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Analysis Product List and Ranking from 182 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 01, 2025～Oct 28, 2025
This ranking is based on the number of page views on our site.

Analysis Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 01, 2025～Oct 28, 2025
This ranking is based on the number of page views on our site.

  1. ビーエルテック Tokyo//Testing, Analysis and Measurement
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. 同仁グローカル Kumamoto//others
  4. 4 西進商事 Hyogo//Industrial Machinery
  5. 5 オーハウス コーポレーション 日本支社 Tokyo//Industrial Electrical Equipment
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Analysis Product ranking

Last Updated： Aggregation Period:Oct 01, 2025～Oct 28, 2025
This ranking is based on the number of page views on our site.

  1. Analysis, precision balance │ EXPLORER series *Comprehensive catalog available オーハウス コーポレーション 日本支社
  2. Seawater Nutrient Measurement Device Quattro ビーエルテック
  3. Certified single-element and mixed standard solutions for ICP-AES/ICP-MS wet analysis. 西進商事
  4. [Information] Understanding Chemikan in 3 Minutes ケミカン
  5. 4 Total Nitrogen and Total Phosphorus Analysis Device Quattro ビーエルテック

Analysis Product List

121～135 item / All 655 items

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[Analysis Case] Analysis of Fucoidan Food Standards and Specifications

[Analysis Case] Analysis of Fucoidan Food Standards and Specifications

MST is a designated testing organization for the JHFA standard (fucoidan food).

Fucoidan is a high molecular weight polysaccharide found in seaweeds, and various functional properties, including anti-cancer effects, have been reported. The Japan Health and Nutrition Food Association (JHFA) announced the standards for fucoidan foods in July 2017, and MST was registered as a designated testing institution capable of conducting the necessary analyses. The JHFA standards specify fucoidan food regulations for three types: Okinawa mozuku, mekabu, and gagome kombu. The testing items include not only the fucoidan content in raw materials and products but also tests to confirm the safety of the products, such as arsenic and bacterial count tests.

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[Analysis Case] Surface Imaging of Soft Contact Lenses in Liquid AFM

[Analysis Case] Surface Imaging of Soft Contact Lenses in Liquid AFM

Quantitative evaluation of surface properties can be performed using AFM analysis in an aqueous solution.

There are materials in polymers that change shape depending on the environment. To observe the original shape of the sample, measurements in real environmental conditions are necessary. This document presents a case study that visualizes the surface shape of soft contact lenses in saline solution. By measuring under conditions close to the actual environment, it is possible to evaluate while maintaining the original shape of the sample.

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[Analysis Case] Evaluation of the Distribution of Drug Components Administered to the Eye

[Analysis Case] Evaluation of the Distribution of Drug Components Administered to the Eye

It is possible to process the eyeball and visualize the drug components (imaging).

Knowing how administered drugs distribute within the body is important information for drug development. In this case, the drug was directly administered into the vitreous body of fish eyes, and the distribution of the drug components was evaluated in cross-sections of the eyeball. As a result, the drug components were strongly detected near the administration site, showing their distribution within the eye. By using a mass microscope called TOF-SIMS, it is possible to apply this to the pharmacokinetics of various biological organs, including the eyeball.

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[Analysis Case] Damage Assessment of Single Crystal Si Surface

[Analysis Case] Damage Assessment of Single Crystal Si Surface

Quantitative analysis of c-Si and a-Si by state is possible using high-resolution measurement and waveform analysis.

In the semiconductor manufacturing process, ion irradiation is sometimes performed for the purpose of surface modification. It is known that irradiating the surface of single-crystal Si with ions of inert elements can cause structural damage and lead to the formation of an amorphous layer. Utilizing the fact that high-resolution XPS spectra detect c (single-crystal) Si and a (amorphous) Si with different peak shapes, we will introduce a case where this damage-derived a-Si was separated from c-Si and quantitatively evaluated.

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[Analysis Case] High Sensitivity Evaluation of SNDM's SiCMOS

[Analysis Case] High Sensitivity Evaluation of SNDM's SiCMOS

The diffusion layer structure of SiC devices can be visualized (high-sensitivity evaluation of the diffusion layer structure).

In SNDM (Scanning Nonlinear Dielectric Microscopy), it is possible to identify the p/n polarity of semiconductors and visualize the shape of the diffusion layer. This method encompasses the functions of the traditionally used SCM (Scanning Capacitance Microscopy), allowing for sufficient evaluation of next-generation power devices, such as SiC, which are difficult to assess with SCM, from low to high concentrations. It is characterized by high sensitivity and can be applied to all compound semiconductor devices. As an example, we will introduce a case where a cross-section of a SiC Planer Power MOS was fabricated and analyzed using SNDM.

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[SXES] Soft X-ray Emission Spectroscopy

[SXES] Soft X-ray Emission Spectroscopy

SXES is a method that evaluates the chemical bonding state using soft X-rays emitted from materials.

- It is possible to evaluate the chemical bonding states focusing on specific elements in the sample (especially light elements such as B, C, N, O). - The spectral shape reflects the partial density of states of the targeted elements in the valence band. - Evaluation of the band structure is also possible through simultaneous measurement with X-ray absorption spectroscopy (XAS). - Since information from the bulk is obtained, it is less affected by the influence of the surface region within a few nanometers. - Evaluation can be performed without being affected by charging effects, even for insulators. - The detection limit is low (<1 atomic%), allowing for the evaluation of trace components.

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[Analysis Case] Measurement of Organic and Inorganic Carbon Content in Food

[Analysis Case] Measurement of Organic and Inorganic Carbon Content in Food

It is possible to evaluate the carbon content of organic and inorganic substances in solids.

The total organic carbon analyzer (TOC analyzer) can quantitatively separate and measure total carbon (TC: Total Carbon) and inorganic carbon (IC: Inorganic Carbon) in a sample. The sample can be measured in its solid state without being dissolved in a solution. This document presents examples of TOC, TC, and IC evaluations in commercially available expanders and salts.

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Evaluation of organic substances at the metal interface causing delamination.

Evaluation of organic substances at the metal interface causing delamination.

TOF-SIMS can evaluate organic substances at metal interfaces in the depth direction.

Organic substances at metal interfaces can cause poor adhesion and delamination. For analyzing this poor adhesion, physically peeling off the layers and conducting qualitative analysis on the peeled surfaces is effective (refer to analysis case C0198). On the other hand, there are many cases where peeling cannot be performed, and in such cases, using a sputtering ion source for depth analysis is effective. This document presents a case of qualitative analysis of organic substances at metal interfaces, either in thin films or as secondary contamination, in the depth direction. As a conclusion, the presence of organic substances was confirmed by detecting C-series ions. Additionally, it is sometimes possible to identify organic substances by comparing them with known standard samples.

  • Ingredient analysis
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[Analysis Case] Depth Profile Concentration Analysis of Mg in Deep Ultraviolet LEDs

[Analysis Case] Depth Profile Concentration Analysis of Mg in Deep Ultraviolet LEDs

Quantification of impurities in AlGaN with various Al compositions is possible.

To determine impurity concentrations using SIMS analysis, it is necessary to use a standard sample with the same composition as the analysis sample. By preparing various Al compositions of AlGaN standard samples for AlGaN used in ultraviolet LEDs and power devices, MST can achieve more accurate quantification of impurities. We will introduce a case where, after disassembling a commercially available deep ultraviolet LED, SIMS analysis was conducted to determine the concentration of the dopant Mg and the distribution of the main component Al composition. Measurement method: SIMS Product fields: Lighting, power devices, optical devices Analysis purposes: Trace concentration evaluation, impurity evaluation, distribution evaluation, product investigation For more details, please download the materials or contact us.

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Solid Analysis New Service Launch (GDMS)

Solid Analysis New Service Launch (GDMS)

We respond to your request to measure many elements with high sensitivity! Simultaneous analysis of over 70 elements, from major components to trace elements, is possible.

We have launched a new service using Glow Discharge Mass Spectrometry (GDMS) starting from May 15 (Monday). - Simultaneous analysis of over 70 elements, from major components to trace components at the ppb level, is possible. - Detection of C, N, and O at the ppm level, which was previously difficult. - Depth direction analysis is possible from nm to several tens of µm.

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Combustion Ion Chromatography Analysis (Combustion-IC)

Combustion Ion Chromatography Analysis (Combustion-IC)

Analysis of halogens (F, Cl, Br) and sulfur is possible.

The combustion ion chromatography (IC) method allows for the investigation of the content of halogens (F, Cl, Br) and sulfur contained in solid materials such as plastics and resins, as well as in liquid materials like organic solvents. As shown in Figure 1, gases generated by combusting and decomposing the sample in a combustion furnace are collected in an absorbent solution. By measuring this absorbent solution using ion chromatography, it is possible to determine the content of halogens and sulfur in solid samples that are insoluble in water.

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[Analysis Case] Measurement of Impurity Concentration on the Surface and Inside of SiC Substrates

[Analysis Case] Measurement of Impurity Concentration on the Surface and Inside of SiC Substrates

Analysis of the substrate surface and interior is separated using ICP-MS and GDMS.

Impurities contained in semiconductor materials can affect product quality, leading to issues such as leakage current and early device failure. Therefore, understanding the amount of impurities in the materials is crucial for improving product quality. This document presents a case study on SiC substrates, which are gaining attention as power device materials, analyzing impurities adhered to the substrate surface using ICP-MS and impurities within the substrate using GDMS. Measurement methods: ICP-MS, GDMS Product fields: Power devices, manufacturing equipment, components Analysis purpose: Trace concentration evaluation For more details, please download the document or contact us.

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Reproducibility of SIMS analysis data

Reproducibility of SIMS analysis data

It is possible to evaluate the amount of impurities with high reproducibility.

In the manufacturing of semiconductor devices, the control of impurities such as dopants is a crucial process. When focusing on ion implantation, even slight differences can affect quality and performance, making precise control necessary. The high reproducibility of SIMS analysis is ideal for the development and maintenance of these processes.

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[Analysis Case] Organic Contamination Analysis of Materials

[Analysis Case] Organic Contamination Analysis of Materials

We will analyze trace amounts of organic contaminants adhered to the material using TD-GC/MS.

In precision machinery, vacuum devices, and semiconductor manufacturing equipment, contamination of the materials used can adversely affect product quality and the stable operation of the equipment. In this case, we handled glass components with disposable gloves of different types and analyzed the organic contamination adhered to the glass components using GC/MS analysis with a gas concentration device. By evaluating the contamination of the materials, it is possible to identify the components causing defects, eliminate the sources of material contamination, and consider changes to the materials.

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AFM Infrared Spectroscopic Analysis

AFM Infrared Spectroscopic Analysis

Infrared spectroscopy is a method for obtaining information about molecular structure by measuring infrared absorption due to molecular vibrations.

This method allows for simultaneous measurement of the sample's surface roughness and mechanical property distribution, as well as infrared absorption images (functional group distribution) at selected absorption bands, by conducting measurements in conjunction with the AFM system. AFM-IR has the following features: - It enables evaluation with very high spatial resolution (on the nanoscale), allowing for spectral and imaging measurements in small areas. - Similar analyses can be performed by using the FT-IR library.

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