List of Contract Services products
- classification：Contract Services
1756～1800 item / All 4721 items
The purpose depends on your ideas! A small swivel bearing "Rakkaru" that allows you to easily and lightly rotate heavy objects!
- Metal bearings
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
The mass array method allows for the simultaneous analysis of multiple genetic polymorphisms.
- Contract measurement
- Contract Analysis
It is possible to capture multiple CT images by connecting them vertically.
- Contract Analysis
- Contract measurement
By using an integrating sphere, it is possible to measure samples with surface roughness or thickness.
- Contract Analysis
High-resolution and high-precision analysis is possible with the OrbitrTM mass spectrometer (HRMS).
- Contract measurement
Local Thermal Analysis System (Nanoscale Thermal Analysis)
- Contract measurement
It is possible to evaluate the sample in its original state.
- Contract Analysis
- Contract measurement
- Contract Inspection
FIB: Focused Ion Beam Processing
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SIMS: Secondary Ion Mass Spectrometry
- Contract Analysis
This is a processing method for cutting bulk samples using a diamond knife to produce ultra-thin sections for transmission electron microscopy with a thickness of less than 100 nm.
- Contract Analysis
- Contract measurement
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EBSD: Electron Backscatter Diffraction
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X-ray photoelectron spectroscopy (XPS)
- Contract Analysis
IC: Ion Chromatography
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SRA: Spread Resistance Measurement Method
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SRA: Spread Resistance Measurement Method
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AES: Auger Electron Spectroscopy
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GC/MS: Gas Chromatography-Mass Spectrometry
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LC/MS/MS: Liquid Chromatography-Mass Spectrometry
- Contract Analysis
SIMS: Secondary Ion Mass Spectrometry
- Contract Analysis
GC/MS: Gas Chromatography-Mass Spectrometry
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- Memory
HPLC: High-Performance Liquid Chromatography
- Contract Analysis
AFM: Atomic Force Microscopy Method
- Contract Analysis
- Wafer
NMR analysis of trace components is possible.
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- Contract measurement
SSDP： Substrate Side Depth Profile
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You can identify high resistance and open areas in the wiring from the absorption current image.
- Contract Analysis
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Using an ultra-short pulse laser with micron-level processing position accuracy, samples can be produced quickly and with low damage.
- Contract Analysis
- Contract measurement
We will introduce the target of analysis, the physical property information obtained, and examples of analysis that can be understood from molecular dynamics calculations.
- Contract measurement
A method for separating components by analyzing volatile components and utilizing differences in gas adsorption or distribution coefficients with respect to the stationary phase.
- Contract measurement
- Contract Analysis
We will introduce the target of analysis, the physical property information obtained, and examples of analysis.
- Contract measurement
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Here is an example of the semi-quantification of the eight catechin components contained in green tea.
- Contract Analysis
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It is possible to visualize the phase separation structure of polymers from thermal conductivity information.
- Contract Analysis
- Contract measurement
Reliability Test
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Measurement of the light solvent as is.
- Contract Analysis
- Contract measurement
![[IP Method] Ar Ion Polishing Proces...](https://image.mono.ipros.com/public/product/image/3af/387108032/IPROS8821214265644794739.jpg?w=280&h=280){kind=small}
The IP method is a type of polishing technique that uses ion beams for processing.
- Contract Analysis
- Contract measurement
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Cooling and hardening the soft sample to make it machinable.
- Contract Analysis
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HAADF-STEM: High-Angle Annular Dark Field Scanning Transmission Electron Microscopy
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XPS: X-ray photoelectron spectroscopy, etc.
- Contract Analysis
TEM: Transmission Electron Microscopy
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EBSD: Electron Backscatter Diffraction
- Contract Analysis
Notice of publication of a written article in the May 2012 issue of Applied Physics.
In the May 2012 issue of the monthly magazine "Applied Physics," published by the Japan Society of Applied Physics, the MST General Foundation for Materials Science and Technology contributed an article on scanning electron microscopy (SEM). ● Magazine Overview - Publisher: Japan Society of Applied Physics - Published Issue: May 2012, Applied Physics - Project Name: Basic Course <Hop, Step, Jump> Series "Scanning Electron Microscopy" ● MST Contribution Overview - Author: Kyoko Yonemitsu, Leader of the Analysis and Evaluation Department, MST General Foundation for Materials Science and Technology - Content: Applications of scanning electron microscopy in research and development - Case studies and uses Please take a look.
This is a processing method for producing thin film samples for transmission electron microscopy with a thickness of less than 50 nm by performing mechanical polishing followed by finishing with a low...
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Processing under atmosphere control, cryo-processing, cooling, TEM: transmission electron microscopy and others.
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Processing under atmosphere control, cryo-processing, cooling, SEM: scanning electron microscopy and others.
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Cryo-processing cooling SEM: Scanning Electron Microscopy method
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Photoluminescence method
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