List of Semiconductor inspection/test equipment products

Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

• Other conveying machines

Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.

• Other safety and hygiene products

From the pursuit of steel materials, we measure with high-precision inspection equipment such as temperature control of heat treatment furnaces, hardness tests, microstructure inspections, and dimensi...

• Other inspection equipment and devices
• Semiconductor inspection/test equipment

Osaka Cutting Mass Production Lathe Processing and Machining Processing [Leave cost reduction to Filir Co., Ltd.]

• CVD Equipment
• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Aluminum precision parts for semiconductor manufacturing equipment. [Leave cost reduction to Philir Co., Ltd.]

• Semiconductor inspection/test equipment
• Ion implantation equipment
• CMP Equipment

Aluminum precision parts, lathe processing, machining processing [Leave cost reduction to Filir Co., Ltd.]

• CVD Equipment
• Etching Equipment
• Semiconductor inspection/test equipment

Five-axis machining for semiconductor manufacturing equipment parts [Leave cost reduction to Philir Co., Ltd.]

• CVD Equipment
• Semiconductor inspection/test equipment
• Etching Equipment

Silicon block internal foreign matter inspection device

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Thin-film solar cell panel measurement device

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Crystal Defect Measurement Device (Light Scattering Tomography)

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Inline wafer measurement module

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Using the JPV method, non-contact measurement of junction leakage in PN junctions, evaluation of the depletion layer capacitance, and rapid measurement of the sheet resistance of PN junction samples!

• Other inspection equipment and devices
• Semiconductor inspection/test equipment

The world's only spectroscopic ellipsometer technology for measuring pore rate and pore distribution using an EP (optical porosimeter).

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

The PN determination of silicon wafers/blocks can be performed instantly.

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Instantly measure the resistance of silicon ingots/blocks non-contact and non-destructively using eddy current technology.

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Mapping measurements using the u-PCD method are possible, and there are numerous achievements in the solar cell and semiconductor markets.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Lifetime measurement device for single crystal silicon blocks

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Roll-to-roll spectral ellipsometer

• Semiconductor inspection/test equipment
• Distance measuring device
• Spectroscopic Analysis Equipment

Crystal defect analysis device (non-contact, non-destructive)

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Industry-specific catalog of a Taiwanese comprehensive electronic measuring instrument manufacturer with a 25% share of the global market!

• Semiconductor inspection/test equipment
• Power Supplies

CD-SEM for photomasks capable of high-speed and high-precision measurement of nano-patterns.

• Semiconductor inspection/test equipment
• Other machine elements

A clear explanation of case studies related to semiconductor testing, divided into four sections: background, issues, implementation, and results!

• Other semiconductors
• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Before overhaul, after overhaul

• Other conveying machines
• Other inspection equipment and devices
• Semiconductor inspection/test equipment

Leave electrical characteristic testing, laser trimming, reliability testing, and more to us!

• Other semiconductors
• Semiconductor inspection/test equipment

We propose a layout design aimed at improving mass production efficiency and trimming accuracy.

• Other semiconductors
• Semiconductor inspection/test equipment

Our company manufactures transport and inspection equipment using robots and drive systems for the purpose of reducing labor.

• Other conveying machines
• Other inspection equipment and devices
• Semiconductor inspection/test equipment

We apply torque to the test specimen and conduct various durability and performance tests.

• Semiconductor inspection/test equipment

Large area high brightness high directional lighting device

• Semiconductor inspection/test equipment
• Lighting for image processing
• Other optical parts

A semiconductor optical amplifier capable of broadband optical amplification in the 1.5μm long wavelength band.

• Other optical parts
• Semiconductor inspection/test equipment

It is an infrared microscope specialized in the observation and measurement of the oxidation region of VCSELs.

• Semiconductor inspection/test equipment
• Other image-related equipment
• Other optical parts

Measurement of wounds and foreign objects is also possible! It is suitable for internal observation of silicon chips!

• Semiconductor inspection/test equipment
• Other image-related equipment
• Other optical parts

It is suitable for visual inspection of wafers, lenses, and glass substrate surfaces.

• Semiconductor inspection/test equipment
• Visual Inspection Equipment
• Other lighting equipment