List of Contract Analysis products

  • classification:Contract Analysis

1036~1080 item / All 2042 items

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

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  • Other conveying machines

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Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.

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  • Other safety and hygiene products

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XRR:X-ray Reflectivity

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FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas...

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Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation

The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology

XRD is a method for obtaining information about the crystal structure of a sample from its diffraction pattern.

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Obtain information about the molecular structure and crystal structure of the sample.

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[MST Homepage] Analysis Case "Evaluation of Bone Condition Before and After HF Treatment" has been published.

We have published analysis cases on the MST homepage. ◆Title Evaluation of Bone Condition Before and After HF Treatment ~Evaluation of Condition Before and After Chemical Treatment Using Raman Analysis~ ◆Measurement Method / Processing Method Raman / Chemical Treatment ◆Product Field Pharmaceuticals / Biotechnology ◆Analysis Purpose Evaluation of Chemical Bonding State ◆Overview HF (hydrofluoric acid) is widely used in processes such as wet etching of SiO2 and plays a very important role in semiconductor manufacturing. However, it is also a very dangerous chemical that can penetrate the skin and damage bones, requiring careful handling. The erosion of bones caused by HF occurs due to the reaction between Ca, which exists in bones as apatite, and HF, resulting in the formation of CaF2. This case introduces an evaluation of the changes in this reaction using Raman analysis. ★★For detailed data, please see the link★★

It is possible to easily obtain crystal information over a wide area.

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A method to obtain information about the electric field structure inside the sample (junction structure of semiconductors).

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By measuring the energy lost due to interactions with atoms as electrons pass through thin film samples, the constituent elements and electronic structure of the material can be analyzed.

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A mass spectrometry method that allows monitoring of gases generated by vacuum heating/warming at different temperatures, with high sensitivity for detecting hydrogen and water.

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  • Contract Analysis
  • Other contract services
  • Circuit board design and manufacturing

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PL:PhotoLuminescence

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Added PL analysis (photoluminescence method).

We have added PL analysis (photoluminescence method) to the list of handled products. PL analysis is a method that observes the light emitted when excited electrons transition to the ground state after being illuminated by light. For more detailed information, please refer to the catalog.

Ion chromatography is a method for detecting ionic components in liquid samples.

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Dissociate and fragment specific mass ions, and detect them with a mass spectrometer.

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EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis area, allowing for elemental analysis and compositional...

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ED is a method for investigating crystal structures from diffraction patterns obtained by irradiating a sample with an electron beam.

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The TOC analyzer is a device that can evaluate the total carbon content, total organic carbon content, and inorganic carbon content (IC) in a sample.

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  • Contract Analysis
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UV-Vis is a method that measures the intensity of light transmitted through a sample by irradiating the sample with light divided by wavelength, allowing for the determination of the sample's absorban...

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Absolute PL quantum yield measurement is a method for determining the photoluminescence efficiency of materials.

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C-SAM is a non-destructive method for observing defects such as delamination within a sample.

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Nano-simulation is a computational science method that handles atoms and molecules based on the laws of physics and chemistry, and it can be utilized to understand various phenomena.

  • Contract Analysis

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Genetic analysis is a method that reads the nucleotide sequences of DNA to investigate gene mutations and functions.

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  • Contract Analysis
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Infrared spectroscopy is a method for obtaining information about molecular structure by measuring infrared absorption due to molecular vibrations.

  • Contract measurement
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Infrared spectroscopy is a method for obtaining information about molecular structure by measuring the infrared absorption due to molecular vibrations.

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TG-DTA simultaneously evaluates weight changes caused by heating (TG) and thermal behavior of endothermic and exothermic reactions (DTA).

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High magnification observation (up to about 300,000 times) is possible.

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Notice of publication of a written article in the May 2012 issue of Applied Physics.

In the May 2012 issue of the monthly magazine "Applied Physics," published by the Japan Society of Applied Physics, the MST General Foundation for Materials Science and Technology contributed an article on scanning electron microscopy (SEM). ● Magazine Overview - Publisher: Japan Society of Applied Physics - Published Issue: May 2012, Applied Physics - Project Name: Basic Course <Hop, Step, Jump> Series "Scanning Electron Microscopy" ● MST Contribution Overview - Author: Kyoko Yonemitsu, Leader of the Analysis and Evaluation Department, MST General Foundation for Materials Science and Technology - Content: Applications of scanning electron microscopy in research and development - Case studies and uses Please take a look.

It is an analytical method that detects ions with a detector and performs qualitative and quantitative analysis.

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This is a method for qualitative and quantitative analysis of components contained in a sample by detecting secondary ions and measuring the detection amount at each mass.

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By measuring the kinetic energy distribution of Auger electrons emitted by electron beam irradiation, insights can be gained regarding the types and quantities of elements present on the sample surfac...

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Rapid identification of the malfunctioning area.

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It is a method for conducting elemental analysis and compositional analysis by detecting characteristic X-rays generated by electron beam irradiation and spectrally analyzing them by energy.

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Three-dimensional measurement of nanoscale surface roughness.

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Local resistance measurement at the nanometer level is possible.

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It is an analytical method for qualitative and quantitative analysis of organic compounds.

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[MST Homepage] We have published a feature on environmental (air and odor) analysis.

"Unlike usual, there is a strange odor." "I want to know the components of the exhaust gases from the engine and pump." By identifying the source of the strange odor and determining its components, we can take measures smoothly. Moreover, as environmental issues gain attention, it is increasingly required to accurately understand what is actually emitted as exhaust gases from the equipment being used. This time, we will introduce our MST analysis service lineup using GC/MS to address the challenges of components in the atmosphere. **************************************** For more details, please visit the MST homepage and check out the special feature on environmental (atmospheric and odor) analysis!! ****************************************

Non-contact and non-destructive 3D measurement is possible.

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Visualizing career distribution in two dimensions

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Measurement of areas on the order of several tens of micrometers is possible.

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For qualitative and quantitative analysis of the composition of the sample surface and work function evaluation.

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- Capable of evaluating periodic structures and orientation at the nanoscale.

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XAFS is a method for analyzing the absorption spectrum obtained by irradiating a substance with X-rays.

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By repeatedly performing cross-sectioning processing with FIB and observation with SEM, and reconstructing the obtained images, three-dimensional structural information can be obtained.

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Scanning Microwave Microscopy

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SRA:Spreading Resistance Analysis

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