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Design Services Product List and Ranking from 42 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Design Services Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. 大谷商会 Niigata//Trading company/Wholesale
  2. クボタ空調 Tokyo//Industrial Electrical Equipment
  3. 枚方技研 Osaka//Industrial Machinery
  4. 4 null/null
  5. 4 オルテコーポレーション 本社 Kyoto//Electronic Components and Semiconductors
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Design Services Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Area air conditioner "ZAHP-P280-S" クボタ空調
  2. Refrigerant Recovery Machine "Lorek Pro Digital" 大谷商会
  3. Tube pump dispenser DR301
  4. 4 Anchorless seismic fixation to protect machinery and equipment from earthquakes - Non-bleeding tack gel. 枚方技研
  5. 5 Proposal for the connection method of hydraulic pump and electric motor by Bell Housing. 大谷商会

Design Services Product List

46～60 item / All 977 items

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Basic Fundamentals: "Smith Chart"

Basic Fundamentals: "Smith Chart"

You will be able to easily perform complex complex calculations on charts.

Including transmission lines, solving various problems in high-frequency circuits using mathematical formulas becomes quite cumbersome due to complex calculations. However, by using the Smith chart devised by P. H. Smith, it becomes possible to easily perform such complex calculations graphically. With a slide rule, the property that multiplication can be replaced by addition when taking logarithms is utilized, allowing for easy multiplication by simply moving the slide. Similarly, the Smith chart is a convenient tool that uses conformal mapping to simplify high-frequency calculations. 【Features】 ○ When the load impedance Zr is not equal to the line impedance Z0, part of the incident wave returns to the source side as a reflected wave. ○ Standing waves appear on the line due to the interference between the reflected wave and the incident wave. ○ The ratio of the reflected wave to the incident wave is called the voltage reflection coefficient, generally represented by Γ or Γv. For more details, please contact us or download the catalog.

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General Fundamentals Edition: "Operation of Nonlinear Circuits"

General Fundamentals Edition: "Operation of Nonlinear Circuits"

The output changes in the form of a line, that is, a straight line, in response to the input.

A linear element, as the name suggests, is one where the output changes in a linear manner, that is, in the form of a straight line, in response to the input. For example, considering a resistor, the current flowing through the resistor is given by Ir = Vr/R = G･Vr, which is a linear function proportional to the voltage across the resistor. Elements that have this kind of input-output relationship are called linear elements. [Points] ○ A capacitor also follows Ic = jωC･Vc, which is again a linear function of Vc. ○ A nonlinear element refers to one where the output characteristics are not a linear function of the input. For more details, please contact us or download the catalog.

  • others

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General Fundamentals: Large Signal S-Parameter Analysis Method Using S-NAP/Pro

General Fundamentals: Large Signal S-Parameter Analysis Method Using S-NAP/Pro

Create a linear equivalent circuit and perform linear analysis including surrounding elements.

When a large signal is input into a circuit, it is a well-known fact that the S-parameters of the circuit differ from those in the small signal case if there are nonlinear elements present. In S-parameter analysis, the treatment of active devices generally involves creating linear equivalent circuits such as hybrid pi models at the bias point from models like the Gummel-Poon model, and performing linear analysis including surrounding elements. The linear equivalent circuit at the bias point maintains a linear input-output relationship regardless of how distorted the bias point may be, and does not introduce distortion in the output. To investigate the circuit characteristics when a large signal is input or when the bias point lies in a higher-order curve region, it is best to calculate the S-parameters from the input-output ratio of the fundamental wave component while in the state of large signal input. S-NAP-Pro does not have a direct function to obtain large signal S-parameters, but it is possible to achieve this using harmonic balance. [Features] - Create circuits with ports similar to S-parameter analysis - Label the terminals of each port in the circuit For more details, please contact us or download the catalog.

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General Foundation Edition "Method for Exchange of Reference Plane for Measured Data"

General Foundation Edition "Method for Exchange of Reference Plane for Measured Data"

Method for exchanging reference planes of measured data using S･NAP-Pro.

When measuring the characteristics of transmission lines, unwanted elements such as connectors and coaxial lines at the connection point between the calibration reference plane of the network analyzer and the device under test may be mixed into the measurement data. Ideally, it would be best to perform calibration at the device under test end as the calibration reference plane of the network analyzer, but in practice, this is often difficult due to the constraints of calibration fixtures. If it is challenging to remove unwanted elements during measurement, it is necessary to eliminate these elements through post-processing to obtain accurate data for the device under test. In many cases, these unwanted elements are connectors or coaxial lines, and if the data for these elements is known, it is possible to remove them using S･NAP-Pro after measurement. [Features] - If the data is known, unwanted elements can be easily subtracted from the measurement data. - The attenuation per unit length can be 'zero' if the length is short. For more details, please contact us or download the catalog.

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Optical design contracting

Optical design contracting

We accept optical design for transparent materials (glass, resin, rubber)! You can trust us with just the design.

Our company offers "optical design contracting." From the development of "lamp caps for lighting" to "ASA COLOR LED" and "ASA COLOR LENS," we leverage the experience and achievements we have cultivated over many years in the lighting field to solve our customers' problems. We not only provide optical design for lenses but also accept design requests related to mounting shapes. 【Main Design Achievements (Partial)】 ■Shapes - Aspherical lenses - Fly-eye lenses - Fresnel lenses - Cylindrical lenses - Freeform lenses *For more details, please refer to the PDF document or feel free to contact us.

  • lens
  • Processing Contract
  • Other contract services

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[Case Study] Adoption of JTAG Testing for LTE Measurement Device Inspection

[Case Study] Adoption of JTAG Testing for LTE Measurement Device Inspection

High-performance, high-quality measurement supported by JTAG boundary scan testing!

We would like to introduce a customer who has implemented "JTAG Boundary Scan Testing" for the inspection of LTE measurement devices. By adopting this product, it has become possible to reliably detect solder defects and pattern defects that cannot be identified through X-ray inspection using electrical testing. Additionally, systems that combine large-scale FPGAs and DDR memory were unable to identify defective areas during functional testing, making feedback to the manufacturing line difficult. However, by adopting this product, we were able to improve manufacturing quality. 【Case Study】 ■ Anritsu Corporation - Engaged in the field of information and communication, providing measurement solutions globally. ■ Challenges - Unable to identify defective areas during functional testing, making feedback to the manufacturing line difficult. *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices

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[Case Study] Adoption of JTAG Testing for Inspection of Implementation Boards

[Case Study] Adoption of JTAG Testing for Inspection of Implementation Boards

Identify defective areas of BGA-mounted boards at the pin level to improve manufacturing quality!

We would like to introduce a customer who adopted "JTAG boundary scan testing" for failure analysis of BGA-mounted boards. After the introduction of our product, sufficient quality assurance can be achieved even for high-density printed circuit boards equipped with numerous BGA packages. 【Case Study】 ■ Saksa Tech Co., Ltd. Production Technology Department - Manufacturing focused on business phones and IC card reader-related products ■ Challenges - Unable to sufficiently establish test pins due to the large number of BGAs - Unable to adequately identify the cause of defects through functional testing - X-ray inspection cannot determine BGA open failures *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices

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[Case Study] Adoption of JTAG Testing for Tascam Products Inspection

[Case Study] Adoption of JTAG Testing for Tascam Products Inspection

JTAG boundary scan testing that improved reliability in the early stages of development!

We would like to introduce a case study of a customer who adopted "JTAG boundary scan testing" in the production line of their in-house developed products. For devices compatible with JTAG that are packaged in BGA format, the basic wiring checks are confirmed through JTAG testing before being handed over to the firmware team for boards that consist of DSP (CPU) + RAM + ROM. This approach eliminates wasted development time due to defects in board or component implementation, thereby improving development efficiency. [Case Study] ■ TEAC Corporation, Audio Equipment Division - Development and sales of audio equipment ■ JTAG testing is conducted from the prototype stage to enhance development efficiency. *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices

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[Case Study] Achieving Quality Assurance for BGA Assembly by Adopting JTAG Testing

[Case Study] Achieving Quality Assurance for BGA Assembly by Adopting JTAG Testing

Feedback the statistical data of BGA defects to manufacturing!

We would like to introduce a case study of a customer who identified defective areas on a BGA implementation board using "JTAG boundary scan testing." By utilizing this product, it became possible to pinpoint the locations of BGA implementation defects at the pin level. A cross-sectional analysis conducted with a microscope on the pins where defects occurred revealed that the cause of the implementation defects was due to the soldering areas being exposed to high temperatures for an extended period. Additionally, by reviewing the temperature management of the solder reflow process, we were able to improve the implementation quality of the board. [Case Study] ■ Oki Electric Communication Systems Co., Ltd. - Mechatronics and electronics design and production contract services ■ Quality assurance of BGA implementation using JTAG testing *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices

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Supports boards with BGA! 【JTAG Test Application Case Collection】

Supports boards with BGA! 【JTAG Test Application Case Collection】

This is a collection of case studies on JTAG testing that led to improvements in quality and enhancements in testing scope.

JTAG boundary scan is a testing method that allows for easy implementation testing of boards with BGA components. It has various advantages, and I believe we can gain insights from the case studies. [Case Studies] - Azbil Corporation: Reduced untested areas with JTAG testing, providing peace of mind to customers! - Anritsu Corporation: JTAG testing supports high-performance and high-quality measurements! - Oki Electric Communication Systems: Achieved BGA implementation assurance through JTAG testing. - Konica Minolta Electronics: Established a consistent and advanced inspection system for high-density implementations. - Saksa Tech: Improved manufacturing quality by pinpointing defects on BGA boards at the pin level. - TEAC Corporation: Enhanced reliability in the early stages of development with JTAG testing. *The company names mentioned in the case studies are as they were at the time permission was granted for the introduction.*

  • Circuit Board Inspection Equipment

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Solar cell tester

Solar cell tester

Solar cell tester. We provide light sources, I-V testers, and transport systems!

A solar cell tester that conducts measurements in accordance with JISC8913/IEC60904-1 for crystalline silicon solar cell output measurement, and performs quality assessment and ranking of the tested cells.

  • Electrical Instruments/Electrometers
  • Image Processing Equipment

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Solar Cell Tester 'DKSCT Series' with Reproducibility Measurement Function

Solar Cell Tester 'DKSCT Series' with Reproducibility Measurement Function

Solar cell tester equipped with monitor cells (with temperature control function) and non-contact infrared thermometers as standard configuration.

The "DKSCT Series" is a measurement device for the output characteristics of crystalline solar cell modules. It is suitable for both R&D and mass production lines. It complies with the output measurement method for crystalline cells according to the "IEC60904-1/JIS C 8913 standards" and the solar simulator standards "IEC60904-9/JIS C 8912." Standard features include an automatic mass production mode, a manual measurement mode, and an automatic illumination configuration function. 【Features】 ■ Complies with the output measurement method for crystalline cells according to "IEC60904-1/JIS C 8913 standards" ■ Complies with the solar simulator standards "IEC60904-9/JIS C 8912" ■ Measurement device for the output characteristics of crystalline solar cells ■ Suitable for both R&D and mass production lines *For more details, please refer to the PDF document or feel free to contact us.

  • Other environmental analysis equipment

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Solar Cell Module Tester "DKSMT Series"

Solar Cell Module Tester "DKSMT Series"

Standard features include manual measurement mode and automatic illumination configuration function.

The "DKSMT Series" is a measurement device for the output characteristics of crystalline solar cell modules. It can be used in R&D and mass production lines. It complies with the solar simulator standards "IEC60904-9/JIS C 8912" and the output measurement method for crystalline modules "IEC60891/JIS C 8914." The standard configuration includes a Class AAA solar simulator, monitoring cells (with temperature control function), and temperature measurement units. 【Features】 ■ Complies with the output measurement method for crystalline modules "IEC60891/JIS C 8914" ■ Complies with the solar simulator standards "IEC60904-9/JIS C 8912" ■ Measurement device for the output characteristics of crystalline solar cell modules ■ Usable in R&D and mass production lines *For more details, please refer to the PDF document or feel free to contact us.

  • Other environmental analysis equipment

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Three-Phase AC Generator "MDAC-5A"

Three-Phase AC Generator "MDAC-5A"

Make the testing process smart!

The "MDAC-5A" is ideal for high-voltage distribution boards and other equipment for adjustment, inspection, and testing power supply. It is a test three-phase AC generator that generates voltage and current from single-phase power. 【Features】 - Achieves a reduction in testing process time - Current, voltage, frequency, and phase can be set independently - Excellent operability, very easy to handle - Compact and lightweight, achieving 22kg *Free rental is also available. *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices

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Electronic Approval System Digital Workflow System

Electronic Approval System Digital Workflow System

【Demonstration Available】A must-see for system managers! We will introduce useful information for business improvement.

-------------------------------------------------------------- Electronic Approval System "DWS (Digital Workflow System)" -------------------------------------------------------------- This is a support system for sharing various information between departments in an intranet environment using web functions, and for facilitating smooth approval workflow operations. ★ On-site demo available! Please feel free to contact us. We look forward to hearing from you. 【Features】 ◆ Electronic Approval System High flexibility in approval operations for efficiency and paperless processes ◆ Document Management System Centralized management of file groups such as Excel and PDF enables knowledge management and data reuse ◆ Simple Client Environment Services can be used with just a web browser (IE), so no software installation is required. * For more details, please download the catalog or feel free to contact us.

  • Workflow System

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