List of Semiconductor inspection/test equipment products

  • classification:Semiconductor inspection/test equipment

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For those who have isolators. Achieving high chemical resistance and workability. Low cost and short delivery times are also possible for glove box and isolator gloves.

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  • Work gloves

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Notice of participation in 'INTERPHEX Week Tokyo' from May 20 (Wednesday) to May 22 (Friday), 2026.

Ito Corporation will be exhibiting at "INTERPHEX Week Tokyo" held at Makuhari Messe. This exhibition is the largest in Japan, showcasing a wide range of products and services related to the research and manufacturing of pharmaceuticals, cosmetics, and regenerative medicine from 25 countries and regions around the world. Pharmaceutical and cosmetic manufacturers, as well as regenerative medicine companies, will be attending from all over the globe. We will be showcasing "Gloves for Glove Boxes/Isolators" manufactured by Tron Power. We look forward to your visit.

Visualize surface foreign substances, dirt, and scratches! It is well-received as a daily management tool for yield management, quality control, cleaning management, and hygiene management. *Demo unit...

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment
  • Defect Inspection Equipment

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1st High-Performance Materials WEEK [Nagoya] We will be exhibiting a fine particle visualization system at the 1st High-Performance Film Exhibition. (February 18 (Wed) - February 20 (Fri), 2026 / Port Messe Nagoya, Hall 3, Booth 7-46)

The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity that allows for real-time visualization of the suspended and adhered states of micro and nano-sized particles. We are expanding our sales of visualization systems and contract services for evaluation (investigating micro-particles and airflow in production processes, manufacturing equipment, and factory environments, evaluating the performance of clean-up products, proposing yield improvement measures, etc.) both domestically and internationally. At this exhibition, we will demonstrate various products including the ultra-sensitive camera "Particle EyeⓇ", the visualization-specific light source "Parallel EyeⓇ H", and the surface visualization tool "D-Light". Experience the high particle detection performance at the venue.

Test solution that does not damage solder balls or measurement substrates with soft contact!

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  • Semiconductor inspection/test equipment
  • Printed Circuit Board

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A sheet socket that enables stable inspection in semiconductor back-end process inspection! What is "PCR" that allows for high-speed and high-density measurements? Technical materials on operating pri...

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  • Other electronic parts
  • socket
  • Semiconductor inspection/test equipment

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It excels in high sensitivity detection, quantification, and portability, making it suitable for quality inspection and research and development settings. It contributes to the detection of minute for...

  • Semiconductor inspection/test equipment
  • Other Sanitation Inspections
  • Other appearance and image inspection equipment

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スライド1.PNG

1st High-Performance Materials WEEK [Nagoya] We will be exhibiting a fine particle visualization system at the 1st High-Performance Film Exhibition. (February 18 (Wed) - February 20 (Fri), 2026 / Port Messe Nagoya, Hall 3, Booth 7-46)

The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity that allows for real-time visualization of the suspended and adhered states of micro and nano-sized particles. We are expanding our sales of visualization systems and contract services for evaluation (investigating micro-particles and airflow in production processes, manufacturing equipment, and factory environments, evaluating the performance of clean-up products, proposing yield improvement measures, etc.) both domestically and internationally. At this exhibition, we will demonstrate various products including the ultra-sensitive camera "Particle EyeⓇ", the visualization-specific light source "Parallel EyeⓇ H", and the surface visualization tool "D-Light". Experience the high particle detection performance at the venue.

Semiconductor test solutions that support event management.

  • スクリーンショット 2025-09-25 112038.png
  • 20250909_161104.jpg
  • Semiconductor inspection/test equipment
  • Printed Circuit Board

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A semiconductor test solution that does not damage the measurement substrate with soft contacts!

  • スクリーンショット 2025-09-25 112038.png
  • 20250909_161104.jpg
  • Semiconductor inspection/test equipment
  • Printed Circuit Board

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Applying semiconductor technology to evaluate the environmental resistance of agricultural materials.

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  • Wafer
  • Semiconductor inspection/test equipment
  • Other semiconductors

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Evaluate the strength of semiconductor coatings and improve tamper resistance.

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  • Wafer
  • Semiconductor inspection/test equipment
  • Other semiconductors

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Supporting high image quality of displays through coating tests of semiconductor wafers.

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  • IPROS8387751296551332030.jpg
  • Wafer
  • Semiconductor inspection/test equipment
  • Other semiconductors

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Coating tests to improve the flexibility and durability of wearable devices.

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  • IPROS17064914101216785752.jpg
  • IPROS8387751296551332030.jpg
  • Wafer
  • Semiconductor inspection/test equipment
  • Other semiconductors

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Supporting precise control of robotics in semiconductor wafer coating tests.

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  • IPROS2683384565922837333.jpg
  • IPROS17064914101216785752.jpg
  • IPROS8387751296551332030.jpg
  • Wafer
  • Semiconductor inspection/test equipment
  • Other semiconductors

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Coating tests that support the miniaturization and high functionality of semiconductor devices.

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  • IPROS17064914101216785752.jpg
  • IPROS8387751296551332030.jpg
  • Wafer
  • Semiconductor inspection/test equipment
  • Other semiconductors

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Introducing various application notes for semiconductor strength testing, surface inspection, environmental testing, and more.

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  • IPROS17064914101216785752.jpg
  • IPROS8387751296551332030.jpg
  • Wafer
  • Semiconductor inspection/test equipment
  • Other semiconductors

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Contributing to improved energy efficiency in semiconductor wafer coating tests.

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  • IPROS17064914101216785752.jpg
  • IPROS8387751296551332030.jpg
  • Wafer
  • Semiconductor inspection/test equipment
  • Other semiconductors

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Support for materials testing in the aerospace field.

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  • IPROS2683384565922837333.jpg
  • IPROS17064914101216785752.jpg
  • IPROS8387751296551332030.jpg
  • Wafer
  • Semiconductor inspection/test equipment
  • Other semiconductors

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Support for improving the quality of automotive parts through durability testing of semiconductor coatings.

  • IPROS11922849580377179457.jpg
  • IPROS2683384565922837333.jpg
  • IPROS17064914101216785752.jpg
  • IPROS8387751296551332030.jpg
  • Wafer
  • Semiconductor inspection/test equipment
  • Other semiconductors

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Applying semiconductor inspection technology to evaluate the biocompatibility of medical devices.

  • IPROS11922849580377179457.jpg
  • IPROS2683384565922837333.jpg
  • IPROS17064914101216785752.jpg
  • IPROS8387751296551332030.jpg
  • Wafer
  • Semiconductor inspection/test equipment
  • Other semiconductors

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Contributing to yield improvement through strength testing, surface inspection, and environmental testing of semiconductors.

  • IPROS11922849580377179457.jpg
  • IPROS2683384565922837333.jpg
  • IPROS17064914101216785752.jpg
  • IPROS8387751296551332030.jpg
  • Wafer
  • Semiconductor inspection/test equipment
  • Other semiconductors

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Automating the concentration process involving neutralization and matrix removal in ion chromatography to measure impurities in high-purity ammonium hydroxide used in semiconductor manufacturing.

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  • Analytical Equipment and Devices
  • Ion Chromatography
  • Semiconductor inspection/test equipment

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Pellet and powder foreign matter inspection device *Compatible with clean rooms and can be installed in factories, capable of detecting 9µm!

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment

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It is possible to inspect appearance defects occurring in the wafer process and dicing process quickly and with high precision.

  • Semiconductor inspection/test equipment
  • Visual Inspection Equipment

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Detect foreign substances and discoloration in pellets and powders with our independently developed inspection mechanism!

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment

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Detecting foreign substances and discoloration in pellets and powders with our independently developed inspection mechanism!

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment

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Thanks to our unique technology, we can cancel out polycrystalline patterns and detect fine defects!

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment

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This is an image inspection machine using a 2D CCD camera that performs high-speed six-sided inspection of chip components.

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment

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High-precision inspection of output line misalignment, pitch between cells, and cell chips and cracks.

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment

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