microscope Product List and Ranking from 177 Manufacturers, Suppliers and Companies

Unmatched high field of view and high resolution interference-type 3D laser scanning microscope.

An interference-type 3D laser scanning microscope that achieves unparalleled high field of view and high resolution (field of view: 30x50 mm; resolution: 50 nm).

First Interferometric Measurement Using Laser Scanning Interference fringes appear with a reflection similar to that of glossy paper. It captures changes of 50 nm with interference fringes. ● Inverted Laser Scanning Interferometer (Model: LSMi-7000) By placing the sample on a glass surface, interference fringe measurement can be easily performed. Scanning range is 30 mm × 50 mm, and it can be observed in an enlarged view on the monitor. It can inspect fine scratches, polishing defects, and chipping on ceramics and other materials. Interference fringe analysis software is optional. ● Cylindrical Laser Scanning Interferometer (Model: LSMi-7500) Interference fringes can be observed over the entire surface of the cylinder, allowing for precise inspection of the cylinder. ● Upright Laser Scanning Interferometer (Model: LSMi-8000) Enables non-contact measurement of fine interference fringes. Interchangeable lenses include 5 mm, 10 mm, and 26 mm scanning lenses, with custom options available. Can also be used as a standard confocal laser scanning imager. Devices Developed from These Applications Ultra-wide field confocal type, high resolution 1 μm 3D laser scanning imager Can measure 3D shapes within a range of 5 × 50 mm. ● Capable of measuring shapes with inclinations up to 45 degrees. ● Can also detect defects such as scratches and deep holes. ● Shape measurement and image acquisition of cylindrical surfaces are also possible.

Company：ワイ・ドライブ
Price：5 million yen-10 million yen

Laser microscope

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[Processing Example] Measurement of the processed surface using a white light interference microscope.

Wide measurement range exceeding mm units! Measurement examples of polycrystalline ceramics and SiC single crystals.

We would like to introduce a case study of surface measurement using the newly introduced white light interference microscope at our company. The white light interference microscope is a type of microscope that utilizes the phenomenon of light interference to measure and analyze "surface shape." It accommodates surface roughness and line roughness through 3D measurement, regardless of the material being measured. In the measurement of the wire slice surface and polishing surface of polycrystalline ceramics, the results were as follows: slice surface Sa 0.8446 μm, lapping surface Sa 0.2506 μm, and polishing surface Sa 0.00583 μm. Additionally, in the measurement of the polishing surfaces of SiC single crystal and SUS316L, the results were: SiC single crystal Sa 0.000458 μm and SUS316L Sa 0.000302 μm. 【Features of the White Light Interference Microscope】 ■ Non-contact & Surface Measurement - No restrictions on the material being measured - Accommodates surface roughness and line roughness through 3D measurement ■ Wide Measurement Range & High Resolution Measurement - Wide in-plane measurement range exceeding millimeter units - Height resolution of 0.01nm *For more details, please refer to the PDF document or feel free to contact us.

Company：新興製作所
Price：Other

3D measuring device

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LYNX EVO

Error reduction! Thorough quality inspection of products with 360° angled observation.

The "LYNX EVO" is a product that enhances productivity and efficiency due to its wide working area and good peripheral vision, making fine manual work under magnification easier. With the optional 360° rotating viewer, it allows for 3D observation, facilitating defect detection that is difficult with direct vertical viewing. Additionally, we offer a low-cost model called "OPTA," which is suitable for replacing existing magnifiers and binocular stereo microscopes. 【Features】 <LYNX EVO> ■ Improved productivity and efficiency ■ Easier fine manual work under magnification ■ Allows for 3D observation ■ Simplifies defect detection that is difficult with direct vertical viewing ■ Simple design enables easy and clear observation even for operators unfamiliar with microscope observation *For more details, please download the PDF or feel free to contact us.

Company：アークステーション
Price：Other

Optical microscope

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Auto Focus Microscope '3R-MSTVUSB20AF'

Full HD 2 million pixels, equipped with a 1/2 inch CSOS, microscope that connects to a monitor without the need for a PC!

The "3R-MSTVUSB20AF" is an autofocus microscope that displays high-definition images in just about 0.5 seconds. It allows for speedy observation without any operation, significantly reducing time. Additionally, it enables the capture and storage of still images and videos while maintaining high quality. The captured data is saved on a microSD card (compatible with up to 32G). The data can be utilized for email attachments or reporting purposes. 【Features】 ■ High-speed autofocus ■ Full HD imaging ■ Still image and video storage ■ Optical zoom 20x, digital zoom 6x ■ Powerful brightness with LED unit *For more details, please feel free to contact us.

Company：ノダキ本社
Price：Other

Other microscopes

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Portable Digital Microscope '3R-MSA600AF'

Maximum magnification of approximately 40 times! A touch panel integrated monitor that can also be used for shooting and measurement.

The "3R-MSA600AF" is a portable digital microscope equipped with a three-stage autofocus function that also allows for simple measurements. It is a microscope and monitor integrated into one unit and is wireless, making it usable even when you are out and about. Additionally, it can be used casually anywhere without being limited by location or subject, similar to using a camera. Please feel free to contact us if you have any inquiries. 【Features】 ■ One-touch automatic focus adjustment ■ Three-stage autofocus function ■ Magnification up to 40 times ■ Easy to operate, integrated monitor ■ Still image and video capture and storage *For more details, please feel free to contact us.

Company：ノダキ本社
Price：Other

Other microscopes

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Digital Microscope "3R-MSUSB Series"

You can correct and measure captured images with the dedicated software available for download!

The "3R-MSUSB Series" is a digital microscope that allows you to display images viewed through the microscope on your computer simply by connecting it via USB. Equipped with an LED light at the tip, it enables bright observation of the subject. You can capture still images and videos, and perform simple measurements using the included software. Additionally, it is possible to save images while displaying the measured values and entered text. 【Features】 ■ Easy measurement ■ Text input function ■ Measurement correction *For more details, please feel free to contact us.

Company：ノダキ本社
Price：Other

Other microscopes

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Scanning Electron Microscope (SEM) Observation

Observation of non-conductive samples without deposition is possible! Scanning electron microscopy is ideal for surface observation of fibers and similar materials.

A "Scanning Electron Microscope (SEM)" is a device that irradiates and scans a finely focused electron beam on a sample, detects secondary and backscattered electrons, and displays their intensity as an image on a monitor to obtain magnified images of the object. Although it is not suitable for high magnification observation due to reduced image quality, it can use low vacuum mode, allowing for non-coating observation of difficult-to-conduct samples. [Observation Items] ■ Surface observation at magnifications of 5 to 300,000 times ■ Elemental analysis (B to U) using an energy-dispersive X-ray spectrometer (EDS) as an accessory ■ Element identification in micro-regions (qualitative and semi-quantitative analysis) *For more details, please refer to the catalog or feel free to contact us.

Company：コベルコ溶接テクノ
Price：Other

Analytical Equipment and Devices

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Transmission Electron Microscopy (TEM) Observation

Electron microscope observation capable of identifying crystalline substances and analyzing crystal orientations! Applicable to all types of metallic materials.

The "Transmission Electron Microscope (TEM)" irradiates a sample with a high-voltage electron beam and obtains transmission electron images and electron diffraction patterns by magnifying the electrons that have passed through the sample using electromagnetic lenses. In transmission electron images, features such as grain boundaries, defects, strain, and the presence of precipitates can be observed, while electron diffraction patterns allow for the identification of crystalline materials and the analysis of crystal orientation. 【Features】 ■ Observation at magnifications from 1,000 to 1,000,000 times ■ Element identification in ultra-micro regions through EDS analysis (qualitative and semi-quantitative analysis of elements from C to U) ■ Identification of crystalline materials and analysis of crystal orientation *For more details, please refer to the catalog or feel free to contact us.

Company：コベルコ溶接テクノ
Price：Other

Analytical Equipment and Devices

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Superior Corporation Business Introduction

We are striving for extreme business development in the fields of healthcare and information to meet the social needs of the 21st century!

Superior Co., Ltd. is a company that specializes in the manufacturing of special coils as a professional in precision winding, and also engages in the assembly of machinery, including the assembly of electron microscope units and ultra-precision assembly of semiconductor-related units. Additionally, we accept orders for integrated services from design to manufacturing of resin processing for cleaning tanks used in semiconductor manufacturing equipment and rationalization machinery and equipment. 【Business Activities】 ■ Special coil manufacturing ■ Machinery assembly ■ Resin processing related to industrial machinery ■ Precision parts processing *For more details, please refer to our catalog or feel free to contact us.

Company：スペリア
Price：Other

Inductor Coil
Electron microscope

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Zoom Stereo Microscope 'BS-2'

Microscope for observing cutting conditions

The "BS-2" is a zoom stereo microscope that can be used for the production of transparent micro-slices for FT/IR and for checking the trimming condition of samples. Since the microscope body is mounted on an X-Y table, fine adjustments to the field of view can be made while maintaining high magnification. Additionally, the microscope body can be retracted, so it does not interfere with the replacement of blades or samples. 【Usage Scenarios】 ■ Production of high-precision slices ■ Confirmation of knife edge quality ■ Alignment check between sample and knife edge ■ Quality check of slices ■ Collection of slices, etc. *For more details, please download the PDF or feel free to contact us.

Company：日本ミクロトーム研究所
Price：Other

Other microscopes

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Technical Information Magazine 202001-01 in-situ STEM

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In recent years, there has been a growing demand for high-sensitivity and low-power consumption devices, leading to increased attention on magnetic memory and magnetic sensors in the field of spintronics. These devices widely utilize the MTJ (magnetic tunnel junction) structure due to its ability to achieve high magnetoresistance effects. The MTJ structure consists of thin layered films on the order of a few nanometers, where the film thickness, roughness, and crystallinity at the atomic level significantly influence the properties. Additionally, since the magnetic characteristics change with annealing temperature, this paper presents a case study using in-situ TEM to analyze the changes in crystallinity and elemental distribution during heating at the nanometer level. **Table of Contents** 1. Introduction 2. Samples and Evaluation Methods 3-1. Changes in Crystallinity 3-2. Analysis of Crystal Orientation 3-3. Analysis of In-Plane Crystal Orientation 4. Conclusion 5. Acknowledgments 6. Closing Remarks

Company：東レリサーチセンター
Price：Less than 10,000 yen

Contract Analysis
Contract measurement
Technical and Reference Books

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Technical Information Magazine 201910-03 In-situ Heating Method

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** Regarding the LIB positive electrode active material LiCoO2, gas analysis using TPD-MS and two in-situ heating methods (in-situ heating TEM) were employed to investigate the relationship between the gases emitted from LiCoO2 particles during heating and the changes in morphology, organization, and structure. The results demonstrated that gas generation is closely related to structural changes. Changes similar to charge-discharge behavior were also observed, and a series of measurements with temperature as a parameter provided important insights for analyzing actual materials. Additionally, it was shown that microscopic structural changes (such as the formation of domain structures), which cannot be detected without high resolution (approximately 40 nm field of view), can be visualized and quantitatively analyzed using ASTAR* (with *ASTAR being a registered trademark of NanoMEGAS) at a field of view of over 1 μm. **Table of Contents** 1. Introduction 2. Experimental Methods 3. Observation of Gas Generation Behavior Using TPD-MS 4. Observation of Structural Changes by in-situ Heating TEM 4-1. Observation of Morphological and Organizational Changes in STEM Images 4-2. Observation of Crystal Structure Changes in HRSTEM Images 4-3. Observation of Morphological, Organizational, and Structural Changes Above 650°C 5. Conclusion

Company：東レリサーチセンター
Price：Less than 10,000 yen

Contract Analysis
Contract measurement
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Technical Information Magazine 201910-02 DDS Technology

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In recent years, research and development have been focused on drug delivery systems (DDS) aimed at reducing side effects of pharmaceuticals and improving their efficacy. Carriers used in DDS include biomaterials such as liposomes, polymer micelles, inorganic nanoparticles, and drug conjugates (e.g., ADCs). Among these, our company is concentrating on establishing analysis and evaluation techniques for liposomes, introducing case studies of liposome analysis primarily using high-difficulty techniques such as TEM (transmission electron microscopy) and AFM (atomic force microscopy). **Table of Contents** 1. Introduction 2. Fundamental technologies of DDS and characteristics of various carriers 3. Case studies of liposome analysis and evaluation 4. Conclusion

Company：東レリサーチセンター
Price：Less than 10,000 yen

Contract Analysis
Contract measurement
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Technical Information Magazine 201902-01 Polymers Using DPC-STEM

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** Differential Phase Contrast (DPC) - Scanning Transmission Electron Microscopy (STEM), one of the measurement techniques of STEM, enables the measurement of electric fields at microscopic regions. By applying this method to polymer alloys, we discovered that contrast of phase separation structures, which are difficult to observe with conventional electron microscopy, emerges. **Table of Contents** 1. Introduction 2. Visualization of Soft Materials through Elemental Analysis 3. Application of DPC-STEM Method 4. Conclusion

Company：東レリサーチセンター
Price：Less than 10,000 yen

Contract Analysis
Contract measurement
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Observation of the crystalline structure of resin and the morphology of polymer alloys using TEM.

It is possible to observe and evaluate the crystalline structure and dispersion state of the resin!

Our website introduces "Observation of Crystal Structure and Morphology of Polymer Alloys using Transmission Electron Microscopy (TEM)." To observe the crystal structure of polymers and the morphology of polymer alloys using TEM, it is necessary to prepare ultra-thin sections. Additionally, staining is required to create differences in electron beam transmission. We provide a table of main staining agents and resins that can be stained, as well as examples of observations, so please take a look. [Contents] ■ Main staining agents and resins that can be stained ■ Observation examples - Crystal structure of HDPE - Observation example of the dispersion structure of polymer alloys *For more details, please refer to the related links or feel free to contact us.

Company：ロンビック
Price：Other

Contract Analysis

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microscope Product List and Ranking from 177 Manufacturers, Suppliers and Companies

microscope Manufacturer, Suppliers and Company Rankings

microscope Product ranking