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Measuring Instrument×ナプソン - List of Manufacturers, Suppliers, Companies and Products

Measuring Instrument Product List

1~15 item / All 18 items

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Resistance rate / Sheet resistance measuring instrument [NC-10]

Resistance rate / Sheet resistance measuring instrument [NC-10]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Resistance rate / Sheet resistance measuring instrument [WS-3000]

Resistance rate / Sheet resistance measuring instrument [WS-3000]

Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Resistance rate / Sheet resistance measuring instrument [NC-80MAP]

Resistance rate / Sheet resistance measuring instrument [NC-80MAP]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and our extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]

Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]

Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Resistance rate / Sheet resistance measuring instrument [CRESBOX]

Resistance rate / Sheet resistance measuring instrument [CRESBOX]

Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Non-contact resistance tester "NC-700"

Embedded non-contact (eddy current method) sheet resistance measurement module (for film samples)

The "NC-700" is a measuring instrument that continuously measures the sheet resistance of conductive films on substrates such as PET film in-line. It can be manufactured with the required number of lines (i.e., probes), making it suitable for a wide range of applications from research and development to production lines. Due to its offset-free specification, it can perform continuous measurements for up to 24 hours without shifting measurement values. It is also compatible with existing transport devices and film deposition equipment. Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ In-line type (non-contact) ■ Embedded measurement module ■ Supports a wide range of applications ■ Continuous measurement for up to 24 hours is also possible *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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Measuring instrument "FLA-200"

Wafer flatness measurement system!

The "FLA-200" is a non-contact flatness and thickness measurement system. It measures the flatness (TTV, BOW, WARP) and thickness of wafer samples. It supports measurements of thickness, TTV, BOW, warp, site flatness, and global flatness (in accordance with ASTM standards), and data output in CSV format is also possible. Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ Software compatible with 2-D and 3-D mapping display ■ High-precision measurement using a 5mmφ core capacitive probe ■ High-speed measurement of 12,000 points in under 60 seconds *For more details, please contact us or download the catalog.

  • Other measurement and measuring equipment
  • Semiconductors and ICs

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Resistance Rate / Sheet Resistance Meter 【EC-80】

Resistance Rate / Sheet Resistance Measuring Instrument 【EC-80】

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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FPD Sheet Resistance Measurement Device [NC-50/RG-1200S]

FPD Sheet Resistance Meter [NC-50/RG-1200S]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Resistance Rate / Sheet Resistance Meter [WS-8800]

Resistance rate / Sheet resistance measuring instrument [WS-8800]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Resistance and Thickness Measuring Instrument 【EC-80SCAN】

Resistance and Thickness Measuring Instrument 【EC-80SCAN】

Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and our extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Contact Resistance Tester "WS-8800"

4-probe method using a wafer transport robot! Fully automatic measurement sorter.

The WS-8800 is a contact-type resistance measuring instrument with a fully automatic type (fully automatic measurement system). It is capable of thickness measurement, PN measurement, and temperature measurement (for silicon wafers). It can accommodate any number of cassettes. Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ Fully automatic ■ Self-test function, wide measurement range ■ Thickness, peripheral position, and temperature correction functions (resistivity measurement) *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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Non-contact resistance tester "NC-80MAP"

Wide-range non-contact (eddy current method) sheet resistance/resistivity multi-point measuring instrument

The "NC-80MAP" is a resistance measuring device that supports a wide range of measurements using multiple types of non-contact probes. The number and type of probes can be changed according to your requirements. It is also capable of multi-point measurements from an edge of 8mm. Additionally, due to its non-contact eddy current method, measurements can be taken without causing any damage. It can be customized in various ways according to customer requests. 【Features】 ■ Non-contact type ■ Semi-auto type ■ Multi-point measurement system *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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Contact Resistance Tester "RT-70V Series"

Four-probe method measuring instrument for simple measurement of resistivity (specific resistance) / sheet resistance.

The "RT-70V Series" is a combination measuring instrument consisting of a measurement tester (RT-70V) and a measurement stage. Due to its contact type, measurements are conducted by bringing the needle-shaped probe head into contact with the sample. The "RT-70V Tester" allows for easy operation of thickness, temperature, and PN input using a JOG dial. It can be customized in various ways according to customer requirements. 【Features】 ■ Contact type ■ Manual type ■ Single-point observation system *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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