List of Contract Analysis products
- classification:Contract Analysis
541~585 item / All 2067 items
Heat resistant up to 1200℃. We will custom-make high-performance insulation covers that ensure safety in the working environment!
- Glass
Component evaluation of organic EL layer structures and degradation layers using GCIB under controlled atmosphere.
- Contract Analysis
Evaluation of the depth direction of surface modification layers of polymers, resins, and films using TOF-SIMS is possible.
- Contract Analysis
Quantitative evaluation of metal components is possible near the bevel area.
- Contract Analysis
XRD measurement can be performed while increasing the temperature.
- Contract Analysis
It is possible to evaluate the change in crystallinity while increasing the temperature.
- Contract Analysis
XRD measurements in micro areas are possible.
- Contract Analysis
Direct evaluation of the structure of solution samples through cryo-SEM observation and EDX analysis.
- Contract Analysis
Estimation of components is possible through TOF-SIMS analysis.
- Contract Analysis
You can visualize the diffusion layer structure of SiC devices.
- Contract Analysis
Quantitative analysis of the main components of sheet-like active substances is possible.
- Contract Analysis
- Contract measurement
It is possible to evaluate the structure of the Si anode after charging through sample cooling.
- Contract Analysis
- Contract measurement
Cross-sectional observation using atmosphere-controlled ion polishing (IP) processing is possible.
- Contract Analysis
- Contract measurement
Detection cases of stacking faults in SiC.
- Contract Analysis
Visualizing the in-plane distribution of impurities such as atmospheric components with a field equivalent to SEM.
- Contract Analysis
Even with a structure that has uneven surfaces, depth distribution evaluation is possible through flattening processing.
- Contract Analysis
Evaluation of crystal orientation, in-plane defect distribution, surface roughness, and impurities.
- Contract Analysis
Evaluation of the activation rate of the Dopant is possible.
- Contract Analysis
Analysis is possible after selectively removing the compound layer through preprocessing.
- Contract Analysis
You can measure the 300mm wafer as it is.
- Contract Analysis
Clear visualization of the layer structure of multilayer films using low-damage sputtering with GCIB.
- Contract Analysis
Capable of nano-order morphological observation and elemental analysis.
- Contract Analysis
Quantification of Si-H and N-H in SiN films using infrared absorption method.
- Contract Analysis
Tracking evaluation of phase transitions and crystallinity changes during the heating process.
- Contract Analysis
Information about valence bands and intra-gap levels can be obtained by element.
- Contract Analysis
"Technical Information: Analysis of Dental Implants Using TOF-SIMS" and two other items have been released.
We have published the following three analysis case studies on the MST website: - Analysis of dental implants using TOF-SIMS - Evaluation of GaN using soft X-ray emission spectroscopy For more details, please visit the MST website. http://www.mst.or.jp/
Measurement targeting microdomains is possible.
- Contract Analysis
Technical information "Raman 3D mapping of organic multilayer films" and three other items have been released.
We have published the following three analysis case studies on the MST website: - Raman 3D mapping of organic multilayer films - Evaluation of metal and organic contamination on wafer surfaces - Foreign substance analysis on metal components using Raman For more details, please visit the MST website. http://www.mst.or.jp/
Depth direction analysis will be conducted to a depth of several micrometers.
- Contract Analysis
- Contract manufacturing
We will evaluate the internal structure of the device in a comprehensive manner.
- Contract Analysis
- Other electronic parts
Evaluation of GFRP is possible according to the purpose.
- Contract Analysis
- Contract measurement
It is possible to analyze the deformation behavior of nanomaterials in response to environmental changes (pressure and temperature).
- Contract Analysis
Observation of SIM images is possible with high resolution (accelerating voltage 30kV: 4nm).
- Contract Analysis
- Contract measurement
- Contract Inspection
Reduce the impact of foreign object surrounding information with appropriate sampling.
- Contract Analysis
Lattice image analysis using the FFTM method
- Contract Analysis
Capable of observing large-area surface shapes.
- Contract Analysis
Evaluate organic EL elements with good depth direction resolution.
- Contract Analysis
X-ray reflectivity measurement (XRR) allows for non-destructive analysis of film thickness and density.
- Contract Analysis
Evaluation of nitrogen in SiON with a film thickness of approximately 1 nm is possible.
- Contract Analysis
Measurement avoiding the effects of surface irregularities and high concentration layers using SSDP-SIMS.
- Contract Analysis
Evaluation of dopant distribution and junctions is possible even in extremely shallow regions.
- Contract Analysis
Waveform analysis and evaluation of the depth distribution of bonding states by Ar sputtering.
- Contract Analysis
We have compiled frequently asked questions regarding your order in an FAQ format.
- Contract Analysis
Reduce the impact of foreign matter surrounding information through appropriate sampling and microscopic measurement.
- Contract Analysis
A lineup of AlGaN standard samples with various Al compositions.
- Contract Analysis
Visualization of pharmaceutical components using TOF-SIMS.
- Contract Analysis
Evaluation of the top surface of modified layers of polymers, resins, and films using TOF-SIMS is possible.
- Contract Analysis
Quantitative analysis of interstitial oxygen and carbon concentration non-destructively using infrared absorption method.
- Contract Analysis