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Atomic Force Microscope(afm) - List of Manufacturers, Suppliers, Companies and Products | IPROS GMS

Last Updated： Aggregation Period:Apr 22, 2026～May 19, 2026
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Atomic Force Microscope Product List

31～39 item / All 39 items

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Atomic Force Microscope "Park NX-HDM"

Atomic Force Microscope "Park NX-HDM"

A scanning atomic force microscope system that accelerates the automatic defect inspection for defect identification, scanning, and analysis by ten times.

The "Park NX-HDM" is an atomic force microscope capable of automatic defect inspection and sub-angstrom surface roughness measurement for media and substrates. It is extensively linked with optical inspection devices, significantly improving the throughput of automatic defect inspection. Additionally, it provides accurate sub-angstrom surface roughness measurements even in repeated measurements. 【Features】 ■ Automatic defect inspection for media and substrates ■ Accurate sub-angstrom surface roughness measurement ■ Cost reduction through true non-contact mode ■ Accurate AFM topography with low-noise Z detector *For more details, please refer to the PDF document or feel free to contact us.

  • Electron microscope
  • Other microscopes
  • Atomic Force Microscope

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Metrix Inc. Business Introduction

Metrix Inc. Business Introduction

We provide contracted measurement and analysis services categorized by analysis and evaluation methods, or by materials and devices, depending on the target to be evaluated or the information to be obtained.

Metrix Inc. supports the resolution of research and development and technical issues through contract evaluation and measurement services, analysis support, and technical consulting utilizing eSPM. We conduct "Conductive Atomic Force Microscopy (C-AFM)" to visualize the local current distribution on sample surfaces and assess leakage paths and electrical inhomogeneities. Additionally, we perform "Scanning Spreading Resistance Microscopy (SSRM)" to evaluate local resistance distribution, which is used for analyzing electrical characteristics in semiconductor cross-sections and within devices. 【Services】 ■ Services by Analysis and Evaluation Method - Conductive Atomic Force Microscopy (C-AFM) - Scanning Spreading Resistance Microscopy (SSRM) *For more details, please refer to the related links or feel free to contact us.

  • Other analysis and evaluation services
  • Atomic Force Microscope

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Compact AFM "NaioAFM" *Demo now available

Compact AFM "NaioAFM" *Demo now available

Quick and simple measurement of surface shapes! Standard features include dust and wind shields, and vibration prevention mechanisms.

The "NaioAFM" is a compact type of atomic force microscope that balances functionality and operability, featuring essential technologies for surface shape measurement as standard, while allowing for easy setup of the device and cantilever replacement. Before scanning, necessary re-tuning, approach to the sample, and tilt correction of the sample plane are automatically performed by the software, so once the cantilever is brought close to the sample, the scan will begin. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera and side-view observation for positioning ■ Additional measurement modes can be added according to needs ■ Demonstrations can be conducted on-site at customer locations *For more details, please refer to the materials. Feel free to contact us with any inquiries. If you wish to request a demonstration, please apply through the contact form.

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  • Electron microscope
  • Atomic Force Microscope

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Compact Type Atomic Force Microscope NaioAFM

Compact Type Atomic Force Microscope NaioAFM

Introducing a low-cost "All-in-one" AFM device that is compact, durable, and easy to operate!

"NaioAFM" is a compact atomic force microscope suitable for users who want to measure surface shapes concisely and quickly in the fields of nanotechnology education at universities and vocational schools, as well as in research and development or quality control. With the product's unique "Flip-over" scan head and dedicated exchange tools, it allows for quick and simple cantilever replacement. Balancing functionality and operability, it is an "All-in-one" AFM device that can be used by anyone, anywhere, and is widely utilized around the world. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera for positioning and side-view observation ■ Additional measurement modes can be added according to needs ■ Simple cantilever replacement: no need to adjust the laser or detector ■ Ready for measurement immediately after installation: just connect the USB cable and launch the software *For more details, please refer to the PDF document or feel free to contact us.

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  • Other microscopes
  • Atomic Force Microscope

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[Analysis Case] Evaluation of Surface Roughness of SiC Trench MOSFET Trench Sidewalls

[Analysis Case] Evaluation of Surface Roughness of SiC Trench MOSFET Trench Sidewalls

Quantitative evaluation of the roughness of trench sidewalls related to device characteristics.

In recent years, SiC has been attracting attention as a material for high-voltage devices. The trench MOSFET structure is necessary for the high integration of devices, and the application development for SiC devices is progressing. Since the channel region of the trench MOSFET structure is the trench sidewall, the flatness of the trench sidewall is related to the reliability of the device. This document introduces an example of quantitatively evaluating the roughness of the trench sidewall of SiC trench MOSFETs using AFM (Atomic Force Microscopy).

  • Contract Analysis
  • Other semiconductors
  • Atomic Force Microscope

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[New Release!] Atomic Force Microscope 'Park NX7'

[New Release!] Atomic Force Microscope 'Park NX7'

[Japanese Version Catalog Available] New products with low cost, high functionality, and short delivery times! Introducing the atomic force microscopes we handle!

The "Park NX7" is equipped with all the new technologies developed by Park Systems and is available at an affordable price. This product is designed down to the finest details, just like the higher-end models, and can facilitate research. Additionally, it offers flat orthogonal XY scanning without bowing. Please feel free to contact us if you have any inquiries. 【Features】 ■ Highly expandable AFM solution ■ Flat orthogonal XY scanning without bowing ■ Low noise Z detector ■ Improved chip lifespan, sample preservation, and repeatability through True Non Contact mode * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.

  • Other microscopes
  • Atomic Force Microscope

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Atomic Force Microscope "Handy AFM"

Atomic Force Microscope "Handy AFM"

A super compact AFM with a depth and width that can take you anywhere, both measuring 15 cm.

The atomic force microscope "Handy AFM" can be used as a substitute for high-magnification optical microscopes. It features standard measurement modes, including static force mode, dynamic force mode, phase contrast, phase measurement, force modulation, spreading resistance, and external input capabilities. The scanning head is available in two types: high-resolution and wide-area, and they can be exchanged instantly. Probe replacement takes only a few seconds, and no adjustments are needed after replacement. Additionally, carbon nanotube probes can also be approached automatically. By using an electromagnetic scanner (patented) for scanning, there is no need to move the workpiece during the scan. Generally, it does not exhibit the non-linear creep or aging changes associated with piezo devices commonly used in AFMs. Optionally, it can be combined with a compact automatic stage. For more details, please download the catalog.

  • Electron microscope
  • Atomic Force Microscope

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High-performance atomic force microscope DriveAFM

High-performance atomic force microscope DriveAFM

Equipped with the off-resonance measurement mode "WaveMode" using photothermal excitation! Achieves high stability and performance!

"DriveAFM" is a high-performance atomic force microscope that dramatically accelerates research in both material science and life science. It enables high-speed imaging with atomic resolution while covering a very wide scan range of 100μm. It boasts high stability even in liquid environments. With "WaveMode," off-resonance measurements can be performed at speeds over 20 times faster, and the time required for imaging a single field of view is less than one minute. 【Features】 ■ Wide-range and high-resolution scanning using the proprietary "Direct drive" piezo scanner ■ Off-resonance mode "WaveMode" utilizing photothermal excitation developed by Nanosurf ■ WaveMode is useful even for soft samples like polymers ■ Equipped with photothermal excitation for the cantilever called "Clean-Drive" ■ Clearly images the periodic double helix structure of DNA *For more details, please refer to the PDF document or feel free to contact us.

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  • Other microscopes
  • Atomic Force Microscope

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Atomic Force Microscope "AFM with Stage"

Atomic Force Microscope "AFM with Stage"

The only microscope capable of non-destructive three-dimensional measurement down to the nanometer scale.

The atomic force microscope "AFM with stage" is the only microscope capable of non-destructive three-dimensional measurements down to the nanometer scale in the atmosphere. It allows measurements without damaging the sample. By using an electromagnetic scanner, stable long-term measurements can be achieved without worrying about non-linear creep or aging effects. With a large stage, it is possible to perform non-destructive measurements simply by setting the sample without cutting the workpiece. Various measurement modes are available, providing functions equivalent to expensive AFM devices. Regardless of the material of the measurement work, measurements at the nano level can be performed immediately, from conductors to insulators, without any coating. For more details, please download the catalog.

  • Electron microscope
  • Atomic Force Microscope

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