List of Semiconductor inspection/test equipment products

Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

• Other conveying machines

Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.

• Other safety and hygiene products

From the pursuit of steel materials, we measure with high-precision inspection equipment such as temperature control of heat treatment furnaces, hardness tests, microstructure inspections, and dimensi...

• Other inspection equipment and devices
• Semiconductor inspection/test equipment

Osaka Cutting Mass Production Lathe Processing and Machining Processing [Leave cost reduction to Filir Co., Ltd.]

• CVD Equipment
• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Aluminum precision parts for semiconductor manufacturing equipment. [Leave cost reduction to Philir Co., Ltd.]

• Semiconductor inspection/test equipment
• Ion implantation equipment
• CMP Equipment

Aluminum precision parts, lathe processing, machining processing [Leave cost reduction to Filir Co., Ltd.]

• CVD Equipment
• Etching Equipment
• Semiconductor inspection/test equipment

Five-axis machining for semiconductor manufacturing equipment parts [Leave cost reduction to Philir Co., Ltd.]

• CVD Equipment
• Semiconductor inspection/test equipment
• Etching Equipment

Silicon block internal foreign matter inspection device

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Thin-film solar cell panel measurement device

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Crystal Defect Measurement Device (Light Scattering Tomography)

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Inline wafer measurement module

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Using the JPV method, non-contact measurement of junction leakage in PN junctions, evaluation of the depletion layer capacitance, and rapid measurement of the sheet resistance of PN junction samples!

• Other inspection equipment and devices
• Semiconductor inspection/test equipment

The world's only spectroscopic ellipsometer technology for measuring pore rate and pore distribution using an EP (optical porosimeter).

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

The PN determination of silicon wafers/blocks can be performed instantly.

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Instantly measure the resistance of silicon ingots/blocks non-contact and non-destructively using eddy current technology.

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Mapping measurements using the u-PCD method are possible, and there are numerous achievements in the solar cell and semiconductor markets.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Lifetime measurement device for single crystal silicon blocks

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Roll-to-roll spectral ellipsometer

• Semiconductor inspection/test equipment
• Distance measuring device
• Spectroscopic Analysis Equipment

Crystal defect analysis device (non-contact, non-destructive)

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Industry-specific catalog of a Taiwanese comprehensive electronic measuring instrument manufacturer with a 25% share of the global market!

• Semiconductor inspection/test equipment
• Power Supplies

CD-SEM for photomasks capable of high-speed and high-precision measurement of nano-patterns.

• Semiconductor inspection/test equipment
• Other machine elements

A clear explanation of case studies related to semiconductor testing, divided into four sections: background, issues, implementation, and results!

• Other semiconductors
• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Before overhaul, after overhaul

• Other conveying machines
• Other inspection equipment and devices
• Semiconductor inspection/test equipment

Leave electrical characteristic testing, laser trimming, reliability testing, and more to us!

• Other semiconductors
• Semiconductor inspection/test equipment

We propose a layout design aimed at improving mass production efficiency and trimming accuracy.

• Other semiconductors
• Semiconductor inspection/test equipment

Our company manufactures transport and inspection equipment using robots and drive systems for the purpose of reducing labor.

• Other conveying machines
• Other inspection equipment and devices
• Semiconductor inspection/test equipment

We apply torque to the test specimen and conduct various durability and performance tests.

• Semiconductor inspection/test equipment

Large area high brightness high directional lighting device

• Semiconductor inspection/test equipment
• Lighting for image processing
• Other optical parts

A semiconductor optical amplifier capable of broadband optical amplification in the 1.5μm long wavelength band.

• Other optical parts
• Semiconductor inspection/test equipment

It is an infrared microscope specialized in the observation and measurement of the oxidation region of VCSELs.

• Semiconductor inspection/test equipment
• Other image-related equipment
• Other optical parts

Measurement of wounds and foreign objects is also possible! It is suitable for internal observation of silicon chips!

• Semiconductor inspection/test equipment
• Other image-related equipment
• Other optical parts

It is suitable for visual inspection of wafers, lenses, and glass substrate surfaces.

• Semiconductor inspection/test equipment
• Visual Inspection Equipment
• Other lighting equipment

Transport ultra-thin wafers with a thickness of 20μm by bending, warping, and without damage in a non-contact manner.

• Other semiconductor manufacturing equipment
• Wafer
• Semiconductor inspection/test equipment

Development and production of optical semiconductors! We are committed to high-quality products at low prices, and we also accept customized products tailored to our customers' needs!

• Semiconductor inspection/test equipment
• Other optical parts

Ceramic bearing

• Other physicochemical equipment
• Semiconductor inspection/test equipment
• Metal bearings

Guide to Semiconductor Test Programs Using "LabVIEW" - DC Measurement Edition

• Technical and Reference Books
• Technical Seminar
• Semiconductor inspection/test equipment

Guide to Semiconductor Test Programs Using "LabVIEW" - AC Measurement Edition

• Technical and Reference Books
• Technical Seminar
• Semiconductor inspection/test equipment

Specialized books on the automated testing system construction tools "LabVIEW" and "TestStand"

• Technical and Reference Books
• Technical Seminar
• Semiconductor inspection/test equipment

Non-contact gripping of preform lenses, and loading and unloading into the press mold.

• lens
• Other physicochemical equipment
• Semiconductor inspection/test equipment

Non-contact wafer sorting system using belt conveyance!

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

We will explain the series of processes involved in ion implantation, which is crucial for determining the characteristics of semiconductors, using illustrations.

• Semiconductor inspection/test equipment
• Other semiconductors
• Other contract services

Complete all-in-one solution from ROM writing to laser stamping and appearance inspection!

• Semiconductor inspection/test equipment

This is a new product that has been improved from the conventional MODEL400 series, with an even faster writing speed to the large-capacity eMMC.

• Semiconductor inspection/test equipment

Next-generation memory compatible mass production 16-channel ultra-high-speed gang programmer.

• Semiconductor inspection/test equipment

A compact design device programmer compatible with a vast array of programmable devices.

• Semiconductor inspection/test equipment

Defects in expansion can also be measured! SemiScope enables spectral line analysis.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Micro cutting of chemically strengthened glass using ultrashort pulse lasers.

• Processing Contract
• Contract manufacturing
• Semiconductor inspection/test equipment

Laser shape processing: Cutting of brittle ceramic materials.

• Processing Contract
• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Consolidating information on partnerships of semiconductor companies, such as business integrations and corporate acquisitions! Introducing information services.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment
• Other semiconductors

We handle a wide range of sheet metal processing, from precision sheet metal to large-scale machining!

• Processing Contract
• Semiconductor inspection/test equipment

We provide support from reliability testing to failure analysis reports!

• Other semiconductors
• Semiconductor inspection/test equipment

Supplying products that consistently meet the level required by customers! Contract manufacturing of components for vacuum equipment.

• Contract manufacturing
• Semiconductor inspection/test equipment

We propose improvements to tester capabilities in line with production quantities.

• Other semiconductors
• Semiconductor inspection/test equipment
• Other contract services

Introduction to the reliability tests conducted by Rishin Tech, including lifespan tests and strength tests.

• Other semiconductors
• Semiconductor inspection/test equipment
• Other contract services

Semiconductor device cover

• Semiconductor inspection/test equipment

Semiconductor device chassis

• Semiconductor inspection/test equipment

Responding to the cleanliness required for semiconductor manufacturing equipment. Made of stainless steel 316L, for high-purity lines, welded compact check valve CMW series.

• valve
• Piping Materials
• Semiconductor inspection/test equipment

The stem angle can be selected from 1°, 3°, or 5°, allowing for flow adjustment that better meets customer needs. It can be fixed at the desired flow rate with a locking screw.

• valve
• Piping Materials
• Semiconductor inspection/test equipment

Stainless steel 316 high-temperature and high-pressure ball valve (ball valve) "H6800 series". Pressure resistance is compatible up to a maximum of 41 MPa.

• valve
• Piping Materials
• Semiconductor inspection/test equipment

Stainless steel 316, high temperature and high pressure compatible T-type and inline filter 'H-600 series'. This filter allows for element replacement.

• filter
• Piping Materials
• Semiconductor inspection/test equipment

Ideal for small-batch, multi-variety production! Equipment with excellent operability that does not require operator skills.

• Semiconductor inspection/test equipment

It is possible to accommodate various package styles! Achieving easier data management is possible.

• Semiconductor inspection/test equipment