List of Electron microscope products
- classification：Electron microscope
1～45 item / All 142 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
No more need to lift heavy one-gallon cans! Enjoy comfortable liquid transfer in the central kitchen.
- Other Pumps
Decision to exhibit at the 1st Chubu Food Industry Creation Exhibition '26!
We will be exhibiting at the "1st Chubu Food Industry Creation Exhibition '26" to be held at Port Messe Nagoya from November 4 (Wednesday) to November 6 (Friday), 2026. As a new addition to our lineup, we will showcase the "Cordless Sanitary Handy Pump," which is a product we started selling in April last year, alongside our "Compact Sanitary Handy Pump Model MHS." - Cordless! Portable anywhere! Easy to use! Simple cleaning! It is compatible with standard 18L cans and BIB (Bag-in-Box) and features a structure that allows for easy disassembly and cleaning. We would like to invite you to visit us at this opportunity. - Venue: Port Messe Nagoya - Our exhibition booth: Hall 1 "C-66"
High resolution that cannot be achieved with conventional zoom microscopes.
- Electron microscope
A super compact AFM with a depth and width that can take you anywhere, both measuring 15 cm.
- Electron microscope
Inspection in one shot for 300mm wafers in 1 second.
- Electron microscope
The only microscope capable of non-destructive three-dimensional measurement down to the nanometer scale.
- Electron microscope
Complete FIB processing, observation, and analysis with just one machine!
- Electron microscope
- Analytical Equipment and Devices
A digital microscope that is convenient for various uses such as detailed work and inspection.
- Microscope
- Electron microscope
- Other microscopes
An all-in-one system for fully automated measurement, defect detection, and observation of wafer sizes.
- Electron microscope
- Defect Inspection Equipment
Automatic defect inspection function, low noise, high throughput! Introducing an accurate atomic force microscope!
- Other microscopes
- Electron microscope
Achieving high-speed 3D/4D imaging measurements of nano-level dynamics!
- Electron microscope
- Optical microscope
- 3D measuring device
Equipped with XY electric stage and autofocus function! Customization for software and more is also supported.
- Electron microscope
Equipped with an electric XY stage and autofocus function!
- Other microscopes
- Electron microscope
Correcting the optical axis shift of the microscope's front and back, variations in the objective lens magnification, and the camera's θ shift with images!
- Other microscopes
- Optical microscope
- Electron microscope
Improving the accuracy of tests in space development.
- Vibration isolation table
- Electron microscope
- Vibration Monitoring
High-performance vibration isolation table to improve measurement accuracy.
- Vibration isolation table
- Electron microscope
- Vibration Monitoring
High-performance vibration isolation table that improves the precision of microfabrication.
- Vibration isolation table
- Electron microscope
- Vibration Monitoring
High-performance vibration isolation table to improve experimental accuracy.
- Vibration isolation table
- Electron microscope
- Vibration Monitoring
High-performance vibration isolation table to improve the accuracy of exposure processes.
- Vibration isolation table
- Electron microscope
- Vibration Monitoring
High-performance vibration isolation table that improves the precision of micro-machining machines.
- Vibration isolation table
- Electron microscope
- Vibration Monitoring
High-performance vibration isolation table that improves the precision of microfabrication.
- Vibration isolation table
- Electron microscope
- Vibration Monitoring
High-performance vibration isolation table that improves the precision of microfabrication.
- Vibration isolation table
- Electron microscope
- Vibration Monitoring
Vibration isolation table with excellent vibration isolation characteristics tailored to the load capacity.
- Vibration isolation table
- Electron microscope
- Vibration Testing
The nano-resolution piezo positioning stage is used in various fields around the world, so you can use it with confidence.
- Optical microscope
- Electron microscope
- Semiconductor inspection/test equipment
Applied CERVO for Cryo-EM analysis, supporting the application analysis of advanced technology that achieved atomic-level resolution.
- Electron microscope
- Transmission electron microscope
- Imaging and image analysis equipment
We are purchasing analytical instruments, physical and chemical instruments, and electronic measuring devices.
- Analytical Equipment and Devices
- oscilloscope
- Electron microscope
This is a grinding machine suitable for sample grinding, tissue observation, and cross-sectional inspection, among other applications. Its versatility is enhanced when combined with the FORCIMAT head.
- Capacitor
- Steel
- Electron microscope
We will conduct surface morphology observation at high magnification using SEM/FE-SEM.
- Electron microscope
- Laser microscope
- Contract Inspection
Nano to angstrom resolution! Observation of fine morphology and composition analysis at the atomic level.
- Electron microscope
- Contract Analysis
- Contract measurement
Assisting with substrate recovery of continuous sections for SEM!
- Other physicochemical equipment
- Other laboratory equipment and containers
- Electron microscope
Exceptional usability: A digital version with USB connection of the "Standard Type EV-1" is available.
- Microscope
- Electron microscope
Pursuing ease of use for skin observation and research! USB-type handheld micro viewer.
- Microscope
- Electron microscope
Achieve everything from macro to distant views with a single device! Strongly supports a wide range of visual inspections with overwhelming clarity.
- Microscope
- Electron microscope
We will perform operation confirmation of the machine tool from a distance. This microscope covers everything from distant views to macro observations with just one unit.
- Microscope
- Electron microscope
Achieve everything from macro to distant views with a single device! A digital microscope that powerfully supports a wide range of visual inspections with overwhelming clarity. Ideal for remote observ...
- Microscope
- Electron microscope
It is possible to observe cross-sections while observing FIB processing in real time.
- Contract Analysis
- Other contract services
- Electron microscope
Power device failure location / Slice & View three-dimensional reconstruction
I will introduce the three-dimensional reconstruction of failure locations using the Slice & View function of FIB-SEM. Continuous SEM images of the structure are obtained, and the resulting images are corrected for positional misalignment between the SEM images and visualized in three dimensions using 3D construction software (Avizo). By combining the position identification technique for cross-sectioning the failure location with the Slice & View function, it is possible to obtain continuous SEM images that retain the defective state and include information before and after the abnormal area.
Observation of samples and elemental analysis are possible! It can be utilized not only in the semiconductor and electronic components fields but also in life sciences and biological fields.
- Electron microscope
Analysis of organic-inorganic composite materials using FT-IR and EDX.
We will introduce an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of a PET bottle label, and the IR spectra differed between the glossy and non-glossy areas. Since the non-glossy area resembles the spectrum of acrylic resin, it is considered that the main component is acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and EDX spectra and backscattered electron images were obtained, revealing that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.
Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.
- Electron microscope
- Contract Analysis
- Contract Inspection
![[Data] Cross-sectional observation ...](https://image.mono.ipros.com/public/product/image/5fd/2000561894/IPROS71970030245724406256.png?w=280&h=280){kind=small}
We have published cross-sectional observations in clear vision mode and normal/standard mode!
- Electron microscope
- Contract Analysis
- Contract Inspection