List of Semiconductor inspection/test equipment products

  • classification:Semiconductor inspection/test equipment

181~225 item / All 673 items

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Achieving a fixture that is difficult to oscillate! Full automation is possible from test condition setup, power-on testing, to data acquisition.

  • Semiconductor inspection/test equipment
  • Thermostatic chamber

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[Case Study] Semiconductor Bar-In Equipment (RF/DC)

Achieving fixtures that are difficult to oscillate! Full automation is possible from test condition setting, current testing, to data acquisition. Our company has a long history of delivering high-frequency power FET current testing equipment to major semiconductor manufacturers in Japan. We provide custom solutions tailored to various functions based on customer applications, such as reliability testing for newly developed devices and use in production lines. Additionally, we leverage our expertise as a manufacturer of high-frequency components to design fixtures that accommodate increasingly smaller and more complex device packages, offering customized designs that consider high-frequency characteristics and long-term maintenance according to customer requests. 【Case Overview】 ■ Installation Site: FA (Semiconductor Testing Equipment) ■ Installed Product: Semiconductor Burn-In Equipment (RF/DC) *For more details, please refer to the related links or feel free to contact us.

Applying our technology and global technologies! Contributing to the development of new products and improving productivity for our customers.

  • Testing Equipment and Devices
  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment

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Achieving probing compatible with multiple simultaneous measurements! Correcting misalignment after dicing.

  • probe
  • Semiconductor inspection/test equipment

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High current/high voltage probing is possible! Achieving contact on both sides of the wafer.

  • probe
  • Semiconductor inspection/test equipment

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This is a high-precision SC-cut OCXO in a 7×5mm size. It is a high stability, fixed frequency type with ±20ppb (-40 to +85℃). It is a standard stock item.

  • Semiconductor inspection/test equipment
  • Power Monitoring Equipment
  • Time-frequency measurements

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This is a high-precision SC-cut OCXO in a 14×9mm size. It has a high stability fixed frequency of ±10ppb (-40 to +85℃). It is a standard stock item.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Other electronic parts

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This is a 9×7mm size SC-cut OCXO. Frequency = 50MHz. High stability with a VC adjustment range of ±20ppb (-40 to +85℃). Standard stock item.

  • Oscillator
  • Other FA equipment
  • Semiconductor inspection/test equipment

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Aiming for a new standard in semiconductor peripheral equipment inspection! We will shorten the takt time through wide-field imaging.

  • Semiconductor inspection/test equipment
  • Other inspection equipment and devices

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You can choose from the 'RST Aligner' that achieves a tracking capability of 0.1μm and the space-saving, thin, and compact 'YRA Series' according to your application needs.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Other image-related equipment

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A kit that allows you to easily learn about the properties of permalloy and its magnetic shielding performance.

  • Electron beam lithography equipment
  • Semiconductor inspection/test equipment
  • Other inspection equipment and devices

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Announcement of the start of sales for the magnetic shield kit.

We are pleased to announce the release of a magnetic shield kit that allows you to easily test the characteristics and magnetic shielding performance of permalloy. This product includes permalloy sheets of varying thicknesses and sizes. There are various ways to use it, such as rolling and bending, allowing you to confirm the differences in performance due to the characteristics of permalloy and variations in thickness. Please use it when considering the introduction of the product. For more details about the magnetic shield kit, please check the product page below. ▼ Magnetic Shield Kit https://www.ohtama.co.jp/products/magnetic_shield_testing_kit.html

Ohtama's magnetic annealing technology based on years of experience.

  • transformer
  • Semiconductor inspection/test equipment
  • Sensors

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Crystal orientation and pole production are evident in 15 minutes! Stable surface analysis is possible without the influence of charging! Time-of-flight atomic scattering surface analysis device [We a...

  • Analytical Equipment and Devices
  • Semiconductor inspection/test equipment

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We have a wide variety of devices for visual inspection of work appearances.

  • Semiconductor inspection/test equipment

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Crystal orientation and polarity are clear in 15 minutes! Stable surface analysis is possible without the influence of charging!

  • Analytical Equipment and Devices
  • Semiconductor inspection/test equipment

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Why do optical semiconductors fail? Let me explain a bit more about failures caused by light!

  • diode
  • Semiconductor inspection/test equipment
  • Other semiconductors

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[Information] Shirutoku Report No. 104 # Introduction of Custom Measurement Services

Our company offers custom measurement services, proposing the construction of testing environments tailored to our customers' needs. We cater not only to general evaluations such as semiconductors but also to a wide range of specialized measurements, including high-sensitivity measurements, large currents, and high voltages. This time, we would like to introduce a transistor sorting inspection system that was developed in response to such requests. It is especially recommended for customers who are struggling with the desire to conduct evaluations that require custom solutions but cannot make capital investments. For more details, please refer to the related products and catalogs below.

Customization suitable for the measurement environment is also available! Introducing the automatic measurement system with curve tracer.

  • Other electronic measuring instruments
  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment

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しるとく104.jpg

[Information] Shirutoku Report No. 104 # Introduction of Custom Measurement Services

Our company offers custom measurement services, proposing the construction of testing environments tailored to our customers' needs. We cater not only to general evaluations such as semiconductors but also to a wide range of specialized measurements, including high-sensitivity measurements, large currents, and high voltages. This time, we would like to introduce a transistor sorting inspection system that was developed in response to such requests. It is especially recommended for customers who are struggling with the desire to conduct evaluations that require custom solutions but cannot make capital investments. For more details, please refer to the related products and catalogs below.

Ultra-thin stage featuring a groundbreaking modular structure (patented)

  • Semiconductor inspection/test equipment
  • Other machine elements
  • Actuator

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Achieves excellent responsiveness with a low-inertia structure.

  • Semiconductor inspection/test equipment
  • Other machine elements
  • Actuator

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High rigidity and capable of accommodating low spaces with a reduced height.

  • Semiconductor inspection/test equipment
  • Other machine elements
  • Actuator

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High precision with a wide variety, suitable for various applications.

  • Semiconductor inspection/test equipment
  • Metal bearings
  • Actuator

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Achieving high precision and smooth movement.

  • Semiconductor inspection/test equipment
  • Actuator
  • Other FA equipment

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Achieves compactness and high rigidity, supports high-precision positioning and low-speed ripple.

  • Semiconductor inspection/test equipment
  • Actuator
  • Other FA equipment

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Achieving high thrust and high acceleration.

  • Semiconductor inspection/test equipment
  • Actuator
  • Other FA equipment

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Ideal for transporting heavy items!

  • Semiconductor inspection/test equipment
  • Actuator
  • Other FA equipment

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Ideal for high-speed transport with long strokes.

  • Semiconductor inspection/test equipment
  • Actuator
  • Other FA equipment

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InGaAs (SWIR) camera compatible microscope

  • Semiconductor inspection/test equipment

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Developed a dicing frame (wafering) using CFRP 3D printing technology. It is lightweight and has high rigidity, making it excellent for wafer transportability.

  • Other semiconductor manufacturing equipment
  • Semiconductor inspection/test equipment
  • Other semiconductors

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Coaxial adapter/converter for microwave to millimeter wave (up to 110GHz)

  • Coaxial Connectors
  • High frequency/microwave parts
  • Semiconductor inspection/test equipment

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