Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.
121～135 item / All 1079 items
EBSD: Electron Backscatter Diffraction
By conducting EBSD analysis on thinned samples, higher spatial resolution can be achieved compared to conventional bulk samples.
![[Analysis Case] Analysis of H termination on Si surface](https://image.mono.ipros.com/public/product/image/602/2000246669/IPROS9595200381976370137.jpg?w=280&h=280)
Qualitative and relative comparison of SiH and states on the Si surface due to differences in processing.
We compared the states of the Si surface after HF treatment and after ozone treatment. In the positive ion spectrum, the peak intensity of Si was different. The weaker Si intensity after HF treatment is due to Si being metallic, while the stronger Si intensity after UV-ozone cleaning and in the As Received state is due to Si being oxide-based. From the negative ion spectrum, fragment ions reflecting the surface state were detected: SiF, SiH, and Six series after HF treatment, and SiO2 series after UV-ozone cleaning and in the As Received state.
![[Analysis Case] Peptide Sequence Analysis by LC/MS/MS](https://image.mono.ipros.com/public/product/image/954/2000305492/IPROS2511988453587356656.jpg?w=280&h=280)
We will analyze the amino acid sequence of the peptide using LC/MS/MS analysis.
When peptides are measured using LC/MS/MS, characteristic fragment ions are obtained, allowing for the analysis of the amino acid sequence that makes up the peptide. Additionally, because peptides are separated and analyzed by LC, it is possible to analyze the sequences even in samples containing multiple peptides or impurities. Here, we present a case study where low molecular weight peptides were analyzed using LC/MS/MS, and the amino acid sequences were estimated.
LC/MS/MS: Liquid Chromatography-Mass Spectrometry
In protein composition analysis, there are methods to examine only the target protein after electrophoresis, but this document introduces "shotgun analysis," which comprehensively investigates proteins. In shotgun analysis, after separating proteins and obtaining mass information using LC/MS/MS measurements, a database search is conducted to comprehensively analyze the proteins present in the solution.
![[Analysis Case] Structural Analysis of Amorphous SiNx Films Using Molecular Dynamics Calculations](https://image.mono.ipros.com/public/product/image/464/2000437277/IPROS86695334060655697793.jpeg?w=280&h=280)
Microscopic structural analysis of amorphous films is possible through simulation.
Amorphous SiNx (a-SiNx) films exhibit significant changes in physical properties from semiconductors to insulators due to compositional variations such as the N/Si ratio, making them suitable for a wide range of applications, including gate insulating films for transistors. On the other hand, experimental methods capable of atomic-level microscopic structural analysis for materials with non-crystalline amorphous structures are limited. Therefore, creating and analyzing amorphous structures with various compositions and densities through simulation becomes an effective tool. This document presents examples of structural analysis of a-SiNx films using molecular dynamics calculations.
I will take care of the analysis of your XPS spectral data and the creation of the report.
In recent years, advancements in measurement devices have made it possible to obtain high-quality and large amounts of XPS spectral data in a short period. However, analyzing the acquired spectral data requires not only time and effort for database research and mastering analytical techniques but also often demands judgments backed by past experience, which poses a barrier to the effective utilization of the devices and data held. MST offers a one-stop service for users facing such challenges, handling everything from analysis to report creation for your XPS spectral data.
Various physical property information such as point defect formation energy, charge, and optical transitions can be obtained.
Gallium nitride (GaN), a wide bandgap semiconductor, is primarily used in the field of power devices, and in recent years, there has been an increasing demand for applications such as rapid chargers and 5G communication base stations. In the development of high-reliability GaN, it is important to understand the reduction of defects in the crystal and the impact of these defects on electrical and optical properties. This document presents a case study analyzing the defect levels formed by nitrogen vacancies (VN) in GaN using first-principles calculations. This analysis is applicable not only to vacancies but also to various point defects in crystalline materials, such as element substitutions. For more details, please download the document or contact us.
Investigate and implement measures for causes that may lead to malfunction on the circuit board, such as SI analysis.
Printed circuit board design technology utilizing transmission line simulation and EMI suppression support tools.
We can provide simple thermal analysis solutions for issues related to the substrate's "heat."
In terms of heat dissipation measures for the substrate, pre-simulation is crucial. Our company will confirm various heat dissipation conditions of the substrate during the estimation and provide "simple thermal analysis."
Significantly contributes to shortening delivery times and reducing production costs! Analysis service to optimize mold designs and casting conditions.
The fluid flow and solidification analysis service "Casting Simulation" is designed to perform flow and solidification analysis of molten materials within molds in order to establish the best mold design and casting conditions during the initial design phase. By utilizing the latest software for simulation, it minimizes the need for modifications after the first trial. This enables higher quality, shorter delivery times, and significantly reduced production costs. It allows for high precision, high airtightness, and high strength. 【Features】 ○ Flow analysis and solidification analysis ○ Minimization of modifications ○ Enables high quality ○ Shortened delivery times ○ Cost reduction For more details, please contact us or download the catalog.
[Free Gift] Technical Documentation Using a Cutting-Edge Micro Infrared Spectroscopy Imaging System
Automotive paint is composed of multiple layers of paint to enhance weather resistance and aesthetic quality, with the layer structure and types of paint varying by vehicle model. Therefore, the component analysis of each layer that makes up a paint chip provides valuable information for identifying the vehicle model. This document presents case studies on the analysis of automotive paint chips conducted using a state-of-the-art micro-infrared spectroscopic imaging system. [Contents] ■ Introduction ■ Samples and Analysis System ■ Data Analysis ■ Results ■ Conclusion ■ References *For more details, please refer to the PDF document or feel free to contact us.
Provides very useful information for elucidating reaction mechanisms! Essential for the development of functional materials.
We would like to introduce our "Real-time Analysis of Light Curing Reactions Using Rapid Scan FT-IR." By analyzing changes in molecular structure during polymerization reactions using infrared spectra, we can gain a detailed understanding of specific chemical changes and reaction rates, providing very useful information for elucidating reaction mechanisms. Furthermore, we can indicate pathways for practical application, such as optimizing material properties and manufacturing processes. [Features] ■ Provides very useful information for elucidating reaction mechanisms ■ Capable of indicating pathways for practical application, such as optimizing material properties and manufacturing processes *For more details, please refer to the PDF materials or feel free to contact us.
It can be confirmed without loss by the "sampling method that protects the surface" of the adhered layer (approximately 20nm) on the surface of the connector terminal plated with STEM.
In STEM (Scanning Transmission Electron Microscopy) and EDS (Energy Dispersive X-ray Spectroscopy), information about the composition of the sample (contrast images reflecting atomic numbers) can be obtained by scanning a finely focused electron beam over the sample. The following features are also available: - Observation of changes in diffraction contrast by varying the angle of incidence of the electron beam - Determination of whether the observation target is crystalline - Acquisition of information about crystal defects (dislocations, twins, etc.) within the crystal In this case, we will introduce "Failure Analysis of Au-Plated Connector Terminal Contacts Using STEM." Please take a moment to read the PDF materials. Additionally, our company conducts various cross-sectional analyses using not only STEM but also TEM and SEM. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.
STEM-EDS observation can confirm the shape and layer structure of the insulating film between semiconductor Poly-Si (polysilicon) and can be applied to investigate the causes of semiconductor defects.
In STEM (Scanning Transmission Electron Microscopy) and EDS (Energy Dispersive X-ray Spectroscopy), information regarding the composition of the sample (contrast images reflecting atomic numbers) can be obtained by scanning a finely focused electron beam over the sample. Additionally, the following features are available: - Observation of changes in diffraction contrast by varying the angle of incidence of the electron beam - Determination of whether the observation target is crystalline - Acquisition of information on crystal defects (dislocations, twins, etc.) within the crystal In this case, we introduce "Evaluation of Semiconductor Insulating Films using STEM-EDS." This case yielded no issues, but abnormal detection is also possible. Please take a moment to read the PDF materials. Furthermore, in addition to this STEM, our company excels in identifying defective areas by performing 3D reconstruction on specific regions of the sample in combination with FIB. We would be happy to provide a demonstration, so please feel free to reach out to us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.
Low-cost AC resistance calculation is possible! A solution for AC analysis of Ritz lines.
When an alternating current is applied to a Litz wire, it is known that the resistance increases with higher frequencies due to the skin effect and proximity effect, and this AC resistance can be determined through electromagnetic field analysis. This document introduces examples of calculating the AC resistance of a Litz wire twisted in two stages using EMSolution. By utilizing the periodic symmetry conditions available in EMSolution, it demonstrates that AC resistance calculations using a three-dimensional model of the Litz wire can be performed with low computational costs. **Benefits of calculating AC resistance through electromagnetic analysis:** - Frequency-dependent characteristics of AC resistance can be obtained before prototyping. - The quantitative impact of the number of strands and twist pitch on AC resistance can be understood. - The current distribution within the strands can be visualized. - A deeper understanding of the phenomena can be achieved. *For more details, please refer to the PDF document or feel free to contact us.*
