List of Contract Inspection products
- classification：Contract Inspection
136～150 item / All 1822 items
It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...
- Sensors
We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!
- Other semiconductors
- Processing Contract
- Wafer
We provide comprehensive support for solving issues from the analysis of functional ingredients to the notification of functional foods!
- Contract measurement
- Contract Inspection
![[XPS] X-ray Photoelectron Spectrosc...](https://image.mono.ipros.com/public/product/image/9af/387108003/IPROS1881601582061665056.jpg?w=280&h=280){kind=small}
Effective for evaluating the types, quantities, and chemical bonding states of elements on the sample surface (at a depth of about several nanometers).
- Contract Analysis
- Contract measurement
- Contract Inspection
This is a method for inorganic element analysis using inductively coupled plasma (ICP) as the excitation source.
- Contract Analysis
- Contract measurement
- Contract Inspection
This is a processing method for cutting bulk samples using a diamond knife to produce ultra-thin sections for transmission electron microscopy with a thickness of less than 100 nm.
- Contract Analysis
- Contract measurement
- Contract Inspection
We have started a testing service to measure PFAS concentrations in blood starting from June 2024.
- Contract Inspection
- others
Non-contact three-dimensional measurement device
- Contract Inspection
- Contract measurement
![[IP Method] Ar Ion Polishing Proces...](https://image.mono.ipros.com/public/product/image/3af/387108032/IPROS8821214265644794739.jpg?w=280&h=280){kind=small}
The IP method is a type of polishing technique that uses ion beams for processing.
- Contract Analysis
- Contract measurement
- Contract Inspection
Cooling and hardening the soft sample to make it machinable.
- Contract Analysis
- Contract measurement
- Contract Inspection
This is a processing method for producing thin film samples for transmission electron microscopy with a thickness of less than 50 nm by performing mechanical polishing followed by finishing with a low...
- Contract Analysis
- Contract measurement
- Contract Inspection
We provide a wide range of analysis of organic and inorganic substances, including composition and molecular structure, using NMR! We will carefully assist you from examination to result reporting.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[Analysis Case] SNP Analysis Using ...](https://image.mono.ipros.com/public/product/image/fed/2001155370/IPROS15757093224478404571.jpeg?w=280&h=280){kind=small}
SNP analysis is possible using real-time PCR (probe method).
- Contract Analysis
- Contract measurement
- Contract Inspection
Differences between real-time PCR method and mass array method.
- Contract Analysis
- Contract measurement
- Contract Inspection
It is possible to measure thyroid-related items, tumor markers, and infectious diseases.
- Contract Analysis
- Contract Inspection
Elemental analysis, state evaluation, particle size analysis, and acquisition of three-dimensional structural images at the nanoscale.
- Contract Analysis
- Contract measurement
- Contract Inspection
Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation
The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology
![[TOF-SIMS] Time-of-Flight Secondary...](https://image.mono.ipros.com/public/product/image/cf8/387108015/IPROS364447109984113922.jpg?w=280&h=280){kind=small}
This is a method for structural analysis of the sample surface. Due to its sensitivity to the surface compared to other analytical devices, it is suitable for identifying organic contaminants on the v...
- Contract Analysis
- Contract measurement
- Contract Inspection
Announcement of the new TOF-SIMS service starting from October 2016.
In October 2016, MST will introduce the latest high-resolution TOF-SIMS and begin analysis services. We will provide analysis services across a wide range of fields, including pharmaceuticals, biotechnology, medical devices, and product development and quality control related to electronics. Building on our proven TOF-SIMS analysis technology, we will further support our customers' research and development with high-quality data. For more details, please visit the URL below. http://www.mst.or.jp/corporate/tabid/1211/Default.aspx Introduction of analysis examples: • Introduction of new TOF-SIMS services [for pharmaceuticals, biotechnology, and medical devices] http://www.mst.or.jp/special/tabid/1194/Default.aspx • Introduction of new TOF-SIMS services [for the electronics field] http://www.mst.or.jp/special/tabid/1210/Default.aspx