Transmission Electron Microscopy (TEM) Observation
Electron microscope observation capable of identifying crystalline substances and analyzing crystal orientations! Applicable to all types of metallic materials.
The "Transmission Electron Microscope (TEM)" irradiates a sample with a high-voltage electron beam and obtains transmission electron images and electron diffraction patterns by magnifying the electrons that have passed through the sample using electromagnetic lenses. In transmission electron images, features such as grain boundaries, defects, strain, and the presence of precipitates can be observed, while electron diffraction patterns allow for the identification of crystalline materials and the analysis of crystal orientation. 【Features】 ■ Observation at magnifications from 1,000 to 1,000,000 times ■ Element identification in ultra-micro regions through EDS analysis (qualitative and semi-quantitative analysis of elements from C to U) ■ Identification of crystalline materials and analysis of crystal orientation *For more details, please refer to the catalog or feel free to contact us.
- Company:コベルコ溶接テクノ
- Price:Other