List of Contract Analysis products

  • classification:Contract Analysis

541~585 item / All 2067 items

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Heat resistant up to 1200℃. We will custom-make high-performance insulation covers that ensure safety in the working environment!

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  • 配管配線カバー.jpg
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  • Glass

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Component evaluation of organic EL layer structures and degradation layers using GCIB under controlled atmosphere.

  • Contract Analysis

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Evaluation of the depth direction of surface modification layers of polymers, resins, and films using TOF-SIMS is possible.

  • Contract Analysis

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Quantitative evaluation of metal components is possible near the bevel area.

  • Contract Analysis

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XRD measurement can be performed while increasing the temperature.

  • Contract Analysis

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It is possible to evaluate the change in crystallinity while increasing the temperature.

  • Contract Analysis

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Direct evaluation of the structure of solution samples through cryo-SEM observation and EDX analysis.

  • Contract Analysis

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Quantitative analysis of the main components of sheet-like active substances is possible.

  • Contract Analysis
  • Contract measurement

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It is possible to evaluate the structure of the Si anode after charging through sample cooling.

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  • 充電曲線およびSi負極の形態観察.png
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  • Contract Analysis
  • Contract measurement

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Cross-sectional observation using atmosphere-controlled ion polishing (IP) processing is possible.

  • Contract Analysis
  • Contract measurement

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Visualizing the in-plane distribution of impurities such as atmospheric components with a field equivalent to SEM.

  • Contract Analysis

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Even with a structure that has uneven surfaces, depth distribution evaluation is possible through flattening processing.

  • Contract Analysis

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Evaluation of crystal orientation, in-plane defect distribution, surface roughness, and impurities.

  • Contract Analysis

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Analysis is possible after selectively removing the compound layer through preprocessing.

  • Contract Analysis

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Clear visualization of the layer structure of multilayer films using low-damage sputtering with GCIB.

  • Contract Analysis

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Capable of nano-order morphological observation and elemental analysis.

  • Contract Analysis

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Quantification of Si-H and N-H in SiN films using infrared absorption method.

  • Contract Analysis

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Tracking evaluation of phase transitions and crystallinity changes during the heating process.

  • Contract Analysis

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Information about valence bands and intra-gap levels can be obtained by element.

  • Contract Analysis

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"Technical Information: Analysis of Dental Implants Using TOF-SIMS" and two other items have been released.

We have published the following three analysis case studies on the MST website: - Analysis of dental implants using TOF-SIMS - Evaluation of GaN using soft X-ray emission spectroscopy For more details, please visit the MST website. http://www.mst.or.jp/

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MST.png

Technical information "Raman 3D mapping of organic multilayer films" and three other items have been released.

We have published the following three analysis case studies on the MST website: - Raman 3D mapping of organic multilayer films - Evaluation of metal and organic contamination on wafer surfaces - Foreign substance analysis on metal components using Raman For more details, please visit the MST website. http://www.mst.or.jp/

Depth direction analysis will be conducted to a depth of several micrometers.

  • Contract Analysis
  • Contract manufacturing

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We will evaluate the internal structure of the device in a comprehensive manner.

  • Contract Analysis
  • Other electronic parts

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Evaluation of GFRP is possible according to the purpose.

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  • Contract Analysis
  • Contract measurement

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It is possible to analyze the deformation behavior of nanomaterials in response to environmental changes (pressure and temperature).

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  • Contract Analysis

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Observation of SIM images is possible with high resolution (accelerating voltage 30kV: 4nm).

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  • セミナー.jpg
  • Contract Analysis
  • Contract measurement
  • Contract Inspection

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Reduce the impact of foreign object surrounding information with appropriate sampling.

  • Contract Analysis

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Evaluate organic EL elements with good depth direction resolution.

  • Contract Analysis

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X-ray reflectivity measurement (XRR) allows for non-destructive analysis of film thickness and density.

  • Contract Analysis

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Evaluation of nitrogen in SiON with a film thickness of approximately 1 nm is possible.

  • Contract Analysis

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Measurement avoiding the effects of surface irregularities and high concentration layers using SSDP-SIMS.

  • Contract Analysis

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Evaluation of dopant distribution and junctions is possible even in extremely shallow regions.

  • Contract Analysis

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Waveform analysis and evaluation of the depth distribution of bonding states by Ar sputtering.

  • Contract Analysis

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We have compiled frequently asked questions regarding your order in an FAQ format.

  • 打ち合わせ.jpg
  • セミナー.jpg
  • Contract Analysis

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Reduce the impact of foreign matter surrounding information through appropriate sampling and microscopic measurement.

  • Contract Analysis

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A lineup of AlGaN standard samples with various Al compositions.

  • Contract Analysis

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Evaluation of the top surface of modified layers of polymers, resins, and films using TOF-SIMS is possible.

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  • Contract Analysis

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Quantitative analysis of interstitial oxygen and carbon concentration non-destructively using infrared absorption method.

  • Contract Analysis

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