microscope - メーカー・企業41社の製品一覧とランキング

更新日：Oct 15, 2025 集計期間:Sep 17, 2025～Oct 14, 2025
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microscopeのメーカー・企業ランキング

更新日：Oct 15, 2025 集計期間:Sep 17, 2025～Oct 14, 2025
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フローベル Kanagawa//Optical Instruments
一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
4 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
5 アズサイエンス松本本社 Nagano//Trading company/Wholesale

企業ランキングへ

microscopeの製品ランキング

更新日：Oct 15, 2025 集計期間:Sep 17, 2025～Oct 14, 2025
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microscopeの製品一覧

586～600 件を表示／全 652 件

表示件数

Atomic Force Microscope (AFM) "Park NX12-Bio"

Powerful scanning probe microscope for life sciences

The "Park NX12-Bio" is an atomic force microscope (AFM) equipped with three types of high-performance nanoscale microscopes on a single innovative platform. It enables both innovative liquid imaging with scanning ion conductance microscopy (SICM) and the highly regarded atomic force microscopy (AFM) technology. 【Comprehensive Solution for Nanoscale Biological Research】 ■ Equipped with a fracture-type fully independent Z-axis scanner/XY scanner, featuring high-precision Park NX AFM with complete non-contact technology (TM) ■ Ultra-high-resolution optical imaging using inverted optical microscopy technology ■ Enhanced biological cell imaging through the integration of scanning ion conductance microscopy *For more details, please download the PDF or feel free to contact us.

企業：パーク・システムズ・ジャパン
価格：Other

Other microscopes

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Atomic Force Microscope (AFM) "Park NX-3DM"

Fully automated industrial AFM with NX technology implemented.

The "Park NX-3DM" is a fully automated AFM (Atomic Force Microscope) system designed for overhang profiling, high-resolution sidewall imaging, and critical angle measurement. With its patented separated XY and Z scanning system equipped with an inclined Z scanner, it overcomes the challenges of conventional and flare chip methods in accurate sidewall analysis. 【Essential Tool for Wafer Fabrication】 ■ Fully automated industrial AFM using advanced and precise Park NX technology ■ Tilt head design for undercut and overhang structures ■ Accurate sidewall roughness measurement without the need for sample pretreatment ■ High-quality images can be obtained without damaging the device or sample due to the fully non-contact mode (TM) *For more details, please download the PDF or feel free to contact us.

企業：パーク・システムズ・ジャパン
価格：Other

Other microscopes

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Atomic Force Microscope "Park NX-HDM"

A scanning atomic force microscope system that accelerates the automatic defect inspection for defect identification, scanning, and analysis by ten times.

The "Park NX-HDM" is an atomic force microscope capable of automatic defect inspection and sub-angstrom surface roughness measurement for media and substrates. It is extensively linked with optical inspection devices, significantly improving the throughput of automatic defect inspection. Additionally, it provides accurate sub-angstrom surface roughness measurements even in repeated measurements. 【Features】 ■ Automatic defect inspection for media and substrates ■ Accurate sub-angstrom surface roughness measurement ■ Cost reduction through true non-contact mode ■ Accurate AFM topography with low-noise Z detector *For more details, please refer to the PDF document or feel free to contact us.

企業：パーク・システムズ・ジャパン
価格：Other

Electron microscope
Other microscopes

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[New Release!] Atomic Force Microscope 'Park NX7'

[Japanese Version Catalog Available] New products with low cost, high functionality, and short delivery times! Introducing the atomic force microscopes we handle!

The "Park NX7" is equipped with all the new technologies developed by Park Systems and is available at an affordable price. This product is designed down to the finest details, just like the higher-end models, and can facilitate research. Additionally, it offers flat orthogonal XY scanning without bowing. Please feel free to contact us if you have any inquiries. 【Features】 ■ Highly expandable AFM solution ■ Flat orthogonal XY scanning without bowing ■ Low noise Z detector ■ Improved chip lifespan, sample preservation, and repeatability through True Non Contact mode * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.

企業：パーク・システムズ・ジャパン
価格：Other

Other microscopes

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TR-Micro Low Frequency Raman Microscope

Raman microscope for low-frequency region (terahertz) measurements

This is an accessory for Raman microscopes that can be easily attached and detached from existing Raman microscopes. It allows for non-contact and non-destructive analysis without the need for sample pretreatment, enabling the measurement of components in organic and inorganic materials, and is suitable for evaluating the crystal forms of trace and minute active pharmaceutical ingredients. It is also possible to assess the dispersion state of components such as active ingredients and excipients that make up tablets and mixed powders through chemical imaging.

企業：テックアナリシス
価格：5 million yen-10 million yen

Spectroscopic Analysis Equipment

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Bilateral Microscope System "TOMOS-50"

Introducing the front and back misalignment / dimensional measurement microscope. Achieved high precision at a low cost.

The "TOMOS-50" is a compact type of measurement system that can simultaneously capture the front and back of electronic components such as crystal oscillators, MEMS, and semiconductors, and measure with an accuracy of ±0.2μm or less. The front and back optical axis correction can be precisely adjusted using a micro stage and software. Additionally, it is also available for sale as a dual-sided microscope module for device integration. Please contact us for more information. 【Features】 ■ Compact type ■ Approximately 3 million pixels ■ Simultaneous capture of both sides, dimensional measurement, and position deviation measurement ■ High-precision correction of the front and back optical axis using a micro stage and software ■ Measurement of position deviation between front and back with a repeatability of ±0.2μm or less (varies depending on conditions) *For more details, please refer to the PDF document or feel free to contact us.

企業：フローベル
価格：Other

Other microscopes

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Bilateral Microscope System "TOMOS-60XY"

Equipped with XY electric stage and autofocus function! Customization for software and more is also supported.

The "TOMOS-60XY" is a 6-inch electric XY stage dual-sided microscope system that can automatically measure multiple locations on a workpiece. It can automatically move to the specified measurement locations on the workpiece and measure the displacement of patterns and alignment marks on the front and back of quartz oscillators, MEMS, semiconductor wafers, and electronic components. Additionally, it is equipped with an alignment function for correcting the positional deviation between the XY stage and the workpiece, ensuring precise movement control and preventing measurement errors. 【Features】 ■ Automatically detects the edges of alignment marks such as circles, squares, and crosses, and measures the displacement between their center coordinates. ■ Controls XYZ stage conditions, measurement conditions, creates maps, and registers recipes to automatically measure multiple locations on the workpiece. *For more details, please download the PDF or feel free to contact us.

企業：フローベル
価格：Other

Electron microscope

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8-inch electric XY stage dual-sided microscope system

We measure the positional deviation of the front and back with a repeatability accuracy of ±0.3μm or less!

The "TOMOS-50/60/80/XY" is a dual-sided microscope displacement measurement system capable of simultaneous imaging of both sides, dimensional measurement, and displacement measurement. It features electric control and automatic measurement, making it suitable for measuring and observing displacement of dual-sided exposure patterns, semiconductor wafers, and 4-inch, 6-inch, and 8-inch wafers, as well as MEMS and quartz oscillators. The correction of the optical axis for both sides is performed with high precision using a micro-stage and software. Additionally, it can be sold as a dual-sided microscope module for integration into devices. 【Features】 ■ Simultaneous imaging, dimensional measurement, and displacement measurement of both sides ■ High-precision correction of the optical axis for both sides using a micro-stage and software ■ Measurement of displacement between both sides with a repeatability accuracy of ±0.3μm or less ■ Compatible with a dual-channel auto-focus unit for both sides (optional) ■ Development of an electric XY stage control system is underway ■ Available for sale as a dual-sided microscope module for device integration *For more details, please download the catalog or feel free to contact us.

企業：フローベル
価格：Other

Other microscopes

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6-inch electric XY stage dual-side microscope system

Equipped with an electric XY stage and autofocus function!

The "TOMOS-60XY" is a dual-sided microscope displacement measurement system capable of simultaneous imaging of both sides, dimension measurement, and displacement measurement. [Applications] ■Observation: Simultaneous observation of both sides of electronic paper electrophoresis, particles, fluids, filters, etc. ■Displacement measurement of both sides: Measurement of the displacement of alignment marks and through holes on both sides of quartz oscillators, MEMS, etc. ■Dimension measurement of both sides: Measurement of dimensions on both sides of quartz oscillators, semiconductor linewidth patterns, etc. *For more details, please download the catalog or feel free to contact us.

企業：フローベル
価格：Other

Other microscopes
Electron microscope

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Dual-sided microscope system with wide-field ring lighting 'TOMOS-50R1'

Dual-sided wide-angle shooting is possible with a 1x shooting field of view! (Field of view 9mm x 7mm)

The "TOMOS-50R1" is a dual-sided microscope system equipped with wide-field ring lighting that allows for dual-sided wide-field imaging at a 1x magnification. It can simultaneously capture images of both sides of electronic components such as crystal oscillators, MEMS, and holes in printed circuit boards. Additionally, it can measure the misalignment of patterns and alignment marks on both sides with a repeatability accuracy of ±0.010mm. 【Features】 ■ High-precision image processing correction for optical axis misalignment of the microscope, lens magnification errors, and camera θ misalignment. ■ Dimension measurement is possible without the hassle of flipping the sample over. ■ Simultaneous imaging of both sides of crystal oscillators, MEMS, holes in printed circuit boards, and electronic components. *For more details, please download the PDF or feel free to contact us.

企業：フローベル
価格：Other

Other microscopes

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Bilateral Microscope System "TOMOS Series"

Correcting the optical axis shift of the microscope's front and back, variations in the objective lens magnification, and the camera's θ shift with images!

We would like to introduce our dual-sided microscope system, the "TOMOS series." Our lineup includes the "TOMOS-50" with a 4-inch stage, the "TOMOS-60" with a 6-inch stage, and the "TOMOS-50R1" with wide-field ring illumination. It captures both sides of quartz oscillators, MEMS, and electronic components simultaneously. Dimension measurements can be performed without the hassle of flipping the sample over. 【Features of TOMOS-50/60】 ■ Simultaneous imaging of both sides of quartz oscillators, MEMS, semiconductor wafers, and electronic components ■ Measurement of alignment marks and pattern shifts on both sides with repeatable accuracy of ±0.3μm ■ High-precision image processing correction for optical axis misalignment, lens magnification errors, and camera θ shifts ■ Supports autofocus function and electric XY stage (optional) *For more details, please download the PDF or feel free to contact us.

企業：フローベル
価格：Other

Other microscopes
Optical microscope
Electron microscope

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Scientific instrument microscope

It is used in various fields such as education, agriculture, forestry, healthcare, and sanitation and epidemic prevention.

We handle a wide range of microscopes, including biological microscopes, industrial microscopes, digital microscopes, and fluorescence microscopes. Each microscope product is produced at a rate of over 15,000 units per month and is used in various fields such as education, agriculture, forestry, healthcare, and sanitation. All raw materials and products have obtained CE, CMD, CQC, and RoHS certifications. 【Product Lineup】 ■ Medical Microscopes ■ Biological Microscopes ■ Digital Microscopes ■ Children's Microscopes ■ Metal Microscopes, etc. *For more details, please download the PDF or feel free to contact us.

企業：フェニックス・ジャパン
価格：Other

Optical microscope
Electron microscope
Other microscopes

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Darkfield Biological Microscope [UT503-DK]

It is a dark field biological microscope [UT503-DK].

★ It is a high-performance dark field microscope. ★ Equipped with a standard Plan achromatic objective lens that demonstrates high performance for both visual observation and photo/video recording. ★ A wide range of options for bright field, phase contrast, and polarized light observation.

企業：誠報堂
価格：100,000 yen-500,000 yen

Optical microscope

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Brightfield Biological Microscope [UT503]

This is a high-performance microscope recommended for research use. - General research and development - Educational use - For high-level amateurs.

- This is a biological microscope suitable for research and high-level amateur use. - It excels in both optical and mechanical performance. - As a system microscope, it offers a wide range of options such as phase contrast, dark field, and polarized light observation. ★ It comes standard with Plan achromat objective lenses that demonstrate high performance for both visual observation and photography/video recording. ★ There are abundant options for dark field, phase contrast, and polarized light observation, among others.

企業：誠報堂
価格：100,000 yen-500,000 yen

Optical microscope
Other physicochemical equipment

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【SM300-T1】 7x to 45x zoom variable magnification three-eyed stereo microscope

This is a three-eye type zoom stereo microscope equipped with a camera port and standard stand type with LED ring lighting.

This is the SM300 series of stereo microscopes. The main body of the microscope features a zoom objective lens (0.7x to 4.5x), and by using optional auxiliary objective lenses (0.5x, 2x), the magnification range can be further expanded. The eyepiece is equipped with a wide-field type as standard (WF10x/20mm), allowing for comfortable observation. The SM300 series is available in binocular (B type) and trinocular (T type) versions with a camera port. Additionally, the trinocular type offers a light path switching option (100/0, 0/100 switchable between eyepiece/camera port), making it easier to observe subjects with lower light levels and to capture photos and videos. Various stands are also available, allowing you to choose the type that best suits your needs.

企業：誠報堂
価格：10,000 yen-100,000 yen

Optical microscope

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