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microscope(afm) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
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microscope Product List

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Data DL available: AFM Case Studies in Scanning Probe Microscopy

Data DL available: AFM Case Studies in Scanning Probe Microscopy

We will introduce numerous analysis cases using AFM scanning probe microscopy, such as structural analysis, elastic modulus measurement, and conductivity measurement.

In this case study collection, we will introduce analysis examples using "AFM: Scanning Probe Microscopy." [Contents] ● Method and results of "Structural analysis and elastic modulus measurement of food (somen)" ● Features and analysis examples of "Conductive measurements of AFM in a vacuum" ● Features and analysis examples of "Conductivity evaluation of material surfaces using AFM" ● "AFM observation of polymer materials (smoothing by microtome)" We conduct various analyses using AFM, which is one of our strengths. We hope you will take a look. There are many other examples not included here. *For more details, please refer to our other PDF materials or feel free to contact us.

  • Other microscopes
  • Contract Analysis
  • Surface treatment contract service

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AFM platform with optical microscope

AFM platform with optical microscope

Achieves high-speed scanning and high resolution imaging using atomic force microscopy. Compatible with measurements in air and liquid.

This is an AFM platform equipped with an optical microscope. It allows imaging with an atomic force microscope targeting areas observed with the optical microscope. It adopts a vertical optical path design, and the gas-liquid dual-use probe holder can be used simultaneously in both air and liquid. (Liquid measurement option required) *For more details, please contact us.*

  • probe

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AFM Data Collection

AFM Data Collection

AFM: Atomic Force Microscopy Method

AFM is a method that scans the surface of a sample with a fine probe and measures nano-scale surface topography in three dimensions. It can measure a wide range of materials, not only for the evaluation of metals, semiconductors, and oxides, but also for soft materials such as hair and contact lenses. This document presents various AFM images of different materials.

  • Contract Analysis
  • Wafer

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AFM-IR device with sub-5 nm IR spatial resolution

AFM-IR device with sub-5 nm IR spatial resolution

AFM-IR device Spectroscopic Nanoscopy PiFM・PiF-IR

This is an AFM-IR device that achieves sub-5 nm IR spatial resolution. It is a compact and self-contained system. The optical system allows for easy quick change and switching, and access to the sample is straightforward.

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AFM Atomic Force Microscope Nano Observer 2

AFM Atomic Force Microscope Nano Observer 2

Achieving measurement quality comparable to high-end products from established AFM manufacturers.

Combining flexibility, outstanding performance, and user-friendly operability, it achieves measurement quality comparable to high-end products from established AFM manufacturers. It is equipped with a wide range of functions for nanoscale imaging and characterization. It also enables electrical property measurements (KFM, C-AFM) and features a soft IC mode that can measure fragile samples.

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[Application Example] Atomic Force Microscopy (AFM) Experiment

[Application Example] Atomic Force Microscopy (AFM) Experiment

The 8-channel Spectrum DigitizerNETBOX provides the high precision necessary to drive the evolution of AFM. Comes with a comprehensive catalog.

I would like to introduce an application example of Atomic Force Microscopy (AFM) experiments at the Precision Mechatronics Laboratory of Newcastle University, UK. Atomic Force Microscopy is an important tool in materials science and is used for mechanical scanning of surfaces. The forces acting between the surface atoms and the tip of the nanoscale probe are measured and calculated, achieving a resolution on the order of a fraction of a nanometer. [Overview] ■ AFM Technology ■ High-precision Multi-channel Digitizer *For more details, please feel free to contact us.

  • Other electronic parts

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Low-cost high-performance research AFM/SPM MFP-3D Origin

Low-cost high-performance research AFM/SPM MFP-3D Origin

Achieve high performance and high quality at low cost! The most affordable atomic force microscope with Asylum quality in the low price range. It offers high performance and a wide range of features.

The MFP-3D Origin is a model that features high performance and quality unique to Asylum Research, while being competitively priced against existing low-cost AFM/SPM options. This model offers a balance of performance and price, providing "high-resolution imaging," "large sample handling," "various imaging modes," and "diverse accessories." It is the best entry-level model for starting to use AFM/SPM!

  • Microscope

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Custom Atomic Force Microscope (AFM) System

Custom Atomic Force Microscope (AFM) System

We will design and build a customized AFM system tailored to your needs!

It is necessary to conduct AFM measurements, but does the sample require special handling due to its size, or does it require experiments that differ from conventional techniques and methods? We sincerely take your needs into consideration and will work together with you to find solutions. At Japan Quantum Design, we design and build systems tailored to your requirements through close collaboration with the device development team at Nanosurf, the manufacturer based in Switzerland. If you have any concerns or requests regarding surface measurements, please feel free to contact us!

  • Other measurement, recording and measuring instruments

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[Analysis Case] Dynamic Viscoelastic Evaluation of PDMS using AFM

[Analysis Case] Dynamic Viscoelastic Evaluation of PDMS using AFM

Introduction to the evaluation of in-plane distribution of viscoelasticity and frequency dependence!

Our organization offers dynamic viscoelastic evaluation of PDMS using AFM. Dynamic Mechanical Analysis (DMA) is an effective method for investigating viscoelastic behavior, which is an important factor in the research and development of polymer materials. Additionally, by combining it with the AFM mechanism, it becomes possible to measure in-plane distribution and evaluate localized areas. This document presents a case study using AFM-DMA to map the viscoelastic modulus of PDMS (polydimethylsiloxane) and conduct frequency-dependent spectroscopy evaluation. [Measurement Method / Processing Method] ■ [AFM] Atomic Force Microscopy *For more details, please download the PDF or feel free to contact us.

  • 4a.png
  • Contract Analysis

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AFM/SPM for Polymers Cypher ES Polymer Edition

AFM/SPM for Polymers Cypher ES Polymer Edition

Standard-equipped with optimal measurement modes and options for polymer material research! Atomic force microscope for polymers based on ultra-high-performance environment-controlled AFM/SPM.

The Cypher ES Polymer Edition is based on the Cypher ES, which adds sophisticated environmental control to Asylum Research's ultra-high-performance AFM, and comes standard with measurement modes and options that are optimal for polymer materials research and polymer characterization (see "Basic Information" below). ● For other features and details, please refer to the catalog or contact us.

  • Other measurement, recording and measuring instruments
  • Microscope

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[Analysis Case] Evaluation of Mechanical Properties of Hair Cross-Sections Prepared by Microtome Method

[Analysis Case] Evaluation of Mechanical Properties of Hair Cross-Sections Prepared by Microtome Method

It is possible to evaluate the elastic modulus of the internal structure of soft materials.

When evaluating the internal structure of materials, it is necessary to expose the internal structure while maintaining it through cross-sectional processing techniques such as cutting and polishing. This document introduces a case where the microtome method, which has a relatively small impact from processing damage, was used to create cross-sections of hair, followed by AFM observation of the internal structure and evaluation of elastic modulus. The microtome method is a cutting processing technique widely used in the field of soft materials, such as rubber materials and biological samples, and this approach has made it possible to evaluate the mechanical properties of the internal structure of these materials. [Measurement and Processing Methods] [AFM] Atomic Force Microscopy [AFM-MA・AFM-DMA] Mechanical Property Evaluation (Elastic Modulus Measurement, Dynamic Viscoelasticity Measurement) Ultra Microtome Processing *For more details, please download the PDF or feel free to contact us.

  • img_c0670_3_Microtome_Modulus_DMT_JKR_Hair_diagram.jpg
  • Contract measurement
  • Contract Analysis

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200mm Large Sample Compatible AFM/SPM Jupiter XR

200mm Large Sample Compatible AFM/SPM Jupiter XR

A large sample-compatible stage-type AFM/SPM (Atomic Force Microscope/Scanning Probe Microscope) with excellent resolution, speed, operability, and flexibility.

The Jupiter XR atomic force microscope is the industry's first large sample-compatible AFM/SPM that supports "ultra-high resolution," "high-speed imaging," and "wide-area scanning" with a single scanner without the need to change scanners. The sample stage allows access to the entire 200 mm sample area and inherits the excellent fundamental design and operability developed in the Cypher AFM (released in 2007), as well as the photothermal excitation 'blueDrive.' With its high level of balance, the Jupiter XR is the best choice for applications that require a variety of samples and applications in fields such as analytical science, industrial R&D, and academic research.

  • Microscope

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High-speed atomic force microscope (high-speed AFM) 'MS-NEX'

High-speed atomic force microscope (high-speed AFM) 'MS-NEX'

Even those who are handling AFM for the first time can easily observe videos at the nanoscale!

The "MS-NEX" is a high-speed atomic force microscope (high-speed AFM) module system that allows for video observation of samples at the nanoscale and in real-time within a solution. It flexibly responds to requests such as "I need this function now" or "I won't use this function now." Depending on your research theme, progress, and budget, you can use a high-speed AFM that matches your current needs by combining various modules. 【Features】 ■ Capable of video observation at the nanoscale and in real-time ■ Various functions can be freely combined as needed ■ Modules can be added later ■ Equipped with various support functions ■ Easy to use even for those handling AFM for the first time *For more details, please refer to the PDF document or feel free to contact us.

  • Microscope
  • others

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Atomic Force Microscope (AFM) "Park NX-3DM"

Atomic Force Microscope (AFM) "Park NX-3DM"

Fully automated industrial AFM with NX technology implemented.

The "Park NX-3DM" is a fully automated AFM (Atomic Force Microscope) system designed for overhang profiling, high-resolution sidewall imaging, and critical angle measurement. With its patented separated XY and Z scanning system equipped with an inclined Z scanner, it overcomes the challenges of conventional and flare chip methods in accurate sidewall analysis. 【Essential Tool for Wafer Fabrication】 ■ Fully automated industrial AFM using advanced and precise Park NX technology ■ Tilt head design for undercut and overhang structures ■ Accurate sidewall roughness measurement without the need for sample pretreatment ■ High-quality images can be obtained without damaging the device or sample due to the fully non-contact mode (TM) *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope (AFM) "Park NX10"

Atomic Force Microscope (AFM) "Park NX10"

Atomic force microscope providing reliable data with the highest level of nanoscale resolution.

The "Park NX10" is an atomic force microscope (AFM) that can be easily operated at all stages, from sample setup to imaging, measurement, and analysis. With this product, users can focus more on innovative research based on better data and more time. 【Features】 ■ Accurate XY scanning without bowing due to crosstalk removal ■ Accurate AFM topography using a low-noise Z detector ■ Top-class chip lifespan, resolution, and sample protection with true non-contact (TM) mode ■ Nano-order surface analysis of various materials such as semiconductors, polymers, battery materials, and carbon-based materials (see image gallery) *For more details, please refer to the PDF document or feel free to contact us.

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