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microscope Product List and Ranking from 41 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. フローベル Kanagawa//Optical Instruments
  3. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  4. 4 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  5. 5 アズサイエンス 松本本社 Nagano//Trading company/Wholesale
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microscope Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. White interference microscope equipped with laser microscope 'VK-X3000'
  2. Bilateral Microscope System "TOMOS Series" フローベル
  3. All-in-one fluorescence microscope 'BZ-X1000 Series'
  4. 4 All-in-one fluorescence microscope 'BZ-X800'
  5. 5 White interference microscope equipped with laser VK-X3000

microscope Product List

31～45 item / All 652 items

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Compact AFM "NaioAFM" *Demo now available

Compact AFM "NaioAFM" *Demo now available

Quick and simple measurement of surface shapes! Standard features include dust and wind shields, and vibration prevention mechanisms.

The "NaioAFM" is a compact type of atomic force microscope that balances functionality and operability, featuring essential technologies for surface shape measurement as standard, while allowing for easy setup of the device and cantilever replacement. Before scanning, necessary re-tuning, approach to the sample, and tilt correction of the sample plane are automatically performed by the software, so once the cantilever is brought close to the sample, the scan will begin. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera and side-view observation for positioning ■ Additional measurement modes can be added according to needs ■ Demonstrations can be conducted on-site at customer locations *For more details, please refer to the materials. Feel free to contact us with any inquiries. If you wish to request a demonstration, please apply through the contact form.

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  • Electron microscope

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Multifunctional Compact Atomic Force Microscope CoreAFM

Multifunctional Compact Atomic Force Microscope CoreAFM

Active vibration isolation built-in! It supports electrochemical measurements and environmental control simply by changing the stage.

"CoreAFM" is a multifunctional compact atomic force microscope that combines high performance with scalability to accommodate any type of measurement. The top-view camera makes it easy to align the measurement target, while the side-view camera allows for visual confirmation of the distance between the cantilever and the sample. Additionally, the cantilever holder can be easily attached and detached from the AFM head unit, allowing for safe cleaning or washing of just the holder. 【Features】 ■ Ready to use with immediate connection of the controller, power supply, and USB cable ■ High-resolution 24-bit ADC/DAC ■ Maximum scan range (X, Y, Z): 100μm, 100μm, 12μm ■ Z noise level: 40pm RMS value ■ Capable of supporting 32 standard measurement modes, including measurements in liquid, as well as various optional modes *For more details, please refer to the PDF document or feel free to contact us.

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  • Other microscopes

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Ultra-precision universal measurement microscope

Ultra-precision universal measurement microscope

Ultra-precision universal measurement microscope

- Measurement range: (X) 200mm x (Y) 100mm - Accuracy: ±(1+0.004L)μm The column can tilt left and right up to ±12.5°, and with the center support (maximum φ100 x 700L mm), it is also possible to measure threaded systems such as screws and taps.

  • Microscope

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InGaAsカメラ付赤外顕微鏡NVU3VD-MS1

InGaAsカメラ付赤外顕微鏡NVU3VD-MS1

LEDリング暗視野赤外照明を内蔵しており、簡便に高解像度な赤外顕微鏡撮像ができます。

カメラ 画素数,画素ピッチ　640×513、15μm 波長域　970～1650nm 画像フォーマット　16bitグレースケール　png、tiff、csv フレームレート　10～60fps　ローリングシャタ デジタルI/F　USB3.0 Vision

  • Other microscopes

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Dislocation observation using the SEM-ECCI method

Dislocation observation using the SEM-ECCI method

The observation of dislocations in metallic materials has traditionally been done using TEM, but it has now become possible to observe dislocations using SEM.

An essential understanding of the processes of deformation and fracture in metallic materials requires the visualization of dislocation states. Traditionally, transmission electron microscopy (TEM) has been used to observe dislocations in metallic materials, but in recent years, observations using scanning electron microscopy (SEM) have also been attempted. This time, our company has also become capable of observing dislocations using SEM.

  • Contract Analysis

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Observation of dislocations in GaN using the SEM-ECCI method.

Observation of dislocations in GaN using the SEM-ECCI method.

Using the SEM-ECCI method, observation becomes possible with easy preprocessing! We will also introduce measurement examples of single crystal GaN.

Our company conducts dislocation observation of GaN using the SEM-ECCI method. In power semiconductors such as Gallium Nitride (GaN), dislocations present during manufacturing are considered factors that lead to decreased device performance and shortened lifespan. Dislocation observation in semiconductors is mainly performed using Transmission Electron Microscopy (TEM) or the Etch Pit method; however, using the SEM-ECCI method allows for observation with easy pre-treatment. [Measurement Example] - Sample: Single crystal GaN (wafer with GaN deposited on a sapphire substrate) - Surface Orientation: C-plane (0001) ±0.5° - GaN Film Thickness: 4.5 ± 0.5 μm - Measurement Conditions: Backscattering mode *For more details, please refer to the related links or feel free to contact us.

  • Contract measurement

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Observation of GaN defects using forward scattering electrons in SEM.

Observation of GaN defects using forward scattering electrons in SEM.

Dislocations and steps (tiny steps) as well as small orientation differences in power semiconductors such as GaN can be observed.

In power semiconductors such as GaN, atomic-level defects affect performance degradation. By evaluating forward-scattered electrons using an EBSD detector, it becomes possible to observe dislocations as well as steps (small height differences) and micro-orientation differences.

  • Contract Analysis

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Special optical devices: Two types of amplitude measurement microscopes.

Special optical devices: Two types of amplitude measurement microscopes.

This is a microscope used for measuring the amplitude of high-speed vibrating objects!

This is a microscope used for measuring the amplitude of high-speed vibrating objects. Type 1: The amplitudes in the vertical and horizontal directions can be read simultaneously on an optical scale within the field of view. Illumination: Two types of illumination, fiber-based incident illumination and coaxial illumination, can be alternately used depending on the purpose. Type 5: It uses an optical sectioning method to measure the amplitude in the front-back and depth directions. A slit is placed on the vibrating object from a diagonal direction, and it is magnified by an optical system arranged symmetrically. The amplitude of the slit increases based on the magnitude of the front-back and depth direction amplitudes, and by aligning this amount with a reference line in the field of view through the microscope's movement in the front-back and depth directions, the result is displayed digitally.

  • Optical Measuring Instruments
  • Optical microscope

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Special optical device for curvature measurement microscope

Special optical device for curvature measurement microscope

Measure the minute curvature (radius) of concave and convex surfaces without contact!

Even the smallest curvature can be measured by increasing the magnification of the objective lens. Not only curvature but also the surface accuracy of the curved surface can be confirmed by the distortion of the optical chart image. By focusing the optical chart image on the curvature surface, performing zero adjustment, and then raising the position of the microscope to focus again on the optical chart image reflected on the curvature surface beyond the filament image, the amount of movement up to that point indicates the curvature and is displayed digitally.

  • Optical microscope

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Special optical device - microscope for measuring observation angles in two directions.

Special optical device - microscope for measuring observation angles in two directions.

For checking the tip angle of a small diameter drill!

It is an optical measurement device that allows simultaneous viewing of the drill tip and side from two directions to check whether the tip of the small diameter drill is correctly polished according to specifications, enabling visual inspection and angle measurement of the tip.

  • Optical microscope

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Compound microscope, zoom stereo microscope

Compound microscope, zoom stereo microscope

It's an easy-to-use microscope with the zoom knob on the top!

The standard magnification ranges from 10 to 40×, while the high magnification models range from 10 to 60×. All models come with ring lighting using fluorescent lamps. We have a wide variety of microscope stands, including those that can accommodate large printed circuit boards, as well as models that feature built-in illumination for both transmitted and reflected light.

  • Optical microscope

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Stereo microscope with three-eye coaxial illumination zoom.

Stereo microscope with three-eye coaxial illumination zoom.

Coaxial and reflected illumination can be switched!

The combination of fiber coaxial lighting with halogen illumination and ring-shaped incident lighting allows for instant switching between bright field observation and dark field observation. It enables effective selection of lighting based on the variations in the reflectivity of the observed object.

  • Optical microscope

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Stereo Microscope Mini Stereo Microscope (Direct View Type 1)

Stereo Microscope Mini Stereo Microscope (Direct View Type 1)

It is a small and lightweight upright microscope!

The MDS-400 model is a compact and lightweight upright microscope. The working distance is 135mm. By using a 0.5× auxiliary objective lens, the working distance can be extended to 230mm, allowing it to be mounted for use with equipment. A 30× eyepiece is also available as a standard option.

  • Optical microscope

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Two-person zoom stereo microscope

Two-person zoom stereo microscope

For the proper description of small parts and products! It can also be used for assembly technical guidance.

This product is a two-person zoom stereo microscope suitable for work guidance and inspection methods for soldering on printed circuit boards. It features a bright long-working-distance type that improves the efficiency of observation tasks. The LED pointer can be manually moved freely within the field of view to indicate the appropriate position. Additionally, it allows two people to simultaneously magnify and view the same object, making it useful for inspecting, sorting, collaborative work, research, and development using the pointer. 【Specifications】 ■ Optical system: Upright image ■ Total magnification: 5x to 20x (standard specification with 10x eyepiece and 1x objective) ■ Working distance: 170mm (standard specification with 1x objective) ■ Base size: 260mm x 300mm x 20mm ■ LED pointer: 100V power supply type or battery-operated type ■ Lighting device: FR-6 type, fluorescent ring lighting device (100V-6W) *For more details, please download the PDF or feel free to contact us.

  • Optical microscope

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3-eye zoom stereo microscope

3-eye zoom stereo microscope

Ideal for record-keeping! You can alternate between binocular vision and observation on a color TV.

This product is a three-eye zoom stereo microscope that allows for alternating observation of a bright stereoscopic image through binocular vision and a color TV image by rotating a knob located on the left side of the optical body to switch the optical path. A transparent plastic cylinder is installed at the tip of the objective lens. The ring illumination can be moved up and down along the cylinder and can be stopped at a bright and easily visible position with good contrast. Additionally, by using a color copier, a clean and practical color TV image copy can be created as a record. 【Features】 ■ Easy-to-see illumination ■ Illumination for good image and record creation ■ Image recording *For more details, please download the PDF or feel free to contact us.

  • Optical microscope

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