List of Contract Analysis products
- classification:Contract Analysis
586~630 item / All 2039 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
A belt grinding machine that has been in use for about 50 years since 1973. In addition to trust and proven results, the lineup is also extensive.
- Other machine tools

Belt grinding machine "Veda Machine" has high durability and a wide range of service parts.
The "Bader Machine" is our belt grinder that boasts excellent polishing performance for each individual unit. By selecting models and types according to the shape and size of the workpiece, and by equipping it with a polishing belt suitable for the task, it can flexibly accommodate a wide variety of items across various fields. Please make extensive use of it for high-efficiency polishing and grinding, reduction of work time, labor-saving, and standardization of tasks. 【Lineup】 ■ Portable type BP-K (air motor type) ■ Made-to-order machine PC-1 (wheel centerless), BC (standard dust cover) ■ Installed type BM (basic type), SBA-1, BH-2 ■ Wheel type SBD-4S, SBD-7, BWd *For more details, please download the PDF or contact us.
You can visualize the diffusion layer structure of SiC devices.
- Contract Analysis
It is possible to evaluate the structure of the Si anode after charging through sample cooling.
- Contract Analysis
- Contract measurement
Cross-sectional observation using atmosphere-controlled ion polishing (IP) processing is possible.
- Contract Analysis
- Contract measurement
Detection cases of stacking faults in SiC.
- Contract Analysis
Even with a structure that has uneven surfaces, depth distribution evaluation is possible through flattening processing.
- Contract Analysis
Evaluation of crystal orientation, in-plane defect distribution, surface roughness, and impurities.
- Contract Analysis
Evaluation of the activation rate of the Dopant is possible.
- Contract Analysis
Analysis is possible after selectively removing the compound layer through preprocessing.
- Contract Analysis
You can measure the 300mm wafer as it is.
- Contract Analysis
Clear visualization of the layer structure of multilayer films using low-damage sputtering with GCIB.
- Contract Analysis
Capable of nano-order morphological observation and elemental analysis.
- Contract Analysis
Quantification of Si-H and N-H in SiN films using infrared absorption method.
- Contract Analysis
Tracking evaluation of phase transitions and crystallinity changes during the heating process.
- Contract Analysis
Evaluation of composition, bonding state, structure, and density is possible.
- Contract Analysis
Simultaneous analysis of six types of ginsenosides (Rb1, Rc, Rd, Re, Rg1, Rg3)
- Contract Analysis
Proposal for evaluation of breakdown voltage of GaN-based devices and surface heat distribution assessment.
- Contract Analysis
Non-destructive analysis of leakage points in Si-based power diodes.
- Contract Analysis
Evaluation of distribution uniformity and identification/estimation of organic matter through surface analysis of microdomains.
- Contract Analysis
Qualitative and relative comparison of SiH and states on the Si surface due to differences in processing.
- Contract Analysis
Accurate evaluation of the separator cross-sectional shape through sample cooling.
- Contract Analysis
- Contract measurement
Evaluation case of resveratrol concentration in red wine.
- Contract Analysis
- Contract measurement
Lattice image analysis using the FFTM method
- Contract Analysis
Evaluate organic EL elements with good depth direction resolution.
- Contract Analysis
Evaluation of nitrogen in SiON with a film thickness of approximately 1 nm is possible.
- Contract Analysis
Measurement avoiding the effects of surface irregularities and high concentration layers using SSDP-SIMS.
- Contract Analysis
NBD: Strain analysis of micro-regions using Nano Beam Diffraction.
- Contract Analysis
Evaluation of dopant distribution and junctions is possible even in extremely shallow regions.
- Contract Analysis
A lineup of AlGaN standard samples with various Al compositions.
- Contract Analysis
Visualization of pharmaceutical components using TOF-SIMS.
- Contract Analysis
Evaluation of the top surface of modified layers of polymers, resins, and films using TOF-SIMS is possible.
- Contract Analysis
Quantitative analysis of interstitial oxygen and carbon concentration non-destructively using infrared absorption method.
- Contract Analysis
Quantitative analysis of main components and trace components is possible.
- Contract Analysis
Verification of the luminous characteristics of the chip and phosphor in white LEDs.
- Contract Analysis
Evaluation of the composition and distribution of impurities in polymer materials using XRF.
- Contract Analysis
Measurement examples of cleaning residues using TOF-SIMS.
- Contract Analysis
It is possible to evaluate the depth distribution of B, Al, N, P, and As in SiC with high sensitivity.
- Contract Analysis
Imaging SIMS enables the evaluation of localized elements.
- Contract Analysis
Imaging SIMS allows for the evaluation of localized elements.
- Contract Analysis
It is possible to identify the components of each layer of PET bottles using TOF-SIMS.
- Contract Analysis
Cool the sample and evaluate the shape of the separator more accurately.
- Contract Analysis
- Contract measurement
It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.
- Contract Analysis
It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.
- Contract Analysis
It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.
- Contract Analysis
Measurements will be taken under analysis conditions suited to the purpose.
- Contract Analysis
Evaluation of localized elements is possible with imaging SIMS.
- Contract Analysis