We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for microscope.
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microscope Product List and Ranking from 26 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Jul 23, 2025～Aug 19, 2025
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 23, 2025～Aug 19, 2025
This ranking is based on the number of page views on our site.

  1. null/null
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  3. ピーテック Osaka//Medical Devices
  4. 4 null/null
  5. 5 null/null
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microscope Product ranking

Last Updated： Aggregation Period:Jul 23, 2025～Aug 19, 2025
This ranking is based on the number of page views on our site.

  1. White interference microscope equipped with laser microscope 'VK-X3000'
  2. Announcement of the introduction of Talos F200E
  3. Digital Phase Contrast Microscope "P-Scope V" ピーテック
  4. 4 All-in-one fluorescence microscope 'BZ-X1000 Series'
  5. 5 All-in-one fluorescence microscope 'BZ-X800'

microscope Product List

481～495 item / All 626 items

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Inverted Metal Microscope BX53M

Inverted Metal Microscope BX53M

With abundant support features, we achieve the appropriate settings.

With its rich support features, even beginners can easily set up the microscope correctly. Additionally, the newly developed guidance function allows users to easily return to the same observation conditions as before. With the BX53M, users can fully utilize the microscope's functions without needing specialized training, reducing variability among different operators. ◆ Just turn the dial: Simple switching of observation methods Complex operations required during microscope use are minimized to the extreme. The dial on the front of the illumination tube allows users to change observation methods, enabling quick switching between commonly used methods such as bright field, dark field, and differential interference, making various analyses easy to perform. Furthermore, even in simple polarized observations, rotating the analyzer expands the range of observations. ◆ Obtain appropriate images with guidance: Indexed diaphragm The diaphragm position, which has been difficult to set correctly in the past, can now be accurately specified just by matching it to the display. By properly setting the aperture diaphragm and field diaphragm, high-contrast images that fully utilize optical performance can be obtained.

  • Optical microscope

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Measuring Microscope STM7 (EVIDENT)

Measuring Microscope STM7 (EVIDENT)

A measuring microscope that fits your purpose.

Whether the measurement sample is small or large. Whether the measurement content is simple or complex. Whether the user is a beginner or experienced. A measuring microscope that fits your measurements. That is the STM7 series.

  • Optical microscope

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Time-lapse fluorescence microscope 'LS 820/850' in incubator

Time-lapse fluorescence microscope 'LS 820/850' in incubator

Incubator-compatible; time-lapse three-color fluorescence microscope.

The "Lumascope 820/850" from Etaluma is a compact time-lapse fluorescence microscope designed for use in limited spaces such as incubators, safety cabinets, and environmental control workstations. With an LED light source, Semrock filters, advanced optical design, and a CMOS sensor, it achieves nearly diffraction-limited resolution. Additionally, by simply connecting to a dedicated computer via USB, it allows for easy saving of still images, time-lapse sequences, and videos, enabling low-cost, high-quality imaging in three-color fluorescence (blue, green, red). 【Features】 - Reduces costs and simplifies operation and maintenance through advanced LED optical design. - Achieves quick setup and ease of use with power supply and control via USB connection to a PC. - Provides excellent resolution even under general lighting conditions with an advanced optical system. - Enhances observation of unstained samples with a phase contrast unit. - Offers high image quality through compatibility with objectives from Evident, among other features. *For more details, please download the PDF or feel free to contact us.

  • Other microscopes and optical inspection equipment

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Atomic Force Microscope (AFM) "Park NX10"

Atomic Force Microscope (AFM) "Park NX10"

Atomic force microscope providing reliable data with the highest level of nanoscale resolution.

The "Park NX10" is an atomic force microscope (AFM) that can be easily operated at all stages, from sample setup to imaging, measurement, and analysis. With this product, users can focus more on innovative research based on better data and more time. 【Features】 ■ Accurate XY scanning without bowing due to crosstalk removal ■ Accurate AFM topography using a low-noise Z detector ■ Top-class chip lifespan, resolution, and sample protection with true non-contact (TM) mode ■ Nano-order surface analysis of various materials such as semiconductors, polymers, battery materials, and carbon-based materials (see image gallery) *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes

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Atomic Force Microscope (AFM) "Park NX20"

Atomic Force Microscope (AFM) "Park NX20"

Fault analysis and nano-shape measurement tools for research and development in large samples.

The "Park NX20" is a large sample atomic force microscope (AFM) that artistically combines power, versatility, and ease of operation. This product is equipped with unique features to clarify the underlying causes of device failures and develop more creative solutions. Additionally, true non-contact (TM) mode scanning allows chips to be maintained sharper and longer, preventing unnecessary time and cost expenditures. [Solutions using large sample AFM in research and FA labs] ■ Surface roughness measurement for media and substrates ■ Defect inspection imaging and analysis ■ High-resolution electrical property measurement mode ■ Sidewall measurement in 3D structural analysis ■ Accurate AFM shape imaging with a low-noise Z detector *For more details, please download the PDF or feel free to contact us.

  • Other microscopes

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Atomic Force Microscope (AFM) "Park NX-Hivac"

Atomic Force Microscope (AFM) "Park NX-Hivac"

Vacuum environment scanning suitable for fault analysis applications.

The "Park NX-Hivac" is a high vacuum atomic force microscope (AFM) designed for failure analysis and materials that are susceptible to environmental influences. It enables precise failure analysis of highly doped semiconductors. Additionally, by utilizing our already recognized technology, it has achieved low noise measurements with high resolution, high reproducibility, and operability. 【High Vacuum Measurement for Failure Analysis】 - Advanced StepScan automatic mechanism and laser alignment mechanism for high-speed scanning - Multi-sample chuck - Park's unique easy chip exchange function - Large vacuum chamber (300mm×420mm×320mm) - Direct optical microscope that enables ultra-long distance observation - Enhanced sensitivity high vacuum SSRM mode *For more details, please download the PDF or feel free to contact us.

  • Other microscopes

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Atomic Force Microscope (AFM) "Park NX12-Bio"

Atomic Force Microscope (AFM) "Park NX12-Bio"

Powerful scanning probe microscope for life sciences

The "Park NX12-Bio" is an atomic force microscope (AFM) equipped with three types of high-performance nanoscale microscopes on a single innovative platform. It enables both innovative liquid imaging with scanning ion conductance microscopy (SICM) and the highly regarded atomic force microscopy (AFM) technology. 【Comprehensive Solution for Nanoscale Biological Research】 ■ Equipped with a fracture-type fully independent Z-axis scanner/XY scanner, featuring high-precision Park NX AFM with complete non-contact technology (TM) ■ Ultra-high-resolution optical imaging using inverted optical microscopy technology ■ Enhanced biological cell imaging through the integration of scanning ion conductance microscopy *For more details, please download the PDF or feel free to contact us.

  • Other microscopes

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Atomic Force Microscope (AFM) "Park NX-3DM"

Atomic Force Microscope (AFM) "Park NX-3DM"

Fully automated industrial AFM with NX technology implemented.

The "Park NX-3DM" is a fully automated AFM (Atomic Force Microscope) system designed for overhang profiling, high-resolution sidewall imaging, and critical angle measurement. With its patented separated XY and Z scanning system equipped with an inclined Z scanner, it overcomes the challenges of conventional and flare chip methods in accurate sidewall analysis. 【Essential Tool for Wafer Fabrication】 ■ Fully automated industrial AFM using advanced and precise Park NX technology ■ Tilt head design for undercut and overhang structures ■ Accurate sidewall roughness measurement without the need for sample pretreatment ■ High-quality images can be obtained without damaging the device or sample due to the fully non-contact mode (TM) *For more details, please download the PDF or feel free to contact us.

  • Other microscopes

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Atomic Force Microscope "Park NX-HDM"

Atomic Force Microscope "Park NX-HDM"

A scanning atomic force microscope system that accelerates the automatic defect inspection for defect identification, scanning, and analysis by ten times.

The "Park NX-HDM" is an atomic force microscope capable of automatic defect inspection and sub-angstrom surface roughness measurement for media and substrates. It is extensively linked with optical inspection devices, significantly improving the throughput of automatic defect inspection. Additionally, it provides accurate sub-angstrom surface roughness measurements even in repeated measurements. 【Features】 ■ Automatic defect inspection for media and substrates ■ Accurate sub-angstrom surface roughness measurement ■ Cost reduction through true non-contact mode ■ Accurate AFM topography with low-noise Z detector *For more details, please refer to the PDF document or feel free to contact us.

  • Electron microscope
  • Other microscopes

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[New Release!] Atomic Force Microscope 'Park NX7'

[New Release!] Atomic Force Microscope 'Park NX7'

[Japanese Version Catalog Available] New products with low cost, high functionality, and short delivery times! Introducing the atomic force microscopes we handle!

The "Park NX7" is equipped with all the new technologies developed by Park Systems and is available at an affordable price. This product is designed down to the finest details, just like the higher-end models, and can facilitate research. Additionally, it offers flat orthogonal XY scanning without bowing. Please feel free to contact us if you have any inquiries. 【Features】 ■ Highly expandable AFM solution ■ Flat orthogonal XY scanning without bowing ■ Low noise Z detector ■ Improved chip lifespan, sample preservation, and repeatability through True Non Contact mode * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.

  • Other microscopes

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[Column] What are the differences between digital microscopes and optical microscopes?

[Column] What are the differences between digital microscopes and optical microscopes?

What are digital microscopes and optical microscopes? Let's choose the right one for each application.

Some people may find it difficult to understand the differences between optical microscopes and digital microscopes. In this column, we will clearly explain the features and differences of each, so please use it as a reference when considering the introduction of optical microscopes or digital microscopes. For more details, please see the related links. [Content Overview (Partial)] ■ Features of Digital Microscopes and Optical Microscopes ・What is a digital microscope? ・What is an optical microscope? ■ Differences between Digital Microscopes and Optical Microscopes ・Differences in ease of information sharing ・Differences in usability *You can view the detailed content of the column from the related links. For more information, please feel free to contact us.

  • Microscope

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[Column] The Difference Between Digital Microscopes and Electron Microscopes

[Column] The Difference Between Digital Microscopes and Electron Microscopes

What is the difference between a digital microscope and an electron microscope? It is important to choose the right equipment.

The electron microscope and digital microscope each have different areas of observation in which they excel. If you choose one without knowing their respective features and usability, you may not be able to conduct observations that align with your intentions. This column introduces the characteristics and differences between digital microscopes and electron microscopes. If you are unsure which one to implement, please use this as a reference. For more details, please see the related links. [Content Included] ■ Characteristics of digital microscopes and electron microscopes ■ Differences between digital microscopes and electron microscopes ■ Choose the one suited for each application *You can view the detailed content of the column (such as blogs) from the related links. For more information, please feel free to contact us.

  • Microscope

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TR-Micro Low Frequency Raman Microscope

TR-Micro Low Frequency Raman Microscope

Raman microscope for low-frequency region (terahertz) measurements

This is an accessory for Raman microscopes that can be easily attached and detached from existing Raman microscopes. It allows for non-contact and non-destructive analysis without the need for sample pretreatment, enabling the measurement of components in organic and inorganic materials, and is suitable for evaluating the crystal forms of trace and minute active pharmaceutical ingredients. It is also possible to assess the dispersion state of components such as active ingredients and excipients that make up tablets and mixed powders through chemical imaging.

  • Spectroscopic Analysis Equipment

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[Blog] Dramatic Advances in Microbial Analysis Technology - A Look Back at Microbial Research

[Blog] Dramatic Advances in Microbial Analysis Technology - A Look Back at Microbial Research

Why microorganisms now? It's because new possibilities have been discovered in the use of microorganisms.

Microorganisms were first recognized in the late 17th century when the microscope was invented by a Dutch textile merchant. For a long time, the flow of research on microorganisms has generally involved acquiring microorganisms that can be cultured under specific conditions (mainly on agar media) and analyzing their characteristics using various analytical devices. Various analytical techniques have been developed, including morphological analysis using optical and electron microscopes, DNA sequence analysis based on improved methods derived from the Sanger method developed in 1977, and protein crystallography, which involves purifying proteins, forming crystals, and irradiating them with X-rays to deduce the protein structure from the resulting diffraction patterns. Research has been steadily and diligently advanced. *For more details about the blog, please refer to the related links. If you have any questions, feel free to contact us.*

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