List of Inspection Equipment and Devices products

  • classification:Inspection Equipment and Devices

226~270 item / All 8318 items

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

  • PRエリア.png
  • Other conveying machines

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Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!

  • Cooling system

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April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024

Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.

We will introduce carefully selected products from world-class research, testing, and analytical instruments!

  • Other inspection equipment and devices
  • Other physicochemical equipment
  • Analytical Equipment and Devices

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Equipped with an autofocus mechanism to prevent distortion blur! Image inspection device "AURCA Series"

  • Defect Inspection Equipment
  • Visual Inspection Equipment
  • Circuit Board Inspection Equipment

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The sale of the appearance inspection device "AURCA series," which supports RDL defect inspection, bump defect inspection, and TSV defect inspection, has begun!

  • Wafer
  • Visual Inspection Equipment
  • Defect Inspection Equipment

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AI analysis function equipped!! Appearance inspection device

  • Visual Inspection Equipment
  • Defect Inspection Equipment
  • Circuit Board Inspection Equipment

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The AI-equipped appearance inspection device "AURCA Series" for semiconductor wafers and panels has arrived! It can also inspect semiconductor package substrates and printed circuit boards!

  • Wafer
  • Visual Inspection Equipment
  • Defect Inspection Equipment

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Full-color appearance inspection device "AURCA Series"

  • Semiconductor inspection/test equipment
  • Visual Inspection Equipment
  • Circuit Board Inspection Equipment

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Appearance inspection device "AURCA series" contributing to yield improvement.

  • Defect Inspection Equipment
  • Circuit Board Inspection Equipment
  • Visual Inspection Equipment

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AI inspection and measurement solution for printed circuit boards, image inspection device "AURCA Series"

  • Defect Inspection Equipment
  • Visual Inspection Equipment
  • Circuit Board Inspection Equipment

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The "AURCA Series" image inspection device for semiconductor package substrates has arrived! It can also inspect printed circuit boards and wafers!

  • Defect Inspection Equipment
  • Visual Inspection Equipment
  • Circuit Board Inspection Equipment

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AI inspection and measurement solution for electronic circuit boards and semiconductor silicon wafers: Introducing the "AURCA Series" appearance inspection equipment!

  • Defect Inspection Equipment
  • Visual Inspection Equipment
  • Circuit Board Inspection Equipment

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Radar-type strip edge position detector and width gauge

  • Other inspection equipment and devices

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A universal detector with consistent weight-dependent responsiveness! Introduction to the technical documentation.

  • others
  • Other inspection equipment and devices

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■High precision and ultra-fast 3D measurement ■Built-in controller ■Easy operation with mouse control

  • Other machine tools
  • 3D measuring device
  • Other inspection equipment and devices

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A lineup of water level gauges and liquid level gauges from low pressure to high pressure! The trusted and reliable "OKB" brand.

  • Other inspection equipment and devices
  • Other measurement, recording and measuring instruments

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Poor contact causes sparks. There is a risk of damaging expensive devices?! We will provide free support from identifying the cause of poor contact to selecting probes.

  • probe

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We will select the optimal probe that is less likely to cause contact failure for wire harnesses of various shapes.

  • probe

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Resolve measurement errors due to poor contact! By identifying the root cause and selecting the optimal probe, we will improve inspection yield.

  • probe

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Introducing Mentor Graphics' ModelSim DE.

  • Solar power generator
  • Wind turbine
  • Evaluation Board

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