relatively long working distance, a wide field of view, and a longer depth of focus, while the Epi Plan DI lens for the Mirau interference system is used for applications that require higher magnification or higher NA. *You can download the catalog from Edmund Optics Japan that features this product from the link below.
- Company：エドモンド・オプティクス・ジャパン
- Price：Other
