Telecentric lens for near-infrared imaging
High magnification observation is possible! It can be used for observing the interior of semiconductor devices and for non-destructive testing of electrical and electronic components.
The "Telecentric Lens" has achieved a high transmittance centered around the near-infrared wavelength coating at 1100nm. With the combination of an infrared camera and SWIR light source, high magnification observation is possible. It can be used for observing the interiors of semiconductor devices such as silicon wafers and IC chips, as well as for non-destructive testing of electrical and electronic components like solar panels and LCDs, and for positioning in wafer and flip bonders. 【Features】 ■ For near-infrared imaging ■ Achieves high transmittance centered around the near-infrared wavelength coating at 1100nm ■ High magnification observation is possible with the combination of an infrared camera and SWIR light source *For more details, please refer to the PDF document or feel free to contact us.
- Company:ケンコー光学
- Price:Other