AFM Atomic Force Microscope Nano Observer 2
Achieving measurement quality comparable to high-end products from established AFM manufacturers.
Combining flexibility, outstanding performance, and user-friendly operability, it achieves measurement quality comparable to high-end products from established AFM manufacturers. It is equipped with a wide range of functions for nanoscale imaging and characterization. It also enables electrical property measurements (KFM, C-AFM) and features a soft IC mode that can measure fragile samples.
- Company:日本レーザー
- Price:Other