List of Contract Analysis products
- classification:Contract Analysis
586~630 item / All 2046 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!
- Cooling system
April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024
Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.
Estimation of components is possible through TOF-SIMS analysis.
- Contract Analysis
You can visualize the diffusion layer structure of SiC devices.
- Contract Analysis
Quantitative analysis of the main components of sheet-like active substances is possible.
- Contract Analysis
- Contract measurement
It is possible to evaluate the structure of the Si anode after charging through sample cooling.
- Contract Analysis
- Contract measurement
Cross-sectional observation using atmosphere-controlled ion polishing (IP) processing is possible.
- Contract Analysis
- Contract measurement
Detection cases of stacking faults in SiC.
- Contract Analysis
Visualizing the in-plane distribution of impurities such as atmospheric components with a field equivalent to SEM.
- Contract Analysis
Even with a structure that has uneven surfaces, depth distribution evaluation is possible through flattening processing.
- Contract Analysis
Evaluation of crystal orientation, in-plane defect distribution, surface roughness, and impurities.
- Contract Analysis
Evaluation of the activation rate of the Dopant is possible.
- Contract Analysis
Analysis is possible after selectively removing the compound layer through preprocessing.
- Contract Analysis
You can measure the 300mm wafer as it is.
- Contract Analysis
Clear visualization of the layer structure of multilayer films using low-damage sputtering with GCIB.
- Contract Analysis
Capable of nano-order morphological observation and elemental analysis.
- Contract Analysis
Quantification of Si-H and N-H in SiN films using infrared absorption method.
- Contract Analysis
Tracking evaluation of phase transitions and crystallinity changes during the heating process.
- Contract Analysis
Information about valence bands and intra-gap levels can be obtained by element.
- Contract Analysis
"Technical Information: Analysis of Dental Implants Using TOF-SIMS" and two other items have been released.
We have published the following three analysis case studies on the MST website: - Analysis of dental implants using TOF-SIMS - Evaluation of GaN using soft X-ray emission spectroscopy For more details, please visit the MST website. http://www.mst.or.jp/
Measurement targeting microdomains is possible.
- Contract Analysis
Technical information "Raman 3D mapping of organic multilayer films" and three other items have been released.
We have published the following three analysis case studies on the MST website: - Raman 3D mapping of organic multilayer films - Evaluation of metal and organic contamination on wafer surfaces - Foreign substance analysis on metal components using Raman For more details, please visit the MST website. http://www.mst.or.jp/
Depth direction analysis will be conducted to a depth of several micrometers.
- Contract Analysis
- Contract manufacturing
We will evaluate the internal structure of the device in a comprehensive manner.
- Contract Analysis
- Other electronic parts
Evaluation of GFRP is possible according to the purpose.
- Contract Analysis
- Contract measurement
It is possible to analyze the deformation behavior of nanomaterials in response to environmental changes (pressure and temperature).
- Contract Analysis
Observation of SIM images is possible with high resolution (accelerating voltage 30kV: 4nm).
- Contract Analysis
- Contract measurement
- Contract Inspection
Reduce the impact of foreign object surrounding information with appropriate sampling.
- Contract Analysis
Lattice image analysis using the FFTM method
- Contract Analysis
Capable of observing large-area surface shapes.
- Contract Analysis
X-ray reflectivity measurement (XRR) allows for non-destructive analysis of film thickness and density.
- Contract Analysis
Evaluation of nitrogen in SiON with a film thickness of approximately 1 nm is possible.
- Contract Analysis
Measurement avoiding the effects of surface irregularities and high concentration layers using SSDP-SIMS.
- Contract Analysis
Evaluation of dopant distribution and junctions is possible even in extremely shallow regions.
- Contract Analysis
Waveform analysis and evaluation of the depth distribution of bonding states by Ar sputtering.
- Contract Analysis
We have compiled frequently asked questions regarding your order in an FAQ format.
- Contract Analysis
Reduce the impact of foreign matter surrounding information through appropriate sampling and microscopic measurement.
- Contract Analysis
A lineup of AlGaN standard samples with various Al compositions.
- Contract Analysis
Visualization of pharmaceutical components using TOF-SIMS.
- Contract Analysis
Evaluation of the top surface of modified layers of polymers, resins, and films using TOF-SIMS is possible.
- Contract Analysis
Quantitative analysis of interstitial oxygen and carbon concentration non-destructively using infrared absorption method.
- Contract Analysis
Quantitative analysis of main components and trace components is possible.
- Contract Analysis
Verification of the luminous characteristics of the chip and phosphor in white LEDs.
- Contract Analysis
Evaluation of the composition and distribution of impurities in polymer materials using XRF.
- Contract Analysis
Measurement examples of cleaning residues using TOF-SIMS.
- Contract Analysis
It is possible to evaluate the depth distribution of B, Al, N, P, and As in SiC with high sensitivity.
- Contract Analysis
Imaging SIMS enables the evaluation of localized elements.
- Contract Analysis
Imaging SIMS allows for the evaluation of localized elements.
- Contract Analysis
It is possible to identify the components of each layer of PET bottles using TOF-SIMS.
- Contract Analysis