List of Other semiconductor manufacturing equipment products
- classification:Other semiconductor manufacturing equipment
1486~1530 item / All 2013 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!
- Cooling system
April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024
Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.
This is a fixture for visual inspection of the front and back surfaces of the quartz mask.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for visual inspection and thickness measurement of 8-inch silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device that performs macro inspection of wafers and micro inspection using a microscope.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for surface inspection of wafers after polishing.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Two-dimensional code reading device
- Other semiconductor manufacturing equipment
- Other semiconductor manufacturing equipment
This is a device for visually inspecting the edges of φ300 mm silicon wafers (chip and chipping inspection).
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Pass/Fail Judgment Device
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Manual device equipped with a safety cover and remote control mechanism.
- Other semiconductor manufacturing equipment
- Other processing machines
This is a device for heating φ300mm bonded wafers using an IR lamp.
- Other semiconductor manufacturing equipment
Bulk cassette to cassette transfer
- Other semiconductor manufacturing equipment
A device capable of performing three types of operations.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for drying 300mm wafers that have been cleaned after double-sided polishing.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for simple cleaning (brush + water) of φ300 mm silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Loading and unloading of φ150 mm and φ125 mm silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for storing φ300 mm wafers, which have completed processing, one by one into a Teflon cassette for submersion.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device that loads wafers one by one.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device used for handling to perform P/N determination and visual inspection of silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device for inverting and transferring silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Classified by resistivity and thickness categories.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device that detects the wafer edge using laser light and measures the diameter by comparing it with a calibration wafer (reference wafer).
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device that detects the edge of a wafer and measures its diameter through image processing.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device that measures the thickness of sapphire wafers and sorts them according to their thickness.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device that measures the thickness of silicon wafers and rearranges them according to their thickness.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and double-sided polishing process.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and the double-sided polishing process.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and the double-sided polishing process.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Thickness measurement of compound semiconductor wafers in sizes φ2”, φ4” or φ6”.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Thickness measurement of various types of wafers below φ4"
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Thickness measurement of Si, SiC, and other wafers with a diameter of φ100mm to φ150mm.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Thickness measurement device for silicon wafers with a diameter of φ200mm and φ300mm.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device that removes silicon wafers from a dedicated cassette and measures the thickness at the set points.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Thoroughly manage the situation and take action based on the guidelines to "raise" it.
- Other semiconductor manufacturing equipment
This is a device for measuring the thickness of SiC wafers adhered to a glass plate and the thickness of the adhesive, as well as measuring the thickness of individual SiC wafers.
- Other semiconductor manufacturing equipment
- Semiconductor inspection/test equipment
The very popular TME series
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Large-diameter silicon wafer measuring instrument
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device that extracts silicon wafers from a dedicated cassette using edge handling and measures the thickness of a set pattern.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Measurement of Si wafer thickness, front and back surface P/N determination.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
We will challenge the world with our reliable technical skills and strong global network as our weapons.
- Vacuum Equipment
- Other semiconductor manufacturing equipment
- Processing Contract
We meet all needs for used semiconductor manufacturing equipment! Our motto is a network of information and expertise.
- Other semiconductor manufacturing equipment
Non-pulsating quantitative pumps and safety valves are now metal-free! Leave it to us for special liquids that react with or corrode metals!
- Other semiconductor manufacturing equipment
- Special Pump
- Other pumps
A kit has been developed to modify the current FOUP load port for N2 purge functionality within 8 hours. There have been 3,000 units delivered.
- Other semiconductor manufacturing equipment
- Semiconductor inspection/test equipment
- Closed-loop control - Equipped with absolute encoder - Achieves battery-less operation
- Other semiconductor manufacturing equipment
Technicians with over 15 years of repair and manufacturing experience are conducting operational checks before shipping. Trico Co., Ltd. is expanding its repair business!!
- Other semiconductor manufacturing equipment
- others